Actel_Reliability_Q3..

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Actel_Reliability_Q3..

Reliability Report

Q3 FY2001

October 19, 2001


Table of Contents

RELIABILITY REPORT............................................................................................................................................................1

RELIABILITY SUMMARY .......................................................................................................................................................3

1.0 UM FPGA RELIABILITY SUMMARY..............................................................................................................................6

0.8 UM FPGA RELIABILITY SUMMARY............................................................................................................................16

0.6 UM FPGA RELIABILITY SUMMARY............................................................................................................................21

0.45 UM FPGA RELIABILITY SUMMARY..........................................................................................................................26

0.35 UM FPGA RELIABILITY SUMMARY..........................................................................................................................29

RTSX 0.6 UM FPGA RELIABILITY SUMMARY ................................................................................................................32

MEC 0.25 UM FPGA RELIABILITY SUMMARY................................................................................................................34

FLASH 0.25 UM FPGA RELIABILITY SUMMARY............................................................................................................37

0.22 UM FPGA RELIABILITY SUMMARY..........................................................................................................................39

Confidential Page 2 11/20/01


Reliability Summary


1.54E+07

Product Process Group

Reliability Summary: FIT-MTTF by Process Technology

# of

Failures

Device

Hours

Tj,

deg C

Ea,

eV

Confidence

Interval

FIT MTTF

Single-Sided

1.0 um CMOS FPGA 6 5.94E+08 55 0.7 60% 12.362 8.090E+07

0.8 um CMOS FPGA 1 1.56E+08 55 0.7 60% 12.948 7.714E+07

0.6 um CMOS FPGA 0 1.85E+08 55 0.7 60% 4.948 2.009E+08

0.45 um CMOS FPGA 0 7.33E+07 55 0.7 60% 12.509 7.946E+07

0.35 um CMOS FPGA 0 5.50E+07 55 0.7 60% 16.670 5.962E+07

RTSX 0.6 um CMOS FPGA 0 3.11E+07 55 0.7 60% 29.450 3.375E+07

0.25 um MEC CMOS FPGA 0 2.34E+07 55 0.7 60% 39.118 2.541E+07

0.25 um Infineon Flash CMOS FPGA 0 9.36E+06 55 0.7 60% 97.625 5.45.E+07

0.22 um UMC CMOS FPGA 0 1.40E+07 55 0.7 60% 65.083 1.54E+07


Reliability Summary: FIT rate by Product-Family

Product Family and Device Technology

# of

Failures

Device Hours Tj,

deg C

Ea,

eV

Confidence FIT MTTF

1.0 um CMOS FPGA 6 5.94E+08 55 0.7 60% 12.36 8.090E+07

Act 1 5 3.97E+08 55 0.7 60% 15.84 6.312E+07

Act 2 1 1.96E+08 55 0.7 60% 10.32 9.674E+07

0.8 um CMOS FPGA 1 1.56E+08 55 0.7 60% 12.95 7.714E+07

Act 3 0 1.36E+08 55 0.7 60% 6.72 1.478E+08

XL 1 2.01E+07 55 0.7 60% 100.71 9.917E+06

DX 0 6.24E+06 55 0.7 60% 146.99 6.762E+06

0.6 um CMOS FPGA 0 1.85E+08 55 0.7 60% 4.95 2.009E+08

Act 3 0 4.99E+07 55 0.7 60% 18.36 5.413E+07

XL 0 7.81E+07 55 0.7 60% 11.73 8.473E+07

DX 0 4.63E+07 55 0.7 60% 19.79 5.022E+07

0.45 um CMOS FPGA 0 7.33E+07 55 0.7 60% 12.51 7.946E+07

MX 0 7.33E+07 55 0.7 60% 12.51 7.946E+07

0.35 um CMOS FPGA 0 5.50E+07 55 0.7 60% 16.67 5.962E+07

SX 0 5.50E+07 55 0.7 60% 16.67 5.962E+07

RTSX 0.6 um CMOS FPGA 0 3.11E+07 55 0.7 60% 29.45 3.375E+07

RTSX 0 3.11E+07 55 0.7 60% 29.45 3.375E+07

0.25 um MEC CMOS FPGA 0 2.34E+07 55 0.7 60% 39.12 2.541E+07

SX 0 2.34E+07 55 0.7 60% 39.12 2.541E+07

EX NA --- 55 0.7 60% --- ---

SX-S NA --- 55 0.7 60% --- ---

0.25 um Infineon Flash CMOS FPGA 0 9.36 E+06 55 0.7 60% 97.625 1.024E+07

ProAsic 0 9.36 E 06 E+06 55 0.7 60% 97.625 1.024E+07

0.22 um UMC CMOS FPGA 0 1.40E+07 55 0.7 60% 65.08 1.54 E+07

SX-A 0 1.40E+07 55 0.7 60% 65.08 1.54 E+07

EX NA --- 55 0.7 60% --- ---


1.0 um FPGA Reliability Summary


1.0 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

1010A JG03 68 PLCC 2000 59 0 0 0 0 118000

1010A JG03 68 PLCC 2000 117 0 0 0 0 234000

1010A TI24 68 PLCC 2000 74 0 0 0 0 148000

1010A TI1104 68 PLCC 1000 107 0 0 0 - 107000

TI1243 0

TI1263 0

TI1297 0

1010A E01-1 68 PLCC 1000 69 0 0 0 - 69000

1010A E02-1 68 PLCC 1000 70 0 0 0 - 70000

1010B TI2072857 68 PLCC 1000 400 1 0 0 - 400000

TI2072858 0

TI2072860 0

1010B U1G-01 68 PLCC 1000 79 0 0 0 - 79000

1010B U1G-02 68 PLCC 500 57 0 0 - - 28500

1010B U9G01P 100 PQFP 1000 76 0 0 0 - 76000

1020A JF01 84 JLCC 2000 25 0 0 0 0 50000

1020A JF01 84 PLCC 2000 15 0 0 0 0 30000

1020A JF02 84 JLCC 2000 44 0 0 0 0 88000

1020A JF02 84 JLCC 2000 41 0 0 0 0 82000

1020A JF04 84 PLCC 1000 77 0 0 0 - 77000

1020A JF04 84 PLCC 500 20 0 0 - - 10000

1020A JF14 84 PLCC 500 58 0 0 - - 29000

1020A JF14 84 PLCC 500 100 0 1 - - 50000

1020A JF37 84 PLCC 168 14 1 - - - 2352

1020A JF37 84 PLCC 168 20 0 - - - 3360

1020A JF39 84 PLCC 168 32 0 - - - 5376

1020A JF39 84 PLCC 168 29 0 - - - 4872

1020A JF42 84 PLCC 500 49 0 0 - - 24500

1020A JF42 84 PLCC 500 30 0 1 - - 15000

1020A JF66 84 PLCC 1000 33 0 0 0 - 33000

1020A JF66 84 PLCC 1000 39 0 0 0 - 39000

1020A JF67 84 PLCC 1000 49 0 0 0 - 49000

1020A JF67 84 PLCC 1000 45 0 0 0 - 45000

1020A TI S#1 84 PLCC 1000 79 0 0 0 - 79000

1020A E-14 84 PLCC 2000 45 0 0 0 0 90000

1020A E-15 84 PLCC 2000 44 0 0 0 0 88000

1020A E-17 84 PLCC 2000 45 0 0 0 0 90000

1020A JF-207 100 PQFP 1000 129 0 0 0 - 129000

1020A D1J1815 84 PGA 1000 51 0 0 0 - 51000

D2B2704 0

1020A E-01 84 PLCC 1000 45 0 0 0 - 45000

1020A E-02 84 PLCC 1000 45 0 0 0 - 45000

1020A E-03 84 PLCC 1000 45 0 0 0 - 45000


1020A ADK29X 84 PLCC 2000 45 0 0 0 0 90000

1020A ADA72X 84 PLCC 2000 45 0 0 0 0 90000

1020A ADC21X 84 PLCC 2000 45 0 0 0 0 90000

1020A TI1130 84 PLCC 1000 223 0 0 0 - 223000

1020A TI1139 0

1020A TI1210 0

1020A TI1800 84 PLCC 1000 34 0 0 0 - 34000

1020A TI1803 0

1020A UP-04 84 PLCC 1000 40 0 0 0 - 40000

UP-05 84 PLCC 1000 40 0 0 0 - 40000

1010B TI5276893 84PLCC 1000 100 0 0 0 - 100000

1020B JJ-14 84 PLCC 1000 45 0 0 0 45000

1020B JJ-15 84 PLCC 1000 45 0 0 0 45000

1020B JJ-17 84 PLCC 1000 45 0 0 0 45000

1020B JJ-13 84 PGA 1000 30 0 0 0 30000

1020B JJ-13 84 PGA 500 80 0 0 - 40000

1020B JJ-16 84 PLCC 1000 80 0 0 0 80000

1020B U1P-01 84 PLCC 1000 40 0 0 0 40000

1020B U1P-02 84 PLCC 1000 40 0 0 0 40000

1020B JJ-24 84 PLCC 1000 87 0 0 0 87000

1020B EBFJ001 84 PLCC 1000 40 0 0 0 40000

1020B EBFI004 84 PLCC 1000 40 0 0 0 40000

1020B U1P41HM 100 PQFP 1000 80 0 0 0 80000

1020B U1P25 80 VQFP 500 45 0 0 - 22500

1020B U1P83 80 VQFP 1000 43 0 0 0 43000

U1P25 80 VQFP 1000 39 0 0 0 39000

1020B U1P05 100 PQFP 1000 129 0 0 0 129000

1020B U1P209B 84 PLCC 1000 40 0 0 0 40000

1020B U9P01 100 PQFP 1000 133 0 1 0 133000

U9P021A 100 PQFP 0

1020B U9P-004 84 PLCC 1000 47 0 0 0 47000

A1020B U1P057/ 0014 PG84C 2000 97 0 0 0 0 194000

1020B U9P046 84 PLCC 1000 100 0 0 0 - 100000

1020B 6085878 84 PLCC 1000 100 0 0 0 - 100000

1020B U9P128 84 PLCC 1000 100 0 0 0 - 100000

1020B UP121 CQ84 1000 24 0 0 0 - 24000

A1020A UP121 CQ84E 1000 24 0 0 0 24000

1020B UB9P034 84 PLCC 2000 98 0 0 0 0 196000

1225 UJ-01 100 PGA 1000 80 0 0 0 - 80000

1225 UJ-01 100 PQFP 1000 127 0 0 0 - 127000

A1225 TI9028537 84PLCC 1000 100 0 0 0 - 100000

1225A U1J-02 100 PQFP 1000 80 0 0 0 - 80000

A1225A MIX PQ100 1000 32 0 0 0 - 32000

1240 TI3257 132 PGA 500 7 0 0 - - 3500

1240 TI3257 144 PQFP 1000 129 0 0 0 - 129000

1240 TI1045571 132 PGA 2000 38 0 0 0 0 76000

1240 TI1053933 132 PGA 2000 55 0 0 0 0 110000

1240 TI1053932 132 PGA 2000 36 0 0 0 0 72000

1240 TI1220494 132 PGA 1000 90 0 0 0 - 90000

1240 UI-01 132 PGA 1000 50 0 0 0 - 50000

1240 UI-03 84 PLCC 1000 80 0 0 0 - 80000

1240 MIX PQ144 1000 36 0 0 0 - 36000


1240A E-02,03 144 PQFP 1000 100 0 0 0 - 100000

1240A E-04 84 PLCC 2000 30 0 0 0 0 60000

1240A U1I-26 144 PQFP 1000 80 0 0 0 - 80000

1280 JH05 176 PGA 2000 15 0 0 0 0 30000

1280 JH06 176 PGA 2000 15 0 0 0 0 30000

1280 JH03(K) 176 PGA 2000 25 0 0 0 0 50000

1280 JH03(SB) 176 PGA 2000 25 0 0 0 0 50000

1280 TI1143649 176 PGA 1000 44 0 1 0 - 44000

1280 TI1143650 176 PGA 1000 44 0 0 0 - 44000

1280 TI1136307 176 PGA 1000 42 0 0 0 - 42000

1280 UH-01 176 PGA 1000 26 0 0 0 - 26000

1280 UH-02 176 PGA 1000 26 0 0 0 - 26000

1280 UH-05 176 PGA 1000 40 0 0 0 - 40000

1280 UH-04 160 PQFP 1000 79 0 0 0 - 79000

1280 UH-10,14 176 PGA 1000 75 0 0 0 - 75000

1280 ADC18X 160 PQFP 1000 130 0 0 0 - 130000

1280A EBFJ002 160 PQFP 168 30 0 - - - 5040

1280A EBFJ003 160 PQFP 168 30 0 - - - 5040

1280A EBFJ004 160 PQFP 168 20 0 - - - 3360

1280A U1H-01 160 PQFP 2000 27 0 0 0 0 54000

1280A U1H-02 160 PQFP 2000 27 0 0 0 0 54000

1280A U1H-35 176 PGA 168 132 0 - - - 22176

1280A U1H-18 160 PQFP 1000 80 0 0 0 - 80000

A1280A U1H486 CQ172B 1000 81 0 0 0 81000

TOTAL Units for 1.0um FPGA = 1127 6762 Total test time Hrs. 7415576

TOTAL Failures for 1.0um FPGA = 6

7620836

Act 1

TOTAL Units for 1.0um FPGA = 1108 4599 Total test time Hrs. 4532460

TOTAL Failures for 1.0um FPGA = 5

5095951

Act 2

TOTAL Units for 1.0um FPGA = 1162 2163 Total test time Hrs. 2276116

TOTAL Failures for 1.0um FPGA = 1

2514317


1.0 um FPGA Reliability Summary

85C/85%TEMPERATURE HUMIDITY BIAS:

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

1010A E01-1 68 PLCC 500 79 0 0 - - 39500

1010A E02-2 68 PLCC 500 79 0 0 - - 39500

1010A E03-1 68 PLCC 500 79 0 0 - - 39500

1010A TI1104 68 PLCC 1000 80 0 0 0 - 80000

TI1243

TI1263

TI1297

1010B 2072857 68 PLCC 1000 201 0 0 0 - 201000

2072858

2072860

1020A E-01 84 PLCC 1000 64 0 0 0 - 64000

E-02 84 PLCC

E-03 84 PLCC

1020A ADK29 84 PLCC 1000 27 0 0 0 - 27000

ADC21X 84 PLCC 1000 27 0 0 0 - 27000

ADA72X 84 PLCC 1000 27 0 0 0 - 27000

1020A E14 84 PLCC 1000 24 0 0 0 - 24000

E15 84 PLCC 1000 29 0 0 0 - 29000

E17 84 PLCC 1000 32 0 0 0 - 32000

1020A UP-06 100 PQFP 1000 77 0 0 0 - 77000

1020B JJ-14 84 PLCC 1000 27 0 0 0 - 27000

JJ-15 84 PLCC 1000 27 0 0 0 - 27000

JJ-17 84 PLCC 1000 27 0 0 0 - 27000

TOTAL Units for 1.0um FPGA = 906 906 Total test time Hrs. 787500

TOTAL Failures for 1.0um FPGA = 0


1.0 um FPGA Reliability Summary

BIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

1020A TI1130 84 PLCC 250 77 0 0 0 0 19250

TI1139

TI1210

1020A U1P05 100 PQFP 100 45 0 0 - - 4500

1020A U1P41HM 100 PQFP 100 81 0 0 - - 8100

1020A U1P-209B 84-PLCC 100 15 0 0 - - 1500

1020B EBFJ001 84-PLCC 100 44 0 0 - - 4400

EBFI004 84-PLCC 100 36 0 0 - - 3600

1020B U9P01 84-PLCC 100 29 0 0 - - 2900

U9P021A 84-PLCC 100 50 0 0 - - 5000

1020B U9P039 84PLCC 100 50 0 0 - - 5000

1020B U9P046 84PLCC 100 50 0 0 - - 5000

1020B 6085878 84PLCC 100 50 0 0 - - 5000

1225A TI6182116 84PLCC 100 52 0 0 - - 5200

A1020B 103501 84PLCC 100 61 - 0 6100

TOTAL Units for 1.0um FPGA = 640 Total test time Hrs. 75550

TOTAL Failures for 1.0um FPGA = 0


1.0 um FPGA Reliability Summary

Temperature Cycle

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 100 500 1000 2000 Unit Hrs

(0 C - +125 C)

1010A TI15 68 PLCC 1000 125 0 0 0 - 125000

1010A TI24 68 PLCC 1000 176 0 0 0 - 176000

1010A TI1104 68 PLCC 2000 129 0 0 0 0 258000

TI1243

TI1263

TI1297

1020A TI1800 84 PLCC 2000 129 0 0 0 0 258000

TI1859

TI2156

TOTAL Units for 1.0um FPGA = 1500 559 Total test time Hrs. 817000

TOTAL Failures for 1.0um FPGA = 0

(-40 C - +125 C)

1010A TI1104 68 PLCC 2000 129 0 0 0 0 258000

TI1243

TI1263

TI1297

1020A TI1800 84 PLCC 2000 129 0 0 0 0 258000

TI1859

TI2156

TOTAL Units for 1.0um FPGA = 2000 258 Total test time Hrs. 516000

TOTAL Failures for 1.0um FPGA = 0

(-55 C - +125 C)

1020B U9P186 68 PLCC 1000 30 0 0 0 30000

1020B U9G042 PQ100 1000 25 0 0 0 25000

TOTAL Units for 1.0um FPGA = 1000 55 Total test time Hrs. 55000

TOTAL Failures for 1.0um FPGA = 0

(-65 C - +150 C)

1010A TI1104 68 PLCC 2000 129 0 0 0 0 258000

TI1243

TI1263

TI1297

1010B TI2072857 68 PLCC 1000 201 0 0 0 - 201000

TI2072858

TI2072860

1010B U1G-01,02 68 PLCC 1000 40 0 0 0 - 40000

1020A TI1800 84 PLCC 2000 129 0 0 0 0 258000

TI1859

TI2156

1020A JF-71 100 PQFP 1000 129 0 0 0 - 129000

1020A E01 84-PLCC 1000 85 0 0 0 - 85000

E02


E03

(-65 C - +150 C)

continued

1020A S-1702A,B,C 84-PLCC 1000 144 0 0 0 - 144000

1020B JJ14-17 84-PLCC 1000 81 0 0 0 - 81000

1020B U1P-01,02 84-PLCC 1000 40 0 0 0 - 40000

1020B EBFJ001 84-PLCC 1000 80 0 0 0 - 80000

1020B U1P41HM 100 PQFP 1000 80 0 0 0 - 80000

1020B EWAI003 84-PLCC 1000 80 0 0 0 - 80000

1020B U1P-209B 84-PLCC 1000 15 0 0 0 - 15000

1020B U1P05 100 PQFP 1000 80 0 0 0 - 80000

1020B U9P021A 84-PLCC 1000 55 0 0 0 - 55000

U9P01 1000 23 0 0 0 - 23000

1020B U9P039 84-PLCC 1000 50 0 0 0 - 50000

1020B U9P046 84-PLCC 1000 50 0 0 0 - 50000

1020B 6085878 84-PLCC 1000 50 0 0 0 - 50000

A1225A TI9039849 84-PLCC 1000 16 0 0 0 - 16000

A1240A TI0094901 PQ144 1000 36 0 0 0 - 36000

A1020B 103501 84PLCC 1000 62 0 - 0 62000

A1240A TI6163513 84-PLCC 1000 40 0 0 0 - 40000

TOTAL Units for 1.0um FPGA = 1087 1695 Total test time Hrs. 1953000

TOTAL Failures for 1.0um FPGA = 0

1.0 um FPGA Reliability Summary

Thermal Shock

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 100 200 500 1000 Unit Hrs

1010A TI1104 68 PLCC 1000 77 0 0 0 0 77000

TI1243

TI1263

TI1297

1010B TI2072857 68 PLCC 1000 45 0 0 0 0 45000

TI2072858

TI2072860

1020A TI1800 84 PLCC 1000 77 0 0 0 0 77000

TI1859

TI2156

TOTAL Units for 1.0um FPGA = 1000 199 Total test time Hrs. 199000

TOTAL Failures for 1.0um FPGA = 0


1.0 um FPGA Reliability Summary

PRESSURE POT (UNBIASED AUTOCLAVE):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 96 168 240 336 Unit Hrs

1010A TI15 68 PLCC 840 77 0 0 0 0 64680

1010A TI24 68 PLCC 840 129 0 0 0 0 108360

1010A TI1104 68 PLCC 840 77 0 0 0 0 64680

TI1243

TI1263

TI1297

1010A E01-1 68 PLCC 840 30 0 0 0 0 25200

1010A E02-1 68 PLCC 840 30 0 0 0 0 25200

1010A E03-1 68 PLCC 840 30 0 0 - 2 25200

1010B TI2072857 68 PLCC 840 45 0 0 0 - 37800

TI2072858

TI2072860

1010B U1G-01 68 PLCC 264 40 0 0 - - 10560

1020A TI1800 84 PLCC 504 77 0 0 0 - 38808

TI1859

TI2156

1020A E-01 84-PLCC 840 26 0 0 0 0 21840

E-02 84-PLCC 840 28 0 0 0 0 23520

E-03 84-PLCC 840 26 0 0 0 0 21840

1020A ADK29 84-PLCC 264 27 0 0 - - 7128

ADC21X 84-PLCC 264 27 0 0 - - 7128

ADA72X 84-PLCC 264 27 0 0 - - 7128

1020A JF-207 100 PQFP 264 80 0 0 - - 21120

1020A S-1702A 84-PLCC 840 25 0 0 0 0 21000

S-1702B 840 26 0 0 0 0 21840

S-1702C 840 25 0 0 0 0 21000

1020B JJ14-17 84-PLCC 264 81 0 0 - - 21384

1020B U1P-01 84-PLCC 264 40 0 0 - - 10560

1020B U09039 84-PLCC 264 50 0 0 - - 13200

A1240A TI6133120 PQ144 264 45 0 0 - - 11880

TOTAL Units for 1.0um FPGA = 600 1068 Total test time Hrs. 631056

TOTAL Failures for 1.0um FPGA = 2


1.0 um FPGA -- Failure Analysis-Units Failed in Test

TOTAL

Failures

PRODUCT RUN# HOURS CAUSE

6

1010A TI29 500 FUNCTIONAL AT VCC>4.5V. ALL NETS SLOW. DAMAGED ISOLATION

TRASISTOR OXIDE. NOT ANTIFUSE RELATED. UNIT WAS MARGINAL

AT T0.

1010B TI2072857 144 IDDH FAILURE AT 144 HRS. GATE POLY TO DRAIN

1020A JF14 417 OPEN METAL I TO METAL II VIA.

1020A JF37 300 GROSS FUNCTIONAL FAILURE DUE TO SHORTED GATE OXIDE. IN

THE LOGIC MODULE. UNIT WAS GOOD AT 112 HRS.

1020A JF42 650 FAILED FUSE SHORTS. CAUSE IS SHORTED ANTIFUSE. UNIT WAS

GOOD AT 168 HRS. BLANK PATTERN AT 6V IS MUCH STRONGER

STRESS THAN NORMAL APPLICATION.

1020B* U9P01 500 FUNTIONAL FAIILURE. DISCOUNTED NO DEFECTS WERE OBSERVED

AFTER DECAPSULATION.

1280 TI1143649 500 TRISTATE LKG PIN 28. NO CAUSE DETERMINED DUE TO BOND WIRE

DAMAGE DURING DECAPSULATION


0.8 um FPGA Reliability Summary


0.8 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

1425 JK08,09,10 133 PGA 1000 140 0 0 0 140000

1425 JK08,09,10 84 PLCC 1000 135 0 0 0 135000

1425A UCJ01,2,3 133 PGA 1000 130 0 0 0 130000

1425A ACN32804 133 PGA 1000 130 0 0 0 130000

ACN30805 0

ACN33807 0

1425A UCJ013 100PQFP 1000 100 0 0 0 100000

1440A JN05 100 VQFP 1000 79 0 0 0 79000

1440A 51940.1 100 VQFP 1000 79 0 0 0 79000

1460A JL-01 208 PQFP 1000 80 0 0 0 80000

1460A JL-01 207 PGA 1000 80 0 0 0 80000

1460A JL-03 208 PQFP 1000 62 0 0 0 62000

1460A JL-06B 207 PGA 1000 65 0 0 0 65000

1460A PC435091 207 PGA 1000 80 0 0 0 80000

PC435092 207 PGA 0

PC435093 207 PGA 0

14100A 24239130 208 RQFP 1000 51 0 0 0 51000

UCLO1 208 RQFP 1000 25 0 0 0 25000

14100A 25290820 313PBGA 1000 45 0 0 0 45000

A1460A(150C) UCKT01 207CPGA 168 81 0 - - 13608

A14100A UCL049 256CQ 1000 15 0 0 0 15000

A 1460A UCK056 PG207B 168 80 0 13440

RT14100A UCL055 CQ256 1000 18 0 0 0 18000

A14100A UCL058 CQ256E 168 82 0 13776

RT14100 UCL72/ 9925/ 9931 CQ256 168 77 0 12936

A1460A 29350050/ 9947 PQ208 2000 65 0 0 0 0 130000

A1460A UCK070/ 9946 PQ208 2000 22 0 0 0 0 44000

RT14100A UCL073/ 9949 CQ256B 1000 15 0 0 0 15000

RT14100A UCL073/ 0019 CQ256E 1000 10 0 0 0 10000

A1460A 20094560/ 0022 PQ208 1000 29 0 0 0 0 29000

A1460A 20145270/ 0026 PQ208 1000 30 0 0 0 0 30000

A1460A 20072420/ 0026 PQ208 1000 30 0 0 0 0 30000

1280 XL ACT 10293.1 CQ172 168 80 0 13440

1280XL 24464430 160 PQFP 1000 78 1 0 0 78000

24442620 0

24381610 0

A1280XL ACU458071/ 0008 PQ160 2000 86 0 0 0 0 172000

A32100DX 84CQ 1000 80 0 0 0 80000

TOTAL Units for 0.8um FPGA = 964 2079 Total test time Hrs. 1919200

TOTAL Failures for 0.8um FPGA = 1

ACT 3

TOTAL Units for 0.8um FPGA = 953 1835 Total test time Hrs. 1655760

TOTAL Failures for 0.8um FPGA = 0

XL

TOTAL Units for 0.8um FPGA = 1056 244 Total test time Hrs. 263440

TOTAL Failures for 0.8um FPGA = 1

DX

TOTAL Units for 0.8um FPGA = 1000 80 Total test time Hrs. 80000

TOTAL Failures for 0.8um FPGA = 0


0.8 um FPGA Reliability Summary

85C/85%TEMPERATURE HUMIDITY BIAS:

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

14100A 25290820 313PBGA 1000 45 0 0 0 45000

TOTAL Units for 0.8um FPGA = 1000 45 Total test time Hrs. 45000

TOTAL Failures for 0.8um FPGA = 0

0.8 um FPGA Reliability Summary

BIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

1280XL 24464430 160 PQFP 100 46 - 0 4600

24381610 0

24442620 0

1425 JK8,9,10 84-PLCC 100 81 - 0 8100

1425A ACN32804 100 PQFP 100 80 - 0 8000

ACN30805 0

ACN33807 0

1425A UCJ01,2,3 100 PQFP 100 80 - 0 8000

1440A JN05 100 VQFP 100 45 - 0 4500

1440A 51940.1 100 VQFP 100 45 - 0 - 4500

1460A JL04A 208 PQFP 100 80 - 0 8000

1460A WB24279010 208 PQFP 100 47 - 0 4700

14100A 24239130 208 RQFP 100 14 - 0 1400

TOTAL Units for 0.8um FPGA = 100 518 Total test time Hrs. 51800

TOTAL Failures for 0.8um FPGA = 0


0.8 um FPGA Reliability Summary

Temperature Cycle

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 100 200 500 1000 Unit Hrs

(-65 C - +150 C)

1280XL 25026540 176 TQFP 500 17 - 0 0 8500

1280XL 25312500 160 PQFP 500 76 0 0 0 38000

25312480 0

1280XL 25312500 160 PQFP 200 76 0 0 - 15200

25312480 0

1280XL 25312500 160 PQFP 500 75 0 0 0 37500

25312480 0

1280XL 25312500 160 PQFP 500 75 0 0 0 37500

25312480 0

1280XL 25312500 160 PQFP 500 74 0 0 0 37000

25312480 0

1280XL 25312500 160 PQFP 500 76 0 0 0 38000

25312480 0

1280XL 25504560 160 PQFP 500 36 0 0 0 18000

1425 JK8,9,10 133 PGA 500 81 0 0 0 40500

1425 JK8,9,10 84 PLCC 500 83 0 0 0 41500

1425A UCJ01,2,3 100 PQFP 500 80 0 0 0 40000

1425A ACN32804 100 PQFP 500 80 0 0 0 40000

ACN30805 0

ACN33807 0

1440A JN-02 160 PQFP 500 80 0 0 0 40000

1440A JN-05 100 VQFP 500 80 0 0 1 40000

1440A 51940.1 100 VQFP 500 45 0 0 0 22500

1460A JL-01 208 PQFP 500 80 0 0 0 40000

1460A JL-01 207 PGA 500 80 0 0 0 40000

1460A PC435091 207 PGA 500 80 0 0 0 40000

PC435092 0

PC435093 0

1460A 25364430 208QFP 500 45 0 0 0 22500

1460A 2610001 208QFP 500 80 0 0 0 40000

14100A 24239130 208 RQFP 500 14 - - 0 7000

UCLO1 208 RQFP 500 31 - - 0 15500

14100A 2537198 208 RQFP 100 19 0 1900

14100A 25290820 313PBGA 500 78 0 0 0 39000

14100A MIX 208RQC 100 24 0 -- 2400

14100A MIX 208RQC 100 24 0 -- 2400

TOTAL Units for 0.8um FPGA = 442 1589 Total test time Hrs. 571200

TOTAL Failures for 0.8um FPGA = 1


0.8 um FPGA Reliability Summary

PRESSURE POT (UNBIASED AUTOCLAVE):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 48 96 168 336 Unit Hrs

1280XL 25312480 176TQ 168 45 0 0 0 7560

14100A 25290820 313PBGA 96 45 0 0 - 4320

TOTAL Units for 0.8um FPGA = 132 90 Total test time Hrs. 11880

TOTAL Failures for 0.8um FPGA = 0

0.8 um FPGA -- Failure Analysis-Units Failed in Test

TOTAL 1

PRODUCT

Failures

RUN# HOURS

1280XL 24442620 168 One polyamide failure due to die saw defect in assembly


0.6 um FPGA Reliability Summary


0.6 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

A1415 ACP17300 100PQFP 1000 100 0 0 0 100000

A1425 ACP122761 100PQFP 1000 100 0 0 0 100000

A1425 ACP12285 100PQFP 1000 88 0 0 0 88000

1460BP 25430540 208PQFP 1000 52 0 0 0 52000

14100BP 26026670 208RQFP 1000 27 0 0 0 27000

1415A ACP17300 PQ100 2000 101 0 0 0 0 202000

A1425A(150C) UCJ01,02,03 PG133 500 130 0 0 65000

1225XL ACP02187.1 100 PQFP 1000 26 0 0 0 - 26000

1225XL ACQ10102 100 PQFP 1000 56 0 0 0 - 56000

1240XL ACP01117.1 144 PQFP 1000 52 0 0 0 - 52000

ACN51939.1

1240XL ACP57584.1 84PLCC 1000 100 0 0 0 - 100000

1240XL MIX PQ144 1000 56 0 0 0 - 56000

1280XL ACP212072 160 PQFP 1000 76 0 0 0 - 76000

ACP19329.1

1280XL MIX 84PLCC 1000 100 0 0 0 100000

1280XL ACR53214 PQ160 168 129 0 21672

A1240XL ACR50594.1 PQ144C 168 228 0 38304

A1240XL ACR50594.1 PQ144C 168 143 0 24024

A1240XL ACR50594.1 PQ144C 168 227 0 38136

A1280XL ACT10293.1 CQ172B 1000 80 0 0 0 80000

A1280XL ACU413553 PG176 1000 76 0 0 0 76000

A1280XL ACV715861 PG176 168 77 0 12936

3265DX ACP163684 160 PQFP 1000 78 0 0 0 78000

32140DX ACP33277.1 208PQFP 1000 75 0 0 0 75000

32140DX ACP56255.1 208PQFP 1000 52 0 0 0 52000

32140DX ACP540231 160PQFP 1000 26 0 0 0 26000

32140DX 25464510 160PQFP 1000 26 0 0 0 26000

32200DX 26207340 208PQFP 1000 29 0 0 0 29000

32140DX ACP562551 PQ208 2000 28 0 0 0 0 56000

32300DX ACQ09069.1 RQ240 2000 26 0 0 0 0 52000

32140DX G10854 PQ208C 1000 26 0 0 0 - 26000

A32100DX(150C) ACR50293.1 CQ84 500 80 0 0 40000

A32200DX ACT166851 CQ256 1000 77 0 0 0 77000

TOTAL Units for 0.6um FPGA = 933 2547 Total test time Hrs. 1928072

TOTAL Failures for 0.6um FPGA = 0

2375078

Act 3

TOTAL Units for 0.6um FPGA = 1071 598 Total test time Hrs. 634000

TOTAL Failures for 0.6um FPGA = 0

XL

TOTAL Units for 0.6um FPGA = 703 1426 Total test time Hrs. 757072

TOTAL Failures for 0.6um FPGA = 0

DX

TOTAL Units for 0.6um FPGA = 1136 523 Total test time Hrs. 537000


TOTAL Failures for 0.6um FPGA = 0

0.6 um FPGA Reliability Summary

BIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

1225XL ACP02187.1 100 PQFP 100 17 - 0 1700

1240XL ACP01117.1 144 PQFP 100 31 - 0 3100

ACN51939.1 0

1280XL ACP19329.1 160 PQFP 100 76 - 0 7600

ACP212072 0

1280XL ACP33235.1 160 PQFP 100 76 - 0 7600

1280XL ACQ01769 160 PQFP 100 40 - 0 4000

1280XL ACQ05561 160 PQFP 100 39 - 0 3900

3265DX ACP163684 160 PQFP 100 40 - 0 4000

1415 ACP17300 100QFP 100 50 - 0 5000

A1425 ACP122761 100PQFP 100 50 - 0 5000

32140DX ACP54023.1 160PQFP 100 26 - 0 2600

32140DX ACP33277.1 208PQFP 100 76 - 0 7600

ACP55730.1 0

ACP54023.1 0

32200DX 26207340 208PQFP 100 26 - 0 2600

14100BP 26330340 208RQFP 100 26 0 0 2600

32200DX ACQ03818.1 208PQFP 100 30 - 0 3000

1280XL 26084380 160PQFP 100 58 - 0 3000

32140DX 55558.1 PQ208C 100 25 0 2500

TOTAL Units for 0.6um FPGA = 100 686 Total test time Hrs. 65800

TOTAL Failures for 0.6um FPGA = 0


0.6 um FPGA Reliability Summary

Temperature Cycle

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 100 200 500 1000 Unit Hrs

(-65 C - +150 C)

1280XL 25026540 176 TQFP 500 17 - 0 0 8500

1280XL 25312500 160 PQFP 500 76 0 0 0 38000

25312480 0

1280XL 25312500 160 PQFP 200 76 0 0 - 15200

25312480 0

1280XL 25312500 160 PQFP 500 75 0 0 0 37500

25312480 0

1280XL 25312500 160 PQFP 500 75 0 0 0 37500

25312480 0

1280XL 25312500 160 PQFP 500 74 0 0 0 37000

25312480 0

1280XL 25312500 160 PQFP 500 76 0 0 0 38000

25312480 0

1280XL 25504560 160 PQFP 500 36 0 0 0 18000

1425 JK8,9,10 133 PGA 500 81 0 0 0 40500

1425 JK8,9,10 84 PLCC 500 83 0 0 0 41500

1425A UCJ01,2,3 100 PQFP 500 80 0 0 0 40000

1425A ACN32804 100 PQFP 500 80 0 0 0 40000

ACN30805 0

ACN33807 0

1440A JN-02 160 PQFP 500 80 0 0 0 40000

1440A JN-05 100 VQFP 500 80 0 0 1 40000

1440A 51940.1 100 VQFP 500 45 0 0 0 22500

1460A JL-01 208 PQFP 500 80 0 0 0 40000

1460A JL-01 207 PGA 500 80 0 0 0 40000

1460A PC435091 207 PGA 500 80 0 0 0 40000

PC435092 0

PC435093 0

1460A 25364430 208QFP 500 45 0 0 0 22500

1460A 2610001 208QFP 500 80 0 0 0 40000

14100A 24239130 208 RQFP 500 14 - - 0 7000

UCLO1 208 RQFP 500 31 - - 0 15500

14100A 2537198 208 RQFP 100 19 0 1900

14100A 25290820 313PBGA 500 78 0 0 0 39000

14100A MIX 208RQC 100 24 0 -- 2400

14100A MIX 208RQC 100 24 0 -- 2400

TOTAL Units for 0.6um FPGA = 442 1589 Total test time Hrs. 571200

TOTAL Failures for 0.6um FPGA = 1


0.6 um FPGA Reliability Summary

PRESSURE POT (UNBIASED AUTOCLAVE):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 48 96 168 336 Unit Hrs

1280XL 25312480 176TQ 168 45 0 0 0 7560

14100A 25290820 313PBGA 96 45 0 0 - 4320

TOTAL Units for 0.6um FPGA = 132 90 Total test time Hrs. 11880

TOTAL Failures for 0.6um FPGA = 0


0.45 um FPGA Reliability Summary


0.45 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

MX04 2XZR24206.5 PL84 2000 29 0 0 0 0 58000

MX04 2ACR23038.3 PL84 2000 30 0 0 0 0 60000

MX16 2XZR25104.1 PQ160 2000 26 0 0 0 0 52000

MX04 2ACR23038.3 PL84 2000 45 0 0 0 0 90000

MX36 2Act10221 PQ208 2000 27 0 0 0 0 54000

MX04 2Act 160021 PL84 2000 77 0 0 0 0 154000

MX36 2ACT363611 CQ256 1000 77 0 0 0 77000

MX04 2ACU040091

(DC9919)

PL84 2000 77 0 0 0 0 154000

MX16 2ACU492561

(DC0012)

PL84 1000 148 0 0 0 - 148000

MX36 2ACU523241 CQ208 184 45 0 - - - 8280

(DC0019)

TOTAL Units for 0.45um FPGA = 1618 581 Total test time Hrs. 855280

TOTAL Failures for 0.45um FPGA = 0

0.45 um FPGA Reliability Summary

BIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

42MX16 2XZR25104.1 PQ160 100 25 - 0 2500

42MX04 2ACR23038.3 PL84 100 81 - 0 8100

42MX04 2ACR23039.1 PL84 100 25 - 0 2500

42MX36 2ACT110221 PQ208 50 27 0 - 1350

42MX36 2ACT180141 BG272 100 76 - 0 7600

42MX09 2ACT110181 PQ160 100 30 - 0 3000

TOTAL Units for 0.45um FPGA = 95 264 Total test time Hrs. 25050

TOTAL Failures for 0.45um FPGA = 0

0.45 um FPGA Reliability Summary

UNBIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

42MX09 2ACT052662 PQ160 100 30 0 0 3000

(DC 9817)

TOTAL Units for 0.45um FPGA = 100 30 Total test time Hrs. 3000

TOTAL Failures for 0.45um FPGA = 0


0.45 um FPGA Reliability Summary

Temperature Cycle

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 200 500 1000 2000 Unit Hrs

(-65 C - +150 C)

42MX16 2XZR25104.1 PQ160 1000 26 0 0 0 26000

42MX04 2XZR24206.5 PL84 1000 26 0 0 0 26000

42MX04 2ACR23038.

3

PL84 1000 26 0 0 0 26000

42MX36 2ACT110221 PQ208 1000 27 0 0 0 27000

42MX09 2ACT210121 PQ160 1000 30 0 0 0 30000

TOTAL Units for 0.45um FPGA = 1000 135 Total test time Hrs. 135000

TOTAL Failures for 0.45um FPGA = 0


0.35 um FPGA Reliability Summary


0.35 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

SX16 2XZR402521 PQ208 1000 38 0 0 0 38000

SX16P 2ACT141821 PQ208 1000 45 0 0 0 45000

SX32 2XZT091468 PQ208 2000 43 0 0 0 0 86000

SX16 2ACT110031 PQ208 2000 74 0 0 0 0 148000

SX32 2ACT500021 CQ208 1000 45 0 0 0 45000

SX16 2ACT100081 PQ208 2000 81 0 0 0 0 162000

SX32 2ACT330111 PQ208 1000 88 0 0 0 88000

2ACT330101 0

2HCU462006 0

SX16 2ACU420072 PQ208 1000 99 0 0 0 99000

TOTAL Units for 0.35um FPGA = 1375 513 Total test time Hrs. 711000

TOTAL Failures for 0.35um FPGA = 0

0.35 um FPGA Reliability Summary

Low Temperature Operating Life (LTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

SX32 2ACT330111 PQ208 1000 88 0 0 0 88000

2ACT330101

2HCU462006

TOTAL Units for 0.35um FPGA = 1000 88 Total test time Hrs. 88000

TOTAL Failures for 0.35um FPGA = 0

0.35 um FPGA Reliability Summary

BIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

A54SX32 2ACU211641 BG329 100 81 0 0 8100

DC 9941

9942, 9943

A54SX16 2ACU241341 DC 9947 208PQFP 100 84 0 0 8400

2ACU420072 DC 0002

2ACU222448 DC 0004

A54SX32 2ACU410201 DC 0013 BG329 100 76 0 0 7600

2ACU410201 DC 0014

2ACU410201 DC 0015

TOTAL Units for 0.35um FPGA = 100 241 Total test time Hrs. 24100

TOTAL Failures for 0.35um FPGA = 0


0.35 um FPGA Reliability Summary

UNBIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

A54SX16 2ACU241341 DC 9947 208PQFP 100 84 0 0 8400

2ACU420072 DC 0002

2ACU222448 DC 0004

TOTAL Units for 0.35um FPGA = 100 84 Total test time Hrs. 8400

TOTAL Failures for 0.35um FPGA = 0

0.35 um FPGA Reliability Summary

Temperature Cycle

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 200 500 1000 2000 Unit Hrs

(-65 C - +150 C)

A54SX16 2ACU241341 DC 9947 208PQFP 1000 93 0 0 0 93000

2ACU420072 DC 0002

2ACU222448 DC 0004

A54SX32 2ACU410201 DC 0013 BG329 1000 76 0 0 0 76000

2ACU410201 DC 0014

2ACU410201 DC 0015

A54SX32 2HCU462006 DC 0010 208PQFP 1000 76 0 0 0 76000

2HCU410216 DC 0017

2HCV022691 DC 0017

TOTAL Units for 0.35um FPGA = 1000 245 Total test time Hrs. 245000

TOTAL Failures for 0.35um FPGA = 0


RTSX 0.6 um FPGA Reliability Summary


RTSX 0.6 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

RTSX16 P02, P03, P04 PQ208 1000 81 0 0 0 - 81000

RTSX16 P05 CQ256 1000 77 0 0 0 - 77000

RTSX16 P04 CQ256 9931 2000 46 0 0 0 0 92000

RTSX32 T6JP01A CQ208B 9949 1000 76 0 0 0 76000

RTSX16 T6HP12 CQ256E 0007 240 101 0 0 24240

TOTAL Units for RTSX 0.6um FPGA = 1048 381 Total test time Hrs. 350240

TOTAL Failures for RTSX 0.6um FPGA = 0


MEC 0.25 um FPGA Reliability Summary


MEC 0.25 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

SX32A T25J002 9943 PQ208 500 50 0 0 - - 25000

P05 9940

P04 9941

SX32A T25J002 9943 PQ208 1000 80 0 0 0 80000

P05 9940

P04 9941

SX72A T25KP04 0007 PQ208 1000 28 0 0 0 28000

SX32A T25JP03 0012 PQ208 1000 88 0 0 0 88000

SX72A T25K001 0045 PQ208 1000 88 0 0 0 88000

TOTAL Units for MEC 0.25um FPGA = 900 334 Total test time Hrs. 309000

TOTAL Failures for MEC 0.25um FPGA = 0

MEC 0.25 um FPGA Reliability Summary

Low Temperature Operating Life (LTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

SX32A T25J002 9943 PQ208 500 50 0 0 - - 25000

P05 9940

P04 9941

SX32A T25J002 9943 PQ208 1000 80 0 0 0 80000

P05 9940

P04 9941

SX72A T25KP04 0007 PQ208 1000 28 0 0 0 28000

SX32A T25JP03 0012 PQ208 1000 88 0 0 0 88000

SX72A T25K001 0045 PQ208 1000 88 0 0 0 88000

TOTAL Units for MEC 0.25um FPGA = 900 334 Total test time Hrs. 309000

TOTAL Failures for MEC 0.25um FPGA = 0


MEC 0.25 um FPGA Reliability Summary

BIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

SX32A T25J002 9943 PQ208 100 80 0 0 8000

P05 9940

P04 9941

SX72A T25KP04 0017 PQ208 100 28 0 0 2800

TOTAL Units for MEC 0.25um FPGA = 100 108 Total test time Hrs. 10800

TOTAL Failures for MEC 0.25um FPGA = 0

MEC 0.25 um FPGA Reliability Summary

Temperature Cycle

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 200 500 1000 2000 Unit Hrs

(-65 C - +150 C)

SX32A T25J002 9943 PQ208 1000 80 0 0 0 80000

P05 9940

P04 9941

SX72A T25KP04 0017 PQ208 1000 28 0 0 0 28000

TOTAL Units for MEC 0.25um FPGA = 1000 108 Total test time Hrs. 108000

TOTAL Failures for MEC 0.25um FPGA = 0


Flash 0.25 um FPGA Reliability Summary


Flash 0.25 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

A500K130 ZA026941 BG 272 1000 76 0 0 0 76000

ZA034979

ZA035953

DC 0039, 0040

A500K130 BG 272 1000 80 0 0 0 80000

TOTAL Units for Flash 0.25um FPGA = 1000 156 Total test time Hrs. 156000

TOTAL Failures for Flash 0.25um FPGA = 0

Flash 0.25 um FPGA Reliability Summary

Low Temperature Operating Life (LTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

A500K130 ZA026941 BG 272 1000 76 0 0 0 76000

ZA034979

ZA035953

DC 0039, 0040

TOTAL Units for Flash 0.25um FPGA = 1000 76 Total test time Hrs. 76000

TOTAL Failures for Flash 0.25um FPGA = 0

Flash 0.25 um FPGA Reliability Summary

Endurance

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 50 100 500 1000 Unit Hrs

Room Temperature

A500K130 ZA026941 BG 272 50 15 0 750

TOTAL Units for Flash 0.25um FPGA = 50 15 Total test time Hrs. 750

TOTAL Failures for Flash 0.25um FPGA = 0

Flash 0.25 um FPGA Reliability Summary

Retention 225 C unbiased 100% Programmed

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

A500K130 ZA026941 BG 272 1000 9 0 0 0 9000

TOTAL Units for Flash 0.25um

1000 9 Total test time Hrs. 9000

FPGA =

TOTAL Failures for Flash 0.25um FPGA = 0

Retention 225 C unbiased 100% Erased

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

A500K130 ZA026941 BG 272 1000 8 0 0 0 8000

TOTAL Units for Flash 0.25um

FPGA =

1000 8 Total test time Hrs. 8000


TOTAL Failures for Flash 0.25um FPGA = 0

0.22 um FPGA Reliability Summary


0.22 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

SX08A DC183 0012 PQ208 1000 150 0 0 0 150000

SX08A D1X191 PQ208 1000 84 0 0 0 84000

TOTAL Units for 0.22um FPGA = 1000 234 Total test time Hrs. 234000

TOTAL Failures for 0.22um FPGA = 0

0.22 um FPGA Reliability Summary

High Temperature Operating Life (HTOL)

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 168 500 1000 2000 Unit Hrs

SX08A DC183 0012 PQ208 1000 150 0 0 0 150000

TOTAL Units for 0.22um FPGA

=

1000 150 Total test time Hrs. 150000

TOTAL Failures for 0.22um FPGA = 0

0.22 um FPGA Reliability Summary

BIASED HUMIDITY (HAST):

Test Hours/Failures

PROD RUN# PACKAGE Test time #UNITS 50 100 200 250 Unit Hrs

SX08A DC183 0012 PQ208 100 150 0 0 15000

TOTAL Units for 0.22um FPGA = 100 150 Total test time Hrs. 15000

TOTAL Failures for 0.22um FPGA = 0

0.22 um FPGA Reliability Summary

Temperature Cycle

NUMBER OF FAILURES (CYCLES)

PROD RUN# PACKAGE Test time #UNITS 200 500 1000 2000 Unit Hrs

(-65 C - +150 C)

SX08A DC183 0012 PQ208 1000 150 0 0 0 15000

TOTAL Units for 0.22um FPGA = 1000 150 Total test time Hrs. 15000

TOTAL Failures for 0.22um FPGA = 0

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