KANDIDÁTSKE DIZERTAČNÉ PRÁCE, obhájené v roku 2002

Annual Report 2008 Department of
Microelectronics
Czech Technical University, 2008. - ISBN 978-80-01-04139-0. (in English)
[9] CHVÁLA, A., DONOVAL, D., BEŇO, P., MAREK, J., KOŠÍK, T.: Analysis of the
Geometry on Robustness of ESD Protection Devices. In: ASDAM 2008. 7th International
Conference on Advanced Semiconductor Devices and Microsystems: Smolenice, Slovak
Republic, 12.-16.10.2008. - Piscataway: IEEE, 2008. - ISBN 978-1-4244-2325-5. - p. 143-
146. (in English)
[10] CHVÁLA, A., DONOVAL, D., BEŇO, P., MAREK, J., KOŠÍK, T.: Extraction of the
Critical Temperature Limit for ESD Protection Device. In: APCOM 2008. Applied Physics
of Condensed Matter: Proceedings of 14th International Workshop. Bystrá, Slovak
Republic, 25.-27.6.2008. - Bratislava: STU, 2008. - ISBN 978-80-227-2902-4. - p. 271-274.
(in English)
[11] ČIČO, K., KUZMÍK, J., LIDAY, J., HUŠEKOVÁ, K., POZZOVIVO, G., CARLIN, J.F.,
GRANDJEAN, N., POGANY, A., VOGRINČIČ, P., FRÖHLICH, K.: Al23 Insulating Films
Grown by MOCVD Using Ar or NH3 Carrier Gas on InAlN/GaN Heterostructures.
In: WODIM 2008: Bad Saarow, Germany, 23.-25.6.2008. - p. 245-246. (in English)
[12] CLARYSSE, T., BRAMMERTZ, G., VANHAEREN, D., EYBEN, P., GOOSSENS, M.,
CLEMENTE, F., MEURIS, M., VANDERVORST, W., SRNÁNEK, R., KINDER, R.,
SCIANA, B., ZHIGIANG, Li., ROBINSON, D.: Accurate Carrier Profiling of n-Type GaAs
Junction. In: E-MRS 2008 Spring Meeting: Strasbourg, France, 26.5.-30.5.2008. -
Strasbourg: European Materials Research Society, 2008. - p. 9. (in English)
[13] DAŘÍČEK, M., DONOVAL, M., ŠATKA, A., KOŠÍK, T.: Characterization of MagFET.
In: APCOM 2008. Applied Physics of Condensed Matter: Proceedings of 14th International
Workshop. Bystrá, Slovak Republic, 25.-27.6.2008. - Bratislava: STU, 2008. - ISBN 978-
80-227-2902-4. - p. 53-56. (in English)
[14] DONOVAL, D.: Current Needs and Offers in Engineering Education in Micro/Nano-
Electronics and Smart System Integration. In: EWME 2008. 7th European Workshop on
Microelectronics Education: Budapest, Hungary, 28.-30.5.2008. - Budapest: Univeristy of
Technology and Economics, 2008. - ISBN 978-2-35500-007-2. - p. 16-17. (in English)
[15] DONOVAL, M., DAŘÍČEK, M., STOPJAKOVÁ, V., MAREK, J.: On-Chip Integration of
Magnetic Force sensing Current Monitors. In: 2008 IEEE Workshop on Design and
Diagnostics of Electronic Circuits and Systems: Bratislava, Slovak Republic, 16.-
18.4.2008. - Piscataway: IEEE, 2008. - ISBN 978-1-4244-2276-0. - p. 310-313. (in English)
[16] DONOVAL, M., DAŘÍČEK, M., STOPJAKOVÁ, V., MAREK, J.: On-Chip Supply Current
Monitoring Units Using Magnetic Force Sensing. In: IEEE International Conference on
Electronics, Circuits and Systems. - Piscataway: IEEE, 2008. - ISBN 978-1-4244-2182-4. -
p. 1229-1232. (in English)
[17] ĎURAČKOVÁ, D., KRAJMER, M., RACKO, J., BREZA, J.: The Influence of Dielectric
Layer on Charging Effect for Modelled Structure of Floating Gate MOS Transistors.
In: Dielectric and Insulating Systems in Electrical Engineering: 17th International
Conference DISEE 2008. Demänovská Dolina, Slovak Republic, 17.-19.9.2008. -
Bratislava: STU, 2008. - ISBN 978-80-227-2933-8. - p. 215-218. (in English)
[18] FLESCH, G.H., WERZER, O., WEIS, M., JAKABOVIČ, J., KOVÁČ, J., HAŠKO, D.,
JAKOPIC, G., WONDERGEM, H.J., RESEL, R.: A Combined x-Ray, Ellipsometry and
Atomic Force Microscopy Study on Thin Parylene-C-Films. In: XTOP 2008: 9th Biannual
Conference on High Resolution X-Ray Diffraction and Imaging. Linz, Austria, 15.-
19.9.2008. - Linz: Johannes Kepler Universität, 2008. - p. 174. (in English)
[19] FLESCH, G.H., WERZER, O., FRANK, P., BLÜMEL, A., KOVÁČ, J., JAKABOVIČ, J.,
JAKOPIC, G., RESEL, R.: Polymer Thin Film Characterization: A Combined Approach by
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