Division 2 Activity Report - CIE Australia
Division 2 Activity Report - CIE Australia
Division 2 Activity Report - CIE Australia
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Attachment 8<br />
<strong>Report</strong> from <strong>Report</strong>ership 2-32: Visual appearance measurement<br />
<strong>Report</strong>er: Date: 2009-04-16<br />
Mike Pointer (UK) I will give overview<br />
This reportership provides a liaison between <strong>Division</strong> 1 TC1-72 and <strong>Division</strong> 2.<br />
TC 1-72 Measurement of Appearance Network: MApNet<br />
Formed: Beijing, 2007<br />
Terms of Reference:<br />
1. To establish a network of those interested in the measurement of visual<br />
appearance.<br />
2. The network shall be under the direction and guidance of a group of at least four<br />
Technical Leaders each responsible for a particular aspect of the subject.<br />
3. Each Technical Leader shall provide substantial periodic reports in a form that<br />
might be published.<br />
4. A second Expert Symposium on Appearance shall be organised at an appropriate<br />
time within the next 4 years.<br />
5. A database of relevant published work shall be maintained.<br />
6. Consideration shall be given to the establishment of separate Technical Committees<br />
when appropriate.<br />
<strong>Report</strong><br />
MApNet is active, currently with 73 members. The work of the Technical Committee is<br />
divided into eight areas:<br />
1. Physical Aspects of Appearance<br />
2. Non-Imaging Appearance Metrology<br />
3. Imaging Appearance Metrology<br />
4. Gloss<br />
5. Colour<br />
6. Translucency<br />
7. Texture<br />
8. Total Appearance<br />
Achievements<br />
Each group except the last has a Technical Leader several of whom have submitted<br />
reports summarising relevant activities during 2008. The total report was too long to<br />
include in <strong>Division</strong> 1 <strong>Activity</strong> <strong>Report</strong> which was published in February 2009: it can<br />
however be obtained from the TC Chair, Mike Pointer, at mrpointer@btinternet.com.<br />
Next <strong>CIE</strong> Expert Symposium on Appearance<br />
Following the very successful symposium organised by Françoise Viénot and her team<br />
in Paris in October 2006, the TC is planning the next <strong>CIE</strong> Expert Symposium for<br />
September 2010.<br />
Peter Hanselaer (<strong>CIE</strong> <strong>Division</strong> 1 member for Belgium) and Frédéric Leloup (<strong>CIE</strong> TC1-72<br />
Technical Leader for non-imaging appearance metrology) have agreed to host the next<br />
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