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Presentation - Accounting for High Frequency Transmission Line Loss

Presentation - Accounting for High Frequency Transmission Line Loss

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On-chip Microstrip Simulations and<br />

Design dimensions:<br />

w=2.4um, h=3.25um, t=2.07um<br />

tanδ = 0.001 σ = 3.22E7<br />

passivation<br />

removed<br />

SiO 2<br />

ε r =4.1<br />

t<br />

w<br />

h<br />

Measured Data<br />

HFSS v9 view<br />

Measured data taken directly on<br />

a test wafer using the<br />

‘TRL’ calibration procedure<br />

to deembed the RF probe<br />

pads and extract the line<br />

characteristics.

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