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In-flight upset - 154 km west of Learmonth, WA, 7 October 2008,

In-flight upset - 154 km west of Learmonth, WA, 7 October 2008,

In-flight upset - 154 km west of Learmonth, WA, 7 October 2008,

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Unit 4167 passed 2,223 <strong>of</strong> 2,272 tests, with the remainder failing due to navigationdrift that was considered normal in a high-temperature environment. This issue wasnot considered relevant to the occurrences under investigation. No other problemswere identified.DO-160C environmental testsThe units were subjected to certain environmental tests in accordance withDO-160C. These tests were originally used for qualification <strong>of</strong> the ADIRU design.Only those parts <strong>of</strong> DO-160C considered relevant to the investigation wereundertaken; for example, the units’ resilience to liquids was not considered an issuebecause there was no visible sign <strong>of</strong> liquid contamination.The DO-160C tests assessed ADIRU behaviour under each <strong>of</strong> the followingenvironmental conditions 211 :• Random vibration along each <strong>of</strong> the three major orthogonal axes <strong>of</strong> the ADIRU(DO-160C section 8).• Power input variation under normal and abnormal conditions, consisting <strong>of</strong>variations in alternating current (AC) power (voltage, frequency, modulation <strong>of</strong>voltage and frequency, power interrupt, surge, and under-voltage), and DCpower (voltage, voltage ripple, power interrupt, surge, and under-voltage)(DO-160C section 16).• Power voltage spike (DO-160C section 17).• Power input audio frequency conducted susceptibility, consisting <strong>of</strong> 750 Hz to22 kHz injected current for AC power and 10 Hz to 180 kHz injected current forDC power (DO-160C section 18).• <strong>In</strong>duced signal susceptibility, consisting <strong>of</strong> magnetic fields at 400 Hz inducedinto the equipment, magnetic fields between 400 Hz and 15 kHz induced intointerconnecting cables, electric fields between 380 Hz and 420 Hz induced intointerconnecting cables, and voltage spikes 212 induced into interconnecting cables(DO-160C section 19).• Radio frequency susceptibility, consisting <strong>of</strong> conducted susceptibility 10 khz to400 Mhz at 150 mA (nominally representative <strong>of</strong> a 100 V/m electric field) andradiated susceptibility 30 Mhz to 18 Ghz at 100 V/m (DO-160C section 20).• Emission 213 <strong>of</strong> electromagnetic energy between 150 kHz and 1.215 GHz(DO-160C section 21).211212213DO-160C sections 16, 17, 18, 19, and 20 theoretically test for various forms <strong>of</strong> EMI, although inpractice sections 16 and 17 typically simulate variability <strong>of</strong> the power supply rather than variationas a result <strong>of</strong> EMI. DO-160C section 21 tests for electromagnetic emissions and can sometimesdetect faulty hardware.Voltage spikes are not the same as data spikes. Voltage spikes (transients) are commonlyintroduced to a power supply as a result <strong>of</strong> power switching. The voltage spikes for this test had aduration <strong>of</strong> 0.05 to 1.00 milliseconds, repetition rate <strong>of</strong> 0.2 to 10.0 microseconds, burst rate <strong>of</strong> 8 to10 Hz, and amplitude <strong>of</strong> 600 volts peak-to-peak.This test is normally used to determine a unit’s electromagnetic emissions. For the purposes <strong>of</strong> thisinvestigation, the test was used to detect any hardware fault that would produce abnormalelectromagnetic emissions.- 249 -

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