Analysis of the extended defects in 3C-SiC.pdf - Nelson Mandela ...
Analysis of the extended defects in 3C-SiC.pdf - Nelson Mandela ...
Analysis of the extended defects in 3C-SiC.pdf - Nelson Mandela ...
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78<br />
After determ<strong>in</strong><strong>in</strong>g all <strong>the</strong> variables <strong>of</strong> <strong>the</strong> problem <strong>the</strong> fault was simulated us<strong>in</strong>g<br />
s<strong>of</strong>tware developed by Head et al. (1955) us<strong>in</strong>g a technique analogous to that<br />
discussed <strong>in</strong> Section 4.3.3.<br />
Fig. 7.8. The bright field and dark field TEM micrographs with <strong>the</strong>ir correspond<strong>in</strong>g<br />
simulated images <strong>of</strong> <strong>the</strong> stack<strong>in</strong>g fault selected.<br />
Fig. 7.8. shows both bright and dark field TEM micrographs <strong>of</strong> <strong>the</strong> stack<strong>in</strong>g fault with<br />
<strong>the</strong> correspond<strong>in</strong>g simulated images. Excellent agreement is seen <strong>in</strong> both cases and it