Materia nº3 - Materials Science Institute of Madrid
Materia nº3 - Materials Science Institute of Madrid
Materia nº3 - Materials Science Institute of Madrid
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OTROS TEMAS: TECNICAS DE CARACTERIZACION<br />
N. Registro 001496853<br />
Zhang, Sam.<br />
<strong>Materia</strong>ls characterization techniques / Sam Zhang, Lin Li, Ashok Kumar.--<br />
Boca Raton : CRC Press, cop. 2009.-- 328 p. : il. ; 25 cm.<br />
M-ICMM 3865<br />
N. Registro 001498856<br />
Kuzmany, Hans<br />
Solid-state spectroscopy : an introduction / Hans Kuzmany.-- Berlin [etc.] :<br />
Springer, cop. 2009.-- 554 p. : il. [algunas col.] ; 25 cm.<br />
M-ICMM 3877<br />
N. Registro 000580644<br />
Lawes, Grahame<br />
Scanning electron microscopy and x-ray microanalysis / Grahame Lawes ;<br />
editor Arthur M. James.-- Chichester : John Wiley & Sons, 1987.-- XVII, 103 p. :<br />
il. ; 24 cm.-- (Analytical chemistry by open learning).<br />
M-ICMM 3493<br />
N. Registro 000007161<br />
Dodd, James W.<br />
Thermal methods : analytical chemistry by open learning / James W. Dodd;<br />
Kenneth H. Tonge; edited by Brian R. Currel.-- Chichester [etc.] : John Wiley<br />
and Sons, cop. 1987.-- 337 p. ; 21 cm.-- (Analytical chemistry by open learning).<br />
M-ICMM 3496<br />
N. Registro 000647846<br />
Harris, Daniel C.<br />
Symmetry and spectroscopy : an introduction to vibrational and<br />
electronic spectroscopy / Daniel C. Harris and Michael D. Bertolucci.-- New<br />
York : Dover Publications, 1978.-- 550 p. ; 22 cm.<br />
M-ICMM 3863<br />
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