Dias nummer 1 - DDV

IEC 61163-2
IEC 61163-3
IEC 61164
IEC 61165
IEC 61649
IEC 61650
IEC 61709
IEC 61710
IEC 61810-1
IEC 61810-2
IEC 62059-31
IEC 62308
IEC 62429
IEC 60706-6
IEC 60410
IEC 60300-3-16
IEC 61882
IEC 62402
Reliability stress screening – Part 2: Electronic components
Reliability stress screening – Part 3: Repairable single items (NWIP)
Reliability growth – Statistical test and estimation methods
Application of Markov techniques
Goodness-of-fit tests, confidence intervals and lower confidence limits for
Weibull distributed data
Reliability data analysis techniques – Procedures for the comparison of two
constant failure rates and two constant failure (event) intensities
Electronic components – Reliability – Reference conditions for failure rates and
stress models for conversion
Power law model – Goodness-of-fit tests and estimation methods
Electromechanical elementary relay - Part 1: General and safety requirements
Electromechanical elementary relay - Part 2: Reliability
Electricity metering equipment (a.c.) - Dependability - Part 31: Accelerated
reliability testing
Reliability assessment methods
Reliability growth - Stress testing for early failures in unique complex systems
Guide on maintainability of equipment – Part 6: Section 9: Statistical methods in
maintainability evaluation
Sampling plans and procedures for inspection by attributes
Dependability management - Part 3-16: Application guide - Guideline for the
specification of maintenance support services
Hazard and operability studies (HAZOP studies) - Application guide
Obsolescence management - Application guide