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Test Execution PanelThe test execution panel is the primary interface for non-expert users. In its initialstate, it allows the user to select a test specification, either directly from all selectedspecifications or filtered to a certain test category. Upon selection of a test specification,the frame underneath the selector presents the parameters for the selected testspecification. The “Execute test” button then initiates a test run. The “Test Output”frame then logs the progress of the test while it is running. Upon completion, the“Result” frame receives the summary information from the test. If a test result wasobtained, the group of controls next to the “Execute test” button is enabled. “Reset”discards the test result or warnings and returns the panel to the state before test execution.This is required between test executions and prevents accidental informationloss through re-execution of the test. The “Details” button enables the detailed errorview, as defined by the test category’s TestResultBrowser. The next two controlsare used to save the test result. The label can be edited, but defaults to the name ofthe test specification with an added timestamp.Test Results PanelThe test results panel is used to load previously stored test results and display theircontent. At the top is a test result selector used to choose among the stored testresults, optionally filtered according to test category and test specification. Uponloading, the corresponding TestResultBrowser is displayed.Interconnection Test Result DisplayThe results of an interconnection test are organized according in a hierarchy accordingto the involved pseudoparticle and test pattern. In the summary view, it displays ashort list of pseudoparticles containign failures and the number of patterns containingerrors. The detailed view contains a line-by-line summary of the failures, organizedin the pseudoparticle-pattern hierarchy. Since test results can become very long, especiallyfor long-running interconnection tests, the output is limited to 200 lines bydefault and can be scrolled using the arrow buttons.A simple parser takes the plain text results and highlights the errors. Figure 5.9shows an excerpt from a typical interconnection test result.Pattern Test Result DisplayThe display for pattern test results is organized along the lines of the readout recordsreceived from the hardware, since all the tests are defined at the level at the level ofthe individual readout record level (see Sec. 5.2.1). The result display consists of a tabcontrol with three panes, where one displays error statistics and the other two containreadout record browsers, one for the lists of DAQ and EVM records each.The readout record browser, shown in Fig. 5.10, provides a navigation interface thatallows the user to browse the result collection, either in order or filtered to records67
} {{ }Input values} {{ }GTL outputs} {{ }COND1} {{ }COND2Figure 5.9: ICT resultexhibiting a certain error. The record display contains a textual description of theerrors and a readout record display. The readout record is displayed in hex dumpformat, but contains color highlighting to indicate the boundaries of board records.In addition, clicking on one of the board records displays the fields of that particularrecord in a table representation. Where applicable, another layer of information isrepresented by tool tips (for example, GMT records contain table fields for the muoncandidates, and these can be decoded to the muon candidate’s p T and other attributes).68
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3.2.10 CMS Online Software . . . .
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factor. The selected events are the
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Figure 2.1: Expected dijet mass spe
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Figure 2.3: Left: Dilepton mass dis
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W −Z, γZ, γZ, γW +Z, γFigure
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ggHVHg(a)g(b)q¯q¯qHHV ∗q(c)qq(d
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