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Rev. Sci. Instrum., Vol. 73, No. 11, November 2002<br />

A <strong>differentially</strong> <strong>pumped</strong> <strong>electrostatic</strong> <strong>lens</strong><br />

3877<br />

high-pressure photoemission <strong>system</strong>. Using this general approach,<br />

it should be possible to make photoemission measurements<br />

up to 100 mbar. Although our experiment has<br />

been implemented at a synchrotron beamline, it should also<br />

be possible to apply the same concepts with a conventional<br />

small-spot x-ray source.<br />

ACKNOWLEDGMENTS<br />

The authors would like to thank Dr. C. H. Alfred Huan<br />

and Dr. E. D. Moler <strong>for</strong> an introduction to synchrotron experiments<br />

and assistance with beamline 9.3.2. Dr. Eli Rotenberg<br />

provided advice and LABVIEW source code <strong>for</strong> controlling<br />

the hemispherical analyzer. Ed Wong built many parts<br />

<strong>for</strong> the HPPES <strong>system</strong> and cheerfully responded to emergency<br />

requests. This work was supported by the Director,<br />

Office of Science, Office of Basic Energy Sciences, Materials<br />

Sciences Division of the U.S. Department of Energy under<br />

Contract No. DE-AC03-76SF00098.<br />

1 Practical Surface Analysis, 2nd ed., edited by D. Briggs and M. P. Seah<br />

Wiley, New York, 1990, Vol.1.<br />

2 J. Stöhr, NEXAFS Spectroscopy Springer, Berlin, 1992.<br />

3 X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEX-<br />

AFS, and XANES, edited by D. C. Koningsberger and R. Prins Wiley,<br />

New York, 1988.<br />

4 C. S. Fadley, M. A. Van Hove, Z. Hussain, and A. P. Kaduwela, J. Electron<br />

Spectrosc. Relat. Phenom. 75, 2731995.<br />

5 K. Siegbahn et al., ESCA Applied to Free Molecules North-Holland, Amsterdam,<br />

1969.<br />

6 H. Siegbahn and K. Siegbahn, J. Electron Spectrosc. Relat. Phenom. 2,<br />

319 1973; H. Fellner-Feldegg, H. Siegbahn, L. Asplund, P. Kelfve, and<br />

K. Siegbahn, ibid. 7, 421 1975; H. Siegbahn, S. Svensson, and M. Lundholm,<br />

ibid. 24, 205 1981.<br />

7 R. W. Joyner, M. W. Roberts, and K. Yates, Surf. Sci. 87, 5011979.<br />

8 H. J. Ruppender, M. Grunze, C. W. Kong, and M. Wilmers, Surf. Interface<br />

Anal. 15, 245 1990.<br />

9 M. A. Kelly, M. L. Shek, P. Pianetta, T. M. Gür, and M. R. Beasley, J. Vac.<br />

Sci. Technol. A 19, 2127 2001.<br />

10 A. Nilsson unpublished results.<br />

11 H. Bluhm, D. F. Ogletree, C. S. Fadley, Z. Hussain, and M. Salmeron, J.<br />

Phys.: Condens. Matter 14, L227 2002.<br />

12 H. Bluhm, M. Hävecker, A. Knop-Gericke, V. I. Bukhtiyarov, D. F. Ogletree,<br />

M. Salmeron, and R. Schlögl unpublished.<br />

13 See any standard text on statistical thermodynamics, <strong>for</strong> example, F. W.<br />

Sears and G. L. Salinger, Thermodynamics, Kinetic Theory, and Statistical<br />

Thermodynamics, 3rd ed. Addison Wesley, Reading, MA, 1975.<br />

14 See Ref. 1, p. 209.<br />

15 D. R. Miller, in Atomic and Molecular Beam Methods, edited by G. Scoles<br />

Ox<strong>for</strong>d University Press, New York, 1988.<br />

16 The Physical Electronics hemispherical capacitor analyzer used in the prototype<br />

HPPES <strong>system</strong> has a maximum acceptance of 7°. The Specs<br />

Phoibos 150 analyzer that will be used <strong>for</strong> the second generation <strong>system</strong><br />

has a maximum acceptance of 9°.<br />

17 PHI 360 SCA with Omni IV input <strong>lens</strong> and a 16 anode channel-plate<br />

detector: Physical Electronics, Inc., Eden Prairie, MN.<br />

18 MacroTorr 250, Varian Vacuum Technologies, Lexington, MA.<br />

19 MKS Instruments, Inc., Andover, MA.<br />

20 A graphical instrument control environment developed by National Instruments,<br />

Inc., Austin, TX.<br />

21 J. Ghijsen, L. H. Tjeng, J. van Elp, H. Eskes, J. Westerink, G. A. Sawatzky,<br />

and M. T. Czyzyk, Phys. Rev. B 38, 11322 1998.<br />

22 See J. Electron Spectrosc. Relat. Phenom. 75, 111995 <strong>for</strong> a discussion<br />

of the splitting of the O 1s level of O 2 .<br />

23 S. Myneni et al., J. Phys.: Condens. Matter 14, L213 2002.<br />

Downloaded 26 Nov 2009 to 157.92.44.71. Redistribution subject to AIP license or copyright; see http://rsi.aip.org/rsi/copyright.jsp

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