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Materia nº3 - Materials Science Institute of Madrid

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OTROS TEMAS: TECNICAS DE CARACTERIZACION<br />

N. Registro 001496853<br />

Zhang, Sam.<br />

<strong>Materia</strong>ls characterization techniques / Sam Zhang, Lin Li, Ashok Kumar.--<br />

Boca Raton : CRC Press, cop. 2009.-- 328 p. : il. ; 25 cm.<br />

M-ICMM 3865<br />

N. Registro 001498856<br />

Kuzmany, Hans<br />

Solid-state spectroscopy : an introduction / Hans Kuzmany.-- Berlin [etc.] :<br />

Springer, cop. 2009.-- 554 p. : il. [algunas col.] ; 25 cm.<br />

M-ICMM 3877<br />

N. Registro 000580644<br />

Lawes, Grahame<br />

Scanning electron microscopy and x-ray microanalysis / Grahame Lawes ;<br />

editor Arthur M. James.-- Chichester : John Wiley & Sons, 1987.-- XVII, 103 p. :<br />

il. ; 24 cm.-- (Analytical chemistry by open learning).<br />

M-ICMM 3493<br />

N. Registro 000007161<br />

Dodd, James W.<br />

Thermal methods : analytical chemistry by open learning / James W. Dodd;<br />

Kenneth H. Tonge; edited by Brian R. Currel.-- Chichester [etc.] : John Wiley<br />

and Sons, cop. 1987.-- 337 p. ; 21 cm.-- (Analytical chemistry by open learning).<br />

M-ICMM 3496<br />

N. Registro 000647846<br />

Harris, Daniel C.<br />

Symmetry and spectroscopy : an introduction to vibrational and<br />

electronic spectroscopy / Daniel C. Harris and Michael D. Bertolucci.-- New<br />

York : Dover Publications, 1978.-- 550 p. ; 22 cm.<br />

M-ICMM 3863<br />

9

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