rESEArCH HIGHLIGHTS - Charlotte Research Institute - University ...

Center for Precision Metrologyatoms to aerospace, sensors to systems, science to standardization,principle to practice, origination to optimizationThe Center for Precision Metrology (CPM) is an interdisciplinary association of UNC Charlotte facultyand student researchers. CPM is allied with industrial partners in the research, development and integrationof metrology (the science of measurement) as it applies to manufacturing. Precision Metrology encompassesmethods of production and inspection in manufacturing; measurement algorithms and tolerancerepresentation; and the integration of metrology into factory quality systems. With five spin-off companies,the Center is pivotal to the Charlotte Research Institute’s mission of economic development.Research outcomes in the above areas have resulted in immediate impacts on the bottom lines of CPMindustry affiliates. These benefits include corporate cost savings of $1 million and shared intellectual capitalvalued at $100,000-$200,000, as well as highly specialized Center graduates ready for hire. Last year,CPM graduated four Ph.D. and eight Master’s degree students, and successfully placed two graduates in newcareers at industry affiliates Mitutoyo and Caterpillar corporations.The National Science Foundation (NSF) is currently funding a jointproject bringing CPM in collaboration with UCLA, UC Berkeleyand HP Labs to build a Multi-Scale Alignment Positioning System(MAPS). MAPS is a nano-precision stage with six degrees of freedomcomprised of a precision positioning stage, control system, andinterchangeable modules; these modules are designed to performnano-scale imprint lithography, plasmonic imaging lithography andnano-assembly on the surface of 50.8 mm substrates. The MAPSmachine is nearing completion and will be used initially to makecross bar memory with densities exceeding current capabilities. Thismachine will enable production of more cost-effective and scalablecomputer chips for faster and smaller computers.This past March, CPM was tapped by the NSF to host the 4th U.S.-Japan Young Researchers Exchange in Nanotechnology at UNCCharlotte. More than 40 young researchers from all over the U.S.and Japan came together to share research interests and information,thereby spurring development of future technologies beneficial toglobal manufacturing.CPM faculty and students continue to represent UNC Charlottethrough international scholarship (34 papers presented) andpublications (18 journal articles) as well as leadership roles in industry research associations. Eighteen faculty/staff members and students, and ten Center alumni, attended the American Society of Precision EngineeringConference this year, presenting two papers (one on affiliate work) and five poster presentations. CenterDirector Dr. Bob Hocken gave an invited talk on Nanotechnology at IMTS (International ManufacturingTechnology Show) and was named President-elect of CIRP (Journal of Manufacturing Science). Dr. Ed Morsegave invited talks at the Manufacturing and Metrology Conference and Workshop and at the Association forCoordinate Metrology in Canada. Professor Morse leads the ISO (International Standards Organization)task force on Articulated Arms and Laser Trackers and holds a position on the NCSL International (NationalConference of Standards Laboratories) panel. Dr. Scott Smith became a CIRP Fellow this year.CPM was again awarded two scholarships by NCSL for students to work in metrology.Engineering doctoral student, OzkanOzturk works with the Multi-Scale AlignmentPositioning System (MAPS) machine that willenable production of more cost effective andmore scalable computer chips for faster andsmaller computers.11Research Highlights 2006-2007Visit: www.cpm.uncc.edu