Characterizing the astrometric errors in the Gaia catalogue Berry Holl

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Location estimation in presence of radiation damaget l → t 1 ,t 2 ,...,t 720No trapsFast trapsSlow trapsPhoto electrons!4x10 43x10 42x10 4 !observedcountstrue LSFPhoto electrons!4x10 43x10 42x10 4 !Photo electrons!4x10 43x10 42x10 4 !1x10 41x10 41x10 40!0 1 2 3 4 5 6 7 8 9 10 11 12!Along-scan pixel!✓ Flux conserved✓ Original line profile0!0 1 2 3 4 5 6 7 8 9 10 11 12!Along-scan pixel!✓ Flux ~ conserved- Line profile distorted0!0 1 2 3 4 5 6 7 8 9 10 11 12!Along-scan pixel!- Flux not conserved- Line profile distortedProdʼhomme & Holl et al. (2011)47Location estimation in presence of radiation damaget l → t 1 ,t 2 ,...,t 720No trapsFast trapsSlow trapsPhoto electrons!4x10 43x10 42x10 4 !observedcountstrue LSFPhoto electrons!4x10 43x10 42x10 4 !Photo electrons!4x10 43x10 42x10 4 !1x10 41x10 41x10 40!0 1 2 3 4 5 6 7 8 9 10 11 12!Along-scan pixel!✓ Flux conserved✓ Original line profile0!0 1 2 3 4 5 6 7 8 9 10 11 12!Along-scan pixel!✓ Flux ~ conserved- Line profile distorted0!0 1 2 3 4 5 6 7 8 9 10 11 12!Along-scan pixel!- Flux not conserved- Line profile distortedUsing slow trap with time release constant of ~90 msProdʼhomme & Holl et al. (2011)48
Location estimation in presence of radiation damaget l → t 1 ,t 2 ,...,t 720Fitting ‘damaged’ observations with:Location bias [pixels]undamaged LSF0.160.140.120.100.080.060.040.02Trap density = 1 trap/pixel:backgroundno backgroundExperimental data CI delay 1 sColours: different profile widths13 14 15 16 17 18 19 20GProdʼhomme & Holl et al. (2011)108642[mas]undamaged LSF perturbed byCharge Distortion Model (CDM)Location bias [pixels]0.030.020.010CTI-freeoptimal CDMCDMred: 4 traps/pixel1.51.00.5−0.01 black:−0.51 trap/pixel−1.0−0.0213 14 15 16 17 18 19 20G049[mas]Effect of image location errors on astrometryInput pattern observation bias:Location bias, δ max [mas]3.02.52.01.51.00.50Standard deviation [mas]−0.50.213 14 15 16 17 18 19 20G210.5Full damageMitigatedCTI-freeResiduals pattern after AGIS:Mean time residual [mas]3210−1−2−3Can use residualpattern to ‘correct’observations!−413 14 15 16 17 18 19 20Gt 1,t 2,...,t 72013 14 15 16 17 18 19 20G...,α, δ, ,µ α∗,µ δ, σ α∗, ρ αδ, σ δ,...Holl & Prodʼhomme et al. (2012)50
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Page 8 and 9: t 1,t 2,...,t 720...,α, δ, ,µ α
Page 10: objects and their characteristics.
Page 13 and 14: s i(α, δ) J2016t 1,t 2,...,t 720
Page 15 and 16: Introduction to astrometry & GaiaIm
Page 17 and 18: 150uncorrelated1+,correlation coeff
Page 19 and 20: Berry Holl Characterization and ana
Page 21 and 22: 0.0075 0.0125CorrelationCorrelation
Page 23: Berry Holl Characterization and ana
Page 27 and 28: Berry Holl Characterization and ana

Characterizing the astrometric errors in the Gaia catalogue Berry Holl

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