VLSIresearch - Semiconductor Wafer Test Workshop
VLSIresearch - Semiconductor Wafer Test Workshop
VLSIresearch - Semiconductor Wafer Test Workshop
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Utilization Rates Recovering<br />
CAPACITY UTILIZATION RATES<br />
(chip production/manufacturing capacity, in %)<br />
100<br />
95<br />
90<br />
85<br />
80<br />
75<br />
70<br />
65<br />
60<br />
55<br />
W.W. Front End Utilization<br />
W.W. <strong>Test</strong> Utilization<br />
W.W.Assembly Utilization<br />
50<br />
2005 JAN<br />
MAR<br />
MAY<br />
JUL<br />
SEPT<br />
NOV<br />
2006 JAN<br />
MAR<br />
MAY<br />
JUL<br />
SEPT<br />
NOV<br />
2007 JAN<br />
MAR<br />
MAY<br />
JUL<br />
SEPT<br />
NOV<br />
2008 JAN<br />
MAR<br />
MAY<br />
JUL<br />
SEPT<br />
NOV<br />
2009 JAN<br />
MAR<br />
MAY F<br />
JUL F<br />
SEPT F<br />
NOV F<br />
<strong>VLSIresearch</strong>.com weSRCH.com chiphistory.org<br />
Copyright © 2009 VLSI Research Inc. All rights reserved. Reprinted with permission from VLSI RESEARCH INC.<br />
7
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