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CPC - G01N - 15.04.2013 - page 59means G01N 2015/1486 )G01N 2015/1068 . . Recognizing failure of the analyser, e.g. bubblesQuality control for particle analysersG01N 2015/1075 . . Determining speed or velocity of a particleG01N 2015/1081 . . Sorting the particlesG01N 2015/1087 . . Particle sizeG01N 2015/1093 . . Particle shapeG01N 2015/12 . . Coulter-countersG01N 2015/1209 . . . { Details }G01N 2015/1236 . . . . Flow formingG01N 2015/1254 . . . ElectrodesG01N 2015/1263 . . . . Scanning electrodesG01N 2015/1272 . . . CleaningG01N 2015/1281 . . . Detecting blocking debrisG01N 2015/129 . . . measuring the ratio of AC/DC impedancesG01N 2015/14 . . Electro-optical investigation, e.g. flow cytometersG01N 2015/1402 . . . Data analysis by thresholding or gating operations performed on the acquiredsignals or stored dataG01N 2015/1404 . . . { Fluid conditioning in flow cytometers, e.g. flow cells; Supply; Control of flow }G01N 2015/1406 . . . . Control of droplet pointG01N 2015/1409 . . . . Control of supply of sheaths fluid, e.g. sample injection controlG01N 2015/1411 . . . . . Features of sheats fluidsG01N 2015/1413 . . . . Hydrodynamic focussingG01N 2015/1415 . . . . Control of particle positionG01N 2015/1418 . . . . Eliminating clogging of debrisG01N 2015/142 . . . . Acoustic or ultrasonic focussingG01N 2015/1422 . . . . Electrical focussingG01N 2015/1434 . . . { using an analyser being characterised by its optical arrangement }G01N 2015/1438 . . . . Using two lasers in successionG01N 2015/144 . . . . Imaging characterised by its optical setupG01N 2015/1443 . . . . . Auxiliary imagingG01N 2015/1445 . . . . . Three-dimensional imaging, imaging in different image planes, e.g. underdifferent angles or at different depths, e.g. by a relative motion of sampleand detector, for instance by tomographyG01N 2015/1447 . . . . Spatial selectionG01N 2015/145 . . . . . by pattern of light, e.g. fringe patternG01N 2015/1452 . . . . Adjustment of focusAlignmentG01N 2015/1454 . . . . using phase shift or interference, e.g. for improving contrastG01N 2015/1456 . . . { without spatial resolution of the texture or inner structure of the particle, e.g.processing of pulse signals }G01N 2015/1461 . . . . Coincidence detectingCircuits thereforG01N 2015/1463 . . . . { using image analysis for extracting features of the particle }