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Division 2 Activity Report - CIE Australia

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Attachment 8<br />

<strong>Report</strong> from <strong>Report</strong>ership 2-32: Visual appearance measurement<br />

<strong>Report</strong>er: Date: 2009-04-16<br />

Mike Pointer (UK) I will give overview<br />

This reportership provides a liaison between <strong>Division</strong> 1 TC1-72 and <strong>Division</strong> 2.<br />

TC 1-72 Measurement of Appearance Network: MApNet<br />

Formed: Beijing, 2007<br />

Terms of Reference:<br />

1. To establish a network of those interested in the measurement of visual<br />

appearance.<br />

2. The network shall be under the direction and guidance of a group of at least four<br />

Technical Leaders each responsible for a particular aspect of the subject.<br />

3. Each Technical Leader shall provide substantial periodic reports in a form that<br />

might be published.<br />

4. A second Expert Symposium on Appearance shall be organised at an appropriate<br />

time within the next 4 years.<br />

5. A database of relevant published work shall be maintained.<br />

6. Consideration shall be given to the establishment of separate Technical Committees<br />

when appropriate.<br />

<strong>Report</strong><br />

MApNet is active, currently with 73 members. The work of the Technical Committee is<br />

divided into eight areas:<br />

1. Physical Aspects of Appearance<br />

2. Non-Imaging Appearance Metrology<br />

3. Imaging Appearance Metrology<br />

4. Gloss<br />

5. Colour<br />

6. Translucency<br />

7. Texture<br />

8. Total Appearance<br />

Achievements<br />

Each group except the last has a Technical Leader several of whom have submitted<br />

reports summarising relevant activities during 2008. The total report was too long to<br />

include in <strong>Division</strong> 1 <strong>Activity</strong> <strong>Report</strong> which was published in February 2009: it can<br />

however be obtained from the TC Chair, Mike Pointer, at mrpointer@btinternet.com.<br />

Next <strong>CIE</strong> Expert Symposium on Appearance<br />

Following the very successful symposium organised by Françoise Viénot and her team<br />

in Paris in October 2006, the TC is planning the next <strong>CIE</strong> Expert Symposium for<br />

September 2010.<br />

Peter Hanselaer (<strong>CIE</strong> <strong>Division</strong> 1 member for Belgium) and Frédéric Leloup (<strong>CIE</strong> TC1-72<br />

Technical Leader for non-imaging appearance metrology) have agreed to host the next<br />

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