RadiationEffectsinComponents (4) Single Event Effectsin detail Latch-up. Latch up. Permanent, potentially destructive Bit flips (‘Single ( Single Event Upset’) Upset ) in bistables High Anomalous Current (HAC), ‘snap snap-back back’ Heavy Ion Induced Burn-out Burn out in power MOS Single Event Gate Rupture (SEGR) Single Event Transient, noise pulses, false outputs ‘Soft Soft Latch’ Latch (device or system ‘lock lock up’) up
Typical Single Event Transient Requirements. �� Output voltage swing of rail voltage to ground and ground to rail voltage. �� Duration: 15 microseconds for Op-Amps. Op Amps. 10 microseconds for comparators, voltage regulators and voltage references. 100 nanoseconds for opto-couplers. opto couplers.