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JEDEC SSD Specifications Explained

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Temperature lots<br />

‣ Different temperatures introduce different<br />

NAND failure mechanisms.<br />

‣ It is necessary to test both at elevated and low<br />

temperatures.<br />

‣ Two approaches are acceptable for<br />

incorporating both high and low temperatures<br />

into the endurance stressing: the rampedtemperature<br />

approach and the split-flow<br />

approach.<br />

‣ The preferred temperature measurement is the<br />

temperature reported by the <strong>SSD</strong> if it has that<br />

capability (ATA and SCSI statistics).

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