種々の結晶方位解析法と SEM/EBSD 法の原理 - Tsuji Lab - 京都大学
種々の結晶方位解析法と SEM/EBSD 法の原理 - Tsuji Lab - 京都大学
種々の結晶方位解析法と SEM/EBSD 法の原理 - Tsuji Lab - 京都大学
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20 <br />
<strong>EBSD</strong> <br />
2008.11.28 <br />
<br />
<br />
<br />
scanning electron microscope: <strong>SEM</strong><br />
<strong>EBSD</strong>electron back<br />
scattering diffraction[1-4] 10 <br />
<strong>EBSD</strong> <br />
<br />
<br />
<br />
anisotropy<br />
polycrystalorientation<br />
<br />
texture<br />
<br />
<br />
<strong>EBSD</strong> <br />
<strong>EBSD</strong> <br />
<br />
<strong>EBSD</strong> <br />
<strong>EBSD</strong> <br />
<br />
<br />
<br />
Table 1 <strong>EBSD</strong>
Table 1 <br />
<br />
<br />
<br />
<br />
<br />
<br />
<br />
- 10 mmφ < ~60 min / pole figure [5,6]<br />
1° < 1 mmφ < ~30 min / point [6]<br />
<br />
<br />
5° < 10 µmφ < ~30 min / point [7-9]<br />
0.5° < 5 µmφ < ~15 min / point [10,11]<br />
0.5° < 5 µmφ < ~30 min / point [11-13]<br />
0.1° < 10 nmφ <
Fig.1 {111} ODF Al [17]<br />
LaueX <br />
<br />
<br />
X <br />
[18,19]<br />
<br />
<br />
<br />
{111}, {110}, {100}<br />
<br />
<strong>SEM</strong> <br />
<br />
[7-9, 20-22]Figure 2 <br />
Fe-19CrFe-36Ni<br />
<strong>SEM</strong> [23] BCC <br />
{110} 12 <br />
FCC <br />
{111}{001}<br />
[23,24]Fe-19Cr <br />
<strong>SEM</strong> <br />
Fig.3 [25]{001}{111}<br />
<br />
<br />
<br />
<br />
10m <br />
<br />
Fig.2 Fe-19Cr Fe-36Ni <br />
<strong>SEM</strong> [23]
Fig.3 Fe-19Cr <br />
<strong>SEM</strong> [25]<br />
<strong>SEM</strong>scanning electron microscope<br />
<strong>EBSD</strong> <br />
X <br />
<br />
[10,11]<br />
Figure 4 [11]<br />
<strong>EBSD</strong> Kikuchi <br />
X <br />
Fig.4 <br />
<br />
X <strong>SEM</strong>
Fig.4 [11]<br />
<strong>SEM</strong> <br />
Fig.5 (a) [13]Fig.5 (b)<br />
Kikuchi <br />
ECPelectron channeling pattern[11-13]Kikuchi <br />
<br />
<br />
m ECP <br />
<br />
ECP Fig.6 <br />
[26]Fe-19Cr 185 <br />
<br />
Fig.5 (a) ECP [13](b) ECP
Fig.6 ECP Fe-19Cr 185 <br />
TEMtransmission electron microscope<br />
TEM <br />
SADselected area diffraction<br />
<br />
Fig.7 <br />
<br />
001 <br />
[001]<br />
<br />
1015[14]SAD <br />
<br />
<br />
<br />
<strong>EBSD</strong>
Fig.7 BCC [27]
<strong>EBSD</strong> <br />
<strong>EBSD</strong> <strong>SEM</strong> <br />
electron back-scattering pattern Kikuchi <br />
Kikuchi <br />
<strong>EBSD</strong> Fig.8 <br />
<strong>EBSD</strong> 1973 [1]<strong>EBSD</strong><br />
1991 <br />
1993 Adams [28,29] Orientation Imaging Microscopy (OIM)<br />
[1]<br />
Fig.9 <br />
<strong>EBSD</strong> <br />
<strong>SEM</strong> <br />
<br />
<br />
<br />
<br />
microstructure<br />
grain boundary<br />
interface<br />
Kikuchi <br />
<strong>EBSD</strong> <br />
<br />
OIM <br />
<br />
Fig.8 Kikuchi SBSD
Fig.9 <strong>EBSD</strong> [3]<br />
<strong>EBSD</strong> Kikuchi 0.1<br />
<br />
<br />
ECP Fig.6 <strong>EBSD</strong> <br />
<strong>EBSD</strong>
<strong>EBSD</strong> ECP <br />
Fig.10 ARB<br />
4.8 <br />
<strong>EBSD</strong> <br />
200nm<br />
4050nm <br />
<br />
Fig.10 ARB 4.8 Al <strong>EBSD</strong> (a) ND<br />
(b) RD (c) [30]<br />
<strong>EBSD</strong> <br />
Figure 11 <br />
<strong>EBSD</strong><br />
[31,32]<br />
[31,32] <strong>EBSD</strong> <br />
<br />
<strong>EBSD</strong> <br />
Fig.11 <br />
[33]
Fig.11 (a) 28.5at%Ni (b) 0.2wt%C <br />
<strong>EBSD</strong> [31,32]<br />
<strong>EBSD</strong> <br />
[33,34]12<br />
<strong>EBSD</strong> <br />
TEM Kikuchi <br />
TEM/Kikuchi <strong>EBSD</strong> <br />
<br />
[15]TEM/Kikuchi <strong>EBSD</strong><br />
<br />
<br />
<br />
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