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Colocalized SPM investigation ofGraphene: Mechanical, Electrical, OpticalAFM G-band Raman D-band RamanConfirmed n+1 layer Confirmed 1,2,3,4 layers ID defects, confirm n=1PF KPFM80mVUpper Limit on E fIR 1730cm -1Measure σ(ω)Graphene Applications:• AFM: layer heights,mechanical properties• Raman: how manylayers, defects• PF KPFM: workfunction/Fermi energy• IR: plasmonics, # oflayers, Fermi energy6/27/13 <strong>Bruker</strong> Nano Surfaces24
sSNOM in universal conductivity regime:layer counting and unexpected resultsIR 1730cm -1 • Expected: contrast consistent withUniversal Conductivity• Confirmed |σ 4 |>|σ 3 |>|σ 2 |>|σ 1 | for ω>2E f• Reproducible – useful for layer counting• Unexpected results:• 1L < SiO 2• Huge jump from 3L to 4LTheoretical PredictionωWhy lower??SiO 212342E f6/27/13<strong>Bruker</strong> Nano Surfaces2625
Page 1: Beating the Diffraction limit by 10
Page 4 and 5: Why Infrared sSNOM at the Nanoscale
Page 6 and 7: Just how big is a 1000X improvement
Page 8 and 9: Resolution limit in near field opti
Page 10 and 11: Optical contrast in sSNOM for 3D an
Page 12 and 13: How the near field light (E nf ) is
Page 14 and 15: sSNOM results from customers:implem
Page 16 and 17: University of Toronto - Prof. Walke
Page 18 and 19: IntroductionGraphene Discovery, wit
Page 20 and 21: Infrared study of Graphene: rich sp
Page 22 and 23: Let’s probe Graphene’s universa
Page 26 and 27: sSNOM in universal conductivity reg
Page 28 and 29: Now let’s switch to the plasmonic
Page 30 and 31: sSNOM of Graphene: fast imaging ofp
Page 32: Conclusion• Near field imaging wi

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