PTV 28956 - Protavic America
PTV 28956 - Protavic America
PTV 28956 - Protavic America
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2 - ELECTRICAL PROPERTIES<br />
Properties<br />
Methods<br />
Units<br />
Typical values<br />
Dielectric rigidity<br />
NFC 26255<br />
kV/mm<br />
> 15<br />
Dielectric constant at 100 HZ and 20°C<br />
NFC 26230<br />
--<br />
5.0 ± 0.5<br />
Electrical dissipation factor at<br />
100 HZ and 20°C<br />
NFC 26230<br />
--<br />
< 0.01<br />
Transverse resistivity<br />
NFC 26215<br />
Ω.cm<br />
> 10 +13<br />
3 - THERMAL PROPERTIES<br />
Properties<br />
Methods<br />
Units<br />
Typical values<br />
Glass transition temperature Tg<br />
DSC 1*<br />
°C<br />
145 - 155<br />
Coefficient of linear expansion<br />
from -50 to +100°C<br />
TMA 1*<br />
10 -6<br />
23 - 25<br />
Coefficient of linear expansion<br />
from 200 to 300°C<br />
TMA 1*<br />
10 -6<br />
85 - 100<br />
Thermal conductivity<br />
CTH 2<br />
W/(m.K)<br />
> 0.70<br />
Decomposition temperature<br />
TGA 1*<br />
°C<br />
> 350<br />
Linear shrinkage<br />
NFT 51401<br />
%<br />
< 0.15<br />
Temperature content<br />
thermal shocks<br />
> 2 000<br />
°C<br />
-65 to 150<br />
* Thermo-analysis chain Mettler TA 3000.<br />
FIELD OF USE<br />
The PROTAVIC ® L 127 HV single-component, high<br />
purity insulating resin has been developed for<br />
protecting semi-conductors in the field of MCM,<br />
chip carriers, hybrid circuits and chip on board<br />
applications.<br />
It is generally recommended for large-sized semiconductors.<br />
It is used in combination with the PROTAVIC ® L 127<br />
resin with the advantage of being absolutely compatible<br />
chemically.<br />
This enables PROTAVIC ® L 127 HV resin to be<br />
applied to form a cordon, with the cavity being filled<br />
with the PROTAVIC ® L 127 resin.<br />
The two resins can then be cured together in<br />
accordance with the same cycle.<br />
The film of resin over the silicon is thus very fine,<br />
which limits the total thickness and stresses.<br />
The high ionic purity guarantees good reliability of<br />
the semi-conductor. The same is true of the<br />
adhesion on different substrates which offers<br />
optimum protection against external agents<br />
(moisture, dust, etc).<br />
KII - 3 -