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effects of electron beam irradiation on properties of etfe insulated ...

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Park E-S<br />

CH 2<br />

CH 2<br />

CH 2<br />

CH 2<br />

CH CH 2<br />

H + F<br />

EB <str<strong>on</strong>g>irradiati<strong>on</strong></str<strong>on</strong>g><br />

CF 2<br />

CF 2<br />

CF 2<br />

Chain scissi<strong>on</strong><br />

CF 2<br />

CF 2<br />

compared with pristine ETFE. In the micrographs<br />

taken <strong>on</strong> the surface <str<strong>on</strong>g>of</str<strong>on</strong>g> 15 and 20 Mrad irradiated<br />

specimens, the wave texture was disappeared and<br />

many voids were found.<br />

As shown in Scheme I, the radiati<strong>on</strong> induced<br />

chemical changes in polymers including chain crosslinking,<br />

chain scissi<strong>on</strong> and creati<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> small<br />

molecular products, structural and morphological<br />

changes [5,9]. When voids are present in solid<br />

dielectrics and the electrical field is sufficiently high,<br />

the air or other gases inside the voids i<strong>on</strong>izes and<br />

creates breakdown pulses across the voids. These<br />

pulses are referred to as discharges. Most soliddielectric<br />

insulati<strong>on</strong>s degrade under the presence <str<strong>on</strong>g>of</str<strong>on</strong>g><br />

partial discharge and lead to premature failure <str<strong>on</strong>g>of</str<strong>on</strong>g> the<br />

insulati<strong>on</strong>. These discharges result in an increase in<br />

current flow through the insulati<strong>on</strong> between the<br />

c<strong>on</strong>ductor and ground and a c<strong>on</strong>sequent reducti<strong>on</strong> in<br />

the amount <str<strong>on</strong>g>of</str<strong>on</strong>g> current which is able to be transmitted<br />

through the c<strong>on</strong>ductor. This failing process increases<br />

the dielectric absorpti<strong>on</strong> current taken by the<br />

insulati<strong>on</strong>, and megohmmeter shows a decrease in ρ I<br />

with increasing voids in insulati<strong>on</strong> by EB <str<strong>on</strong>g>irradiati<strong>on</strong></str<strong>on</strong>g>.<br />

Thermal Stability <str<strong>on</strong>g>of</str<strong>on</strong>g> ETFE Insulated Wire after<br />

EB Irradiati<strong>on</strong><br />

Table 3 (2 columns in the right) shows the result <str<strong>on</strong>g>of</str<strong>on</strong>g><br />

flexibility test and dielectric BDV <str<strong>on</strong>g>of</str<strong>on</strong>g> EB-irradiated<br />

wires after thermal aging at 240°C for 30 min. After<br />

CF<br />

Dehydr<str<strong>on</strong>g>of</str<strong>on</strong>g>luorinati<strong>on</strong><br />

Formati<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> unsaturated b<strong>on</strong>ds<br />

Effects <str<strong>on</strong>g>of</str<strong>on</strong>g> Electr<strong>on</strong> Beam Irradiati<strong>on</strong> <strong>on</strong> Properties ...<br />

CH 2<br />

CH 2<br />

CH 2<br />

CH 2<br />

CH 2<br />

flexibility test at 240°C for 30 min, extruded- and<br />

EB-irradiated wire did not show insulati<strong>on</strong> crack<br />

phenomen<strong>on</strong>. The BDV <str<strong>on</strong>g>of</str<strong>on</strong>g> pristine ETFE was not<br />

significantly changed after thermal aging. In general,<br />

c<strong>on</strong>tinuous maximum temperature rating <str<strong>on</strong>g>of</str<strong>on</strong>g> ETFE<br />

<strong>insulated</strong> wire is 155°C. It withstands temperature up<br />

to 180°C for 168 c<strong>on</strong>tinuous hours [23] and it goes<br />

under thermal aging at 240°C with no cracks<br />

detected after exposure for 30 min [24]. In sharp<br />

c<strong>on</strong>trast, when the EB-irradiated wire has been<br />

exposed to thermal aging at 240°C for 30 min, the<br />

BDV reducti<strong>on</strong> is more significant (Table 3). The<br />

BDV reducti<strong>on</strong>s are 12.6, 17.2, 21.9, 24.2 and 34.9%<br />

as in the order given for ETFE-01, ETFE-05,<br />

ETFE-10, ETFE-15 and ETFE-20 with respect to that<br />

<str<strong>on</strong>g>of</str<strong>on</strong>g> corresp<strong>on</strong>ding un-irradiated thermally aged<br />

sample. The thermal aging is manifested in two ways<br />

<str<strong>on</strong>g>of</str<strong>on</strong>g> forming polymer radicals [25] and microvoids [26]<br />

in the material. This leads to formati<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> defects <str<strong>on</strong>g>of</str<strong>on</strong>g><br />

extruded layer and lowering the BDV <str<strong>on</strong>g>of</str<strong>on</strong>g> wire samples<br />

significantly [19].<br />

Figure 4 dem<strong>on</strong>strates the surface images <str<strong>on</strong>g>of</str<strong>on</strong>g> EBirradiated<br />

wire before and after thermal aging at<br />

240°C for 30 min. The surface <str<strong>on</strong>g>of</str<strong>on</strong>g> the EB-irradiated<br />

samples shows increased scratching with the<br />

<str<strong>on</strong>g>irradiati<strong>on</strong></str<strong>on</strong>g> dose. In sharp c<strong>on</strong>trast, after thermal aging<br />

<str<strong>on</strong>g>of</str<strong>on</strong>g> the EB-irradiated samples the number and the size<br />

<str<strong>on</strong>g>of</str<strong>on</strong>g> the black spots <strong>on</strong> the surface <str<strong>on</strong>g>of</str<strong>on</strong>g> insulati<strong>on</strong> were<br />

increased as the <str<strong>on</strong>g>irradiati<strong>on</strong></str<strong>on</strong>g> dose increased. The<br />

Iranian Polymer Journal / Volume 20 Number 11 (2011) 879<br />

CH<br />

CH 2<br />

CH<br />

CF 2<br />

C<br />

F<br />

CF 2<br />

CF CF 2<br />

CF 2<br />

CF 2<br />

Cross-linking<br />

Scheme I. Schematic representati<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> mechanism <str<strong>on</strong>g>of</str<strong>on</strong>g> EB <str<strong>on</strong>g>irradiati<strong>on</strong></str<strong>on</strong>g> induced reacti<strong>on</strong>s in ETFE.<br />

CF 2<br />

+ H<br />

+ F

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