CEA-Saclay Activities - TESLA Technology Collaboration - Desy

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CARE-SRF : Surface Preparation - EP Series of EP with samples • Gloss measurements allow fast evaluation of surface state • No correlation between etching rate and surface state <strong>TESLA</strong> collaboration meeting -LAL Orsay 07/09/2004 4
CARE-SRF : Surface Preparation - EP Rotating sample holder @ 16 V : • t = 470mn, d A-C =22 mm, Rem.Thick. = 160 µm • t = 470mn, d A-C = 92mm, Rem.Thick. = 80 µm EP bath • t = 300mn, d A-C =2.2mm, Rem.Thick. = 157 µm • Standard sample holder Rotating sample holder: (reproduces cavity geometry, exposure to air, rotation….) • Rotating anode: surface state differ considerably from what usually found on samples => better tool to estimate optimal conditions on cavities • Several bath compositions will be tested with design of experiment techniques (statistical tool => modelisation of the behavior of any bath composition) <strong>TESLA</strong> collaboration meeting -LAL Orsay 07/09/2004 5
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Page 7 and 8: CARE-SRF : Cold Piezo Tuner •Old
Page 9 and 10: CARE-SRF : Cold Piezo Tuner New des
Page 11 and 12: Cold Reentrant BPM Measurements in
Page 13 and 14: Beam loss Electronics Beam Tests on
Page 15 and 16: HOM (coll. with DESY) Beam Measurem

CEA-Saclay Activities - TESLA Technology Collaboration - Desy

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