8 months ago

GBS smartWLI prime

High Lateral Resolution

High Lateral Resolution – Structured Wafer (ASIC) Scanning of an structured wafer / ASIC using an 100x objective • FOV 180 x 110 µm² point density 0.09 µm can be used to analyze the fine structures • wall seize app. 1 µm

Fast Scanning of larger Objects – Insert app. 15 x 15 mm Scanning of an insert using an 5x objective • 5 min measuring time • xy-table used for stitching • data quality suitable for roughness and form measurement

NTEGRA Aura, information brochure - NT-MDT
imager® 5010 - Z+F USA, Inc.
応用理工学概論 医療機器開発と産学連携 - Computational Optics ...
MG6170MeissenBrochureFAP.indd 1 8/13/10 10:58:57 AM
Optical Coherence Tomography (OCT)
The complete solution for liquid lens testing to ... - Imagine Optic
R&D on a New Scanning System for the Opera Experiment
2118 Quick Vision - Mitutoyo America Corporation
Void Scanner 150Mk2 - Mertind Ltda. Bolivia
COMET L3D 5M - Techsheet - Steinbichler
easyScan 2 brochure (1.1 MB) - Schaefer Technology
stereoSCAN3D -
Optical Spectrum Analyzer FTB-5240/FTB-5240B - Rohde & Schwarz
Resolution Measures in Single Particle Analysis - NCMI
Download Chapter Summary - ThinkSpot
Judging Guidelines
Focus on modern frontiers of matter wave optics and interferometry
Time Domain Interferometry With Laser Cooled Atoms, B. Barrett, I ...
Verifire™ Asphere Brochure - Zygo Corporation
The benchmark for high quality film and photo scanning