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Electro Optical Characterisation of Short Wavelength Semiconductor ...

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Data Analysis<br />

for the whole devices on a bar.<br />

For the 6µm planars most <strong>of</strong> the devices needed a large amount <strong>of</strong> current to start emitting<br />

and degraded very fast. This indicates a bad metal contact with relatively high resistance<br />

and high amount <strong>of</strong> impurities in the crystal which lead to non-radiative recombinations.<br />

Applying more and more current will consequently lead to heat and degradation <strong>of</strong> the<br />

device. Fig. 4.16 shows the output light power vs. current density diagram as well as the<br />

spectrum <strong>of</strong> the only lasing device <strong>of</strong> 6µm planar . A high threshold current density (28.9<br />

KA/cm 2 ) is observable.<br />

Output Light Power [W]<br />

0,0002<br />

0,00015<br />

0,0001<br />

5e-05<br />

g0975/planar/unmirrored<br />

width: 6um, length: 1035.20 um<br />

0 10000 20000<br />

Current Density[A/cm<br />

30000 40000<br />

2 0<br />

]<br />

Cts/s<br />

3e+05<br />

2,5e+05<br />

2e+05<br />

1,5e+05<br />

1e+05<br />

50000<br />

0<br />

g0975/planar/6um<br />

spectrum<br />

360 380 400 420 440<br />

<strong>Wavelength</strong> [nm]<br />

Figure 4.16: L/I behaviour as well as spectrum <strong>of</strong> the only unmirrored lasing device<br />

belonging to 6µm planars<br />

At the first glimpse at the spectrum there is no lasing available. By zooming in, some<br />

details get cleared. Fig. 4.17 shows the zoomed spectrum <strong>of</strong> the lasing device as well as<br />

the far field photo taken by a regular digital camera. As it can been seen from the spectrum<br />

there is indeed a multimode lasing which happens to occur on top <strong>of</strong> an LED regime. The<br />

fact that a multimode lasing happens is just normal and because <strong>of</strong> the many standing<br />

waves which are achieved in different physical places <strong>of</strong> the active region with possibly<br />

different indium contents which leads to different energy gaps. The strongest modes seem<br />

to be at around 390nm. The LED regime which can be seen as a long bowing blue light<br />

perpendicular to the lasing ray in the far field photo (Fig. 4.17), is actually due to the<br />

photoluminescence <strong>of</strong> the substrate. As already mentioned the III-V crystals characterised<br />

in this thesis are all homoepitaxially grown, i.e. growth on GaN substrate. Because <strong>of</strong><br />

the lower refracting index difference than in sapphire (Al2O3) case, it is possible that the<br />

wave propagates into the GaN and causes luminescence. To stop this, one way would be<br />

increasing the thickness <strong>of</strong> the Si-doped AlGaN cladding layer. This possibility had been<br />

taken as a basis for growing g0937, g0938 and g0942.<br />

As mentioned on device <strong>of</strong> the 10µm shallow ridge structure was also able to lase exactly<br />

44

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