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種々の結晶方位解析法と SEM/EBSD 法の原理 - Tsuji Lab - 京都大学

種々の結晶方位解析法と SEM/EBSD 法の原理 - Tsuji Lab - 京都大学

種々の結晶方位解析法と SEM/EBSD 法の原理 - Tsuji Lab - 京都大学

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20 <br />

<strong>EBSD</strong> <br />

2008.11.28 <br />

<br />

<br />

<br />

scanning electron microscope: <strong>SEM</strong><br />

<strong>EBSD</strong>electron back<br />

scattering diffraction[1-4] 10 <br />

<strong>EBSD</strong> <br />

<br />

<br />

<br />

anisotropy<br />

polycrystalorientation<br />

<br />

texture<br />

<br />

<br />

<strong>EBSD</strong> <br />

<strong>EBSD</strong> <br />

<br />

<strong>EBSD</strong> <br />

<strong>EBSD</strong> <br />

<br />

<br />

<br />

Table 1 <strong>EBSD</strong>


Table 1 <br />

<br />

<br />

<br />

<br />

<br />

<br />

<br />

- 10 mmφ < ~60 min / pole figure [5,6]<br />

1° < 1 mmφ < ~30 min / point [6]<br />

<br />

<br />

5° < 10 µmφ < ~30 min / point [7-9]<br />

0.5° < 5 µmφ < ~15 min / point [10,11]<br />

0.5° < 5 µmφ < ~30 min / point [11-13]<br />

0.1° < 10 nmφ <


Fig.1 {111} ODF Al [17]<br />

LaueX <br />

<br />

<br />

X <br />

[18,19]<br />

<br />

<br />

<br />

{111}, {110}, {100}<br />

<br />

<strong>SEM</strong> <br />

<br />

[7-9, 20-22]Figure 2 <br />

Fe-19CrFe-36Ni<br />

<strong>SEM</strong> [23] BCC <br />

{110} 12 <br />

FCC <br />

{111}{001}<br />


[23,24]Fe-19Cr <br />

<strong>SEM</strong> <br />

Fig.3 [25]{001}{111}<br />

<br />

<br />

<br />

<br />

10m <br />

<br />

Fig.2 Fe-19Cr Fe-36Ni <br />

<strong>SEM</strong> [23]


Fig.3 Fe-19Cr <br />

<strong>SEM</strong> [25]<br />

<strong>SEM</strong>scanning electron microscope<br />

<strong>EBSD</strong> <br />

X <br />

<br />

[10,11]<br />

Figure 4 [11]<br />

<strong>EBSD</strong> Kikuchi <br />

X <br />

Fig.4 <br />

<br />

X <strong>SEM</strong>


Fig.4 [11]<br />

<strong>SEM</strong> <br />

Fig.5 (a) [13]Fig.5 (b)<br />

Kikuchi <br />

ECPelectron channeling pattern[11-13]Kikuchi <br />

<br />

<br />

m ECP <br />

<br />

ECP Fig.6 <br />

[26]Fe-19Cr 185 <br />

<br />

Fig.5 (a) ECP [13](b) ECP


Fig.6 ECP Fe-19Cr 185 <br />

TEMtransmission electron microscope<br />

TEM <br />

SADselected area diffraction<br />

<br />

Fig.7 <br />

<br />

001 <br />

[001]<br />

<br />

1015[14]SAD <br />

<br />

<br />

<br />

<strong>EBSD</strong>


Fig.7 BCC [27]


<strong>EBSD</strong> <br />

<strong>EBSD</strong> <strong>SEM</strong> <br />

electron back-scattering pattern Kikuchi <br />

Kikuchi <br />

<strong>EBSD</strong> Fig.8 <br />

<strong>EBSD</strong> 1973 [1]<strong>EBSD</strong><br />

1991 <br />

1993 Adams [28,29] Orientation Imaging Microscopy (OIM)<br />

[1]<br />

Fig.9 <br />

<strong>EBSD</strong> <br />

<strong>SEM</strong> <br />

<br />

<br />

<br />

<br />

microstructure<br />

grain boundary<br />

interface<br />

Kikuchi <br />

<strong>EBSD</strong> <br />

<br />

OIM <br />

<br />

Fig.8 Kikuchi SBSD


Fig.9 <strong>EBSD</strong> [3]<br />

<strong>EBSD</strong> Kikuchi 0.1<br />

<br />

<br />

ECP Fig.6 <strong>EBSD</strong> <br />

<strong>EBSD</strong>


<strong>EBSD</strong> ECP <br />

Fig.10 ARB<br />

4.8 <br />

<strong>EBSD</strong> <br />

200nm<br />

4050nm <br />

<br />

Fig.10 ARB 4.8 Al <strong>EBSD</strong> (a) ND<br />

(b) RD (c) [30]<br />

<strong>EBSD</strong> <br />

Figure 11 <br />

<strong>EBSD</strong><br />

[31,32]<br />

[31,32] <strong>EBSD</strong> <br />

<br />

<strong>EBSD</strong> <br />

Fig.11 <br />

[33]


Fig.11 (a) 28.5at%Ni (b) 0.2wt%C <br />

<strong>EBSD</strong> [31,32]<br />

<strong>EBSD</strong> <br />

[33,34]12<br />

<strong>EBSD</strong> <br />

TEM Kikuchi <br />

TEM/Kikuchi <strong>EBSD</strong> <br />

<br />

[15]TEM/Kikuchi <strong>EBSD</strong><br />

<br />

<br />

<br />

[1] ‘Electron Backscatter Diffraction in Materials Science’, Edited by A.J.Schwartz,<br />

M.Kumar and B.L.Adams, Kluwer Academic / Plenum Publishers, New York, (2000).<br />

[2] ‘Microtexture Determination and its applications’, V.Randle, The Institute of Materials,<br />

London, (1992)<br />

[3] , 50 (2000), 86.<br />

[4] , 40 (2001), 612.<br />

[5] (1984)<br />

[6] X (1977)<br />

[7] , 18 (1979), 282.


[8] 18 (1979), 642.<br />

[9] , 20 (1981), 377.<br />

[10] , 18 (1979), 632.<br />

[11] , 33 (1983), 491.<br />

[12] , 13 (1974), 177.<br />

[13] , 42 (1992), 306.<br />

[14] E.Furubayashi: Scripta Metall. Mater., 27 (1992), 1493.<br />

[15] S.Zaefferer: J. Appl. Cryst., 33 (2000), 10.<br />

[16] , 57 (1993), 726.<br />

[17] N.<strong>Tsuji</strong>, Y.Nagai, T.Sakai and Y.Saito: Mater. Trans. JIM, 39 (1998), 252.<br />

[18] D.Juul Jensen, E.M.Lauridsen, L.Margulies, H.F.Poulsen, S.Schmidt, H.O.Sørensen and<br />

G.B.M.Vaughan: Materials Today, 9 (2006), 18.<br />

[19] , 48 (2008), 301.<br />

[20] G.E.G.Tucker and P.C.Murphy: J. Inst. Metals, 8 (1952-1953), 235.<br />

[21] , 22 (1958), 320.<br />

[22] , 22 (1958), 324.<br />

[23] (1994)<br />

[24] (1992)<br />

[25] N.<strong>Tsuji</strong>, K.Tsuzaki and T.Maki: ISIJ International, 32 (1992), 1319.<br />

[26] N.<strong>Tsuji</strong>, K.Tsuzaki and T.Maki: ISIJ International, 33 (1993), 783.<br />

[27] — (2001)<br />

[28] B.L.Adams: Mater. Sci. Eng., A166 (1993), 59.<br />

[29] B.L.Adams, S.I.Wright and K.Kunze: Metall. Trans. A, 24A (1993), 819.<br />

[30] (2005)<br />

[31] H.Kitahara, R.Ueji, M.Ueda, N.<strong>Tsuji</strong> and Y.Minamino: Mater. Characterization, 54<br />

(2005), 378.<br />

[32] H.Kitahara, R.Ueji, N.<strong>Tsuji</strong> and Y.Minamino: Acta Mater., 54, (2006), 1279.<br />

[33] A.F.Gourgues-Lorenzon: Int. Mater. Rev., 52 (2007), 65.<br />

[34] X.Huang, N.<strong>Tsuji</strong>, N.Hansen and Y.Minamino : Mater. Sci. Eng. A340 (2003), 265.<br />

[35] N.Kamikawa, N.<strong>Tsuji</strong>, X.Huang and N.Hansen: Acta Mater., 54, (2006), 3055.

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