Veröffentlichungen in referierten Zeitschriften und ... - GFE Aachen
Veröffentlichungen in referierten Zeitschriften und ... - GFE Aachen
Veröffentlichungen in referierten Zeitschriften und ... - GFE Aachen
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
Y.-S. L<strong>in</strong>, K.-J. Ma, C. Hsu, Y.-Y. Chung, C.-W. Liu, S.-W. Feng, Y.-C. Cheng, C. C. Yang, M.-H. Mao,<br />
H.-W. Chuang, C.-T. Kuo, J.-S. Tsang & T.E. Weirich, Quasiregular quantum-dot-like structure<br />
formation with postgrowth thermal anneal<strong>in</strong>g of InGaN/GaN quantum wells, Applied Physics Letters<br />
2002, 80, 2571 – 2573.<br />
Y.-S. L<strong>in</strong>, K.-J. Ma, C. C. Yang & T.E. Weirich, Effects of post-growth thermal anneal<strong>in</strong>g on the <strong>in</strong>dium<br />
aggregated structures <strong>in</strong> InGaN/GaN quantum wells, Journal of Crystal Growth 2002, 242, 35 – 40.<br />
F. Klocke, R. Engelhorn, J. Mayer & T. Weirich, Micro-analysis of the contact zone of tribologically<br />
loaded second-phase re<strong>in</strong>forced sol-gel-abrasives, CIRP Annals-Manufactur<strong>in</strong>g Technology 2002, 51,<br />
245 – 250.<br />
R. M. Öksüzoglu, T.E. Weirich & H. Fuess, Characterisation of Co 25 Ag 75 and (Co 90 Al 10 ) 28 Ag 72 granular<br />
th<strong>in</strong> films by electron diffraction, high-resolution transmission electron microscopy and electron<br />
spectroscopic imag<strong>in</strong>g, Journal of Electron Microscopy 2003, 52(2), 91 – 100.<br />
M. Schallehn, M. W<strong>in</strong>terer, T.E. Weirich, U. Keiderl<strong>in</strong>g & H. Hahn, In-Situ Preparation of Polymer-<br />
Coated Alum<strong>in</strong>a Nanopowders by Chemical Vapor Synthesis, Chem. Vap. Dep. 2003, 9, 40 – 44.<br />
K. Albe & T.E. Weirich, Structure and stability of α - and β -Ti 2 Se. Electron diffraction versus densityfunctional<br />
theory calculations. Acta Cryst. 2003, A59, 18 – 21.<br />
A. Hohl, T. Wieder, P.A. van Aken, T.E. Weirich, G. Denn<strong>in</strong>ger, M. Vidal, S. Oswald, C. Deneke, J.<br />
Mayer & H. Fuess, An <strong>in</strong>terface clusters mixture model for the structure of amorphous silicon<br />
monoxide (SiO), Journal of Non-Crystall<strong>in</strong>e Solids 2003, 320, 255 – 280.<br />
S.H. Irsen, P. Kroll, R. Dronskowski, T.E. Weirich & M. Epple, Chemical Reactivity of Tetrasulfur<br />
Tetranitride: Synthesis, Physical Properties and Structural Characterization of the Amorphous Phase<br />
Cu 7 S 4 N 4 , Z. Anorg. Allg. Chem. 2003, 629, 1751 – 1759.<br />
T.E. Weirich, Electron Diffraction Structure Analysis: structural research with low-quality<br />
diffraction data, Z. Kristallogr. 2003, 218, 269 – 278.<br />
T. Myslowicki, T.E. Weirich & W. Bleck, Contraction of high strength Invar steel dur<strong>in</strong>g creep test,<br />
Steel Research International 2003, 74(6), 376 – 385.<br />
Y.-S. L<strong>in</strong>, K.-J. Ma, C. C. Yang & T.E. Weirich, Effects of thermal anneal<strong>in</strong>g on quantum-dot-like<br />
structure of medium <strong>in</strong>dium-content InGaN/GaN mulitquantum wells, Journal of Materials Science:<br />
Materials <strong>in</strong> Electronics 2003, 14, 49 – 53.<br />
A. Re<strong>in</strong>holdt, R. Detemple, A. L. Stepanov, T.E.Weirich & U. Kreibig, Novel Nanoparticle Matter: ZrN-<br />
Nanoparticles, Applied Physics B 2003, 77, 681 − 686.<br />
T.E. Weirich, The crystal structure of Zr 2 Se re<strong>in</strong>vestigated by electron crystallography and X-ray<br />
powder diffraction, Crystallography Reports 2004, 49, 379 – 389.<br />
T.E. Weirich, First-pr<strong>in</strong>ciples Calculations as a Tool for Structure Validation <strong>in</strong> Electron<br />
Crystallography, Acta Cryst. 2004, A60, 75 – 81.<br />
M. Béreš, T.E.Weirich, K. Hulka, J. Mayer, TEM Investigations of F<strong>in</strong>e Niobium Precipitates <strong>in</strong> HSLA<br />
Steel, Steel Research Int., 75 (2004) 753 – 758.<br />
A. Re<strong>in</strong>holdt, R. Pecenka, A.P<strong>in</strong>chuk, S. Runte, A. L. Stepanov, T.E. Weirich, and U. Kreibig,<br />
Structural characterization, optical and colorimetric properties, of TiN-nanoparticles, The European<br />
Physical Journal D - Atomic, Molecular and Optical Physics, Eur. Phys. J. D 31 (2004) 69 – 76.<br />
M. Siemons, T. E. Weirich, J. Mayer, U. Simon, Preparation of nanosized perovskite-type oxides via<br />
polyol method, Z. Anorg. Allgem. Chemie 630 (2004) 2083 – 2089.<br />
2