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Web Inspection System | FSP600 - Optical Control Systems GmbH

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Sample Testing <strong>System</strong> ST4<br />

For an offline film defect analysis, film samples with<br />

the size of DIN A4 & DINA 3 can be analysed in<br />

detail with resolutions down to 20 µm. The scanner<br />

also helps to design inline inspection systems for<br />

production regarding the defect detection feasibility,<br />

the resolution, the right inspection angle and lighting<br />

technology.<br />

Technical Data<br />

• Measuring principle<br />

Transmission modus & reflection modus with<br />

various inspection angles<br />

• Lighting technology<br />

High frequent fluorescent lamps with focus<br />

rod<br />

High power Chip on Board (COB)<br />

blue/white/red/infrared LEDs<br />

• Resolution<br />

From 20 µm to 400 µm<br />

• Sample size<br />

DIN A3 or DIN A4

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