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JAMES REED WILSON - Industrial and Systems Engineering - North ...

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<strong>WILSON</strong> – 20<br />

63. Kuhl, M. E., E. K. Lada, N. M. Steiger, M. A. Wagner, <strong>and</strong> J. R. Wilson. 2006. Introduction to modeling<br />

<strong>and</strong> generating probabilistic input processes for simulation. In Proceedings of the 2006 Winter Simulation<br />

Conference, ed. L. F. Perrone, F. P. Wiel<strong>and</strong>, J. Liu, B. G. Lawson, D. M. Nicol, <strong>and</strong> R. M. Fujimoto, 19–35.<br />

Available online via www.informs-sim.org/wsc06papers/003.pdf [accessed May 23, 2007].<br />

64. Aktaran-Kalaycı, T., D. Goldsman, <strong>and</strong> J. R. Wilson. 2007. Confidence interval estimation using linear<br />

combinations of overlapping variance estimators. In Proceedings of the 2007 Winter Simulation Conference,<br />

ed. S. G. Henderson, B. Biller, M.-H. Hsieh, J. Shortle, J. D. Tew, <strong>and</strong> R. R. Barton, 448–454. Piscataway,<br />

New Jersey: Institute of Electrical <strong>and</strong> Electronics Engineers. Available online via www.informs-sim.org/<br />

wsc07papers/053.pdf [accessed June 14, 2008].<br />

65. Antonini, C., C. Alexopoulos, D. Goldsman, <strong>and</strong> J. R. Wilson. 2007. Folded st<strong>and</strong>ardized time series area variance<br />

estimators for simulation. In Proceedings of the 2007 Winter Simulation Conference, ed. S. G. Henderson,<br />

B. Biller, M.-H. Hsieh, J. Shortle, J. D. Tew, <strong>and</strong> R. R. Barton, 455–462. Piscataway, New Jersey: Institute of<br />

Electrical <strong>and</strong> Electronics Engineers. Available online via www.informs-sim.org/wsc07papers/054.pdf<br />

[accessed June 14, 2008].<br />

66. Elkins, D., A. C. LaFleur, E. Foster, J. Tew, B. Biller, <strong>and</strong> J. R. Wilson. 2007. Clinic: Correlated inputs in an<br />

automotive paint shop fire risk simulation. In Proceedings of the 2007 Winter Simulation Conference, ed. S. G.<br />

Henderson, B. Biller, M.-H. Hsieh, J. Shortle, J. D. Tew, <strong>and</strong> R. R. Barton, 250–259. Piscataway, New Jersey:<br />

Institute of Electrical <strong>and</strong> Electronics Engineers. Available online via www.informs-sim.org/wsc07papers/<br />

028.pdf [accessed June 14, 2008].<br />

67. Kuhl, M. E., E. K. Lada, N. M. Steiger, M. A. Wagner, <strong>and</strong> J. R. Wilson. 2007. Introduction to modeling <strong>and</strong><br />

generating probabilistic input processes for simulation. In Proceedings of the 2007 Winter Simulation Conference,<br />

ed. S. G. Henderson, B. Biller, M.-H. Hsieh, J. Shortle, J. D. Tew, <strong>and</strong> R. R. Barton, 63–76. Piscataway,<br />

New Jersey: Institute of Electrical <strong>and</strong> Electronics Engineers. Available online via www.informs-sim.org/<br />

wsc07papers/008.pdf [accessed June 14, 2008].<br />

68. Lada, E. K., <strong>and</strong> J. R. Wilson. 2007. SBatch: A spaced batch means procedure for simulation analysis. In<br />

Proceedings of the 2007 Winter Simulation Conference, ed. S. G. Henderson, B. Biller, M.-H. Hsieh, J. Shortle,<br />

J. D. Tew, <strong>and</strong> R. R. Barton, 463–471. Piscataway, New Jersey: Institute of Electrical <strong>and</strong> Electronics Engineers.<br />

Available online via www.informs-sim.org/wsc07papers/055.pdf [accessed June 14, 2008].<br />

69. Kuhl, M. E., S. Deo, <strong>and</strong> J. R. Wilson. 2008. Smooth flexible models of nonhomogeneous Poisson processes<br />

using one or more process realizations. In Proceedings of the 2008 Winter Simulation Conference, ed. S. J.<br />

Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, <strong>and</strong> J. W. Fowler, 353–361. Piscataway, New Jersey:<br />

Institute of Electrical <strong>and</strong> Electronics Engineers. Available online via www.informs-sim.org/wsc08papers/<br />

041.pdf [accessed April 25, 2009].<br />

70. Kuhl, M. E., E. K. Lada, N. M. Steiger, M. A. Wagner, <strong>and</strong> J. R. Wilson. 2008. Introduction to modeling<br />

<strong>and</strong> generating probabilistic input processes for simulation. In Proceedings of the 2008 Winter Simulation<br />

Conference, ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, <strong>and</strong> J. W. Fowler, 48–61. Piscataway,<br />

New Jersey: Institute of Electrical <strong>and</strong> Electronics Engineers. Available online as www.informs-sim.org/<br />

wsc08papers/008.pdf [accessed April 23, 2009].<br />

71. Tafazzoli, A., J. R. Wilson, E. K. Lada, <strong>and</strong> N. M. Steiger. 2008. Skart: A skewness- <strong>and</strong> autoregression-adjusted<br />

batch-means procedure for simulation analysis. In Proceedings of the 2008 Winter Simulation Conference, ed.<br />

S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, <strong>and</strong> J. W. Fowler, 387–395. Piscataway, New Jersey:<br />

Institute of Electrical <strong>and</strong> Electronics Engineers. Available online via www.informs-sim.org/wsc08papers/<br />

045.pdf [accessed April 23, 2009].<br />

72. Kuhl, M. E., S. Deo, <strong>and</strong> J. R. Wilson. 2009. Smooth flexible models of time-dependent arrivals using one or<br />

more process realizations. In Proceedings of the 2009 <strong>Industrial</strong> <strong>Engineering</strong> Research Conference, ed. J. Cole<br />

Smith <strong>and</strong> Joseph Guenes, 1706–1711. Atlanta, Georgia: Institute of <strong>Industrial</strong> Engineers. Available online via<br />

www.ise.ncsu.edu/jwilson/files/kuhl09iieac.pdf [accessed June 22, 2009].

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