Space Radiation Effects in Electronic Components. - Esa

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Space Radiation Effects in Electronic Components. - Esa

Radiation Effects in Components

(4) Single Event Effects in detail

Latch-up. Latch up. Permanent, potentially destructive

Bit flips (‘Single ( Single Event Upset’) Upset ) in bistables

High Anomalous Current (HAC), ‘snap snap-back back’

Heavy Ion Induced Burn-out Burn out in power MOS

Single Event Gate Rupture (SEGR)

Single Event Transient, noise pulses, false outputs

‘Soft Soft Latch’ Latch (device or system ‘lock lock up’)

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