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TECHNOLOGY<br />

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THE ENGINEER’S SOURCE FOR POWER AND ENERGY EFFICIENCY DESIGN INFORMATION<br />

Metal in<br />

the Board<br />

Boosts PCB<br />

<strong>Power</strong> Density<br />

p. 8<br />

www.powerelectronics.com<br />

JUNE 2013<br />

Vol. 39, No. 6<br />

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EDITOR’Sviewpoint<br />

Three-Engineer Team Wins $1M for<br />

DARPA’s Ground Vehicle Challenge<br />

THE DEFENSE Advanced Research Projects<br />

Agency (DARPA) awarded a $1 million prize<br />

to “Ground Systems”, a three-person team with<br />

members in Ohio, Texas and California, as the<br />

winner of the Fast Adaptable Next-Generation<br />

Ground Vehicle (FANG) Mobility/Drivetrain Challenge.<br />

Team Ground Systems’ final design submission received the<br />

highest score when measured against the established requirements<br />

for system performance and manufacturability.<br />

“I’m very pleased with the quality of the submissions we<br />

received during the challenge, and we have learned a great<br />

deal throughout the process,” said Army Lt. Col. Nathan<br />

Wiedenman, DARPA program manager. “The first FANG<br />

Challenge has been a great experiment, and the submission<br />

of many viable, innovative designs has validated the<br />

Adaptive Vehicle Make (AVM) design tools and provided<br />

invaluable feedback to continue their development.”<br />

Wiedenman noted that several different types of teams<br />

were able to use various aspects of the tools to create viable<br />

designs in the course of the challenge. The winning team,<br />

for example, was geographically separated, but was able<br />

to use the collaboration tools to create the winning design.<br />

Another finalist team was comprised of people who met<br />

through VehicleFORGE, the online collaboration platform<br />

used by competitors to manage and submit their designs.<br />

Still another top design was submitted by a one-person team.<br />

In many cases, a traditional design process would likely have<br />

excluded these teams from contributing their ideas.<br />

Since the beginning of the first FANG Challenge on<br />

January 14, 2013, more than 1,000 participants within<br />

more than 200 teams used the META design tools and<br />

the VehicleFORGE collaboration platform developed by<br />

Vanderbilt University in Nashville, Tenn., to design and<br />

simulate the performance of thousands of potential mobility<br />

and drivetrain subsystems. The goal of the FANG program<br />

is to test the specially developed META design tools, model<br />

libraries and the VehicleFORGE platform, which were created<br />

to significantly compress the design-to-production time<br />

of a complex defense system.<br />

Now that the design challenge has concluded, the winning<br />

FANG design will be built by the DARPA iFAB program<br />

team. iFAB, or Instant Foundry Adaptive through Bits, is led<br />

by the Applied Research Laboratory at Penn State University<br />

and will validate the manufacturability feedback, foundry<br />

configuration, and instruction generation tools as part of the<br />

build process. Ultimately, the as-built design will be subjected<br />

to test and evaluation under the leadership of the FANG performer,<br />

Ricardo Inc. of Van Buren Township, Mich.<br />

Begun in 2010 as part of DARPA’s advanced manufacturing<br />

initiative, AVM is a portfolio of programs focused<br />

on the reduction of complex military system development<br />

timelines by a factor of five or more. The technical approach<br />

encompasses multiple efforts addressing all aspects of the<br />

manufacturing process, from requirements representation,<br />

through design, to final physical build of a full-scale complex<br />

defense system.<br />

The ultimate goal of the META program is to dramatically<br />

improve the existing systems engineering, integration,<br />

and testing process for defense systems. META is not predicated<br />

on one particular alternative approach, metric, technique<br />

or tool. Broadly speaking, however, it aims to develop<br />

model-based design methods for cyber-physical systems far<br />

more complex and heterogeneous than those to which such<br />

methods are applied today; to combine these methods with<br />

a rigorous deployment of hierarchical abstractions throughout<br />

the system architecture; to optimize system design with<br />

respect to an observable, quantitative measure of complexity<br />

for the entire cyber-physical systems; and to apply probabilistic<br />

formal methods to the system verification problem,<br />

thereby dramatically reducing the need for expensive realworld<br />

testing and design iteration.<br />

VehicleFORGE aims to significantly expand open source<br />

collaborative development for defense systems by employing<br />

a general representation language — being developed under<br />

the META program.<br />

SAM DAVIS, Editor-in-Chief<br />

2 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


EDITORIAL<br />

EDITOR IN CHIEF: SAM DAVIS (818) 348-3982 sam.davis@penton.com<br />

MANAGING EDITOR: SPENCER CHIN spencer.chin@penton.comt<br />

GROUP DESIGN DIRECTOR: ANTHONY VITOLO tony.vitolo@penton.com<br />

ART<br />

CREATIVE DIRECTOR: DIMITRIOS BASTAS dimitrios.bastas@penton.com<br />

SENIOR ARTIST: JAMES MILLER james.miller@penton.com<br />

PRODUCTION<br />

JUNE 2013<br />

GROUP PRODUCTION DIRECTOR: JUSTIN MARCINIAK justin.marciniak@penton.com<br />

AD PRODUCTION COORDINATOR: KARA WALBY kara.walby@penton.com<br />

CLASSIFIED PRODUCTION COORDINATOR: LINDA SARGENT linda.sargent@penton.com<br />

AUDIENCE MARKETING<br />

AUDIENCE MARKETING MANAGER: BRENDA ROODE brenda.roode@penton.com<br />

ONLINE MARKETING SPECIALIST: RYAN MALEC ryan.malec@penton.com<br />

SALES & MARKETING<br />

BRAND DIRECTOR, e/DESIGN:<br />

TRACY SMITH<br />

(913) 967-1324<br />

Tracy.Smith@penton.com<br />

REGIONAL SALES REPRESENTATIVES:<br />

Northwest/Northern CA/<br />

Western Canada<br />

JAMIE ALLEN<br />

(415) 608-1959<br />

Jamie.Allen@penton.com<br />

South<br />

BILL YARBOROUGH<br />

(713) 636-3809<br />

Bill.Yarborough@penton.com<br />

Northeast:<br />

DAVID MADONIA<br />

(212) 204-4331<br />

Dave.Madonia@penton.com<br />

ONLINE<br />

ONLINE DEVELOPMENT DIRECTOR: VIRGINIA GOULDING virginia.goulding@penton.com<br />

DIRECTOR OF DIGITAL CONTENT: PETRA ANDRE petra.andre@penton.com<br />

SUBSCRIBER SERVICES CONTACT<br />

EMAIL: pmcs@pbsub.com<br />

PHONE: (866) 505-7173, Outside US (847) 763-9504<br />

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DESIGN ENGINEERING & SOURCING GROUP<br />

VICE PRESIDENT & MARKET LEADER:<br />

BILL BAUMANN<br />

GROUP DIRECTOR OF EDITORIAL CONTENT:<br />

NANCY FRIEDRICH<br />

GROUP DIRECTOR OF OPERATIONS:<br />

CHRISTINA CAVANO<br />

PENTON MEDIA, INC.<br />

Midwest/Mid-Atlantic<br />

STEPHANIE CAMPANA<br />

(312) 840-8437<br />

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stephanie.campana@penton.com<br />

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MARK DURHAM<br />

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mark.durham@penton.com<br />

LIST RENTAL:<br />

MARIE BRIGANTI<br />

(877) 796-6947<br />

marie.briganti@meritdirect.com<br />

GROUP DIRECTOR OF MARKETING:<br />

JANE COOPER<br />

RESEARCH MANAGER:<br />

JULIE RITCHIE<br />

MARKETING & EVENTS SPECIALIST:<br />

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MARKETING COMMUNICATIONS SPECIALIST:<br />

CYNTHIA RODRIGUEZ<br />

Electronic Design • Machine Design • Microwaves & RF • Source ESB • Energy Efficiency & <strong>Technology</strong> •<br />

<strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> • Global Purchasing • Defense <strong>Electronics</strong> • Medical Design •<br />

Mobile DevDesign • Electronic Design China • Motion System Design • Engineering TV •<br />

Electronic Design Europe • Hydraulics & Pneumatics • Auto <strong>Electronics</strong> • Fluid <strong>Power</strong> Expo •<br />

Medical Silicon • Medical Prototyping • One <strong>Power</strong>ful Day • Combating Counterfeit Conference<br />

CHIEF EXECUTIVE OFFICER: DAVID KIESELSTEIN david.kieselstein@penton.com<br />

CHIEF FINANCIAL OFFICER/EXECUTIVE VP: NICOLA ALLAIS nicola.allais@penton.com<br />

SENIOR VP, DESIGN ENGINEERING GROUP: BOB MacARTHUR bob.macarthur@penton.com<br />

166 Avenue of the Americas • 10th Floor • New York, NY 10036<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 3


CoverStory<br />

p.7<br />

Metal in the Board: Meeting<br />

The Challenge of Digital <strong>Power</strong><br />

By Nick Pearne and Bill Burr, BPA Consulting.<br />

New generations of miniaturized power<br />

packages require thermal and electrical<br />

pathways into the board. Described here are<br />

these developments and a design example<br />

for an innovative printed circuit approach for<br />

a light electric vehicle powerpack.<br />

COVER CREDIT: Fraunhofer IIS Battery Management System<br />

with active cell control andsemiconductor safety shutdown<br />

(courtesy of Häusermann GmbH)<br />

FOR DESIGNERS AND SYSTEMS ENGINEERS<br />

www.powerelectronics.com<br />

JUNE 2013 • Vol. 39, No. 6<br />

DESIGN FEATURES<br />

Stability Criteria Of<br />

A Control System<br />

13<br />

Excerpts from the book “Designing<br />

Control Loops for Linear and Switching<br />

<strong>Power</strong> Supplie”, focusing on what engineers<br />

really need to know to compensate<br />

or stabilize a given control system.<br />

eGaN® FET-Silicon <strong>Power</strong><br />

19 Shoot-Out: Small Signal<br />

RF Performance<br />

This article of the eGaN® FET-Silicon<br />

Shoot-Out series examines RF performance<br />

of the EPC2012 eGaN FET.<br />

Back to Basics: Voltage<br />

24 Regulator ICs, Part 1<br />

A primer on the two major types of regulator<br />

ICs, linear and switch-mode.<br />

Intelligent Energy<br />

29 Optimization System<br />

Slashes Electric Bills<br />

The SP1000 series of hybrid energy<br />

management and correction systems<br />

guarantees and quantifi es kilowatt-hour<br />

savings by reducing power delivery<br />

losses.<br />

SMA<br />

Connector –<br />

Gate<br />

Connection<br />

(AC & DC)<br />

Thermal Sensor<br />

Connection<br />

Thermal Sensor<br />

D.U.T. (e.g. EPC2012) 50 Ω Micro-Strip<br />

CURRENT TRENDS<br />

PET INNOVATIONS<br />

Gas Gauge IC Monitors<br />

31 Lead-Acid Battery State-Of-<br />

Health, State-Of-Charge<br />

An accurate, simple-to-use gas gauge<br />

IC monitors lead-acid batteries used in<br />

mobile and stationary applications.<br />

DEPARTMENTS<br />

2 EDITOR’S VIEWPOINT<br />

6 INDUSTRY HIGHLIGHTS<br />

35 NEW PRODUCTS<br />

38 PATENTS<br />

40 PRODUCT MARKETPLACE<br />

40 CLASSIFIED ADS<br />

40 ADVERTISER INDEX<br />

SMA<br />

Connector –<br />

Drain<br />

Connection<br />

(AC & DC)<br />

4 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

Hea<br />

Mounti


CoverStory<br />

p.7<br />

Metal in the Board: Meeting<br />

The Challenge of Digital <strong>Power</strong><br />

By Nick Pearne and Bill Burr, BPA Consulting.<br />

New generations of miniaturized power<br />

packages require thermal and electrical<br />

pathways into the board. Described here are<br />

these developments and a design example<br />

for an innovative printed circuit approach for<br />

a light electric vehicle powerpack.<br />

COVER CREDIT: Fraunhofer IIS Battery Management System<br />

with active cell control andsemiconductor safety shutdown<br />

(courtesy of Häusermann GmbH)<br />

FOR DESIGNERS AND SYSTEMS ENGINEERS<br />

www.powerelectronics.com<br />

JUNE 2013 • Vol. 39, No. 6<br />

DESIGN FEATURES<br />

Stability Criteria Of<br />

A Control System<br />

13<br />

Excerpts from the book “Designing<br />

Control Loops for Linear and Switching<br />

<strong>Power</strong> Supplie”, focusing on what engineers<br />

really need to know to compensate<br />

or stabilize a given control system.<br />

eGaN® FET-Silicon <strong>Power</strong><br />

19 Shoot-Out: Small Signal<br />

RF Performance<br />

This article of the eGaN® FET-Silicon<br />

Shoot-Out series examines RF performance<br />

of the EPC2012 eGaN FET.<br />

Back to Basics: Voltage<br />

24 Regulator ICs, Part 1<br />

A primer on the two major types of regulator<br />

ICs, linear and switch-mode.<br />

Intelligent Energy<br />

29 Optimization System<br />

Slashes Electric Bills<br />

The SP1000 series of hybrid energy<br />

management and correction systems<br />

guarantees and quantifi es kilowatt-hour<br />

savings by reducing power delivery<br />

losses.<br />

SMA<br />

Connector –<br />

Gate<br />

Connection<br />

(AC & DC)<br />

Thermal Sensor<br />

Connection<br />

Thermal Sensor<br />

D.U.T. (e.g. EPC2012) 50 Ω Micro-Strip<br />

CURRENT TRENDS<br />

PET INNOVATIONS<br />

Gas Gauge IC Monitors<br />

31 Lead-Acid Battery State-Of-<br />

Health, State-Of-Charge<br />

An accurate, simple-to-use gas gauge<br />

IC monitors lead-acid batteries used in<br />

mobile and stationary applications.<br />

DEPARTMENTS<br />

2 EDITOR’S VIEWPOINT<br />

6 INDUSTRY HIGHLIGHTS<br />

35 NEW PRODUCTS<br />

38 PATENTS<br />

40 PRODUCT MARKETPLACE<br />

40 CLASSIFIED ADS<br />

40 ADVERTISER INDEX<br />

SMA<br />

Connector –<br />

Drain<br />

Connection<br />

(AC & DC)<br />

4 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

Hea<br />

Mounti


INDUSTRY<br />

APEC 2014 Call for Papers Now Open<br />

APEC 2014 CONTINUES the long-standing tradition<br />

of addressing issues of immediate and longterm<br />

interest to the practicing power electronic engineer.<br />

For more information visit our website or view<br />

the full Call for Papers. Topics Papers<br />

of value to the practicing engineer are<br />

solicited in the following topic areas:<br />

• AC-DC and DC-DC Converters<br />

• <strong>Power</strong> <strong>Electronics</strong> for Utility Interface<br />

• Motor Drives and Inverters<br />

• Devices and Components<br />

• System Integration<br />

• Modeling, Simulation, and Control<br />

• Manufacturing and Business Issues<br />

ROBOTIC INSECTS MAKE FIRST CONTROLLED FLIGHT<br />

THE DEMONSTRATION OF THE FIRST<br />

CONTROLLED FLIGHT of an insectsized<br />

robot is the culmination of more<br />

than a decade’s work, led by researchers<br />

at the Harvard School of Engineering and<br />

Applied Sciences (SEAS) and the Wyss<br />

Institute for Biologically Inspired Engineering<br />

at Harvard.<br />

“This is what I have been trying to do<br />

for literally the last 12 years,” says Robert J.<br />

Wood, Charles River Professor of Engineering<br />

and Applied Sciences at SEAS, Wyss Core<br />

Faculty Member, and principal investigator of<br />

the National Science Foundation-supported<br />

RoboBee project. “It’s really only because of<br />

this lab’s recent breakthroughs in manufacturing,<br />

materials, and design that we have<br />

even been able to try this. And it just worked,<br />

spectacularly well.”<br />

Inspired by the biology of a fly, with submillimeter-scale<br />

anatomy and two wafer-thin<br />

wings that flap almost invisibly, 120 times<br />

per second, the tiny device not only represents<br />

the absolute cutting edge of micromanufacturing<br />

and control systems; it is an<br />

aspiration that has impelled innovation in<br />

these fields by dozens of researchers across<br />

Harvard for years.<br />

“We had to develop solutions from<br />

scratch, for everything,” explains Wood. “We<br />

would get one component working, but when<br />

we moved onto the next, five new problems<br />

would arise. It was a moving target.”<br />

Flight muscles, for instance, don’t come<br />

prepackaged for robots the size of a fingertip.<br />

“Large robots can run on electromagnetic<br />

motors, but at this small scale you have to<br />

come up with an alternative, and there wasn’t<br />

one,” says co-lead author Kevin Y. Ma, a<br />

graduate student at SEAS.<br />

The tiny robot flaps its wings with piezoelectric<br />

actuators-strips of ceramic that<br />

expand and contract when an electric field<br />

is applied. Thin hinges of plastic embedded<br />

within the carbon fiber body frame serve as<br />

joints, and a delicately balanced control system<br />

commands the rotational motions in the<br />

flapping-wing robot, with each wing controlled<br />

independently in real-time.<br />

At tiny scales, small changes in airflow<br />

can have an outsized effect on flight dynamics,<br />

and the control system has to react that<br />

much faster to remain stable.<br />

The robotic insects also take advantage<br />

of an ingenious pop-up manufacturing technique<br />

that was developed by Wood’s team in<br />

<strong>Power</strong> <strong>Electronics</strong> Applications Important Dates<br />

• Deadline for digest submission is July 8, 2013<br />

• Notification that a submission was accepted or declined<br />

will be emailed no later than October 7, 2013.<br />

• Final submission and registration will be<br />

accepted no later than November 18, 2013.<br />

• At APEC 2014, the technical sessions<br />

will be given on March 18 - 20, 2014<br />

Upload your submission online at http://www.epapers.<br />

org/apec2014 no later than Monday, July 8, 2013.<br />

• Call For Reviewers: Please sign-up to become a technical<br />

paper reviewer by July 12th. Accepted reviewers will be<br />

notified by August 5th. All reviews must be completed by<br />

September 2nd.<br />

2011. Sheets of various laser-cut materials<br />

are layered and sandwiched together into<br />

a thin, flat plate that folds up like a child’s<br />

pop-up book into the complete electromechanical<br />

structure.<br />

The quick, step-by-step process replaces<br />

what used to be a painstaking manual art and<br />

allows Wood’s team to use more robust materials<br />

in new combinations, while improving<br />

the overall precision of each device.<br />

“We can now very rapidly build reliable<br />

prototypes, which allows us to be more<br />

aggressive in how we test them,” says Ma,<br />

adding that the team has gone through 20<br />

prototypes in just the past six months.<br />

Applications of the RoboBee project could<br />

include distributed environmental monitoring,<br />

search-and-rescue operations, or assistance<br />

with crop pollination, but the materials, fabrication<br />

techniques, and components that<br />

emerge along the way might prove to be even<br />

more significant. For example, the pop-up<br />

manufacturing process could enable a new<br />

class of complex medical devices. Harvard’s<br />

Office of <strong>Technology</strong> Development, in collaboration<br />

with Harvard SEAS and the Wyss<br />

Institute, is already commercializing some of<br />

the underlying technologies.<br />

6 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


DESIGNfeature<br />

NICK PEARNE AND BILL BURR, BPA Consulting<br />

METAL IN THE BOARD:<br />

MEETING THE CHALLENGE OF<br />

DIGITAL POWER<br />

New generations of miniaturized power packages require thermal and electrical pathways<br />

into the board. Described here are these developments and a design example for a new and<br />

innovative printed circuit approach for a 150 – 300 A light electric vehicle powerpack.<br />

New families of power semiconductors<br />

require new approaches in board design<br />

for thermal and power management. A<br />

number of board level solutions have<br />

emerged, divided into 12 major types<br />

segregated by:<br />

• Thermal management technology- heat pipes, inlays, dissipation<br />

planes, etc.<br />

• Current management- copper planes, embedded bus<br />

bars, discrete wiring or strips<br />

• Board layup- number of layers, use of internal/external<br />

dissipator planes<br />

The basic building blocks for “Metal in the Board” or<br />

“MiB” consist of:<br />

• Metal based laminate<br />

• Thick copper layers<br />

• Thermal vias<br />

• Thermal risers<br />

• Metal inlays<br />

• Encapsulated bus bars<br />

• Bonded and/or embedded wires and strips<br />

These building blocks offer a wide range of thermal<br />

management capabilities, and have been characterized in<br />

terms of the power densities they are capable of managing<br />

with less than 10 °C temperature rise through the board<br />

thermal path. Solutions typically range from 0.25 W/cm 2<br />

up through 35 W/cm 2 - through the board. This range of<br />

capabilities is proving to be critical as power conversion,<br />

management, and control becomes digital and advances in<br />

power semiconductor technology combined with the cost<br />

advantages of automated assembly drive development of<br />

new and smaller surface mount packaging.<br />

HIGH POWER<br />

One of these is the “isometric” family of packages, developed<br />

by International Rectifier and marketed as the<br />

“DirectFET®.” A similar package is offered under license<br />

to IR by Infineon- the “CanPAK”. These devices are<br />

“isometric” because they provide a balanced thermal pathway<br />

both into the board and, if necessary, out through the<br />

top of the package. This represents a significant advantage<br />

over other SMT power semiconductor packages such as<br />

the TO-252 “D2PAK” or TO-263 types, which require<br />

“gullwing” heat sinks if the board design is not capable of<br />

supplying a sufficiently low thermal resistance pathway<br />

(Fig. 1).<br />

While the isometric types offer greater flexibility in<br />

management of the thermal path, they are also capable of<br />

currents well in excess of the 10 – 15 A typically considered<br />

the top end for conventional printed circuit boards.<br />

The power applications typically serviced by MOSFETs<br />

or IGBTs in isometric packaging involve currents from 50<br />

to several hundred amperes, and managing these current<br />

levels involves a different and unique set of board design<br />

criteria.<br />

AMPACITY<br />

Current flow through a conductor causes resistive power<br />

losses (I 2 R) in the form of heat, and at high current lev-<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 7


THERMALmanagement<br />

els the temperature increase<br />

becomes a factor in determining<br />

ampacity because the<br />

resistivity of the conductor<br />

changes with temperature.<br />

The relationship is linear, i.e.,<br />

resistivity increases proportional to the change in temperature<br />

at a rate determined by the temperature coefficient of<br />

the conductor:<br />

R T = R T0 × [(1 + (T - T 0 )] (1)<br />

Where:<br />

T = Temperature at which resistivity is measured<br />

T 0 = Reference temperature (ambient)<br />

= Linear temperature coefficient (copper = 0.004)<br />

R T = Resistivity at measurement temperature<br />

R T0 = Resistivity at reference temperature<br />

For a copper conductor, every 25°C increase in temperature<br />

means a drop of about 5% in maximum ampacity<br />

due to an increase in conductor resistivity, RT . Since<br />

this presents the probability of further power dissipation<br />

and temperature rise, MiB design practice must consider<br />

effective methods not only to control and reduce conductor<br />

resistivity, but also to provide low thermal resistance<br />

pathways for heat dissipation.<br />

In a printed circuit board, ampacity depends on a number<br />

of different factors:<br />

• Conductive + convective capability provided by spreading<br />

layers, ground layers, stack-up<br />

• Ratio of track width to thickness<br />

• Ambient temperature<br />

• Adjacent high current tracks<br />

• AC or DC current<br />

• Presence and frequency of partial crosssection<br />

shrinkage<br />

• Presence, number, and conductive<br />

cross-section of plated through holes in<br />

series with the conductor.<br />

Therefore effective design needs to<br />

consider more variables than are normally<br />

addressed by the IPC-2152 current vs.<br />

temperature charts.<br />

MIB<br />

“Metal in the Board” or “MiB” includes<br />

a number of approaches where MiB<br />

building blocks are combined to provide<br />

effective high-current solutions.<br />

The “DWPCB” (discrete wire PCB) type<br />

Fig. 1. Gullwing heat sink on TO-252<br />

power device.<br />

External Only<br />

Low heat spreading<br />

Low heat spreading<br />

Wire Bonder<br />

Bonded Elements<br />

Etched Conductor<br />

Pattern<br />

Substrate Cross-Section<br />

Fig. 2. “Discrete Wire” process- bonding high current elements to inner layer.<br />

is one of the most versatile. One of the commercially<br />

available versions of DWPCB is HSMtec, developed by<br />

the Austrian PCB manufacturer Häusermann GmbH.<br />

HSMtec uses 0.5 mm diameter copper wire and rectangular<br />

sectioned 0.5 mm thick copper strips (“profiles”)<br />

to provide discrete low resistance electrical and thermal<br />

pathways in the board as shown in Fig. 2.<br />

There are a number of advantages to this solution compared<br />

to conventional thick copper or metal core boards:<br />

• Conventional PCB processes ensure consistently high<br />

reliability<br />

• Enhanced thermal and current pathways only where<br />

needed<br />

• Cost of MiB limited to those nets needing MiB<br />

• Wiring densities up to and including HDI enable logic<br />

and power integration<br />

• FR-4 materials reduce CTE mismatch common to aluminum<br />

based substrates<br />

• Board may be folded during assembly, providing photometric<br />

solutions for LED luminaires and eliminating<br />

daughter boards/connectors<br />

The profiles and wires that make up the MiB compo-<br />

Internal + External<br />

Heat spreading<br />

Heat spreading<br />

Fig. 3. Effect on heat spreading of thermal dissipation plane (source: Häusermann GmbH).<br />

8 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


THERMALmanagement<br />

els the temperature increase<br />

becomes a factor in determining<br />

ampacity because the<br />

resistivity of the conductor<br />

changes with temperature.<br />

The relationship is linear, i.e.,<br />

resistivity increases proportional to the change in temperature<br />

at a rate determined by the temperature coefficient of<br />

the conductor:<br />

R T = R T0 × [(1 + (T - T 0 )] (1)<br />

Where:<br />

T = Temperature at which resistivity is measured<br />

T 0 = Reference temperature (ambient)<br />

= Linear temperature coefficient (copper = 0.004)<br />

R T = Resistivity at measurement temperature<br />

R T0 = Resistivity at reference temperature<br />

For a copper conductor, every 25°C increase in temperature<br />

means a drop of about 5% in maximum ampacity<br />

due to an increase in conductor resistivity, RT . Since<br />

this presents the probability of further power dissipation<br />

and temperature rise, MiB design practice must consider<br />

effective methods not only to control and reduce conductor<br />

resistivity, but also to provide low thermal resistance<br />

pathways for heat dissipation.<br />

In a printed circuit board, ampacity depends on a number<br />

of different factors:<br />

• Conductive + convective capability provided by spreading<br />

layers, ground layers, stack-up<br />

• Ratio of track width to thickness<br />

• Ambient temperature<br />

• Adjacent high current tracks<br />

• AC or DC current<br />

• Presence and frequency of partial crosssection<br />

shrinkage<br />

• Presence, number, and conductive<br />

cross-section of plated through holes in<br />

series with the conductor.<br />

Therefore effective design needs to<br />

consider more variables than are normally<br />

addressed by the IPC-2152 current vs.<br />

temperature charts.<br />

MIB<br />

“Metal in the Board” or “MiB” includes<br />

a number of approaches where MiB<br />

building blocks are combined to provide<br />

effective high-current solutions.<br />

The “DWPCB” (discrete wire PCB) type<br />

Fig. 1. Gullwing heat sink on TO-252<br />

power device.<br />

External Only<br />

Low heat spreading<br />

Low heat spreading<br />

Wire Bonder<br />

Bonded Elements<br />

Etched Conductor<br />

Pattern<br />

Substrate Cross-Section<br />

Fig. 2. “Discrete Wire” process- bonding high current elements to inner layer.<br />

is one of the most versatile. One of the commercially<br />

available versions of DWPCB is HSMtec, developed by<br />

the Austrian PCB manufacturer Häusermann GmbH.<br />

HSMtec uses 0.5 mm diameter copper wire and rectangular<br />

sectioned 0.5 mm thick copper strips (“profiles”)<br />

to provide discrete low resistance electrical and thermal<br />

pathways in the board as shown in Fig. 2.<br />

There are a number of advantages to this solution compared<br />

to conventional thick copper or metal core boards:<br />

• Conventional PCB processes ensure consistently high<br />

reliability<br />

• Enhanced thermal and current pathways only where<br />

needed<br />

• Cost of MiB limited to those nets needing MiB<br />

• Wiring densities up to and including HDI enable logic<br />

and power integration<br />

• FR-4 materials reduce CTE mismatch common to aluminum<br />

based substrates<br />

• Board may be folded during assembly, providing photometric<br />

solutions for LED luminaires and eliminating<br />

daughter boards/connectors<br />

The profiles and wires that make up the MiB compo-<br />

Internal + External<br />

Heat spreading<br />

Heat spreading<br />

Fig. 3. Effect on heat spreading of thermal dissipation plane (source: Häusermann GmbH).<br />

8 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


THERMALmanagement<br />

Layer Stack<br />

Δ T (°C)<br />

20<br />

40<br />

60<br />

80<br />

100<br />

120<br />

Round wire<br />

0.5 mm<br />

8.3 26.6<br />

11.8<br />

14.4<br />

16.7<br />

18.6<br />

20.4<br />

Cu – Profile<br />

2 mm<br />

37.7<br />

46.1<br />

53.3<br />

59.6<br />

65.3<br />

FR4 160 mm x 100 mm x 1.6 mm<br />

Cu - Profile<br />

4 mm<br />

44.0<br />

62.3<br />

76.3<br />

88.1<br />

98.5<br />

107.9<br />

Cu -Profile<br />

8 mm<br />

nents in a DWPCB board are bonded to tracks etched on<br />

inner layer cores, basically forming a sandwich consisting<br />

of the etched track and the bonded elements. This patented<br />

process ensures the uniform contact between the track<br />

and the wire/profile, which is essential for homogenous<br />

heat spreading and uniform conductor cross-sectional area.<br />

It also simplifies the layout task and/or conversion from<br />

conventional designs, as placement of the high current<br />

MiB components: the wires and profiles—will be done on<br />

what are essentially enlarged tracks on an inner or outer<br />

layer.<br />

This arrangement provides a great deal of flexibility<br />

in stack-up configuration. Profiles/wires are bonded to<br />

a routing track, and thermal dissipation planes can be<br />

located on the same layer or on a facing layer co-axial<br />

with the MiB track. Facing layer thermal planes have been<br />

seen to improve thermal performance as shown in Fig. 3.<br />

Design guidelines include ampacity tables based on actual<br />

thermographic observations of different layup configurations.<br />

As shown in Fig. 4, the DWPCB type is suited for<br />

“medium” power applications with nominal currents up<br />

to about 140 A (40 °C temp rise). In combination with<br />

thermal vias or inlays this value can run to over 300 A<br />

depending on duty cycle. Other MiB types covered in<br />

BPA’s report are designed for high current applications<br />

(250 - 1000 A) — typical of Hybrid/Electric Vehicle and<br />

high power rectification.<br />

The medium current capability, heat-spreading characteristics,<br />

and design versatility of the DWPCB type make<br />

72.8<br />

102.9<br />

126.1<br />

145.6<br />

162.7<br />

178.3<br />

Fig. 4. Temperature increase for various profile cross-sections and current in<br />

Amperes (source: Häusermann GmbH).<br />

Cu – Profile<br />

12 mm<br />

it a cost-effective alternative to logic<br />

boards, busbars, and cable in an expanding<br />

range of applications.<br />

ELECTROMOBILITY POWERTRAIN<br />

The Lithium-ion battery pack shown in<br />

Fig. 5 provides a mean value of 100 A<br />

with peaks to 300 A for a light electric<br />

vehicle. Both weight and size are critical<br />

in this application as any increase in<br />

mass directly affects vehicle range. To<br />

save both, a battery management system<br />

consisting of control logic and eight<br />

DirectFET power devices is mounted<br />

right on the front of the battery pack. A<br />

DWPCB solution proved ideal for integrating<br />

the control logic with the power<br />

section, reducing two pcbs to one and<br />

eliminating the associated connectors and<br />

cabling.<br />

The design challenge involved rout-<br />

ing 100 / 300 A through an FR-4 circuit board to the<br />

DirectFETs and out to the load. Häusermann’s versatile<br />

DWPCB technology enabled several different options to<br />

be considered, ranging from single-layer power distribution<br />

to a multi-level design with integrated thermal vias<br />

and dissipation planes.<br />

The most cost-effective design is shown in Fig. 6. In<br />

this layout, the profiles have been bonded to an inner core<br />

10 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

97.6<br />

138.1<br />

169.1<br />

195.3<br />

218.4<br />

239.2<br />

MOSFETS<br />

Fig. 5. Fraunhofer IIS Battery Management System/Controller (source:<br />

Häusermann GmbH)


Fig. 6. MiB layout for DirectFET package using HSMtec.<br />

consisting of High Tg FR-4 clad with 2 oz. (70μ) copper.<br />

Since the profiles are all on the same reference plane,<br />

setup and run time for the bonding equipment is optimized<br />

and the subsequent mass-lamination process has a<br />

less complex embedding task compared to a design where<br />

the profiles are on several different layers. The embedded<br />

profiles also free up real estate on the surface of the board:<br />

the area needed for the high-current tracks is confined to<br />

the via arrays used to access the embedded profiles,while<br />

the wide tracking necessary to support the profiles is confined<br />

to the internal layer.<br />

MICROVIAS<br />

The high current profiles are accessed by arrays of laser<br />

microvias. This technique is growing in popularity in a<br />

number of MiB types, because although laser vias are<br />

typically 100μ in diameter or less, what counts in an MiB<br />

application is the length of the conductive element (in this<br />

case, depth of the via) and cross-sectional area of copper<br />

available as a thermal pathway.<br />

The copper area can be determined by the difference<br />

in surface area between the two circles formed by the via<br />

drilled diameter and inside plated diameter. The thermal<br />

resistance of the via array is therefore determined by:<br />

R Ѳ array = l / k × (N vias × {π × [(D 1 /2) 2 - (D 2 /2) 2 ]}) (2)<br />

Where:<br />

l = Depth of via<br />

k = Conductivity of copper (approx. 380 W/m-K)<br />

D 1 = Drilled diameter<br />

D 2 = Finished (plated)<br />

hole diameter<br />

N vias = Number of vias<br />

in the array<br />

And, since laser<br />

microvias are very small<br />

and are drilled at effective<br />

hit rates well in<br />

excess of 10,000 per<br />

minute (for CO2 “copper<br />

direct” process),<br />

a lot of them can be<br />

placed in a thermal pad.<br />

An array of 1296 microvias<br />

in a 100 mm2 Fig. 7. The finished board: DirectFET footprint<br />

(source: Häusermann GmbH).<br />

thermal<br />

pad will present a thermal resistance of about 0.01<br />

W/°C: about the same as the solder joint used to bond the<br />

device’s thermal slug to the pad!<br />

In addition to the microvias used to access the buried<br />

profiles, the design increases the dissipation area available<br />

to the device by running thermal vias down to bottomside<br />

dissipation planes. Here, the fabrication challenge entails<br />

drilling bulk copper, which involves chiploads less than<br />

one-third those of FR-4. However, thermal vias are basically<br />

heat pipes, so any nailheading that occurs at the layer<br />

3 joint in this design will not compromise electrical performance.<br />

The objective is to get a clean hole and homogeneous<br />

copper deposit for thermal transfer. Thermal via<br />

arrays can be very effective ways to get heat down through<br />

the board to a backside dissipation plane: the conductivity<br />

of a typical array is between 20 – 30 W/m-K which is over<br />

100X that of FR-4.<br />

Managing the power tracks inside the board leaves<br />

room for signal and control wiring on the outer layer, and<br />

the gate signals for the parallel FETs are run on the surface<br />

of the board. Typical dimensions for a layout of this kind<br />

are shown in Fig. 6 as well as the positioning of the profiles<br />

on the etched core carrier tracks. Gaps between the<br />

profiles have been expanded for clarity: the gap volume<br />

represents a variation of less than 0.1% of the total conductor<br />

volume. The result of this design is the clean footprint<br />

shown in Fig. 7.<br />

MIB COST<br />

Faced with a solution presenting this level of innovation<br />

and simplicity, the first question is almost certainly “but<br />

how much does it cost?” While the applications requiring<br />

this solution are driven primarily by reliability and<br />

performance (electromobility lifetimes range from 15 to<br />

25 years, and improvements in functional density mean<br />

decreases in weight and volume with corresponding<br />

increases in operational autonomy), the cost equation is<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 11


THERMALmanagment<br />

zero sum, i.e., an alternative technology either has to<br />

come in at parity and be ready to follow the same cost<br />

reduction trajectory as the assembly it replaces, or offer an<br />

order of magnitude improvement: in cost, performance,<br />

reliability, or a combination of all three.<br />

The design example presented above essentially<br />

accomplished two objectives:<br />

• it enabled the use of the latest generation of isometric<br />

power packages, in the process reducing board real<br />

estate necessary for thermal and current management<br />

by some 30%<br />

• it enabled a reduction in volume and weight through a<br />

combination of reduced power board area, elimination<br />

of the controller daughterboard, replacement of the<br />

vertical plate heat sinks required by PIH (pin-in-hole)<br />

TO devices with smaller finned assemblies and chassis<br />

standoffs, and replacement of high current cabling with<br />

direct connections to the power bus.<br />

Considering only the reduction in parts count and<br />

assembly costs, the MiB solution provided a savings of<br />

about 13% compared to the initial design. But the potential<br />

savings could be greater when taking into account the<br />

additional benefits of weight and volume reduction. The<br />

cost savings obtained from reduced weight and volume is<br />

the subject of ongoing analysis.<br />

The result of this design has been a printed circuit solution<br />

to the challenges of heat dissipation and power distribution<br />

typical of medium power applications using the<br />

latest SMT packages. The surface mount nature of these<br />

devices means the board must be capable of providing low<br />

resistance thermal as well as electrical pathways. This<br />

design exemplifies how conventional printed circuit technologies,<br />

including laser and mechanically drilled holes ,<br />

may be combined in innovative buildups to meet the<br />

challenges of Digital <strong>Power</strong>.<br />

*NOTE*<br />

Information for the Metal In The Board article was derived from a February<br />

2013 BPA Consulting report on “Metal In the Board-Opportunities<br />

for Printed Circuit Boards Providing Enhanced Thermal and <strong>Power</strong><br />

Management.” In the report, BPA (www.bpaconsulting.com) take the first<br />

comprehensive look at what Digital <strong>Power</strong> means for printed circuits. In over<br />

250 pages including 360 illustrations, charts, and tables, the report presents<br />

the fundamentals of thermal and power management for PCBs, identifying<br />

and profiling a number of emerging board level solutions and applications.<br />

The report includes both technology and business analysis as well as international<br />

market forecasts by technology, application, and region.<br />

12 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


DESIGNfeature<br />

CHRISTOPHE BASSO, Product Engineering Director, ON Semiconductor, Toulouse, France<br />

Stability Criteria Of<br />

A Control System<br />

“Designing Control Loops for<br />

Linear and Switching <strong>Power</strong><br />

Supplies” is the latest book<br />

from Christophe Basso, a<br />

past contributer to <strong>Power</strong><br />

<strong>Electronics</strong>. This book focuses<br />

on what engineers really<br />

need to know to compensate<br />

or stabilize a given control<br />

system. This article contains<br />

excerpts from the section of<br />

the book covering stability<br />

criteria.<br />

+ (s)<br />

Vin (s) H(s)<br />

V out (s)<br />

–<br />

G(s)<br />

Fig. 1. An oscillator is actually a control system where<br />

the error signal does not oppose the output signal<br />

variations.<br />

In the electronic field, an oscillator is a circuit capable of producing a selfsustained<br />

sinusoidal signal. In a lot of configurations, cranking up the oscillator<br />

involves the noise level inherent to the adopted electronic circuit. As the<br />

noise level grows at power-up, oscillations are started and self-sustained. This<br />

kind of circuit can be formed by assembling blocks such as those appearing<br />

in Fig. 1. As you can see, the configuration looks very similar to that of our<br />

control system arrangement.<br />

In our example, the excitation input is not the noise but a voltage level, V in ,<br />

injected as the input variable to crank the oscillator. The direct path is made of<br />

the transfer function H(s), while the return path consists of the block G(s). To<br />

analyze the system, let us write its transfer function by expressing the output<br />

voltage versus the input variable:<br />

If we expand this formula and factor V out (s), we have<br />

The transfer function of such a system is therefore<br />

In this expression, the product G(s)H(s) is called the loop gain, also noted<br />

T(s).To transform our system into a self-sustained oscillator, an output signal<br />

must exist even if the input signal has disappeared. To satisfy such a goal, the<br />

following condition must be met:<br />

To verify this equation in which V in disappears, the quotient must go to<br />

infinity. The condition of the quotient to go to infinity is that its characteristic<br />

equation, D(s), equals zero:<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 13<br />

<br />

1 + G(s)H(s) = 0 (5)<br />

To meet this condition, the term G(s)H(s) must equal -1. Otherwise<br />

stated, the magnitude of the loop gain must be 1 and it sign should change to<br />

minus. A sign change with a sinusoidal signal is simply a 180° phase reversal.<br />

These two conditions can be mathematically noted as follows:


POWER CONTROLloops<br />

–180 –30.0<br />

–360<br />

° dB<br />

360<br />

180<br />

0<br />

60.0<br />

30.0<br />

0<br />

–60.0<br />

|T (f)|<br />

T (f)<br />

100 1k 10k 100k<br />

Frequency (Hz)<br />

|G(s)H(s)| = 1 (6)<br />

|T (100 kHz)| = 0 dB<br />

T T (100 kHz) = –180° –180°<br />

argG(s)H(s) = –180º (7)<br />

1M 10M<br />

Fig. 2. Conditions for oscillation can be illustrated either in a Bode diagram or in a Nyquist plot.<br />

When these two expressions are exactly satisfied, we<br />

have conditions for steady-state oscillations. This is the<br />

so-called Barkhausen criterion, expressed in 1921 by the<br />

eponymous German physicist. Practically speaking, in a<br />

control loop system, it means that the correction signal<br />

no longer opposes the output but returns in phase with<br />

the exact same amplitude as the excitation signal. In<br />

dB °<br />

40<br />

20<br />

0<br />

–20<br />

–40<br />

180 <br />

90<br />

0<br />

–90 <br />

–180<br />

|T (f)|<br />

T (f)<br />

φ m = 90°<br />

Crossover frequency frequency<br />

f c = 6.5 kHz<br />

10 100<br />

1k 10k 100k<br />

Frequency (Hz)<br />

<br />

a Bode plot, (3.6) and (3.7) would imply a loop gain<br />

curve crossing the 0-dB axis and affected by a 180° phase<br />

lag right at this point. In a Nyquist analysis, where the<br />

imaginary and real portions of the loop gain are plotted<br />

versus frequency, this point corresponds to the coordinates<br />

-1, j0. Fig. 2 displays these two curves where conditions<br />

for oscillation are met. Should the system slightly<br />

deviate from these values (e.g., temperature drift, gain<br />

change), output oscillations would either exponentially<br />

decrease to zero or diverge in amplitude until the upper/<br />

lower power supply rail is reached. In an oscillator, the<br />

designer strives to reduce<br />

as much as possible the<br />

gain margin so the conditions<br />

for oscillations are<br />

satisfied for a wide range<br />

of operating conditions.<br />

3.2 STABILITY CRITERIA<br />

You understand that our<br />

goal with a control system<br />

is not to build an<br />

oscillator. We want a<br />

control system featuring<br />

speed, precision, and an<br />

oscillation-free response.<br />

We must therefore keep<br />

away from a configuration<br />

where conditions for<br />

oscillation or divergence<br />

are met. One way is to<br />

limit the frequency range<br />

14 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

<br />

<br />

<br />

<br />

<br />

T T (s) = –180°<br />

1M<br />

ω <br />

–1,j0<br />

GM = 45 dB<br />

Fig. 3. In this example, the 0-dB crossover point is located at 6.5 kHz, where the total phase lag offers a phase margin of 90°.<br />

Tm T (ω)<br />

Re T (ω)


within which our system will react. By definition, the<br />

frequency range, or the bandwidth, corresponds to a<br />

frequency where the closed-loop transmission path from<br />

the input to the output drops by 3 dB. The bandwidth<br />

of a closed-loop system can be seen as a frequency range<br />

where the system is said to satisfactorily respond to its<br />

input (i.e., follows the setpoint or efficiently rejects the<br />

perturbations). As we will later see, during the design<br />

stage, We do not directly control the closed-loop bandwidth<br />

but the crossover frequency f c , a parameter pertinent<br />

to an open-loop analysis. Both variables are often<br />

approximated as equal, and we will see that it is true in<br />

one condition only. However, they are not far away from<br />

each other, and both terms can be interchanged in the<br />

discussion.<br />

We have seen that the open-loop gain represents<br />

an important parameter for our control system. When<br />

gain exists (i.e. |T(s)|>1), the system works in dynamic<br />

closed-loop conditions and can compensate for incoming<br />

perturbations or react to setpoint changes. However,<br />

there is a limit to the system reaction: the system must<br />

offer gain at the frequencies involved in the perturb-<br />

ing signal. If the perturbations of the setpoint changes<br />

are too fast, the frequency content of the excitation<br />

signal is beyond the bandwidth of the system, implying<br />

the absence of gain at these frequencies: the system<br />

becomes slow and cannot react, operating as if the<br />

loop were unresponsive to varying waveforms. Is an<br />

infinite bandwidth system desirable then? No, because<br />

increasing the bandwidth is like widening the diameter<br />

of a funnel: you are certainly going to collect more<br />

information and react faster to incoming perturbations,<br />

but the system will also accept spurious signals such as<br />

noise and parasitic data, self-produced by the converter<br />

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www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 15


“Time ago, when amplifiers or servomechanisms were driven by<br />

vacuum tubes-based circuits, warm-up times during the power-on<br />

sequence could induce large loop gain variations.”<br />

point as well as the phase margin. We know by experience<br />

that the elements constitutive of the converter will<br />

exhibit variations along the product life cycle. These<br />

variations can be linked to natural production spreads<br />

(for instance, resistors or capacitors affected by lot-tolot<br />

tolerance). The converter environmental operating<br />

conditions also have an impact on components. Among<br />

these variables, temperature plays an important role<br />

and affects passive or active component parameters. It<br />

can be capacitors or inductors equivalent series resistors<br />

(ESR), the optocoupler current transfer ratio (CTR),<br />

or the beta of bipolar transistors for instance. These<br />

variations impact the loop gain by shifting it up or down<br />

depending on the affected parameters.<br />

If the gain curve undergoes a shift, the 0-dB cross-<br />

over frequency will transition to a new value imposing a<br />

different bandwidth to the converter. How can the converter<br />

stability be affected under these changes? Well, if<br />

the new crossover tales place at a point where the phase<br />

margin is weak, you may degrade the transient response<br />

so that the overshoot is no longer acceptable. It is thus<br />

your responsibility, as a designer, to ensure that these<br />

dispersions do not suddenly increase the gain at a frequency<br />

where you approach the -180° limit. You need<br />

sufficient gain margin as defined by<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 17


POWER CONTROLloops<br />

dB °<br />

40.0<br />

20.0<br />

0<br />

–20.0<br />

–40.0<br />

180 <br />

|T (f)|<br />

90.0 <br />

0<br />

–90.0 <br />

–180 <br />

T (f)<br />

–2 dB<br />

–10 dB<br />

φ m 45°<br />

φ φm 0° m <br />

0°<br />

Where corresponds to the frequency point where is<br />

exactly -180° or radians (1 MHz in Fig. 3).<br />

Fig. 4. portrays typical gain variations of ±10 dB due to<br />

production spreads in the selected components. It brings<br />

the crossover frequency from 1.5 kHz to 30 kHz. In this<br />

area, the phase margin changes from 70° to 45°, safe<br />

numbers according to theory. What is the worst case?<br />

It is when the new crossover frequency occurs where<br />

the total phase lag is 180°, matching the conditions for<br />

oscillations. This condition occurs at 1 MHz, implying a<br />

positive gain change of 35 dB.<br />

LARGE GAINS UNLIKELY<br />

Fortunately, deviations of 35 dB are unlikely to happen<br />

in modern electronics circuits. Time ago, when<br />

amplifiers or servomechanisms were driven by vacuum<br />

tubes-based circuits, warm-up times during the poweron<br />

sequence could induce large loop gain variations.<br />

Gain provisions were thus necessary to reject a second<br />

point where the stability could be in danger. This gain<br />

margin, identified on the loop gain curve at the frequency<br />

where the total phase lag reaches -180°, is noted<br />

GM in Fig. 3. In modern electronic circuits, gain margins<br />

beyond 10 dB are usually enough, unless your loop gain<br />

exhibits extreme sensitivity to an external parameter.<br />

Another example of gain shift appears in Fig. 5. It<br />

shows another compensated converter exhibiting a phase<br />

margin of 80° at 10 kHz. Based on what we discussed,<br />

we know that gain changes can occur, inducing ups or<br />

downs on the gain curve. In our example, we can identify<br />

an area around 2 kHz where the phase margin is as<br />

Crossover frequency<br />

f <br />

c = 10 6.5 kHz<br />

c<br />

<br />

φ = 50° m<br />

10 100<br />

1k<br />

Frequency (Hz)<br />

10k 100k<br />

Fig. 6. The phase lags beyond 180° but in an area where the gain is larger than 1. This is not a problem,<br />

and the response is acceptable.<br />

small as 18°. If a gain decrease of 20-25<br />

dB occurs, you can end up with a control<br />

system showing a dangerously low<br />

phase margin around 2 kHz. It would<br />

lead to an oscillatory response, perhaps<br />

exceeding the overshoot specifications.<br />

This kind of system is told to be conditionally<br />

stable. Fortunately, as already<br />

said, a 25-dB variation of gain is unusual<br />

and such a system can be considered<br />

robust with this gain margin. However,<br />

I have seen design cases where the<br />

end user (your customer) clearly stated<br />

in the specifications that conditional<br />

designs were not acceptable, asking for<br />

a phase margin greater than 60° at all<br />

points below the crossover frequency.<br />

In this case, it becomes mandatory to<br />

compensate the converter so that no<br />

region of reduced phase margins below<br />

crossover ever exist whatever the operating<br />

conditions are.<br />

STABLE OR UNSTABLE?<br />

It is often believed that a system where the phase dips<br />

below -180° before crossover is an unstable system. Such<br />

a response appears in Fig. 6. The phase curve quickly<br />

drops after 1 kHz and passes the -180° limit at 1.5 kHz<br />

for a few kilohertz.<br />

It then goes up again to offer a phase margin of 50°<br />

at 10 kHz. Yes, this system is stable simply because we<br />

do not satisfy (3.7) at 0 dB. Remember, to cancel the<br />

denominator of (3.3), you must have the gain magnitude<br />

exactly equal to 1 and a phase lag of 180° or beyond. In<br />

the graph, we can see that this condition is not satisfied<br />

at any point in the picture. However, it is worth noting<br />

that the loop is highly conditional. Should the gain<br />

reduce by a few decibels and your phase margin becomes<br />

less than 45°. Another 10-dB decrease and you enter a<br />

dangerous area of zero phase margin where, this time,<br />

the oscillation criteria would be met.<br />

Note: This article is reprinted from the book “Designing<br />

Control Loops for Linear and Switching <strong>Power</strong> Supplies: A<br />

Tutorial Guide,” (c) 2012, with permission of the publisher,<br />

Artech House, Inc., Boston. The subjects in the book include:<br />

Basics of Loop Control, Transfer Functions, Stability Criteria<br />

of a Control System, Compensation, Operational<br />

Amplifier-Based Compensation, Operational Transconductance<br />

Amplifier-Based Compensation, TL-431-Based Compensation,<br />

Shunt Regulator-Based Compensation, Measurements<br />

and Design Examples. The book can be purchased at<br />

ArtechHouse.com, Amazon.com, or BN.com<br />

18 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


DESIGNfeature<br />

MICHAEL DE ROOIJ, Ph.D., Executive Director of Applications Engineering, Efficient <strong>Power</strong> Conversion Corporation<br />

JOHAN STRYDOM, Ph.D., Vice President, Applications, Efficient <strong>Power</strong> Conversion Corporation<br />

eGaN ® FET- Silicon <strong>Power</strong> Shoot-<br />

Out: Small Signal RF Performance<br />

In this eGaN FET-silicon power<br />

shoot-out series article, we<br />

examine RF performance<br />

using the 200 V EPC2012 [3]<br />

eGaN FET as a starting point.<br />

The eGaN FET is optimized<br />

as a power-switching device<br />

but also exhibits good RF<br />

characteristics. Future eGaN<br />

FET parts can be optimized<br />

for better RF performance at<br />

higher frequencies.<br />

1621<br />

Gate Circuit<br />

Reference Plane<br />

Device Outline<br />

914<br />

349<br />

271<br />

135.3<br />

Unlike power switching FETs, RF FETs are designed to work best<br />

in the linear region of operation to maximize power gain and<br />

minimize distortion, whereas power switching devices are optimized<br />

for lowest R DS(ON) and gate charge [1,2,3,17,18,19,20]. Another<br />

significant difference between power switching and RF FETs is the<br />

power dissipation capability of RF devices is significantly higher<br />

than that of power switching devices for equivalent terminal characteristics<br />

to accommodate the higher power losses in the linear region.<br />

We will focus on RF characterization in the frequency range from 200 MHz<br />

through 2.5 GHz, the results of which can be used to design a pulsed power RF<br />

amplifer.<br />

RF CHARACTERIZATION<br />

Prior to being able to compare various RF FETs with each other they need to be<br />

properly characterized, which can accomplished by measuring the S-parameters<br />

of the FET while regarding it as a 2-port network under controlled bias conditions.<br />

A test fixture was designed for the EPC2012 to connect the RF signals to the FET<br />

and to provide the necessary S-parameter measurement reference planes from<br />

which the dataset would be valid. The test fixture design used a 30 mil thick Rogers<br />

4350 substrate [21] , chosen for its low losses at higher frequencies. This allowed the<br />

design to be suitable for frequencies as high as 12 GHz. Fig. 1 shows the reference<br />

plane design and highlights the outline of the EPC2012 device. The transmission<br />

lines to the device Gate and Drain were designed as microstrip transmission lines<br />

with 50 Ω characteristic impedance.<br />

271<br />

914<br />

1621<br />

Drain Circuit<br />

Reference Plane<br />

Fig. 1. Reference plane design for the EPC2012 eGaN FET using a 30 mil thick Rogers<br />

4350 substrate.<br />

The test fixture was also equipped with a negative<br />

temperature co-efficient thermistor (NTC) placed in<br />

close proximity to the source pad of the eGaN FET to<br />

provide an indication of the temperature of the copper<br />

in that area without affecting the RF performance.<br />

The EPC9903 test fixture in Fig. 2 shows the right side<br />

image showing the top mounted heat-sink. The EPC<br />

FET has a lower thermal resistance [3] from junction to<br />

the top side of the device, compared to the bottom side<br />

(soldered), and hence mounting the heat-sink to the<br />

back side of the device has a high impact on the power<br />

dissipation capability of the device.<br />

Due to thermal limitations of the test fixture and the<br />

EPC2012 device, testing of the eGaN FET was pulsed<br />

with a low duty cycle with the average power dissipation<br />

kept below 0.7 W without the heat-sink, and 5 W<br />

with the heat-sink and forced air cooling. The heat-sink<br />

used was 15 mm x 15 mm x 14.5 mm high, supplied by<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 19


eGaNfets<br />

SMA<br />

Connector –<br />

Gate<br />

Connection<br />

(AC & DC)<br />

Thermal Sensor<br />

Connection<br />

Thermal Sensor<br />

D.U.T. (e.g. EPC2012) 50 Ω Micro-Strip<br />

Advanced Thermal Solutions [14] with thermal interface<br />

material from Wakefield [7] .<br />

RF MEASUREMENT<br />

The basic setup using the EPC9903 test fixture is<br />

shown in Fig. 3. Both the bias and RF signal are provided<br />

to the board using SMA connectors. A bias Tee [4] was<br />

used for the separate connection of gate/ drain bias and<br />

the RF signal.<br />

Prior to using the test fixture (EPC9903) for the<br />

S-parameter measurement of the EPC2012 device, it was<br />

calibrated using the Thru-Reflect-Line (TRL) method [10] .<br />

The process followed is well documented and similar to<br />

that described in [11] .<br />

With the small signal S-parameter setup complete, the<br />

next step was to measure the EPC2012 device at various<br />

bias conditions to determine the highest maximum gain<br />

SMA<br />

Connector –<br />

Drain<br />

Connection<br />

(AC & DC)<br />

Heat-Sink<br />

Mounting Shim<br />

Fig. 2. Photograph of the EPC9903 small signal RF test fixture for the EPC2012 eGaN FET (with the heat sink mounted shown in right image).<br />

Gate<br />

Bias<br />

To VNA<br />

Chnl 1<br />

Bias<br />

Tee<br />

Gate Bias<br />

Voltage<br />

V<br />

O V ~<br />

5 VDC<br />

Drain Bias<br />

Voltage<br />

10 VDC ~<br />

160 VDC<br />

Fig. 3: Basic test fixture schematic and RF small signal test setup.<br />

V<br />

EPC9903<br />

Fixture<br />

Board<br />

Drain Bias<br />

Current<br />

Heat Sink<br />

Protective Spacer For<br />

Horizontal Alignment<br />

bias point. This will then be used to design a class A power<br />

amplifier to evaluate the RF power performance of the<br />

EPC2012.<br />

Initial testing to determine the useful gain frequency<br />

range of the device swept the frequency from 30 MHz<br />

through 12 GHz under continuous wave (CW) conditions<br />

at a low drain bias voltage of 10 V and 300 mA.<br />

Subsequent testing was limited to the 200 MHz through<br />

2.5 GHz frequency range. Initial testing also investigated<br />

the influence of the heat-sink on the RF performance<br />

of the test fixture and the device. It was found that the<br />

impact of the heat-sink only became detectable at frequencies<br />

above 2.5 GHz and caused a resonance around<br />

6.5 GHz which is well above the working frequency of<br />

the device.<br />

Various drain bias conditions were then applied to<br />

the FET terminals from 10 V through 70 V, and from<br />

10’s of mA though 6 A as small sig-<br />

nal S-Parameter measurements were<br />

taken. Under these conditions the bias<br />

power dissipation in the FET became<br />

significant and therefore the device<br />

was pulsed for short durations while<br />

measurements were taken. The pulse<br />

width was set to approximately 20 μs<br />

with a repetition frequency of 50 Hz.<br />

For this discussion, the gate-source<br />

circuit will be designated as port-1<br />

and the drain-source circuit as port-2.<br />

Maximum gain at 500 MHz is shown<br />

in the graph (Fig. 4) as a function of<br />

drain bias power. The graph clearly<br />

shows that once the drain bias power<br />

exceeds 20 W there is very little<br />

20 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

A<br />

Bias<br />

Tee<br />

300 mADC<br />

~ 3ADC<br />

To VNA<br />

Chnl 2<br />

Drain<br />

Bias


Max Gain (dB)<br />

20<br />

18<br />

16<br />

14<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

Region of Interest<br />

Drain<br />

10 V<br />

20 V<br />

30 V<br />

40 V<br />

50 V<br />

60 V<br />

65 V<br />

70 V<br />

0 25 50 75 100 125 150 175 200<br />

Drain Bias <strong>Power</strong> (W)<br />

Fig. 4. Graph of small signal Max. Gain as function of various Drain bias powers<br />

at 500 MHz as measured for the EPC2012 eGaN FET.<br />

increase in maximum gain with further increase in drain<br />

bias power. It also shows a nearly constant gain with drain<br />

voltage beyond 15 V bias. The graph shows the useful<br />

drain bias power range for a class A amplifier highlighted<br />

by the region of interest and will be the design point for<br />

such an amplifier. It is important to note that, for an<br />

amplifier design the drain bias must have sufficient voltage<br />

to allow the drain to swing with maximum amplitude.<br />

Too high of a voltage will lead to unnecessary drain bias<br />

power, and too low of a voltage will reduce the 1 dB compression<br />

point and induce clipping.<br />

Fig. 5 shows a graph of maximum gain as a function of<br />

Max. Gain (dB)<br />

30<br />

25<br />

20<br />

15<br />

10<br />

5<br />

0<br />

100 1000<br />

Frequency (MHz)<br />

Fig. 5. Maximum gain of the eGaN FET at various drain bias conditions.<br />

frequency for various drain bias power conditions ranging<br />

from 10 W through 179 W. It should be noted that low<br />

drain bias power reduces the gain more above 600 MHz<br />

and, at very high drain bias power, gain reduces below<br />

400 MHz.<br />

Three optimal drain bias points have been identified<br />

from the data that will be used to evaluate the performance<br />

of the EPC2012 device as a class A amplifier operating<br />

at 500 MHz. The drain voltage is around 65 V with<br />

drain power of 20 W, 40 W and 80 W. The 500 MHz<br />

point was chosen as it yielded the highest gain frequency<br />

product for various devices tested. The various drain bias<br />

power points will be used to determine the impact on the<br />

1 dB compression point and drain efficiency.<br />

RF POWER AMPLIFIER DESIGN<br />

Suitable drain bias points and frequency have been<br />

selected for the EPC2012 device based on maximum gain<br />

and frequency. The S-parameters at these bias points and<br />

frequency that can be used in the design of an RF <strong>Power</strong><br />

amplifier will be analyzed next.<br />

Fig. 6 shows the Smith Chart plot for the gate (S11)<br />

and drain (S22) reflection coefficients from 200 MHz<br />

through 2.5 GHz with a drain bias of 64 V and 1.275 A. A<br />

change in drain current has negligible impact on the input<br />

and output impedances. However, a reduction in drain<br />

voltage to below 15 V will have a significant impact on<br />

the input and output impedance as the COSS of the eGaN<br />

FET increases dramatically. This will also reduce the available<br />

gain as more output current is shunted internally in<br />

the device reducing the output voltage swing. This leads<br />

to non-linear behavior and must be<br />

accounted for in an amplifier design.<br />

The Smith chart plot shows that the<br />

EPC2012 device has low impedance<br />

for both the gate and drain circuits in<br />

the frequency region from 200 MHz<br />

through 2.5 GHz, and of particular<br />

interest at 500 MHz where both are<br />

capacitive.<br />

Based on measurement data, at<br />

a frequency of 500 MHz the gatesource<br />

impedance is 5.44 – j3.69 Ω<br />

and the drain-source impedance is 3.13<br />

– j3.08 Ω and can be used to determine<br />

matching networks for the device. The<br />

impact of bias networks, and whether<br />

an amplifier must be unconditionally<br />

stable, must also be considered prior to<br />

matching network design.<br />

A stability analysis, based on the<br />

Rollett Stability [22] condition where<br />

1 [1-5] Drain<br />

70 V, 10 W<br />

64 V, 20 W<br />

67 V, 43 W<br />

64 V, 82 W<br />

50 V, 102 W<br />

55 V, 118 W<br />

50 V, 167 W<br />

40 V, 179 W<br />

Peak Gain<br />

, indicates that<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 21


eGaNfets<br />

0<br />

0.1<br />

0.2<br />

200 MHz<br />

0.1<br />

0.2<br />

500 MHz<br />

RF Café<br />

2002<br />

0.2<br />

2.5 GHz<br />

0.3<br />

the EPC2012 device is close to, but not unconditionally<br />

stable at 500 MHz, where = 0.722 and K = 0.673.<br />

Fig. 7 shows the stability circle plotted at 500 MHz, 64<br />

V and a drain bias of 1.275 A with the unstable regions<br />

highlighted. A change in drain bias current, as in the case<br />

of input and output impedances, has a negligible impact<br />

on the location and size of the stability circles. The Smith<br />

Chart shows that the unstable regions are small. To ensure<br />

unconditional stability for an amplifier, a small series<br />

resistance in the RF gate circuit will suffice to shift the<br />

impedance to the right on the Smith Chart thereby ensuring<br />

unconditional stability. This solution is not practical for<br />

the output as the power may be high and the resistor will<br />

dissipate a large amount of RF power, thereby reducing<br />

the effective gain of the amplifier. A low Q factor matching<br />

network consisting of two L-section networks was<br />

chosen for the output to allow for exploration of broadband<br />

amplifier performance characteristics. This design<br />

also tends to reduce losses in the matching network since<br />

smaller inductors may be used with corresponding lower<br />

resistive loss and is particularly useful for large transformations,<br />

such as 2 Ω to 50 Ω.<br />

Since the real part of both the gate-source and drainsource<br />

impedances are smaller than the characteristic<br />

impedance of the transmission lines (50 Ω) used to connect<br />

the RF signal to the eGaN FET, the impedance<br />

matching network will take the form shown in Fig. 8.<br />

The basic matching network shown in Fig. 8 has the<br />

following solutions [1] :<br />

<br />

<br />

0.4<br />

0.5<br />

0.6<br />

S11 – Input Reflection<br />

S22 – Output Reflection<br />

0.7<br />

0.8<br />

0.9<br />

1.0<br />

Fig. 6. Smith Chart plot of Gate (S11) and Drain (S22) reflection for the EPC2012<br />

over the frequency range 200 MHz through 2.5 GHz.<br />

22 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

Source<br />

Load<br />

Unstable<br />

Regions<br />

Fig. 7. Stability Circle plot for the EPC2012 device at 500 MHz with a drain bias<br />

of 64 V, 1.275 A.<br />

(2)<br />

Where:<br />

Z o = Characteristic impedance of the transmission line<br />

used to connect the RF signal to the eGaN FET.<br />

Z L = Gate-source or drain-source impedance<br />

R L = Resistance part of Z L<br />

X L = Reactance part of Z L<br />

B = Matching shunt reactance<br />

X = Matching series reactance<br />

A trombone section of the input microstrip transmission<br />

line can be used to tune the impedance matching network<br />

to the device at a specific frequency whereby a shunt<br />

matching component may be installed anywhere along its<br />

length. Using the calculated value for B (Fig. 8), which in<br />

this case will be a capacitor, and moving it away from the<br />

FET on the 50 Ω transmission line, rotates the impedance<br />

clockwise on the Smith Chart with the result of shifting<br />

the impedance and altering the frequency response of the<br />

matching network. This is useful when designing an amplifier<br />

suitable for a wide operating frequency range.<br />

APPLICATIONS<br />

S-Parameter analysis of the EPC2012 eGaN FET has<br />

demonstrated that at up to 635 MHz, the device exhibits<br />

a good gain (>10 dB). This makes it useful for several<br />

applications, and in particular pulsed applications. These<br />

applications include Magnetic Resonance Imaging (MRI)<br />

Low power transmit systems and cyclotron drivers.<br />

MRI systems operate in the frequency range from


Z o<br />

Z in<br />

j-B Z L<br />

Fig. 8. Suitable Matching network for the EPC2012 eGaN FET.<br />

42 MHz (1T systems) through 300 MHz (7T systems).<br />

During imaging, an RF pulse is transmitted into the subject.<br />

The EPC2012 has several electrical characteristics<br />

that make it suitable for use in MRI transmit systems.<br />

A magnetic susceptibility test was conducted by Case<br />

Western University to further determine if the EPC2012<br />

was also suitable for use inside the MRI magnet. Any component<br />

inside the magnet must have an absolute volumetric<br />

magnetic susceptibility value of less than 24·10 -6 . Fig. 9<br />

shows an MRI and photograph images from the magnetic<br />

susceptibility test and clearly shows that the EPC device<br />

has no impact on the image quality and is clearly distinguishable<br />

in the MRI image. A device which exceeds the<br />

magnetic susceptibility limits will distort the image and<br />

will clearly show up as either a large black spot or produce<br />

ripples on an image similar to a stone thrown in water.<br />

CYCLOTRON DRIVER<br />

Another application that is suitable for the EPC2012<br />

device is a cyclotron driver. Such systems operate over<br />

a wide range of frequencies and are typically application<br />

specific. Cyclotrons are also pulsed and, due to the<br />

EPC2012’s small size and high voltage rating, are ideally<br />

suited for these types of applications [2] . Future work may<br />

also explore applications such as WiFi, Bluetooth, Zigbee<br />

and M2M power amplifiers which all operate in pulse<br />

mode.<br />

For continuous wave (CW) applications, the EPC2012<br />

Photograph<br />

Non-Magnetic<br />

ATC100B<br />

capacitor<br />

j-X<br />

EPC2012<br />

MRI<br />

Image<br />

EPC1013<br />

GRE sequence at 1.5T: TE=10 ms, TR = 100 ms<br />

Fig 9. Image showing the magnetic susceptibility impact of the EPC 2012 on a<br />

MRI image as compared to a non-magnetic ATC 100B series capacitor.<br />

device would need to be in an appropriate RF package that<br />

is capable of dissipating large amounts of heat flux.<br />

Another option for the efficient removal of heat from the<br />

RF package is eutectic die attach of the eGaN FET back<br />

side silicon directly to the circuit board substrate.<br />

ACKNOWLEDGEMENTS<br />

EPC hereby acknowledges the following for their support during<br />

this project:<br />

• Modelithics Inc. for their support in the design of the test fixtures<br />

and measuring the small signal S-Parameters.<br />

• Michael Twieg and Mark Griswold, Case Western Reserve<br />

University - Case Center for Imaging Research, for their assistance<br />

with the magnetic susceptibility testing of the EPC2012<br />

eGaN FETs<br />

• The blank Smith chart courtesy of www.RFcafe.com.<br />

• M. Meiller, Peakgainwireless, for help with s-parameter analysis<br />

that lead to the matching network design<br />

REFERENCES<br />

[1] D. M. Pozar, “Microwave Engineering”, Third Edition 2005, J. Wiley ISBN<br />

0-471-44878-8<br />

[2] http://en.wikipedia.org/wiki/Cyclotron<br />

[3] EPC2012 datasheet, www.epc-co.com<br />

[4] Bias Tee 8860SFM2-12, www.aeroflex.com<br />

[5] S. J. Orfanidis, “Electromagnetic Waves and Antennas”, Chapter 13, http://<br />

www.ece.rutgers.edu/~orfanidi/ewa/<br />

[6] www.rfcafe.com<br />

[7] Wakefield Engineering thermal interface material P/N 173-7-1212A, http://<br />

www.wakefield.com<br />

[8] http://en.wikipedia.org/wiki/Electronic_amplifier<br />

[9]R. C. Hejhall, “RF Small Signal Design Using Two-Port Parameters”,<br />

Motorola application note AN215A, 1993.<br />

[10]Engen, G.F., Hoer C.A.,“Thru-Reflect-Line: An Improved Technique for<br />

Calibrating the Dual Six-Port Automatic Network Analyzer,” IEEE Trans.<br />

Microwave Theory and Techniques, December 1979.<br />

[11]Agilent Network Analysis Applying the 8510 TRL Calibration for Non-<br />

Coaxial Measurements Product Note 8510-8A<br />

[12] www.microwaves101.com<br />

[13]http://en.wikipedia.org/wiki/Magnetic_susceptibility<br />

[14] ATS-54150K-C2-R0 datasheet, Advanced Thermal Solutions, www.qats.<br />

com<br />

[15]Ken Payne, “Practical RF Amplifier Design Using the Available Gain<br />

Procedure and the Advanced Design System EM/Circuit Co-Simulation<br />

Capability”, Agilent Technologies White Paper, 2008, www.agilent.com<br />

[16]G. Gonzales, “Microwave Transistor Amplifiers”, Second Edition 1997,<br />

Prentice Hall ISBN 0-13-254335-4<br />

[17]A. Lidow, J. Strydom, M. de Rooij, Y. Ma, “GaN Transistors for Efficient<br />

<strong>Power</strong> Conversion”, First Edition, ISBN 978-0-615-56925-3<br />

[18] J. Strydom, “eGaN® FET- Silicon <strong>Power</strong> Shoot-Out Volume 8: Envelope<br />

Tracking”, <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong>, May 2012, http://powerelectronics.<br />

com/power_semiconductors/gan_transistors/egan-fet-silicon-power-shoot-outvolume-8-0430/<br />

[19]J. Strydom, “eGaN® FET- Silicon <strong>Power</strong> Shoot-Out Volume 11:<br />

Optimizing FET On-Resistance”, <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong>, Oct. 2012,<br />

http://powerelectronics.com/discrete-semis/gan_transistors/egan-fet-siliconpower-shoot-out-volume-11-optimizing-fet-on-resistance-1001/<br />

[20] M. de Rooij, J. Strydom, “eGaN® FET- Silicon <strong>Power</strong> Shoot-Out Volume<br />

9: Low <strong>Power</strong> Wireless Energy Converters”, <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong>,<br />

June. 2012, http://powerelectronics.com/discrete-power-semis/egan-fet-siliconshoot-out-vol-9-wireless-power-converters<br />

[21] Rogers 4350 material specifications, www.rogerscorp.com<br />

[22] J. M. Rollett, “Stability and <strong>Power</strong>-Gain Invariants of Linear Twoports”,<br />

IRE Transactions on Circuit Theory, Vol. 9, Issue 1, March 1962, pp 29 – 32<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 23


DESIGNfeature<br />

SAM DAVIS, <strong>Power</strong> <strong>Electronics</strong><br />

Back to Basics:<br />

Voltage Regulator ICs, Part 1<br />

There are two basic types<br />

of regulator ICs, linear and<br />

switch-mode. The linear<br />

regulator operates in the<br />

linear region and is always<br />

on, whereas basic the switchmode<br />

type turns on and off<br />

and requires a rectifier to<br />

produce a dc output voltage.<br />

Among regulators, the simplest regulator circuit is for a low-dropout<br />

(LDO) voltage regulator whose topology is shown in Fig. 1. As a<br />

linear voltage regulator, its main components are a pass transistor,<br />

error amplifier, voltage reference, and output power MOSFET.<br />

One input to the error amplifier, set by resistors R1 and R2, monitors<br />

a percentage of the output voltage. The other input is a stable<br />

voltage reference (VREF). If the output voltage increases relative<br />

to VREF, the error amplifier changes the pass-transistor’s output to maintain a<br />

constant output voltage (VOUT).<br />

Low dropout refers to the difference between the input and output voltages<br />

that allows the IC to regulate the output voltage. That is, the LDO regulates the<br />

output voltage until its input and output approach each other at the dropout voltage.<br />

Ideally, the dropout voltage should be as low as possible to minimize power<br />

dissipation and maximize efficiency.<br />

The major advantage of an LDO IC is its relatively “quiet” operation because it<br />

does not involve switching. In contrast, a switch-mode regulator typically operates<br />

between 50 kHz and 1 MHz, which can produce EMI that affects analog or RF<br />

circuits. LDOs with an internal power MOSFET or bipolar transistor can provide<br />

outputs in the 50 to 500mA range. The LDO’s low dropout voltage and low quiescent<br />

current make it a good fit for portable and wireless applications.<br />

V IN<br />

C IN<br />

EN<br />

Pass<br />

Transistor<br />

Shutdown<br />

& UVLO<br />

+<br />

Error<br />

Amplifier<br />

24 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

–<br />

LDO<br />

V REF<br />

Bandgap<br />

Voltage<br />

Reference<br />

R1<br />

R2<br />

V OUT<br />

C OUT<br />

Ground<br />

Bypass<br />

C Bypass<br />

Fig. 1. An LDO’s low dropout voltage and low quiescent current make it a good fit for portable and wireless applications.


An LDO regulator’s dropout voltage determines the<br />

lowest usable input supply voltage. That is, although specs<br />

may show a broad input voltage range, the input voltage<br />

must be greater than the dropout voltage plus the output<br />

voltage. For a 200mV dropout LDO, the input voltage<br />

must be above 3.5V to produce a 3.3V output.<br />

With an LDO, the difference between input voltage and<br />

output voltage may be small, and the output voltage must<br />

be tightly regulated. Plus, transient response must be fast<br />

enough to handle loads that can go from zero to tens of<br />

amperes in nanoseconds. Further, output voltage can vary<br />

due to changes in input voltage, output load current, and<br />

temperature. Primarily, these output variations are caused<br />

by the effects of temperature on LDO voltage reference,<br />

error amplifier, and its sampling resistors (R1 and R2).<br />

SWITCH-MODE REGULATORS<br />

In many applications linear supplies have been superseded<br />

by switch-mode supplies. Shown in Fig. 2 is a typical isolated<br />

switch-mode supply. One widely used approach uses<br />

the on and off times of pulse-width modulation (PWM) to<br />

control the power switch output voltage. The ratio of on<br />

time to the switching period time is the duty cycle. The<br />

higher the duty cycle, the higher the power output from<br />

the power MOSFET switch. A low-pass filter connected<br />

to the output transformer provides a voltage proportional<br />

to the ON and OFF times of the PWM controller. In<br />

operation, a fraction of the dc output voltage feeds back to<br />

the error amplifier, which causes the comparator to control<br />

the PWM ON and OFF times. If the output voltage<br />

changes, the feedback adjusts the duty cycle to maintain<br />

the output voltage at the desired level.<br />

To generate the PWM signal, the error amplifier<br />

accepts the feedback signal input and a stable voltage<br />

reference to produce a output related to the difference<br />

V CC<br />

PWM<br />

controller<br />

ON<br />

OFF<br />

V OUT feedback<br />

<strong>Power</strong><br />

Switch<br />

Low-Pass Filter<br />

VOUT Fig. 2. Switch-mode power supply turns the input dc on and off, then rectifies it to obtain a dc output.<br />

L1<br />

C1<br />

R1<br />

R2<br />

of the two inputs. The comparator compares the error<br />

amplifier’s output voltage with the ramp (sawtooth) from<br />

the oscillator, producing a modulated pulse width. The<br />

comparator output is applied to the driver, whose output<br />

goes to the power MOSFET.<br />

The inductor-capacitor low pass output filter converts<br />

the switched voltage from the switching transformer to a<br />

dc voltage. The filter is not perfect so there is always some<br />

residual output noise called ripple. The amount of ripple<br />

depends on the effectiveness of the low pass filter at the<br />

switching frequency. <strong>Power</strong> supply switching frequencies<br />

can range between 100kHz to over 1MHz. Higher switching<br />

frequencies allow the use of lower value inductors and<br />

capacitors in the output low pass filter. However, higher<br />

frequencies can also increase power semiconductor losses,<br />

which reduce power supply efficiency.<br />

In terms of power dissipation, the power switch is key<br />

component in the switch-mode power supply. The switch<br />

is usually a power MOSFET that operates in only two<br />

states - on and off. In the off state the power switch draws<br />

very little current and dissipates very little power. In the<br />

on state the power switch draws the maximum amount<br />

of current, but its on-resistance is low, so in most cases its<br />

power dissipation is minimal. In the transition from the on<br />

state to the off state and off to on the power switch goes<br />

through its linear region where it consumes some power.<br />

The total losses for the power switch is therefore the sum<br />

of the on and off state losses plus the losses in the transition<br />

through its linear region.<br />

CONVERTER ICS<br />

ICs for switch-mode power supplies are found either of<br />

two basic configurations: converter and controller ICs.<br />

Converter ICs provide a complete dc-dc converter in a<br />

single package. The only required external components are<br />

usually passive devices. <strong>Power</strong> switches<br />

may be either a bipolar or MOSFET<br />

device capable of handling the required<br />

current and power. Typically, the power<br />

semiconductor switch turns on and off<br />

at a frequency that may range from 100<br />

kHz to 1 MHz, depending on the IC<br />

type. Most power switches employ pulse<br />

Load width modulation to control the output<br />

voltage, so the duty cycle varies according<br />

to the desired output voltage.<br />

A controller IC requires an external<br />

power switch, either a bipolar transistor<br />

or power MOSFET. The controller<br />

circuit that employs an external power<br />

switch usually has higher efficiency than<br />

the converter with an integrated power<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 25


VOLTAGEregulator ICs<br />

MOSFET because integrated<br />

MOSFETs have a higher onresistance<br />

(higher losses).<br />

On-resistance of an external<br />

power MOSFET is lower<br />

and the MOST usually has<br />

higher power output capa- V<br />

IN<br />

bility than an IC with an<br />

integrated MOSFET.<br />

For both converter and<br />

controller ICs, the switching<br />

frequency determines the<br />

physical size and value of<br />

filter inductors, capacitors,<br />

and transformers. The higher<br />

the switching frequency,<br />

the smaller the physical size<br />

and component values. To<br />

optimize efficiency, magnetic<br />

core material for the inductor and transformer should<br />

be consistent with the switching frequency. That is, the<br />

transformer/inductor core material should be chosen to<br />

operate efficiently at the switching frequency.<br />

<br />

FREE SAMPLES<br />

C1<br />

Switch Network<br />

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Fig. 3. An advantage of the charge pump is elimination of the magnetic fields<br />

and EMI that comes with an inductor or transformer.<br />

DC-DC converters<br />

accept a dc input and produce<br />

a dc output. They can<br />

be isolated or non-isolated,<br />

which depends on whether<br />

there is a direct dc path<br />

V from the input to the out-<br />

OUT<br />

put. An isolated converter<br />

(Fig. 2) employs a trans-<br />

C2 former to provide isolation<br />

between the input and<br />

output voltage. The nonisolated<br />

converter employs<br />

an inductor-capacitor filter<br />

and an optocoupler<br />

usually provides isolation<br />

between the output feedback<br />

and the input. For<br />

many applications, nonisolated<br />

converters are appropriate. An advantage of the<br />

transformer-based converter is that it has the ability to<br />

easily produce multiple output voltages using multiple<br />

secondary windings.<br />

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26 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


Initially, integrated power switch<br />

converters used bipolar power switches,<br />

but virtually all newer devices<br />

employ MOSFET power switches that<br />

improve efficiency. Another efficiency<br />

improvement is the use of integrated<br />

synchronous rectifiers consisting of<br />

power MOSFETs switches that rectify<br />

the power supply output and provide<br />

a dc output.<br />

Among the features found in converter<br />

and controller ICs:<br />

• Fixed or an adjustable output voltage<br />

• Single-ended or synchronous outputs<br />

• Soft-start that causes the output to come up gradually<br />

• Undervoltage lockout<br />

• Thermal shutdown<br />

• Overcurrent protection<br />

• Overvoltage protection<br />

CHARGE PUMP ICS<br />

Charge pumps are actually a different form of switching<br />

supply. They switch capacitors to provide dc-dc voltage<br />

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A major advantage<br />

of the charge pump<br />

is elimination of the<br />

magnetic fields and<br />

EMI that comes<br />

with an inductor or<br />

transformer.<br />

conversion using a switch network<br />

to charge and discharge one or more<br />

capacitors. The switch network toggles<br />

between charge and discharge states of<br />

the capacitors. As shown in Fig. 3,<br />

the “flying capacitor “ (C1) shuttles<br />

charge, and the “reservoir capacitor “<br />

(C2) holds charge and filters the output<br />

voltage. The basic charge pump<br />

lacks regulation, which is generally<br />

added using either linear regulation<br />

or charge-pump modulation. Linear<br />

regulation offers the lowest output<br />

noise, and therefore provides better<br />

performance. Charge-pump modulation offers more output<br />

current for a given die size (or cost), because the<br />

regulator IC need not include a series pass transistor.<br />

A major advantage of the charge pump is elimination<br />

of the magnetic fields and EMI that comes with an inductor<br />

or transformer. There is one possible EMI source - the<br />

high charging current that flows to a “flying capacitor”<br />

when it connects to an input source or another capacitor<br />

with a different voltage.<br />

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by Dean <strong>Technology</strong><br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 27


VOLTAGEregulator ICs<br />

Gate<br />

Drive<br />

MOSFET 2<br />

MOSFET 1<br />

V CC<br />

MULTIPLE OUTPUT CONVERTER/REGULATOR ICS<br />

Multiple output controller ICs consist of two or more<br />

regulators in a single package. They could be two switchmode<br />

converters or two LDO regulators.<br />

An example of a dual switch-mode regulator is a dual<br />

current mode PWM step-down dc-dc converter with<br />

internal 2 A power switches, this IC operates from a 3.6<br />

V to 25 V input, enabling it to regulate a wide variety<br />

of power sources such as four-cell batteries, 5 V logic<br />

rails, unregulated wall transformers, lead acid batteries<br />

and distributed-power supplies. The two regulators share<br />

common circuitry including input source, voltage reference<br />

and oscillator, but are otherwise independent. Their<br />

feedback loop controls the peak current in the switch during<br />

each cycle. This current mode control improves loop<br />

dynamics and provides cycle-by-cycle current limit.<br />

An example of a dual-output, low-dropout voltage<br />

regulator IC has integrated reset, power on reset (POR)<br />

and power good (PG) functions. Differentiated features,<br />

such as accuracy, fast transient response, supervisory<br />

circuit (power on reset), manual reset input, and independent<br />

enable functions provide a complete system solution.<br />

These voltage regulators have extremely low noise output<br />

performance without using any added filter bypass capacitors<br />

and are designed to have a fast transient response and<br />

usually stable with low ESR capacitors.<br />

This LDO family also can feature a sleep mode;<br />

applying a high signal to either enable input shuts down<br />

Regulator 1 or Regulator 2, respectively. Putting the regulators<br />

in the sleep mode reduces the input current at TJ =<br />

25°C. Each regulator, has an internal discharge transistor<br />

to discharge the output capacitor when the regulator is<br />

turned off (disabled).<br />

L<br />

C OUT<br />

V OUT<br />

Fig. 4. The synchronous rectifier is more efficient than a Schottky diode rectifier.<br />

Multiple output controller ICs can also consist of two<br />

or more charge pump converters in a single package. They<br />

can be controllers that employ external power switches or<br />

regulators with an internal power switch. One possibility<br />

is a 5 V output and a 3.3 V output for processor and logic<br />

applications.<br />

For example, a typical multiple output charge pump<br />

controller ICs can step-down dc-dc converters that produce<br />

two adjustable regulated outputs from a single 2.7 V<br />

to 5.5 V input. The IC uses switched capacitor fractional<br />

conversion to achieve a typical efficiency increase of 50%<br />

over that of a linear regulator. No inductors are required.<br />

The IC has two switched capacitor charge pumps to<br />

step down VIN to two regulated output voltages. The two<br />

charge pumps operate 180° out of phase to reduce input<br />

ripple. Regulation is achieved by sensing each output voltage<br />

through an external resistor divider and modulating<br />

the charge pump output current based on the error signal.<br />

A two-phase, non-overlapping clock activates the two<br />

charge pumps running them out of phase from each other.<br />

SYNCHRONOUS RECTIFICATION<br />

Efficiency is an important criterion in designing dc-dc converters,<br />

which requires low power. These losses are caused<br />

by the power switch, magnetic elements, and the output<br />

rectifier. Reduction in power switch and magnetics losses<br />

require components that can operate efficiently at high<br />

switching frequencies. Output rectifiers can be Schottky<br />

diodes, but synchronous rectification (Fig. 4) consisting of<br />

power MOSFETS provide higher efficiency.<br />

MOSFETs exhibit lower forward conduction losses<br />

than Schottky diodes. Unlike conventional diodes that<br />

are self-commutating, the MOSFETs turn on and off by<br />

means of a gate control signal synchronized with converter<br />

operation. The major disadvantage of synchronous<br />

rectification is the additional complexity and cost associated<br />

with the MOSFET devices and associated control<br />

electronics. At low output voltages, however, the resulting<br />

increase in efficiency more than offsets the cost disadvantage<br />

in most applications.<br />

UPCOMING TOPICS<br />

There are other key regulator topologies. Next month,<br />

we will discuss the two basic IC topologies employed in dc<br />

power sources: the step-down, or buck converter and the<br />

step-up, or boost converter. Buck topology is a non-isolated<br />

power management configuration whose advantages<br />

are simplicity and low cost. The boost converter employs<br />

a switching technique that causes current to build up in an<br />

inductor and then stores the resulting voltage in an output<br />

capacitor. Multiple switching cycles build the output<br />

capacitor voltage so that the output voltage is higher than<br />

the input.<br />

28 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


DESIGNfeature<br />

ROGER ALLAN, Contributing Editor<br />

Intelligent Energy Optimization<br />

System Slashes Electric Bills<br />

The SP1000 series of hybrid<br />

energy management and<br />

correction systems from<br />

PMI guarantees and quantifies<br />

kilowatt-hour savings<br />

by reducing losses in power<br />

delivery, identifying and<br />

reducing harmonics, correcting<br />

for system imbalance,<br />

increasing equipment<br />

efficiency, and optimizing<br />

power utilization.<br />

Engineers at <strong>Power</strong> Metrics International (PMI) looked at age-old<br />

problems with a new perspective when they devised a patentpending<br />

optimization technique for electric power management. The<br />

result was PMI’s SP1000A series of hybrid energy management and<br />

correction system that addresses inefficiencies in power delivery and<br />

usage. It guarantees and quantifies kilowatt-hour savings by reducing<br />

losses in power delivery, identifying and reducing harmonics, correcting<br />

for system imbalance, increasing equipment efficiency, and optimizing power<br />

utilization. Reductions in kilowatt-hours of 3% to 7% have been regularly observed.<br />

Total electric bill reductions of 8% to 15% have been achieved. User return on<br />

investment (ROI) typically ranges from 15 months to two years.<br />

The SP1000A continuously measures current, harmonics, load-source imbalances,<br />

and power factor at a rate of 128 samples per cycle, then corrects for these<br />

parameters “on the fly.” It also stores data in five-minute increments for more than<br />

15 months. It was designed and tested by PMI and manufactured by MHT, which<br />

produces high-efficiency lighting products. Table 1 lists the SP1000A data sheet<br />

The circuit board of the SP1000A uses a conventional off-the-shelf triac and<br />

state-of-the-art, proprietary, long-life switches (rated for on and off switching times<br />

of millions before burnout like other types do), as well as small capacitors (Fig. 1).<br />

It dissipates one-tenth the power of similar products during switching. The hybrid<br />

system is available in three versions:<br />

208-V SP1000A (10 kVAR)<br />

208-V SP1000B (17 kVAR)<br />

480-V SP1000E (30 kVAR)<br />

The system’s SPIDER (Sensor Perfect<br />

Interface Data Exchange Routines)<br />

software supports constant power-consumption<br />

monitoring and management.<br />

It gives users a “dashboard” view of readings<br />

in real time in charts. Also, it highlights<br />

issues like motor deterioration,<br />

allowing users to be proactive instead<br />

of reactive in their maintenance (Fig. 2).<br />

The system makes thousands of decisions<br />

per minute, based on what it is<br />

reading through external and internal<br />

current transmitters. It addresses harmonics,<br />

voltage imbalance, temperature<br />

rise and fall, loss of current, and other<br />

facility issues while increasing motor<br />

efficiency and reducing the operating<br />

temperature.<br />

Fig. 1. The SP1000 hybrid energy management and correction system board (top) and its capacitors (bottom)<br />

fit in an electrical subpanel. The system takes up little space yet saves a lot on electric bills.<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 29


ENERGYmanagement<br />

Underwriters Laboratories (UL) has<br />

approved the SP1000A system under Section<br />

508. According to PMI executive vice president<br />

Robert Turner, it is the only system on<br />

the market that can monitor, record, and<br />

quantify true kilowatt/kilowatt-hour savings<br />

at this price point. For more information<br />

on UL requirements, see the box “UL 508-<br />

Industrial Control Equipment”.<br />

The SP1000A also monitors each leg of<br />

a three-phase panel independently from the<br />

other two legs and then applies capacitance<br />

to each leg based on the load characteristics<br />

and arbitration between all governing<br />

parameters, according to the system’s inventor<br />

Hamid Pishdadian.<br />

Improved PFC also increases internal electrical system capacity, since unconnected<br />

power increases losses in the electrical distribution system and limits<br />

capacity for expansion. The voltage drop at the point of use also is improved.<br />

Voltages below equipment rating reduce efficiency, increase current, and reduce<br />

the motor’s starting torque.<br />

TABLE 1. SP1000A DATA SHEET<br />

Model SP1000 Family – Series – 1000 – SP1000A<br />

Phase Configuration<br />

(120/208 Wye-3Ø) L1 (Blue) L3(Black) Neutral (White) Ground<br />

(Green)<br />

Maximum Line 120/208 Volts<br />

Total Capacitance rated up to 180 μF per phase<br />

Monitoring Capabilities Metering for monitoring PF, I, V, KVAR, and THD<br />

KVAR Performance Range 0.05 to 3.0 per phase<br />

Frequency 50 – 60 Hertz<br />

Typical Protection<br />

(Not evaluated by UL LLC)<br />

Electrical Storms, Lightning Activity and <strong>Power</strong> Utility Spikes<br />

(Units are not intended to take the place of designed <strong>Power</strong> Surge<br />

Equipment)<br />

Protected 10,000 AFC per UL-810<br />

Lightning Stroke Protection<br />

(Not evaluated by UL LLC)<br />

Fig. 2. An hourly view of the SP1000 hybrid energy management and correction system provides a<br />

view of how a facility’s current levels (red) correspond with the power consumed in kilowatts (blue).<br />

Metal Oxide Varistors – with Transient voltage Suppressors on separate<br />

MOV board for internal use only.<br />

Circuit Breaker Required<br />

30 A - 3Ø Breaker or NEC approved isolation device (External to<br />

unit)<br />

Low Losses 1.2 watt per KVAR<br />

Dissipation Factor 0.1% at 60 Hz and 25 °C, 1% at1,000 Hz and 25 °C<br />

Insulation Resistance 500 MΩ per μF<br />

Human Protection<br />

Capacitor terminals isolated from human contact. All high voltage<br />

shielded from contact.<br />

Operating Temperature Range<br />

Capactiors: -16 °C to +70 °C (Unit rating ambient temperature at<br />

50 °C)<br />

Dimensions (LxHxD) 16” x 12” x 16” Metal Enclosure UL Listed<br />

Operating Life<br />

60,000 hours with >94% survival (Capacitors switched by electronics<br />

in separate bank configuration)<br />

General Enclosure UL Listed NEMA-1 Enclosure 16 Ga. H.R.P. & O. (1.4 mm)<br />

Wire Rating: 600 Volts THHN – Gasoline & Oil Resistant 11<br />

Wire Gauge THHN – 10 Gauge wire<br />

Unit Weight 30 lbs.<br />

UL 508 - INDUSTRIAL<br />

CONTROL EQUIPMENT<br />

REQUIREMENTS cover industrial control<br />

devices, and devices accessory thereto,<br />

for starting, stopping, regulating, controlling,<br />

or protecting electric motors. These<br />

requirements also cover industrial control<br />

devices or systems that store or process<br />

information and are provided with an output<br />

motor control function(s). This equipment<br />

is for use in ordinary locations in<br />

accordance with the National Electrical<br />

Code, NFPA 70.<br />

These requirements cover devices<br />

rated 1500 volts or less. Industrial control<br />

equipment covered by these requirements<br />

is intended for use in an ambient temperature<br />

of 0 - 40°C (32 - 104°F), unless<br />

specifically indicated for use in other<br />

conditions.<br />

A product that contains features, characteristics,<br />

components, materials, or systems<br />

new or different from those covered<br />

by the requirements in this standard, and<br />

that involves a risk of fire or of electric<br />

shock or injury to persons shall be evaluated<br />

using appropriate additional component<br />

and end-product requirements to maintain<br />

the safety level as originally anticipated by<br />

the standard. A product whose features,<br />

characteristics, components, materials, or<br />

systems conflict with specific provisions<br />

of this standard does not comply with this<br />

standard. Revised shall be proposed and<br />

adopted in conformance with the methods<br />

employed for development, revision, and<br />

implementation of this standard.<br />

30 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


PETinnovations<br />

RAJAKRISHNAN RADJASSAMY, Texas Instruments<br />

Gas Gauge IC Monitors Lead-Acid Battery<br />

State-Of-Health, State-Of-Charge<br />

THE bq34z110 gas gauge IC from Texas<br />

Instruments provides accurate operating data for<br />

lead- acid batteries, a capability not available from<br />

other sources. This 14-pin IC (Fig. 1) is the industry’s<br />

only scalable gas gauge device that supports multi-cell<br />

lead-acid battery packs with battery voltages of 4 V, 12 V,<br />

24 V, 48 V and higher.<br />

Until recently, it has been difficult to<br />

accurately measure and report a lead-acid<br />

battery’s current capacity. This could<br />

frustrate the end user, and require<br />

more batteries to ensure an adequate<br />

output load. The bq34z110<br />

solves this problem by employing<br />

T.I.’s proprietary Impedance Track<br />

algorithm that uses voltage, current,<br />

temperature measurements, and battery characteristics,<br />

to assess battery state-of-charge within 1% error<br />

over normal operating conditions.<br />

Fig. 2 shows a typical bq34z110 circuit implementation.<br />

The bq34z110 gauge continuously informs the user about<br />

a lead-acid battery’s state-of-health and state-of-charge and<br />

maintains up to a 95-percent accurate capacity measurement<br />

for the battery’s entire life. This information prevenqts<br />

premature shutdown and increases longevity of the battery<br />

and end equipment. An associated host processor can<br />

interrogate the gas gauge to obtain cell information, such as<br />

remaining capacity, full charge capacity, and average current.<br />

Table 1 lists the recommended operating conditions.<br />

Standard Commands in the bq34z110 access battery<br />

information, with additional capabilities provided by an<br />

Extended Commands set. Both sets of commands are used<br />

to read and write information contained within the IC’s<br />

control and status registers, as well as its data flash locations.<br />

Commands are sent from the host to the fuel gauge<br />

IC using HDQ or I2C serial communications engines that<br />

can execute during application development, pack manufacture,<br />

or end-equipment operation.<br />

The 2-byte Standard Commands consist of two data<br />

bytes. Two consecutive HDQ or I2C transmissions must<br />

be executed to initiate the command function and to read<br />

or write the corresponding two bytes of data. Also, two<br />

block commands are available to read the manufacturer<br />

name and device chemistry.<br />

Also included in the bq34z110 are 32 bytes of userprogrammable,<br />

non-volatile data flash memory, accessible<br />

via its data flash interface. The data flash memory contains<br />

initialization, default, cell status, calibration, configuration,<br />

and user information. Cell information is stored in<br />

this non-volatile flash memory. Many of these data<br />

flash locations are accessible during application development<br />

and pack manufacture. They cannot, generally, be<br />

accessed directly during end-equipment operation.<br />

Access to these locations is achieved<br />

by either use of companion evaluation<br />

software, through individual commands,<br />

or through a sequence of data-flash-access<br />

commands.<br />

Most data flash locations, however, can only<br />

accessible in UNSEALED mode by<br />

Fig 1. bq34z110 is a use of the evaluation software or<br />

scalable power management by data flash block transfers. These<br />

device that supports multi- locations should be optimized and/<br />

cell lead-acid battery packs.<br />

or fixed during the development<br />

and manufacture processes. They<br />

become part of a Golden Image File and can then be written<br />

to multiple battery packs. Once established, the values<br />

generally remain unchanged or get updated by the gauge<br />

algorithm during end equipment operation.<br />

Two security modes control data flash access permissions:<br />

• Public Access refers to those data flash locations that are<br />

accessible to the user.<br />

• Private Access refers to reserved data flash locations used<br />

by the bq34z110.<br />

FUEL GAUGING<br />

The bq34z110 measures cell voltage, temperature, and<br />

current to determine the battery state of charge (SOC)<br />

based on the Impedance Track algorithm. It monitors<br />

charge and discharge activity by sensing the voltage across<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 31


PETinnovations<br />

a resistor (5 mΩ to 20 mΩ , typical)<br />

between the SRP and SRN pins<br />

and in-series with the cell. By integrating<br />

charge passing through the<br />

battery, the cell’s SOC is adjusted<br />

during battery charge or discharge.<br />

When an application’s load is<br />

applied, cell impedance is measured<br />

by comparing its Open<br />

Circuit Voltage (OCV) with its<br />

measured voltage under loading<br />

conditions. The total battery capacity<br />

is found by comparing states of<br />

charge before and after applying<br />

the load with the amount of charge<br />

passed. When an application load<br />

is applied, the impedance of the<br />

cell is measured by comparing the<br />

OCV obtained from a predefined<br />

function for present SOC with the<br />

measured voltage under load. Measurements of OCV and<br />

charge integration determine chemical state of charge and<br />

Chemical Capacity (Qmax).<br />

The bq34z110 can use an NTC thermistor (default is<br />

Semitec 103AT or Mitsubishi BN35-3H103FB-50) for<br />

temperature measurement, or can also be configured to<br />

use its internal temperature sensor. It uses temperature to<br />

monitor the battery-pack environment, which is used for<br />

fuel gauging and cell protection functionality.<br />

To minimize power consumption, the bq34z110 has<br />

three power modes: NORMAL, SLEEP, and FULL<br />

SLEEP. The bq34z110 passes automatically between<br />

these modes, depending upon the occurrence of specific<br />

events. Multiple modes are available for configuring from<br />

one to 16 LEDs as an indicator of remaining state of<br />

charge. More than four LEDs require the use of one or<br />

two inexpensive SN74HC164 shift register expanders. A<br />

SHA-1 or HMAC-based battery pack authentication feature<br />

is also implemented on the bq34z110. When the IC<br />

is in UNSEALED mode, authentication keys can be (re)<br />

assigned. Alternatively, keys can also be programmed permanently<br />

in secure memory. A scratch pad area receives<br />

challenge information from a host and also to export<br />

SHA-1/HMAC encrypted responses.<br />

The bq34z110 has two flags accessed by the Flags()<br />

function that warns when the battery’s SOC has fallen to<br />

critical levels. When RemainingCapacity() falls below the<br />

first capacity threshold, specified in SOC1 Set Threshold,<br />

the [SOC1] (State of Charge Initial) flag is set. The<br />

flag is cleared once RemainingCapacity() rises above<br />

SOC1 Clear Threshold. All units are in mAh. When<br />

RemainingCapacity() falls below the second capacity<br />

TABLE 1. RECOMMENDED OPERATING CONDITIONS<br />

FUNCTION PARAMETER CONDITIONS MIN TYP MAX UNIT<br />

V REGIN<br />

C REGIN<br />

C LDO25<br />

I CC<br />

I SLP<br />

I SLP+<br />

Supply Voltage<br />

External input capacitor<br />

for internal LDO between<br />

REGIN and VSS<br />

External output capacitor<br />

for internal LDO between<br />

VCC and VSS<br />

NORMAL operating mode<br />

current<br />

SLEEP operating mode<br />

current<br />

FULL SLEEP operating<br />

mode current<br />

No operating restrictions 2.7 4.5 V<br />

No Flash writes 2.45 2.7 V<br />

Normal capacitor values<br />

specified. Recommend a<br />

10% ceramic X5R type<br />

capacitor located close to<br />

the device.<br />

Gas gauge in<br />

NORMAL mode<br />

ILOAD = Sleep current<br />

Gas gauge in SLEEP mode<br />

ILOAD = Sleep current<br />

Gas gauge in<br />

FULL SLEEP mode<br />

ILOAD = Sleep current<br />

TA = 25°C, C LDO25 = 1μF, V REGIN = 3.6 V (unless otherwise noted)<br />

0.1 μF<br />

0.47 1 μF<br />

140 μA<br />

64 μA<br />

19 μA<br />

threshold, SOCF Set Threshold, the [SOCF] (State of<br />

Charge Final) flag is set, serving as a final discharge warning.<br />

If SOCF Set Threshold = –1, the flag is inoperative<br />

during discharge. Similarly, when RemainingCapacity()<br />

rises above SOCF Clear Threshold and the [SOCF] flag<br />

has already been set, the [SOCF] flag is cleared. All units<br />

are in mAh.<br />

The bq34z110 has two additional flags accessed by<br />

the Flags() function that warn of internal battery conditions.<br />

The fuel gauge monitors the cell voltage during<br />

relaxed conditions to determine if an internal short has<br />

been detected. When this condition occurs, [ISD] will<br />

be set. The bq34z110 also has the capability of detecting<br />

when a tab has been disconnected in a 2-cell parallel<br />

system by actively monitoring the state of health. When<br />

this condition occurs, [TDD] is set. Lead-Acid gauging in<br />

the charge direction makes use of four Charge Efficiency<br />

factors to correct for energy lost due to heat. Lead-Acid<br />

charge efficiency is not linear throughout the charging<br />

process, as it drops with increasing state of charge.<br />

X10 MODE<br />

The bq34z110 supports high current and high capacity<br />

batteries above 32.76 Amperes and 32.76 Ampere-Hours<br />

by switching to a times-ten mode where currents and<br />

capacities are internally handled correctly, but various<br />

reported units and configuration quantities are rescaled to<br />

tens of milliamps and tens of milliamp-hours. The need<br />

for this is due to the standardization of a two byte data<br />

command having a maximum representation of ±32767.<br />

When the X10 bit (Bit 7) is set in the Pack Configuration<br />

register, all of the mAh, cWh, and mWh settings will take<br />

32 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


on a value of ten times normal. When this bit is set, the<br />

actual units for all capacity and energy parameters will<br />

be 10 mAh or Wh. This includes reporting of Remaining<br />

Capacity. This bit will also be used to rescale the current<br />

reporting to 10 times normal, up to ±327 A. The actual<br />

resolution then becomes 10 mA.<br />

It is important to know that setting the X10 flag does<br />

not actually change anything in the operation of the<br />

gauge. It serves as a notice to the host that the various<br />

reported values should be reinterpreted ten times higher.<br />

X10 Current measurement is achieved by calibrating the<br />

current gain to a value X10 lower than actually applied.<br />

Because the flag has no actual effect, it can be used to<br />

represent other scaling values.<br />

VOLTAGE DIVISION AND CALIBRATION<br />

The bq34z110 is shipped with factory configuration for<br />

the default case of 2-series lead-acid cell. This can be<br />

changed by setting the number of series cells in the data<br />

flash configuration section.<br />

Multi-cell applications, with voltages up to 65535<br />

mV may be gauged by using the appropriate input<br />

scaling resistors such that the maximum battery voltage,<br />

under all conditions, appears at the BAT input as<br />

approximately 900 mV. The actual gain function is<br />

determined by a calibration process and the resulting<br />

PACK+<br />

I<br />

PROG<br />

2 C<br />

HDQ COMM<br />

ALERT<br />

PACK–<br />

CE<br />

REGIN<br />

P1<br />

P2<br />

P3/DAT<br />

P4/CLK<br />

P5/HDQ<br />

optional to reduce divider power consumption<br />

TYPICAL IMPLEMENTATION<br />

BAT<br />

VEN<br />

REG 25<br />

P6/TS<br />

SRP<br />

SRN<br />

VSS<br />

Fig 2. Typical implementation of bq34z110 for lead-acid battery.<br />

voltage calibration factor is stored in the data flash location<br />

Voltage Divider.<br />

For two-cell applications, an external divider network<br />

is not required. Inside the IC, behind the BAT pin is a<br />

nominal 5:1 voltage divider with 88 KΩ in the top leg<br />

and 22 KΩ in the bottom leg. This internal divider network<br />

is enabled by clearing the VOLTSEL bit in the Pack<br />

Configuration register. This ratio is optimum for directly<br />

measuring a dual cell lead-acid cell where charge voltage<br />

is limited to 5 V max.<br />

For higher voltage applications, an external resistor<br />

divider network should be implemented as per the<br />

reference designs in this document. The quality of the<br />

divider resistors is very important to avoid gauging errors<br />

over time and temperature. It is recommended to use<br />

0.1% resistors with 25 ppm temperature coefficient.<br />

Alternately, a matched network could be used that tracks<br />

its dividing ratio with temperature and age due to the<br />

similar geometry of each element.<br />

AUTO CALIBRATION<br />

The bq34z110 provides an auto calibration feature that<br />

will measure the voltage offset error across SRP and SRN<br />

from time-to-time as operating conditions change. It subtracts<br />

the resulting offset error from normal sense resistor<br />

voltage, VSR, for maximum measurement accuracy.<br />

The gas gauge performs<br />

a single offset<br />

calibration when (1) the<br />

interface lines stay low<br />

for a short time. The<br />

bq34z110 can act as a<br />

SHA-1 and HMAC<br />

authentication slave by<br />

using its internal engine.<br />

Sending a 160-bit SHA-1<br />

challenge message to the<br />

bq34z110 causes the IC<br />

to return a 160-bit digest,<br />

based upon the challenge<br />

message and hidden<br />

plain-text authentication<br />

keys. When this digest<br />

matches an identical one,<br />

generated by a host or<br />

dedicated authentication<br />

master (operating on the<br />

same challenge message<br />

and using the same plain<br />

text keys), the authentication<br />

process is successful.<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 33<br />

**<br />

**<br />

n Series Cells<br />

Sense<br />

Resistor


PETinnovations<br />

EVALUATION MODULE<br />

The bq34z110EVM evaluation module (Fig.<br />

3) is a complete evaluation system for the<br />

bq34z110 wide-range fuel gauge for lead-acid<br />

chemistries when combined with an EV2300<br />

USB adapter and Windows®-based PC software,<br />

downloadable from the TI.com website.<br />

The circuit module includes one bq34z110<br />

integrated circuit (IC) and all other components<br />

necessary to monitor and predict capacity<br />

in 2 or more series cell Lead Acid battery<br />

packs. The circuit module connects directly<br />

across the battery.<br />

With the EV2300 interface adapter and<br />

software, it is possible to read the bq34z110<br />

data registers, program the chip for different<br />

pack configurations, log cycling data for further<br />

evaluation, and evaluate the overall functionality<br />

of the bq34z110 solution under different<br />

charge and discharge conditions.<br />

600V XPT IGBTs<br />

Short Circuit Capability<br />

Rugged.Effecient.Reliable<br />

Part<br />

Number<br />

IXXH50N60C3D1<br />

IXXA50N60B3<br />

IXXR100N60B3H1<br />

IXXH30N65B4<br />

IXXK160N65C4<br />

IXXX160N65B4<br />

IXYN100N120C3H1<br />

IXYH82N120C3<br />

IXYK100N120C3<br />

V ces<br />

(V)<br />

600<br />

600<br />

600<br />

650<br />

650<br />

650<br />

1200<br />

1200<br />

1200<br />

I C25<br />

T C =25 O C<br />

(A)<br />

100<br />

120<br />

145<br />

65<br />

290<br />

310<br />

134<br />

160<br />

188<br />

For more parts, visit www.ixys.com<br />

V ce(sat)<br />

max<br />

T J =25 O C<br />

(V)<br />

2.3<br />

1.8<br />

1.8<br />

0.2<br />

2.1<br />

1.8<br />

3.5<br />

3.2<br />

3.5<br />

t fi<br />

typ<br />

(ns)<br />

42<br />

135<br />

150<br />

57<br />

30<br />

90<br />

110<br />

93<br />

110<br />

650V XPT Trench IGBTs<br />

Short Circuit Capability<br />

Low-on-State Voltage<br />

E off typ<br />

TJ=125 O C<br />

*TJ=150 O C<br />

(mJ)<br />

*0.48<br />

*1.2<br />

*2.8<br />

0.6<br />

1.3<br />

2.36<br />

3.55<br />

3.7<br />

3.55<br />

R thjc<br />

max<br />

( O C/W)<br />

0.25<br />

0.25<br />

0.31<br />

0.65<br />

0.16<br />

0.16<br />

0.18<br />

0.12<br />

0.13<br />

Package<br />

Style<br />

TO-247<br />

TO-263<br />

ISOPLUS247<br />

TO-247<br />

TO-264<br />

PLUS247<br />

SOT-227<br />

TO-247<br />

TO-264<br />

<strong>Power</strong> Inverter Switch Mode <strong>Power</strong> Supply<br />

Battery Charger Welding Machine<br />

EUROPE<br />

IXYS GmbH<br />

marcom@ixys.de<br />

+46 (0) 6206-503-249<br />

www.ixys.com<br />

USA<br />

IXYS <strong>Power</strong><br />

sales@ixys.com<br />

+1 408-457-9042<br />

1200V XPT IGBTs<br />

High-Speed Hard-Switching<br />

Low Gate Drive Requirement<br />

ASIA<br />

IXYS Taiwan/IXYS Korea<br />

sales@ixys.com.tw<br />

sales@ixyskorea.com<br />

34 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com<br />

TO-264<br />

TO-220<br />

Fig 3. Evaluation module fuel<br />

gauge for lead-acid chemistries<br />

employs an EV2300<br />

USB adapter and Windows®based<br />

PC software.<br />

PLUS247<br />

SOT-227<br />

TO-247<br />

Uninterruptible <strong>Power</strong> Supply


NEWproducts<br />

■14-Bit, 4.5Msps SAR Analog-to-Digital Converter<br />

THE LTC2314-14 from Linear <strong>Technology</strong> is a 14-bit 4.5Msps<br />

successive approximation register (SAR) ADC in a tiny 8-lead<br />

TSOT-23 package, offering up to 90% reduction in size over<br />

competing solutions for space-conscious applications. This small<br />

SAR ADC integrates a precision 2.048 V/4.096 V reference with<br />

7 ppm/°C typical and guaranteed<br />

20 ppm/°C maximum temperature<br />

coefficient into an 8mm² footprint.<br />

The LTC2314-14 operates from a<br />

3 V or 5 V supply and features the<br />

lowest power dissipation (18 mW<br />

at 3 V or 31 mW at 5 V) compared<br />

to other competitive parts on the<br />

market. With its serial SPI interface,<br />

tiny footprint and very low power<br />

dissipation, the LTC2314-14 is ideal for a wide range of portable<br />

and space-constrained applications, including medical devices,<br />

communications systems and battery-operated systems.<br />

Also available is the LTC2315-12, a 12-bit pin- and softwarecompatible<br />

version of the LTC2314-14, featuring a fast 5Msps<br />

sample rate. The LTC2314-14 and LTC2315-12 lead a family of<br />

14- and 12-bit SAR ADCs featuring sample rates from 500 ksps<br />

■Online IGBT Product Selector and Performance Evaluator<br />

Tool Simplifies Device Selection and Optimization<br />

INTERNATIONAL RECTIFIER, IR® has enhanced its Insulated Gate Bipolar Transistor<br />

(IGBT) selection tool that enables design optimization in a wide range of applications<br />

including motor drives, uninterruptable power supplies (UPS), solar inverters, and welding.<br />

IR’s enhanced IGBT selection tool evaluates application conditions including bus<br />

voltage, load current, switching frequency, short-circuit requirements, package and<br />

thermal system. New features include<br />

customizable thermal constraint setting<br />

and Current vs. Frequency output chart<br />

that conveniently compare devices over<br />

a range of operating conditions.<br />

Located at http://mypower.irf.com/<br />

IGBT, the IGBT selection tool returns<br />

a shortlist of products that meet or<br />

exceed the application parameters entered by the user. The products are ranked by<br />

performance with losses and junction temperature for the specified operating condition<br />

to help facilitate the selection process.<br />

IGBT selection requires evaluation of many parameters that cannot be simplified into<br />

a single metric, as switching losses can be traded for conduction losses. To address<br />

this problem, IR’s product selection tool generates a Current vs. Frequency graph that<br />

provides a powerful indication of the relative performance of different IGBTs. With this<br />

information the designer can select the most cost-effective IGBT for the application.<br />

International Rectifier<br />

El Segundo, CA<br />

http://www.irf.com<br />

to 5 Msps with 77.5 dB SNR at 14 bits and 73 dB SNR at 12<br />

bits resolution. Accurate DC specifications include a maximum<br />

INL and DNL of ±3.75 LSB and ±0.99 LSB at 14-bits, and<br />

±1.25 LSB and ±0.99 LSB at 12-bits, respectively. The complete<br />

LTC2314 SAR ADC family offers single-ended unipolar<br />

inputs, small 8-lead TSOT-23<br />

packages, precision integrated<br />

reference and low power dissipation<br />

with flexible 3V or 5V supply<br />

operation, along with nap and<br />

sleep modes for optimizing the<br />

power within a system.<br />

The LTC2314-14 and<br />

LTC2315-12 are available today<br />

in commercial, industrial and<br />

automotive (-40 °C to 125 °C) temperature grades. Pricing<br />

begins at $9.52 each for the LTC2314-14 and $5.17 each<br />

for the LTC2315-12 in 1,000-piece quantities. The DC1563A<br />

evaluation board for the LTC2314 SAR ADC family is available.<br />

Linear <strong>Technology</strong><br />

Milpitas, CA<br />

http://www.linear.com<br />

■Miniature Through-Hole<br />

<strong>Power</strong> MOSFETs<br />

ADVANCED POWER <strong>Electronics</strong> Corp.<br />

(USA), launched a new series of power<br />

MOSFETs in the popular TO-92 throughhole<br />

package which is widely used in commercial<br />

and industrial applications where<br />

PCB space is at a premium.<br />

Ideally suited for low current applications<br />

such as small switch power supplies and<br />

load switches, the AP4002T N-channel<br />

enhancement-mode power MOSFETs feature<br />

fast switching characteristics and a low gate<br />

charge. BVDSS is 600 V, RDS(on) is 5 ohm,<br />

and ID is 400 mA. Devices also feature<br />

ROHS-compliant, halogen-free packaging.<br />

Advanced <strong>Power</strong> <strong>Electronics</strong> Corp.<br />

San Jose, CA<br />

http://www.a-powerusa.com<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 35


NEWproducts<br />

■UL913 Certified Fuse For Intrinsically Safe Apparatus<br />

LITTELFUSE, INC. has introduced the PICO® 259-UL913 Series<br />

Intrinsically Safe Fuse, reportedly the first fuse to be certified under<br />

the latest revision of the UL913 Safety Standard for Intrinsically<br />

Safe Apparatus and Associated Apparatus for Use<br />

in Class I, II, and III, Division 1, Hazardous<br />

(Classified) Locations. The PICO 259-<br />

UL913 Series is a range of encapsulated,<br />

hermetically sealed fuses that are<br />

ideal for 125 V applications in the oil,<br />

gas, mining, chemical, pharmaceutical, and<br />

food/beverage processing industries.<br />

The use of devices that are certified to<br />

be Intrinsically Safe (IS) is a requirement<br />

of operating electronic equipment in potentially<br />

explosive areas. The PICO 259-UL913<br />

Series Fuse is suitable for use in testing, measuring<br />

or processing electronic and electrical equipment, motor<br />

controllers, lighting, communication handsets, flow meters, process<br />

control and automation, sensors and other intrinsically safe<br />

Holy Stone<br />

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in <strong>Power</strong> Applications<br />

High Capacitance X7R for<br />

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High Voltage Capacitors for<br />

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High Capacitance MLCCs<br />

for DC/DC smoothing<br />

High Voltage and Safety<br />

Certified for Chargers<br />

and Adapters<br />

Stacked, High C/V for Switch<br />

Mode <strong>Power</strong> Supplies<br />

Holy Stone MLCCs are available with<br />

Arc Prevention Coating and SuperTerm, polymer<br />

layer that reduces the risk of internal cracks.<br />

Holy Stone Enterprise Co., Ltd.<br />

Tel: 951-696-4300 Fax: 951-696-4301<br />

info@holystonecaps.com www.holystonecaps.com<br />

In Europe: www.holystoneeurope.com In Asia: www.holystone.com.tw<br />

apparatus designed to operate in these hazardous locations. The<br />

PICO 259-UL913 Series Fuse and its encapsulant prevent heat<br />

and sparks from being exposed to the hazardous gases or dust in<br />

the environment. The Fuse is suitable for use in intrinsically safe<br />

apparatus for voltages not exceeding 125 Vrms (190 V peak). In<br />

addition to the Underwriters Laboratories, Inc. standard, these<br />

fuses meet ATEx, IECEx, and Baseefa requirements.<br />

Features<br />

• Hermetically sealed, encapsulated design<br />

• Well suited for 125 V applications<br />

• Current rating options from 62 mA to 5 A<br />

• Designed for operation in a range of hazardous environments<br />

• RoHS compliant<br />

Littelfuse PICO 259-UL913 Series Intrinsically Safe Fuses are<br />

packaged in bulk in quantities of 10 or 1,000 pieces. Samples<br />

are available now for bulk orders.<br />

Littelfuse Inc.<br />

Chicago, IL<br />

http://www.littelfuse.com.<br />

■Compact DC/DC Converters<br />

AVAILABLE IMMEDIATELY from Micro<strong>Power</strong> Direct, the<br />

G200EI series is a family of compact 2W, EN 60950 approved<br />

DC/DC converters. These converters are specifically designed<br />

for board level power applications that require small size, robust<br />

operation, high input/output isolation levels and low cost.<br />

Twenty one standard models operate from inputs of 5, 12<br />

or 24 VDC, providing single and dual outputs of 5, 9, 12,<br />

15, ±5, ±12, or ±15 VDC.<br />

Standard features include<br />

an input/output isolation of<br />

3,000 VDC, efficiency as<br />

high as 85%, and low noise<br />

operation. The MTBF (per<br />

MIL HDBK 217F) of the<br />

G200EI series is greater<br />

than 3.5 Mhours. All models<br />

are approved to EN 60950 and are RoHS compliant.<br />

The G200EI family is packaged in a miniature, Mini-DIP<br />

case that is only 0.787 x 0.394 x 0.4 in. The pin-out is industry<br />

standard and all case materials meet UL94-VO. Each model<br />

is specified for operation over the wide operating industrial<br />

temperature range of -40 °C to +85 °C with no derating or heat<br />

sinking required. The G200EI series is an ideal solution for a<br />

variety of board level power applications requiring small size,<br />

robust performance, and high reliability.<br />

Micro<strong>Power</strong> Direct<br />

Stoughton, MA<br />

http://www.micropowerdirect.com<br />

36 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


■Mercury-Free Nickel Zinc<br />

Batteries Meet OEM Needs<br />

ANNOUNCED BY VARTA Microbattery<br />

is the new mercury-free primary Nickel<br />

Zinc (NiOOH) Battery Systems. VARTA<br />

Microbattery’s nickel zinc cells are developed<br />

as an ideal cost effective and highly<br />

reliable substitute to conventional primary<br />

silver oxide (Ag2O) button cells. The cells<br />

are manufactured with high quality raw<br />

materials, unparalleled leakage protection,<br />

size, shape, and quality standards equivalent<br />

to VARTA Microbattery’s popular mercury-free<br />

primary SR Silver Oxide (Ag2O)<br />

System. As nickel zinc cell pricing is not<br />

tied to the volatility inherent in the silver<br />

market, end product pricing for retailers and<br />

OEMs is not adversely effected by material<br />

cost fluctuations.<br />

VARTA Microbattery’s nickel zinc cells<br />

may be specified for use in a wide range<br />

of miniature, low voltage<br />

power source applications<br />

in which highreliability,ecofriendlymercury-free<br />

cells<br />

are required.<br />

The ZR Nickel Zinc (NiOOH)<br />

System is particularly suited for watches<br />

(analog and digital) as it notably complies<br />

with the requirements of the international<br />

IEC 60086-3 standard for watch batteries.<br />

Moreover, the cells are highly appropriate<br />

for use in such medical devices as blood<br />

sugar indicators, insulin pumps and thermometers,<br />

as well as in electronic calculators,<br />

laser pointers, toys, and remote control<br />

applications.<br />

The nickel zinc cells feature a voltage level<br />

of 1.65V and are available with 8 mAh to<br />

130 mAh capacity, in heights ranging from<br />

2.10mm to 5.4mm, and in weights from<br />

0.23 g to 2.33 g. The cells additionally<br />

boast a stable discharge curve, good pulse<br />

load behavior, and an EOL detection feature<br />

for watch applications. For more detailed<br />

information regarding VARTA Microbattery’s<br />

cells and configurations, visit http://www.<br />

varta-microbattery.com/en/products/batteries-cells-configurations.html.<br />

Pricing for VARTA Microbattery’s mercury-free<br />

primary ZR Nickel Zinc (NiOOH)<br />

Button 364 Cell starts at $0.13 each in<br />

quantities of 10,000. Delivery time is to<br />

2-4 weeks.<br />

VARTA Microbattery<br />

White Plains, NY<br />

http://www.varta-microbattery.com<br />

www.powerelectronics.com June 2013 | <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> 37


POWERelectronics<br />

SAM DAVIS, Senior Technical Editor<br />

POWER BRIDGE CIRCUIT FOR BI-DIRECTIONAL<br />

INDUCTIVE SIGNALING<br />

Issued: May 7, 2013<br />

United States Patent 8,437,695<br />

An inductive signal interface comprises a coil assembly including one or<br />

more inductive coils, a bridge circuit including a plurality of switches,<br />

and control circuitry. The control circuitry is configured to individually<br />

operate the plurality of switches to enable the inductive signal interface<br />

to dynamically switch between a power-transmit mode and a power<br />

receive mode.<br />

Inventors: Chatterjee; Manjirnath (San Francisco, CA), Lehr; Michael<br />

(Sunnyvale, CA), Shaffer; Dyke (Santa Rosa, CA)<br />

Assignee: Hewlett-Packard Development Company, L.P. (Houston, TX)<br />

Appl. No.: 12/841,001<br />

Filed: July 21, 2010<br />

WIDE INPUT VOLTAGE RANGE POWER FACTOR<br />

CORRECTION CIRCUIT<br />

Issued: May 7, 2013<br />

United States Patent 8,436,593<br />

A boost circuit is used for power factor correction (PFC). In a low power<br />

application, transition mode control is utilized. However, switching frequency<br />

varies with different input voltages, and over a wide input voltage<br />

range, the switching frequency can become too high to be practical. To<br />

address this issue, a boost circuit is provided whose effective inductance<br />

changes as a function of input voltage. By changing the inductance, control<br />

is exercised over switching frequency.<br />

Inventors: Shao; Jianwen (Hoffman Estates, IL), Hopkins; Thomas Lea<br />

R. (Mundelein, IL)<br />

Assignee: STMicroelectronics, Inc. (Coppell, TX)<br />

Appl. No.: 13/023,072<br />

Filed: February 8, 2011<br />

BATTERY CELL EQUALIZER SYSTEM<br />

Issued: May 7, 2013<br />

United States Patent 8,436,582<br />

A method of operating a battery system includes a plurality of battery<br />

cells coupled in series. The plurality of cells includes at least three battery<br />

cells coupled in series. The method includes determining a cell with the<br />

greatest charge excess of the plurality of battery cells. The method further<br />

includes determining a cell with the greatest charge deficit of the plurality<br />

of battery cells. The method further includes discharging the cell with the<br />

greatest charge excess to charge, with a voltage converter, the cell with the<br />

greatest charge deficit.<br />

Inventors: Pigott; John M. (Phoenix, AZ)<br />

Assignee: Freescale Semiconductor, Inc. (Austin, TX)<br />

Appl. No.: 12/833,430<br />

Filed: July 9, 2010<br />

SYSTEMS AND METHODS FOR IMPROVED<br />

OVER-CURRENT CLIPPING<br />

Issued: May 7, 2013<br />

United States Patent 8,437,478<br />

Systems and methods for implementing over-current protection include<br />

reducing a clip level while an over-current condition is being detected.<br />

Once the over-current condition is no longer detected, the clip level is<br />

maintained for a specified period before allowing the clip level to be<br />

increased. In an embodiment, the specified period, for which the clip level<br />

is maintained before the clip level is allowed to be increased, starts when<br />

the over-current condition is no longer detected, and ends when each of<br />

N immediately preceding sample(s) of the audio signal are not clipped to<br />

the clip level, where N is an integer. After an over-current condition is no<br />

longer detected, and after the clip level has been maintained for the specified<br />

period, the clip level can be increased if an over-current condition is<br />

not detected for a sample and the clip level is below a specified maximum<br />

clip level.<br />

Inventors: Kost; Michael A. (Cedar Park, TX)<br />

Assignee: Intersil Americas Inc. (Milpitas, CA)<br />

Appl. No.: 13/284,723<br />

Filed: October 28, 2011<br />

LEVEL CONVERTER CIRCUIT FOR USE IN CMOS CIRCUIT<br />

DEVICE PROVIDED FOR CONVERTING SIGNAL LEVEL OF<br />

DIGITAL SIGNAL TO HIGHER LEVEL<br />

Issued: May 7, 2013<br />

United States Patent 8,436,654<br />

A level converter circuit is provided for converting an input signal of<br />

a digital signal having a first signal level into an output signal having a<br />

second signal level higher than the first signal level. An amplifier circuit<br />

amplifies the input signal and outputs an amplified output signal, and<br />

a current generator circuit generates a control current corresponding to<br />

an operating current flowing through the amplifier circuit upon change<br />

of the signal level of the input signal. A current detector circuit detects<br />

the generated control current, and controls the operating current of the<br />

amplifier circuit to correspond to the detected control current. The current<br />

generator circuit includes series-connected first and second nMOS<br />

transistors as inserted between the current detector circuit and the ground.<br />

The first nMOS transistor operates responsive to the input signal, and the<br />

second nMOS transistor operates responsive to an inverted signal of the<br />

input signal.<br />

Inventors: Hirose; Tetsuya (Kobe, JP), Osaki; Yuji (Kobe, JP), Mori;<br />

Toshihiko (Yokohama, JP)<br />

Assignee: Semiconductor <strong>Technology</strong> Academic Research Center<br />

(Kanagawa, JP)<br />

Appl. No.: 13/181,825<br />

Filed: July 13, 2011<br />

APPARATUS FOR DETECTING A STATE OF OPERATION<br />

OF A POWER SEMICONDUCTOR DEVICE<br />

Issued: May 7, 2013<br />

United States Patent 8,436,600<br />

An embodiment of the invention relates to an apparatus including a power<br />

semiconductor device and a processor coupled thereto. The processor is<br />

configured to provide a control signal to the power semiconductor device<br />

to regulate an output characteristic of the apparatus. The processor models<br />

an internal characteristic of the power semiconductor device and alters<br />

the control signal if the modeled internal characteristic crosses a threshold<br />

value. In an exemplary embodiment, the internal characteristic is a channel<br />

temperature of a MOSFET. A sensor such as a thermistor is coupled<br />

to or included within the processor to sense a parameter separate from<br />

the power semiconductor device, such as a processor temperature, and<br />

the processor is configured to adapt the modeled internal characteristic to<br />

the sensed parameter.<br />

Inventors: Pelz; Georg (Ebersberg, DE), Lenz; Michael (Zorneding, DE),<br />

Kunze; Matthias (Neubiberg, DE)<br />

Assignee: Infineon Technologies Austria AG (Villach, AT)<br />

Appl. No.: 13/088,200<br />

Filed: April 15, 2011<br />

38 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


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PRODUCTmarketplace<br />

ADVERTISERindex<br />

Ametherm .................................................................. 26<br />

Applied <strong>Power</strong> Systems ............................................. 37<br />

API Spectrum Control ................................................ 15<br />

CKE, Products by Dean <strong>Technology</strong> ............................ 27<br />

Coilcraft ................................................................... BC<br />

Crane Aerospace & <strong>Electronics</strong> ................................... 3<br />

EBG Resistors ............................................................ 27<br />

Holystone International ............................................. 36<br />

International Rectifi er Corporation .............................IFC<br />

IXYS .......................................................................... 34<br />

IXYS Colorado ........................................................... 12<br />

Linear <strong>Technology</strong> ....................................................... 1<br />

Mouser <strong>Electronics</strong> ................................................. 5, 9<br />

Payton America ......................................................... 17<br />

Trim-Lok ................................................................... IBC<br />

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40 <strong>Power</strong> <strong>Electronics</strong> <strong>Technology</strong> | June 2013 www.powerelectronics.com


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