MicroProbe Vx-RF Probe Card Technology - Semiconductor Wafer ...

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Advanced Measurement System Analysis „AMSA is a fast and efficient tool based on Gage r&R methodology to analyze and assess test performance, identifying test instabilities ( Gr&R and Bin Flips ) and focusing on the impact on yield of the measurement process ( C gk ) vs manufacturing process ( C pk )“ • When to use AMSA: A regular Gr&R, whenever … – the product is transferred into production (test package transfer) – a novel test equipment (e.g. probe cards) is introduced – a transfer from existing to new test site location June 7 to 10, 2009 IEEE SW Test Workshop 10
Smarti UE Critical Tests vs. 300 samples Tx – Pout Cres Sensitivity
Page 1 and 2: Presenter’s Name Oliver Nagler, C
Page 3 and 4: Problem Statement • Infineon Tech
Page 5 and 6: Probes Optimized For Individual App
Page 7 and 8: Vx-RF RF-80 Contact Force Wide over
Page 9: Infineon‘s Probe Card Qualificati
Page 13 and 14: Smarti UE Comparison (I_TX) Package
Page 15 and 16: Minimal Bump Damage 65µm OD No xy-
Page 17 and 18: Cleaning • Media: ITS 1um AlO2 la

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