04.06.2013 Views

Measuring Nanoparticle Exposure - Application Note NSAM-001 - TSI

Measuring Nanoparticle Exposure - Application Note NSAM-001 - TSI

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compared with the Model 3550 reading averaged over the entire period of SMPS sampling. They must be<br />

within ±10% (for TB and A) for the Model 3550 to pass calibration and verification testing.<br />

<strong>Application</strong>s<br />

The Model 3550 provides a simple and fast solution for indicating the surface area equivalent dose of<br />

particles in the size range of 10 to 1000 nanometers. The Model 3550 is well suited for the following<br />

applications:<br />

• Monitoring workplace exposure to nanoparticles<br />

o Industrial hygiene surveys<br />

o Ambient work area monitoring<br />

o Baseline screening and trending<br />

o Engineering studies<br />

• Material science and production process monitoring<br />

• Inhalation toxicology research studies<br />

• Epidemiology research studies<br />

Theory of Operation<br />

The Model 3550 is based on diffusion charging of sampled particles, followed by detection of the charged<br />

aerosol using an electrometer. An aerosol sample is drawn into the instrument continuously at a rate of<br />

2.5 L/min. The flow is split with 1 L/min passing through two filters (a carbon and a HEPA) and an ionizer<br />

and 1.5 L/min of aerosol sample flow.<br />

The flow streams are merged in a mixing chamber where particles in the aerosol flow mix with the ions<br />

carried by the filtered clean air. This patented counter-flow diffusion charging ** brings the aerosol particles<br />

into a defined, charged state. The separation of particles from direct interaction with the corona needle<br />

and/or the strong field near it reduces particle loss and makes the charging process more efficient and<br />

reproducible. The charged aerosol then passes through an ion trap to remove excess ions and charged<br />

aerosol. The aerosol then moves on to an electrometer for charge measurement. In the electrometer,<br />

current is passed from the particles to a conductive filter and measured by a very sensitive amplifier. A<br />

microprocessor controls the instrument flows and measures various operational parameters and converts<br />

the measurement output into units of square micrometers per cubic centimeter (µm 2 /cc 3 ).<br />

** U.S. Patent No. 6,544,484<br />

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