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Technical Guidance and Sales Support<br />

Eugenie Neureuther | Phone +49 8153 405-53 | e.neureuther@laser2000.de<br />

Technical Details<br />

Product no.<br />

RAP-OWL-1280<br />

FPA Specification<br />

Sensor Type<br />

InGaAs PIN-Photodiode<br />

Active Pixel<br />

1280 pixel x 1024 pixel or 640 pixel x 512 pixel (binning)<br />

Pixel Pitch<br />

10 μm x 10 μm or 20 μm x 20 μm (binning)<br />

Active Area<br />

12.8 mm x 10.24 mm<br />

Spectral response<br />

0.4 μm to 1.7 μm<br />

Noise (RMS)<br />

< 170 electrons Low Gain < 35 electrons High Gain<br />

Quantum Efficiency<br />

Peak > 85 % (> 73 % @ 1064 mm, 78 % @ 1.55 mm)<br />

Pixel Well Depth<br />

Low Gain: 500 ke-, High Gain: >10 ke-<br />

Pixel Operability > 99.5 %<br />

Camera Specification<br />

Digital Output Format<br />

14 bit CameraLink (base configuration)<br />

Exposure time<br />

1 μm to 1/frame rate<br />

Shutter mode<br />

Global shutter<br />

Frame Rate<br />

10 Hz to 60 Hz programmable, 25 ns resolution<br />

Optical interface<br />

C-mount (selection of SWIR lens available)<br />

Camera Setup/Control<br />

Camera Link<br />

Dynamic Range<br />

14 bit<br />

Trigger interface<br />

Trigger IN and OUT - TTL compatible<br />

Power supply 12 V DC ±10 %<br />

TE Cooling<br />

ON/OFF<br />

Image Correction<br />

3 point NUC (offset, Gain & Dark Current) + pixel correction<br />

Functions controlled by serial communication Exposure, intelligent AGC, Non Uniformity Correction, Gamma, Pk/Av, TEC, ROI<br />

Camera Power Consumption<br />

< 3.5 W (TEC OFF, NUC ON), < 4 W (TEC ON in ambient, NUC ON)<br />

Operating Case Temperature -20 °C to +55 °C<br />

Storage Temperature -30 °C to +60 °C<br />

Dimensions & Weight<br />

50 mm x 50 mm x 61 mm / 247 g<br />

Applications<br />

QE Curves<br />

• Surveillance 860, 1064 & 1550 nm laser line detection<br />

• Active Imaging<br />

• Airborne Payload<br />

• Hand Held Goggles<br />

• Imaging through Fog<br />

• Range Finding<br />

• Vision enhancement<br />

• Astronomy<br />

• Beam Profiling<br />

• Hyperspectral Imaging<br />

• Semiconductor Inspection<br />

• Solar Cell Inspection<br />

• Thermography<br />

9

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