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Power Optimization and Prediction Techniques for FPGAs - Jason H ...

Power Optimization and Prediction Techniques for FPGAs - Jason H ...

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List of Tables2.1 Summary of commercial FPGA routing architectures (lengths given in CLB tilesor LAB tiles, as appropriate). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 243.1 Major circuit blocks in target FPGA. . . . . . . . . . . . . . . . . . . . . . . . . . 523.2 Characteristics of benchmark circuits. . . . . . . . . . . . . . . . . . . . . . . . . 543.3 Detailed active leakage power results. . . . . . . . . . . . . . . . . . . . . . . . . . 603.4 Effect of leakage-aware routing on critical path delay. . . . . . . . . . . . . . . . . 663.5 Detailed active leakage power results <strong>for</strong> leakage-aware routing combined withpolarity selection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 684.1 85 ◦ C leakage power reduction results <strong>for</strong> basic design (unshaded) <strong>and</strong> alternatedesign (shaded). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 894.2 25 ◦ C leakage power reduction results <strong>for</strong> basic design (unshaded) <strong>and</strong> alternatedesign (shaded). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 904.3 85 ◦ C leakage power reduction results <strong>for</strong> basic+MUX design (unshaded) <strong>and</strong>alternate+MUX design (shaded). . . . . . . . . . . . . . . . . . . . . . . . . . . . 914.4 25 ◦ C leakage power reduction results <strong>for</strong> basic+MUX design (unshaded) <strong>and</strong>alternate+MUX design (shaded). . . . . . . . . . . . . . . . . . . . . . . . . . . . 914.5 Sleep mode leakage results 85 ◦ C (unshaded) <strong>and</strong> 25 ◦ C (shaded). . . . . . . . . . 924.6 Dynamic power results <strong>for</strong> all switch designs. . . . . . . . . . . . . . . . . . . . . 935.1 Detailed results <strong>for</strong> depth-optimal 4-LUT mapping solutions. . . . . . . . . . . . 1156.1 Characteristics of benchmark circuits. . . . . . . . . . . . . . . . . . . . . . . . . 1256.2 Effect of glitching on switching activity. . . . . . . . . . . . . . . . . . . . . . . . 1276.3 Error in predicted activity values. . . . . . . . . . . . . . . . . . . . . . . . . . . . 1356.4 Error in predicted activity values <strong>for</strong> alternate benchmark division. . . . . . . . . 1396.5 Noise in individual circuits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 142xv

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