Chlorine atom and molecule dynamics in an inductively ... - Leti
Chlorine atom and molecule dynamics in an inductively ... - Leti
Chlorine atom and molecule dynamics in an inductively ... - Leti
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<strong>Chlor<strong>in</strong>e</strong> <strong>atom</strong> <strong><strong>an</strong>d</strong> <strong>molecule</strong> <strong>dynamics</strong><br />
Laboratoire de Physique des Plasmas<br />
<strong>in</strong> <strong>an</strong> <strong>in</strong>ductively coupled plasma<br />
<strong>in</strong> pure Cl 2<br />
Je<strong>an</strong>-Paul Booth<br />
Nish<strong>an</strong>t Sirse, Yasm<strong>in</strong>a Azamoum<br />
Pascal Chabert
•Test/calibrate/improve models : HPEM from Mark Kushner<br />
•Underst<strong><strong>an</strong>d</strong> pulsed plasmas – for process<strong>in</strong>g<br />
Measure:<br />
• Cl <strong>atom</strong>s - Absolute densities (time <strong><strong>an</strong>d</strong> space resolved)<br />
• Cl 2 <strong>molecule</strong>s ….. ……..<br />
• Electron density<br />
• Gas temperatures<br />
•Dynamics <strong>in</strong> pulsed plasmas :<br />
Laboratoire de Physique des Plasmas<br />
Objectives<br />
•Cl recomb<strong>in</strong>ation at the reactor walls
Gas outlet grid<br />
13.56 MHz<br />
power supply<br />
Al 2O 3 w<strong>in</strong>dow<br />
550mm chamber<br />
200mm chuck<br />
Laboratoire de Physique des Plasmas<br />
Anodized alum<strong>in</strong>ium chamber<br />
ICP reactor at LPP:<br />
Cl 2, HBr, O 2, Ar<br />
Supplied via showerhead<br />
4 turn spiral <strong>an</strong>tenna<br />
Pump<strong>in</strong>g port<br />
-Industrial Scale Reactor<br />
(550mm, 100mm high)<br />
-Industrial gases (Cl 2, HBr)<br />
-All surfaces Al 2O 3<br />
-Adv<strong>an</strong>ced diagnostics:<br />
TALIF<br />
Hairp<strong>in</strong> proben e<br />
Laser photodetachement<br />
IRLAS etc
n e ( x10 16 m -3 )<br />
10<br />
8<br />
6<br />
4<br />
2<br />
Laboratoire de Physique des Plasmas<br />
Electron density (at centre)<br />
50mm from top/Cl 2 /Centre<br />
500W<br />
400W<br />
300W<br />
200W<br />
100W<br />
0<br />
0 20 40 60 80 100<br />
Pressure (mT)<br />
• Measure us<strong>in</strong>g microwave<br />
hairp<strong>in</strong> resonator<br />
• Maximum density at 10 mTorr<br />
– 9x10 16 m -3
Electron density (10 10 cm -3 )<br />
9<br />
8<br />
7<br />
6<br />
5<br />
4<br />
3<br />
2<br />
1<br />
Laboratoire de Physique des Plasmas<br />
Comparison simulation to experiment<br />
Electron density at reactor centre<br />
500W<br />
Experimental<br />
Simulation<br />
0<br />
0 10 20 30 40 50 60 70 80 90<br />
Cl 2 pressure (mTorr)<br />
• Good agreement at very low<br />
pressure<br />
• Increas<strong>in</strong>gly wrong (low) at<br />
higher pressure<br />
• What is wrong <strong>in</strong> the<br />
simulation?
Ono, JVSTA 1992<br />
Laboratoire de Physique des Plasmas<br />
Two-Photon Laser-Induced Fluorescence<br />
(TALIF) of <strong>atom</strong>ic <strong>Chlor<strong>in</strong>e</strong><br />
Laser: 233.2nm,<br />
1-3 mJ, 5ns<br />
Detect Fluorescence<br />
at 726nm (Gated redsensitive<br />
PMT)<br />
•Measures relative concentrations with<br />
high spatial <strong><strong>an</strong>d</strong> temporal resolution
TALIF Laser:<br />
233.2nm, 3<br />
mJ, 5ns<br />
Detect Fluorescence at 726nm<br />
(Photomultiplier + filter)<br />
Laboratoire de Physique des Plasmas<br />
Calibration :<br />
Photo-dissociation of Cl 2 at 355 nm<br />
Pump<strong>in</strong>g port<br />
Absorpt<strong>in</strong> cross-section (10 -24 m 2 )<br />
Photolysis Laser<br />
355 nm, 10 mJ 2mm<br />
9% dissociation of Cl 2<br />
30<br />
25<br />
20<br />
15<br />
10<br />
5<br />
Cl 2 absorption spectrum<br />
= 15.9x10 -24 m 2 @355nm<br />
0<br />
250 300 350 400 450 500<br />
Wavelength (nm)
TALIF signal (arb. units)<br />
50 mTorr Cl 2:<br />
5<br />
4<br />
3<br />
2<br />
1<br />
0<br />
Laboratoire de Physique des Plasmas<br />
Compare TALIF signals Plasma/laser:<br />
50 mTorr Cl 2<br />
Laser<br />
photolysis<br />
233.200 233.205 233.210<br />
Laser wavelength (nm)<br />
500 W Plasma<br />
Photolysis products have higher velocity :<br />
Doppler broaden<strong>in</strong>g<br />
-Ratio of <strong>in</strong>tegrated signals:<br />
S plasma/S laser= 0.498<br />
n Cl = 8.3x10 13 cm -3 @ 50 mTorr 500W<br />
In practice, 355nm beam quality limits<br />
precision (±20%)
Cl <strong>atom</strong> density, n Cl (10 13 cm -3 )<br />
8<br />
7<br />
6<br />
5<br />
4<br />
3<br />
2<br />
1<br />
0<br />
0 100 200 300 400 500<br />
Laboratoire de Physique des Plasmas<br />
RF Power (W)<br />
Results : Cl density<br />
Cl 2 pressure:<br />
50 mTorr<br />
20 mTorr<br />
10 mTorr<br />
5 mTorr<br />
2 mTorr<br />
Severe test of model, but:<br />
Model : all parameter for one plasma<br />
condition<br />
Expt: one parameter for all plasma<br />
conditions!
n /n Cl 0<br />
Cl2<br />
0.20<br />
0.15<br />
0.10<br />
Laboratoire de Physique des Plasmas<br />
Cl normalised to <strong>in</strong>itial gas density<br />
0.05<br />
20 mTorr<br />
50 mTorr<br />
0.00<br />
0 100 200 300 400 500<br />
RF Power (W)<br />
2 mTorr<br />
5 mTorr<br />
10 mTorr<br />
Normalise to Cl 2 density before plasma:<br />
•Dissociation fraction highest for lowest pressure<br />
•20% @ 2mTorr 500W<br />
• 5-7% at higher pressure, saturates with RF power<br />
•Why so low? (n e peaks at 10 mT)<br />
•What is Cl 2 density dur<strong>in</strong>g plasma?
• Plasma + 355nm laser :<br />
Laboratoire de Physique des Plasmas<br />
Cl 2 <strong>molecule</strong> density <strong>in</strong> plasma<br />
– produces <strong>an</strong> additional signal,<br />
– n(Cl 2) dur<strong>in</strong>g plasma<br />
• Calculate Cl 2 density relative<br />
• to “no plasma” from:<br />
nCl I plasma laser I<br />
2<br />
<br />
<br />
n I<br />
Cl<br />
0<br />
2<br />
laser<br />
plasma<br />
TALIF <strong>in</strong>tensity<br />
20<br />
15<br />
10<br />
5<br />
0<br />
20mTorr 500W<br />
355nm laser<br />
plasma<br />
plasma + 355nm laser<br />
233.200 233.205 233.210<br />
Laser wavelength (nm)
Cl /Cl 2 0<br />
2<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
0.0<br />
Laboratoire de Physique des Plasmas<br />
Cl 2 density<br />
0 100 200 300 400 500<br />
RF power (W)<br />
Cl 2 relative density<br />
2mT<br />
5 mT<br />
10 mT<br />
20mT<br />
50mT<br />
Cl 2 density strongly depleted <strong>in</strong> plasma:<br />
-<strong>in</strong>creases with RF power, <strong><strong>an</strong>d</strong> pressure<br />
-dissociation<br />
-gas heat<strong>in</strong>g?
(nCl+nCl )/nCl 2 0<br />
2<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
0.0<br />
0 100 200 300 400 500<br />
Laboratoire de Physique des Plasmas<br />
RF power (W)<br />
Total gas density<br />
Total gas density<br />
(relative to no plasma)<br />
2mT<br />
5 mT<br />
10mT<br />
20mT<br />
50mT<br />
? No other possible product <strong>in</strong><br />
pure Cl 2<br />
Total gas density = n Cl + n Cl2<br />
Gas density severely depleted <strong>in</strong><br />
the plasma at higher pressure<br />
Strong gas heat<strong>in</strong>g?<br />
(Electron pressure negligible<br />
-Max = 0.3mT @10mT)
T (K)<br />
2500<br />
2000<br />
1500<br />
1000<br />
500<br />
Gas temp (without corr)<br />
T(2mT)<br />
T(5mT)<br />
T(10mT)<br />
T(20mT)<br />
T(50mT)<br />
Laboratoire de Physique des Plasmas<br />
Estimate gas temperature<br />
0 100 200 300 400 500<br />
RF power (W)<br />
From ideal gas law :<br />
T plasma =T 0.n 0/n plasma<br />
(total pressure unch<strong>an</strong>ged by plasma)<br />
Estimated T gas = 2300K!<br />
Nb: TALIF only measures Cl density <strong>in</strong><br />
P 3/2 ground state.<br />
If P 1/2 state (at 0.11eV) is populated by<br />
electron collisions (up to 50% more<br />
density) T gas 1900K
Cross-section(10 -20 cm 2 )<br />
25<br />
20<br />
15<br />
10<br />
5<br />
Temperature variation of Cl 2 absorption<br />
291K<br />
441K<br />
554K<br />
699K<br />
853K<br />
1038K<br />
0<br />
260 280 300 320 340 360 380 400 420<br />
Laboratoire de Physique des Plasmas<br />
Cl 2 absorption spectrum<br />
355 nm<br />
wavelength (nm)<br />
(Gibson <strong><strong>an</strong>d</strong> Bayliss,<br />
Phys. Rev., 44, 188 (1933))<br />
absorption cross-secion (10 -20 cm 2 )<br />
15<br />
10<br />
5<br />
(354.7nm)<br />
Cl 2 absorption cross-section<br />
-Temperature dependence<br />
- cross-section 30%<br />
lower at 2300K ?<br />
0<br />
300 600 900 1200 1500 1800 2100<br />
Temperature (K)<br />
? assume exponential<br />
dependence ?<br />
Cl 2 density underestimated by 30%<br />
at 2300K<br />
Corrected Tgas 1900K
Temperature (K)<br />
1200<br />
900<br />
600<br />
Gas temperature from Ar m spectroscopy:<br />
5mT<br />
10mT<br />
20mT<br />
50mT<br />
300<br />
0 100 200 300 400 500<br />
Laboratoire de Physique des Plasmas<br />
Ar:Cl 2 /50:50/LIF<br />
Power (W)<br />
50% Cl 2/ 50% Ar<br />
Laser-Induced Fluorescence : at reactor<br />
centre<br />
•T m1250K @ 50mTorr 500W<br />
•TALIF : 2300/1900K <strong>in</strong> pure Cl 2<br />
(Measurements not possible with less<br />
Ar at higher pressures)
Laboratoire de Physique des Plasmas<br />
Cl <strong>atom</strong> recomb<strong>in</strong>ation coefficient, g<br />
• Cl recomb<strong>in</strong>ation at reactor walls has strong effect on plasma<br />
physics <strong><strong>an</strong>d</strong> chemistry:<br />
– Determ<strong>in</strong>es dissociation fraction Cl/Cl 2<br />
– Impacts etch behaviour – Cl spont<strong>an</strong>eous etch<strong>in</strong>g, uniformity<br />
– Electron collision rate –higher for Cl 2 then Cl (Te)<br />
– Electron attachment e + Cl 2 Cl - + Cl<br />
• plasma tr<strong>an</strong>sport ch<strong>an</strong>ged for electronegative plasmas<br />
• Still one of the biggest factors of uncerta<strong>in</strong>ty <strong>in</strong> modell<strong>in</strong>g
Previous measurements of g Cl on Al 2O 3<br />
Kota et al, JVSTA (1997)<br />
g Decreases with temperature<br />
-poor precision at higher T<br />
-ex-situ measurement<br />
Laboratoire de Physique des Plasmas<br />
Guha et al JAP (2008)<br />
-sp<strong>in</strong>n<strong>in</strong>g wall technique<br />
-quasi-<strong>in</strong>-situ<br />
g depends on n Cl/n Cl2 ratio<br />
-but surface polluted by SiO 2<br />
-large scatter for high Cl/Cl 2<br />
Compare to <strong>in</strong>-situ measurements:
TALIF signal (arb. units)<br />
Determ<strong>in</strong>e Cl lifetime <strong>in</strong><br />
afterglow of a pulse-modulated plasma by TALIF:<br />
40<br />
30<br />
20<br />
10<br />
0<br />
0.000 0.005 0.010 0.015 0.020 0.025<br />
Laboratoire de Physique des Plasmas<br />
20mT Cl 2<br />
100W<br />
200W<br />
500W<br />
time (s)<br />
Excellent S/N ratio<br />
-follow decays up to 50 ms<br />
-pure Cl 2 :<br />
-no gas-phase loss processes<br />
-Directly deduce surface<br />
recomb<strong>in</strong>ation coefficients g Cl<br />
first ms<br />
-non-exponential decays<br />
-gas cool<strong>in</strong>g<br />
Assume gas is cold after 2ms
(Ch<strong>an</strong>try, J.Appl.Phys. 62,1141, (1987) For a cyl<strong>in</strong>der:<br />
1<br />
k<br />
g presumed equal on all surfaces<br />
-Diffusion Coefficient for Cl <strong>in</strong> Cl 2 :<br />
Laboratoire de Physique des Plasmas<br />
Determ<strong>in</strong><strong>in</strong>g recomb<strong>in</strong>ation coefficient<br />
from decay rates<br />
wall<br />
<br />
2<br />
<br />
D<br />
0<br />
<br />
V<br />
S<br />
D 0=0.149cm 2 s -1 @1 atm 298K<br />
3<br />
2 T <br />
D D0<br />
. <br />
298 <br />
2(2 -g<br />
)<br />
.<br />
vg<br />
.<br />
p<br />
p<br />
0<br />
1<br />
<br />
2<br />
0<br />
v <br />
<br />
<br />
= <br />
L <br />
8kBT<br />
m<br />
2<br />
+<br />
2<br />
2.4<br />
<br />
R
surface loss coefficient g<br />
0.35<br />
0.30<br />
0.25<br />
0.20<br />
0.15<br />
0.10<br />
0.05<br />
Loss rates <strong><strong>an</strong>d</strong> surface recomb<strong>in</strong>ation coefficient<br />
Cl surface loss coefficient<br />
100W<br />
200W<br />
500W<br />
0.00<br />
0 5 10 15 20<br />
Laboratoire de Physique des Plasmas<br />
pressure (mT)<br />
• Deduced from decay 2-10ms<br />
• g very high ! 0.2-0.35<br />
(compare 0.02 by Guha et al)<br />
•Pressure : decrease <strong>in</strong> g<br />
•RF power : only a small effect. Trend<br />
seems to depend on pressure
TALIF signal<br />
10<br />
1<br />
0.1<br />
Laboratoire de Physique des Plasmas<br />
Background signal at long times :<br />
10 mT 200W<br />
0.00 0.01 0.02 0.03 0.04 0.05<br />
time (s)<br />
Model Exponential<br />
Equation y = y0 + A*ex<br />
p(R0*x)<br />
Reduced Chi<br />
-Sqr<br />
0.1523<br />
Adj. R-Squar 0.99599<br />
Value St<strong><strong>an</strong>d</strong>ard Err<br />
1 y0 0.23357 0.06247<br />
1 A 33.5583 0.35147<br />
1 R0 -406.348 7.69425<br />
-almost const<strong>an</strong>t background signal <strong>in</strong><br />
late afterglow (20 ms)<br />
-has same spectral shape as TALIF<br />
signal<br />
-Increased strongly by small O 2<br />
addition/low flow rates<br />
g falls to low value <strong>in</strong> late afterglow<br />
-Saturation of reaction sites?<br />
-The value of g <strong>in</strong> the late afterglow is<br />
more comparable to those measured by<br />
Guha <strong><strong>an</strong>d</strong> by Kota…..
Laboratoire de Physique des Plasmas<br />
Conclusions<br />
• Cl <strong>atom</strong> <strong><strong>an</strong>d</strong> Cl 2 <strong>molecule</strong> absolute density determ<strong>in</strong>ed by a new TALIF<br />
calibration scheme<br />
– Cl density is small compared to <strong>in</strong>itial gas density (
• Determ<strong>in</strong>e n Cl2 <strong>in</strong> afterglow<br />
• Measure Cl P 1/2 density by TALIF<br />
Laboratoire de Physique des Plasmas<br />
Future work<br />
• Cl - negative ion density by laser photodetachment<br />
• Model improvements<br />
– Add miss<strong>in</strong>g gas heat<strong>in</strong>g terms<br />
– Model the afterglow – test tr<strong>an</strong>sport modell<strong>in</strong>g<br />
– Model the breakdown phase/ vompare to experiments<br />
• Other gases:<br />
– O 2, HBr, mixtures<br />
• Work partly supported by ANR INCLINE (ANR-09 BLAN 0019) & AMAT
TALIF signal<br />
10<br />
1<br />
0.1<br />
Laboratoire de Physique des Plasmas<br />
Effect of flow rate /residence time<br />
Effect of flow rate/residence time<br />
10mT 200 W<br />
0.00 0.01 0.02 0.03 0.04 0.05<br />
Time (s)<br />
10 sccm<br />
20 sccm<br />
50 sccm<br />
100 sccm<br />
Low flow long residence time <br />
<strong>in</strong>creased import<strong>an</strong>ce of air leaks<br />
Due to O 2 impurities?<br />
- Add small amount of O 2 at high flow rate :
Cl TALIF signal (arb. units)<br />
10<br />
1<br />
Laboratoire de Physique des Plasmas<br />
Effect of impurities: small O 2 addition<br />
Effect of O addition 2 O2 addition has same affect as<br />
reduc<strong>in</strong>g flow rate<br />
10mT 200W<br />
50 sccm Cl 2<br />
0.1<br />
0.00 0.01 0.02 0.03 0.04 0.05<br />
Time (s)<br />
+3 sccm O 2<br />
+2 sccm O 2<br />
+1 sccm O 2<br />
pure Cl 2<br />
Flow rate effect appears to be l<strong>in</strong>ked<br />
to O 2 impurities:<br />
Possible orig<strong>in</strong>s:<br />
•Saturation of Cl reaction sites by O 2<br />
when no ion bombardment?<br />
•Formation of O xCl y product,<br />
photolysed by 233nm laser?
TALIF <strong>in</strong>tensity<br />
25<br />
20<br />
15<br />
10<br />
5<br />
0<br />
Laboratoire de Physique des Plasmas<br />
Persistent signal <strong>in</strong> afterglow<br />
10 mT 200W<br />
10sccm Cl 2<br />
3 sccm O 2<br />
233.185 233.190<br />
wavelength (nm)<br />
0 ms<br />
20 ms<br />
20ms (x3.7)<br />
Identical centre wavelength <strong><strong>an</strong>d</strong> l<strong>in</strong>e-width<br />
as Cl TALIF at start of afterglow:<br />
Doesn’t appear to be photolysis of a Cl xO y<br />
product (would have high energy-large<br />
Doppler width)<br />
TALIF signal<br />
3.0<br />
2.5<br />
2.0<br />
1.5<br />
1.0<br />
0.5<br />
0.0<br />
Decay of slow sigal:<br />
50 Cl 2 + 3 O 2<br />
0.01 0.02 0.03 0.04 0.05<br />
Time (s)<br />
Observed decay rate 5-10s -1<br />
Pump-out rate 2.5s -1 @ 10sccm<br />
-corresponds to g of 1-2%<br />
(comparable to Guha et al)
nCl+ nCl2<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
Laboratoire de Physique des Plasmas<br />
Effect of add<strong>in</strong>g 50% Cl P 1/2:<br />
Cl + Cl2 (without correction)<br />
Tot(2mT)<br />
Tot(5mT)<br />
Tot(10mT)<br />
Tot(20mT)<br />
Tot(50mT)<br />
0.0<br />
0 100 200 300 400 500<br />
RF power (W)<br />
Total gas density<br />
total density<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
tot with sp<strong>in</strong> orbit<br />
0.0<br />
0 100 200 300 400 500<br />
RF power (W)<br />
Tot(2mT)<br />
Tot(5mT)<br />
Tot(10mT)<br />
Tot(20mT)<br />
Tot(50mT)
n Cl /n Cl +n Cl2 )<br />
0.7<br />
0.6<br />
0.5<br />
0.4<br />
0.3<br />
0.2<br />
0.1<br />
Pressure<br />
(mTorr)<br />
2<br />
5<br />
10<br />
20<br />
50<br />
Laboratoire de Physique des Plasmas<br />
Effect of add<strong>in</strong>g 50% Cl P 1/2:<br />
mole fraction Cl/ (Cl + Cl 2)<br />
Cl mole fraction<br />
(without P 1/2 correction)<br />
0.0<br />
0 100 200 300 400 500<br />
RF power (W)<br />
n Cl /(n Cl +n Cl2 )<br />
0.7<br />
0.6<br />
0.5<br />
0.4<br />
0.3<br />
0.2<br />
0.1<br />
Mole fraction n Cl /(n Cl +n Cl2 )<br />
(with P 1/2 correction)<br />
Pressure (mTorr)<br />
2<br />
5<br />
10<br />
20<br />
50<br />
0.0<br />
0 100 200 300 400 500<br />
RF power (W)
Temperature (K)<br />
1200<br />
900<br />
600<br />
Gas temperature from Ar m spectropscopy:<br />
2mT<br />
3mT<br />
5mT<br />
10mT<br />
Laboratoire de Physique des Plasmas<br />
Absorption:<br />
Ar:Cl 2 /10:90<br />
300<br />
0 100 200 300 400 500<br />
Power (W)<br />
Cl 2/Ar 90/10%<br />
Temperature (K)<br />
1200<br />
900<br />
600<br />
2mT<br />
3mT<br />
5mT<br />
10mT<br />
Absorption Fluorescence<br />
No signal above 10 mTorr;<br />
Tm 800K @ 10mTorr 500W (comparable to 50% Ar)<br />
Ar:Cl 2 /10:90/LIF<br />
300<br />
0 100 200 300 400 500<br />
Power (W)
Laboratoire de Physique des Plasmas<br />
Absolute Cl calibration techniques<br />
• Niemi et al. : compare to rare gas TALIF for H, O, N<br />
– No suitable rare gas tr<strong>an</strong>sition near 233nm<br />
• Ono et al: use 233nm TALIF beam to photolyse CCl 4 (known<br />
pressure, no plasma)<br />
– Gave Cl densities 3x higher th<strong>an</strong> total gas density!<br />
– Depends on knowledge of spatio-temporal profile of 233nm beam<br />
at waist<br />
– Integrate rate equations for photolysis + simult<strong>an</strong>eous excitation<br />
– Photolysed Cl fly out of the (very small) detection volume<br />
– These effects lead to over-estimation of effective Cl density<br />
• A better technique is needed!
n Cl /n Cl2<br />
1.0<br />
0.5<br />
P (mTorr)<br />
2<br />
5<br />
10<br />
20<br />
50<br />
0.0<br />
0 100 200 300 400 500<br />
Laboratoire de Physique des Plasmas<br />
RF power (W)<br />
Ratio n Cl/n Cl2<br />
without correction Maximum 1.2 at 2 mTorr 500W<br />
(Cl mole fraction 0.55)<br />
Increas<strong>in</strong>g RF power causes more<br />
gas heat<strong>in</strong>g, rather th<strong>an</strong><br />
dissociation!
n e ( x10 16 m -3 )<br />
10<br />
8<br />
6<br />
4<br />
2<br />
Laboratoire de Physique des Plasmas<br />
Electron density (at centre)<br />
50mm from top/Cl 2 /Centre<br />
500W<br />
400W<br />
300W<br />
200W<br />
100W<br />
0<br />
0 20 40 60 80 100<br />
Pressure (mT)<br />
• Measure us<strong>in</strong>g microwave hairp<strong>in</strong><br />
resonator<br />
• Density at reactor centre unless<br />
stated<br />
• Maximum density at 10 mTorr<br />
– 9x10 16 m -3
n e ( x10 16 m -3 )<br />
10<br />
8<br />
6<br />
4<br />
2<br />
0<br />
Laboratoire de Physique des Plasmas<br />
Electron density :radial profile<br />
50mm from top/ Cl 2 / 500W / radial sc<strong>an</strong><br />
3mT<br />
5mT<br />
10mT<br />
0 50 100 150 200 250<br />
Position (mm)<br />
Peaked at centre for low<br />
pressure ……
n e ( x10 16 m -3 )<br />
10<br />
8<br />
6<br />
4<br />
2<br />
0<br />
Laboratoire de Physique des Plasmas<br />
Electron density :radial profile<br />
50mm from top/ Cl 2 / 500W / radial sc<strong>an</strong><br />
10mT<br />
20mT<br />
50mT<br />
90mT<br />
0 50 100 150 200 250<br />
Position (mm)<br />
Peaked at centre for low<br />
pressure<br />
Peaks away from axis at higher<br />
pressure<br />
- Local density maximum under<br />
coil
T (K)<br />
2500<br />
2000<br />
1500<br />
1000<br />
500<br />
Laboratoire de Physique des Plasmas<br />
Effect of add<strong>in</strong>g 50% Cl P 1/2:<br />
Gas temp (without corr)<br />
T(2mT)<br />
T(5mT)<br />
T(10mT)<br />
T(20mT)<br />
T(50mT)<br />
0 100 200 300 400 500<br />
RF power (W)<br />
Gas temperature<br />
T (K)<br />
2500<br />
2000<br />
1500<br />
1000<br />
500<br />
T(2mT)<br />
T(5mT)<br />
T(10mT)<br />
T(20mT)<br />
T(50mT)<br />
-reduces peak temperature from 2300K to 1900K<br />
Gas temperature (<strong>in</strong>clud<strong>in</strong>g P1/2)<br />
0 100 200 300 400 500<br />
RF power (W)
Laboratoire de Physique des Plasmas<br />
Previous gas temperature measurements<br />
Steady state<br />
Cunge JVSTA 2009<br />
700W Cl 2/Ar<br />
centre<br />
wall<br />
Determ<strong>in</strong>ed from Ar m Doppler width.<br />
L<strong>in</strong>e-<strong>in</strong>tegrated technique<br />
-Strong axial T gradient<br />
-estimated 1000K at the centre<br />
Factor 2 lower th<strong>an</strong> our observations<br />
(& at higher power density!)<br />
IRLAS measurements <strong>in</strong> our reactor….
TALIF signal<br />
10<br />
1<br />
0.1<br />
0.00 0.01 0.02 0.03 0.04 0.05<br />
time (s)<br />
Laboratoire de Physique des Plasmas<br />
Decays vs pressure <strong><strong>an</strong>d</strong> power<br />
5 mT<br />
500W<br />
200W<br />
100W<br />
TALIF signal<br />
100<br />
10<br />
1<br />
0.1<br />
10 mT<br />
500W<br />
200W<br />
100W<br />
0.00 0.01 0.02 0.03 0.04 0.05<br />
TALIF signal<br />
10<br />
1<br />
0.1<br />
20 mT<br />
500W<br />
200W<br />
100W<br />
0.00 0.01 0.02 0.03 0.04 0.05<br />
•At long times : presence of <strong>an</strong> almost const<strong>an</strong>t background signal <strong>in</strong> all cases.<br />
•Reasonable fit with s<strong>in</strong>gle exponential + offset<br />
•RF power only has a small effect<br />
•NB data taken after stabilisation; <strong>in</strong>itial rates (when plasma first turned on) faster by<br />
10-20% (surface temperature effect?)<br />
time (s)<br />
time (s)