adapt - Satisloh
adapt - Satisloh
adapt - Satisloh
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Example of a dwell time<br />
controlled tool path<br />
Local calculation of pressure<br />
distribution at the contact point<br />
Interferogram as data-input<br />
Available for SPS-60 and SPS-140<br />
Contact<br />
<strong>Satisloh</strong> AG<br />
Neuhofstrasse 12<br />
CH - 6340 Baar<br />
Switzerland<br />
Phone: +41 (0) 41766 16 16<br />
Fax: +41 (0) 41766 16 10<br />
Mail: info@satisloh.com<br />
www.satisloh.com<br />
North America<br />
Europe<br />
Asia<br />
Features:<br />
• New polishing technology<br />
available on MTX-controlled<br />
polishing-machines<br />
• Removal-function is calculated<br />
based on local geometry of lensshape<br />
• Processes: Deterministic preand<br />
local corrective-polishing on<br />
aspherical shapes<br />
• Polishing-modes:<br />
- spindle-mode (pre-polishing/rotational<br />
symmetrical correction)<br />
- axis-mode (correction of nonrotational<br />
symmetric errors)<br />
Benefits:<br />
•<br />
•<br />
•<br />
All in one: Pre- and corrective polishing<br />
in one machine<br />
Easy setup: Simple, user-guided<br />
software-input with operation optimized<br />
for industrial environment<br />
Fast process: Scalable removal<br />
rates, less iterative steps in<br />
production<br />
Technical Information:<br />
Available for SPS-60 and SPS-140<br />
Runs on external multi-core PC with<br />
Microsoft WindowsTM •<br />
•<br />
64 bit<br />
•<br />
Metrology interfaces: Taylor-Hobson,<br />
Mahr, Zygo, Zeiss, others on request<br />
Sales Service<br />
Phone: +1 262 255 6001 +1 262 255 6001<br />
Email: info.usa@satisloh.com service.usa@satisloh.com<br />
Phone: +49 (0) 6441 912 0 +49 (0) 6441 912 555<br />
Email: info.de@satisloh.com service.de@satisloh.com<br />
Phone: +852 27 56 7711 +852 27 53 5058<br />
Email: info.asia@satisloh.com service.asia@satisloh.com<br />
•<br />
•<br />
•<br />
•<br />
•<br />
•<br />
Software: User-guided graphical<br />
interface, pre-simulation of the result,<br />
easy-to-use metrology-processing<br />
Tools: Exchangeable, pre-configured<br />
polishing-pads<br />
CGH distortion compensation:<br />
Map transformation of 3D interferometer<br />
data<br />
Cost-effective: Common polishingcompounds<br />
are used (e.g. CeO 2)<br />
Best results low residual structure,<br />
superb surface finish<br />
Less non-productive-time: Simple<br />
and maintenance-free tools<br />
© <strong>Satisloh</strong> / KH / May 2012<br />
Subject to technical changes
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