Testing Embedded Systems in the Automotive Industry with TTCN-3
Testing Embedded Systems in the Automotive Industry with TTCN-3
Testing Embedded Systems in the Automotive Industry with TTCN-3
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Example: Comparison of Message Tim<strong>in</strong>g<strong>in</strong> Standard <strong>TTCN</strong>-3www.temea.orgArrival of messages m o ,..,m n and <strong>the</strong>timeout of timers t 0 ,..,t m are denotedby events e 0 ,..,e k+1 ,9tim<strong>in</strong>g is measured by comparisonof events, andonly events that occur <strong>in</strong> differentsnapshots are dist<strong>in</strong>guishable.Duration between two consecutive snapshot denote <strong>the</strong> bestaccuracy of time measurement for standard <strong>TTCN</strong>-3. Theduration depends on:- <strong>the</strong> number of messages that arrive and <strong>the</strong> number of ports(queues) to check,- <strong>the</strong> duration of check, decode, match for <strong>in</strong>dividual messages where<strong>the</strong> duration of decode and match is directly dependent on <strong>the</strong>content and structure of <strong>the</strong> message under observation.