High performance HBM Known Good Stack Testing
S06_02_Loranger_SWTW2015R
S06_02_Loranger_SWTW2015R
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<strong>HBM</strong> <strong>Stack</strong> Probing<br />
• Bottom of SoC device in the stack provides test<br />
pads in the field of Micro bumps<br />
Test Pad<br />
137.5 µm<br />
25µm<br />
25um<br />
68.4 µm<br />
240 µm<br />
Micro Bump<br />
144µm<br />
165 µm<br />
Marc Loranger<br />
John Oonk<br />
7
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