Change in the Sensitivity of CR-39 for Alpha-Tracks after Storage at ...
Change in the Sensitivity of CR-39 for Alpha-Tracks after Storage at ...
Change in the Sensitivity of CR-39 for Alpha-Tracks after Storage at ...
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P-1a-17<br />
( ) ( )<br />
D= 2V t V V − 1 V V + 1 (1)<br />
b t b t b<br />
where V b is namely <strong>the</strong> bulk etch r<strong>at</strong>e, th<strong>at</strong> is <strong>the</strong> etch<strong>in</strong>g velocity <strong>of</strong> <strong>the</strong> <strong>CR</strong>-<strong>39</strong> pl<strong>at</strong>e itself, and V t is namely <strong>the</strong><br />
track etch r<strong>at</strong>e, th<strong>at</strong> is <strong>the</strong> etch<strong>in</strong>g velocity along <strong>the</strong> track.<br />
Because V t /V b >>1<strong>for</strong> fission fragments, <strong>the</strong> bulk etch r<strong>at</strong>e is approxim<strong>at</strong>ely expressed as a function <strong>of</strong><br />
<strong>the</strong> etch pit diameter <strong>of</strong> <strong>the</strong> fission fragment D f :<br />
V = D 2 t<br />
(2)<br />
b<br />
The results <strong>for</strong> bulk etch r<strong>at</strong>e obta<strong>in</strong>ed by this equ<strong>at</strong>ion are shown <strong>in</strong> Fig.4.<br />
f<br />
1.65<br />
1.6<br />
Bulk Etch R<strong>at</strong>e (μm/h)<br />
1.55<br />
1.5<br />
1.45<br />
1.4<br />
1.35<br />
-80℃<br />
-23℃<br />
4℃<br />
23℃<br />
35℃<br />
1.3<br />
0 2 4 6 8 10 12 14<br />
<strong>Storage</strong> time (months)<br />
Fig.4<br />
<strong>Change</strong>s <strong>in</strong> bulk etch r<strong>at</strong>es <strong>of</strong> <strong>CR</strong>-<strong>39</strong> dur<strong>in</strong>g storage <strong>at</strong> different temper<strong>at</strong>ures.<br />
The changes <strong>of</strong> bulk etch r<strong>at</strong>es <strong>of</strong> <strong>CR</strong>-<strong>39</strong> observed <strong>in</strong> this study are summarized as follows.:<br />
(1) The storage <strong>at</strong> –80 °C and –23 °C <strong>for</strong> one year did not br<strong>in</strong>g any significant changes to <strong>the</strong> bulk etch r<strong>at</strong>e.<br />
(2) At 4 °C, <strong>the</strong> bulk etch r<strong>at</strong>e decreased gradually with <strong>the</strong> storage period and reached down to 88 % <strong>at</strong> one<br />
year <strong>after</strong> <strong>the</strong> start <strong>of</strong> <strong>the</strong> experiment.<br />
(3) At 23 °C, <strong>the</strong> bulk etch r<strong>at</strong>e decreased down to 88% dur<strong>in</strong>g one month. After th<strong>at</strong> it cont<strong>in</strong>ued to decrease<br />
slowly and reached to 84 % <strong>at</strong> one year <strong>after</strong> <strong>the</strong> start <strong>of</strong> <strong>the</strong> storage.<br />
(4) At 35 °C, <strong>the</strong> bulk etch r<strong>at</strong>e decreased dur<strong>in</strong>g one month down to 86%. It turned <strong>of</strong>f to <strong>the</strong> tendency <strong>of</strong><br />
<strong>in</strong>crease <strong>at</strong> 3 months. One year <strong>after</strong>, <strong>the</strong> bulk etch r<strong>at</strong>e returned to almost <strong>the</strong> same as th<strong>at</strong> <strong>at</strong> <strong>the</strong> start <strong>of</strong><br />
<strong>the</strong> experiment<br />
The change <strong>of</strong> bulk etch r<strong>at</strong>e thus observed <strong>in</strong> this study is a new f<strong>in</strong>d<strong>in</strong>g. Up to now <strong>the</strong> registr<strong>at</strong>ion<br />
property <strong>of</strong> <strong>CR</strong>-<strong>39</strong> has been <strong>in</strong>vestig<strong>at</strong>ed under an assumption th<strong>at</strong> <strong>the</strong> bulk etch r<strong>at</strong>e is almost constant even <strong>after</strong><br />
storage <strong>for</strong> long time <strong>at</strong> room temper<strong>at</strong>ure.<br />
3. <strong>Change</strong> <strong>of</strong> sensitivity.<br />
As an <strong>in</strong>dex <strong>of</strong> sensitivity <strong>of</strong> <strong>the</strong> solid st<strong>at</strong>e track detector, <strong>the</strong> value [V t /V b – 1] is <strong>of</strong>ten used. This<br />
value is derived from <strong>the</strong> equ<strong>at</strong>ions (1) and (2) as <strong>the</strong> equ<strong>at</strong>ion (3):<br />
{ ( ) } ( )<br />
{ }<br />
2 2<br />
t b a f a f<br />
V V − 1= 1+ D D 1− D D −1<br />
(3)<br />
4