W. Richard Bowen and Nidal Hilal 4

More documents

Recommendations

Info

xii Preface them from hostile conditions and to functionalise them for a variety of purposes. In particular, ultrathin coatings play a crucial role in many processes, ranging from protection against chemical corrosion to microfabrication for microelectronics and biomedical devices. Chapter 8 describes the use of AFM for the study of the fine structure and local nanomechanical properties of such advanced polymer monolayers and submonolayers. AFM allows the real-time/real-space monitoring of relevant physicochemical surface processes. As miniaturisation of electronic and medical devices approaches the nanometre scale, AFM is becoming the most important characterisation tool of their nanostructural and nanomechanical properties. AFM has been considered primarily as a technique for the investigation of the surfaces of solid materials, with the considerable benefit that it can be used to carry out such investigations in liquid environments. However, AFM may also be used to study the properties of such liquids themselves. This is the topic of Chapter 9, which describes dynamic studies of confined fluids, micro- and nanorheology, cavitation and adhesive failure in thin films, and meso-scale experimental studies of the tensile behaviour of thin fluid films. Such studies benefit considerably from the coupling of AFM with high-magnification optical microscopy and highspeed video techniques. The development of such studies may be of considerable importance for the many large-scale processes that depend on the properties of thin liquid films, and also for instances where the available quantities of fluids are tiny, such as for synovial fluid. In the final chapter, we have pooled the thoughts of the contributors to provide a vision of some of the ways in which AFM may contribute to the development of process engineering in the future. We thank all of the authors who have collaborated in the writing of this volume. We are very grateful for their willingness to devote time to this task and for their timely delivery of high-quality manuscripts. We also thank the many colleagues and research students who have contributed to the work described. Particular thanks are due to Dr Peter M. Williams. Peter worked as a research technician at our centre when we first started AFM studies. The results of our research as presented in this volume owe much to his technical ingenuity and patience. W. Richard Bowen and Nidal Hilal wrichardbowen@i-newtonwales.org.uk nidal.hilal@nottingham.ac.uk Wales and England February 2009
About the Editors Professor W. Richard Bowen is a Fellow of the UK Royal Academy of Engineering. His work in chemical and biochemical engineering is widely recognised as world leading, particularly in the application of atomic force microscopy and in the development of membrane processes. He holds chairs in the Schools of Engineering at the University of Wales Swansea and the University of Surrey. He has carried out extensive consultancy for industry, government departments, research councils and universities on an international basis, currently through i-NewtonWales. xiii
Page 2 and 3: Butterworth-Heinemann is an imprint
Page 4 and 5: x Preface in their work. Hence, it
Page 8 and 9: xiv About thE Editors Professor Nid
Page 10 and 11: xvi List of Contributors Dr Daniel
Page 12 and 13: 2 1. BAsIC PRINCIPLEs OF ATOMIC FOR
Page 30 and 31: 20 1. BAsIC PRINCIPLEs OF ATOMIC FO
Page 42 and 43: 32 2. MEASUREMENT OF PARTICLE ANd S
Page 56 and 57:
46 2. MEASUREMENT OF PARTICLE ANd S
Page 58 and 59:
Page 60 and 61:
Page 62 and 63:
Page 64 and 65:
Page 66 and 67:
Page 68 and 69:
Page 70 and 71:
Page 72 and 73:
Page 74 and 75:
Page 76 and 77:
Page 78 and 79:
Page 80 and 81:
Page 82 and 83:
Page 84 and 85:
Page 86 and 87:
Page 88 and 89:
Page 90 and 91:
Page 92 and 93:
82 3. QUANTIFICATION OF PARTICLE-BU
Page 94 and 95:
Page 96 and 97:
Page 98 and 99:
Page 100 and 101:
Page 102 and 103:
Page 104 and 105:
Page 106 and 107:
Page 108 and 109:
Page 110 and 111:
100 3. QUANTIFICATION OF PARTICLE-B
Page 112 and 113:
Page 114 and 115:
Page 116 and 117:
C H A P T E R 4 Investigating Membr
Page 118 and 119:
4.2 THE RANgE OF POssIbILITIEs FOR
Page 120 and 121:
4.2 THE RANgE OF POssIbILITIEs FOR
Page 122 and 123:
4.3 CORREsPONdENCE bETwEEN sURFACE
Page 124 and 125:
4.3 CORREsPONdENCE bETwEEN sURFACE
Page 126 and 127:
4.4 IMAgINg IN LIqUId ANd THE dETER
Page 128 and 129:
4.4 IMAgINg IN LIqUId ANd THE dETER
Page 130 and 131:
4.5 EFFECTs OF sURFACE ROUgHNEss ON
Page 132 and 133:
4.6 ‘vIsUALIsATION’ OF THE REjE
Page 134 and 135:
4.7 THE UsE OF AFM IN MEMbRANE dEvE
Page 136 and 137:
Dfractional 0.18 0.16 0.14 0.12 0.1
Page 138 and 139:
4.8 CHARACTERIsATION OF METAL sURFA
Page 140 and 141:
Page 142 and 143:
Page 144 and 145:
At pH 5.5, dissolution began to occ
Page 146 and 147:
REFERENCEs 137 [4] W.R. Bowen, N. H
Page 148 and 149:
C H A P T E R 5 AFM and Development
Page 150 and 151:
5.2 MEAsUREMENT OF ADHEsION OF COLL
Page 152 and 153:
5.2 MEAsUREMENT OF ADHEsION OF COLL
Page 154 and 155:
The antibacterial activity of initi
Page 156 and 157:
5.3 MODIFICATION OF MEMBRANEs 147 t
Page 158 and 159:
5.3 MODIFICATION OF MEMBRANEs 149 B
Page 160 and 161:
Force (nN m -1 ) Loading force (mN
Page 162 and 163:
5.3 MODIFICATION OF MEMBRANEs 153 p
Page 164 and 165:
Adhesion force (mN m -1 ) 10 8 6 4
Page 166 and 167:
Adhesion force (mN m -1 ) 20 15 10
Page 168 and 169:
Adhesion force (mN m -1 ) 10 8 6 4
Page 170 and 171:
5.3 MODIFICATION OF MEMBRANEs 161 F
Page 172 and 173:
5.4 MODIFICATION OF MEMBRANEs wITH
Page 174 and 175:
5.4 MODIFICATION OF MEMBRANEs wITH
Page 176 and 177:
Å 200 100 0 5.4 MODIFICATION OF ME
Page 178 and 179:
AbbrEvIAtIonS And SyMbolS NOM Natur
Page 180 and 181:
REFERENCEs 171 [29] W.R. Bowen, T.A
Page 182 and 183:
174 6. NANOSCALE ANALySIS Of PHARMA
Page 184 and 185:
Page 186 and 187:
Page 188 and 189:
Page 190 and 191:
Page 192 and 193:
Page 194 and 195:
Page 196 and 197:
Page 198 and 199:
Page 200 and 201:
Page 202 and 203:
Page 204 and 205:
196 7. MICRO/NANOENgINEERINg ANd AF
Page 206 and 207:
Page 208 and 209:
Page 210 and 211:
Page 212 and 213:
Page 214 and 215:
Page 216 and 217:
Page 218 and 219:
Page 220 and 221:
Page 222 and 223:
Page 224 and 225:
Page 226 and 227:
Page 228 and 229:
Page 230 and 231:
Page 232 and 233:
Page 234 and 235:
226 8. ATOMIC FORCE MICROSCOPy ANd
Page 236 and 237:
Page 238 and 239:
Page 240 and 241:
Page 242 and 243:
Page 244 and 245:
Page 246 and 247:
Page 248 and 249:
Page 250 and 251:
Page 252 and 253:
Page 254 and 255:
246 9. APPLICATION OF ATOMIC FORCE
Page 256 and 257:
Page 258 and 259:
Page 260 and 261:
Page 262 and 263:
Page 264 and 265:
Page 266 and 267:
Page 268 and 269:
Page 270 and 271:
Page 272 and 273:
Page 274 and 275:
Page 276 and 277:
Page 278 and 279:
Page 280 and 281:
Page 282 and 283:
Page 284 and 285:
276 10. FuTuRE PRosPECTs most AFM s
Page 286 and 287:
278 10. FuTuRE PRosPECTs targeted d
Page 288 and 289:
A Actin stress fiber, 197 Adhesion,
Page 290:
Natural organic matter, 140 Negativ
show all

W. Richard Bowen and Nidal Hilal 4

You also want an ePaper? Increase the reach of your titles

Delete template?

Save as template?