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Activity Report IMT-Bucharest 2009

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Anexa 4<br />

Infrastructura de Cercetare-Dezvoltare<br />

Lista de echipamentelor performante si facilităţile de cercetare specifice (2008-<br />

<strong>2009</strong>)<br />

- Echipamente corporale<br />

- Echipamente necorporale<br />

Anul<br />

CORPORALE<br />

fabricaţ<br />

iei Valoarea<br />

Sursa de finanţare a<br />

investiţiei<br />

Upgrade to 110GHz the 1-65 GHz set-up for on wafer<br />

characterization<br />

<strong>2009</strong> 229 138 Capacităţi +<br />

REGPOT<br />

Frequency synthesiser up to 110 GHz <strong>2009</strong> 336 201 REGPOT<br />

Ecipament procesare – hota cu flux laminar cu azot <strong>2009</strong> 73 160 Contract de cercetare<br />

(Salare, USA)<br />

Microscop cu camera (sistem optic de marire, soft <strong>2009</strong> 25 250 Contract de cercetare<br />

achizitie si prelucrare imagini) T200-60 (Sepadin<br />

SRL)<br />

Echipament de masura a unghiului de contact si a <strong>2009</strong> 22 942 Contract de cercetare<br />

tensiunii superficiale (Sepadin SRL)<br />

Difractometru de Raze X – XRD<br />

2008 1 344 755 Capacităţi<br />

X-ray Diffraction System - SmartLab - (Rigaku<br />

Corporation, Japan)<br />

<strong>2009</strong><br />

Scanning Electrochemical Microscope (SECM) - 2008 434 094 Contract de cercetare<br />

ElProScan (HEKA, Germany)<br />

Witecalpha300S Scanning Near-field Optical<br />

Microscope (SNOM) WiTec GmbH, Germany.<br />

2008 638 181 Contract de cercetare+<br />

REGPOT<br />

WLI - White Light Interferometer - Photomap 3D 2008 546 520 Capacităţi<br />

(FOGALE nanotech, France)<br />

Curve tracer with accesories 2008 116 400 Contract de cercetare<br />

Up upgrade spectrum analyzer to 110 GHz (mixer) 2008 146 255 Capacităţi<br />

Field Emission Gun Scanning Electron Microscope 2008 133 643 Capacităţi<br />

(FEG-SEM) - Nova NanoSEM 630 (FEI Company, USA)<br />

Nanomechanical characterization equipment - Nano<br />

Indenter G200 - (Agilent Technologies, USA)<br />

2008<br />

<strong>2009</strong><br />

158 500 Capacităţi<br />

Electrodynamic vibration system with thermal and<br />

electrical tests - TV 55240/LS (TIRA, Germany)<br />

Thermal shock chamber - TSE-11-A (Espec Europe,<br />

Germany) Temperature range: - 65 o C...+250 o C<br />

InkJet Printer: Instalation for deposition of coductive<br />

layers using Ink Jet method<br />

Nanoprinting System - Dip Pen Nanolithography Writer -<br />

NSCRIPTOR (NanoInk, Inc., USA)<br />

3D Printer by using Selective Laser Sintering, Formiga<br />

P100, EOS GmbH, Germany<br />

Semiconductor Characterization System (DC) with<br />

Wafer Probing Station - 4200-SCS/C/Keithley<br />

Easyprobe EP6/ Suss MicroTec (Keithley Instruments,<br />

USA; Suss MicroTec, Germany)<br />

RTP (Rapid Thermal Processing) or RTA (Rapid<br />

Thermal Annealing)<br />

Chemical bench<br />

Hota cimica cu solventi (Atechim, Romania)<br />

PECVD equipment for deposition of thin dielectric<br />

layers Plasma-assisted chemical vapor deposition of<br />

dielectric thin films PECVD - LPX-CVD, with LDS<br />

module (STS, UK) – liqid delivery<br />

Echipament de depunere chimica din faza de vapori<br />

2008 112 617 Capacităţi<br />

2008 102 126 Capacităţi<br />

2008 166 805 Contract de cercetare<br />

2008 861 735 Capacităţi<br />

2008 639 847 Capacităţi<br />

2008 242 500 Contract de cercetare<br />

2008 239 611 Contract de cercetare<br />

2008 36 149 Contract de cercetare<br />

2008 459 677 Contract de cercetare<br />

Capacităţi<br />

19

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