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Differential Pair Characterization in BGA Packages<br />

Huihui (Grace) Hu<br />

Electrical Engineer;<br />

Package Characterization<br />

Enabling a<br />

Microelectronic World


• Introduction<br />

Outline<br />

• Full wave simulation results<br />

– Comparisons<br />

� Virtual return path vs. Physical grounding<br />

� Differential driven vs. Single-ended<br />

– Return current distribution<br />

• Conclusions<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Why full wave simulation?<br />

• Challenges <strong>of</strong> chip packages<br />

– High routing density in limited space<br />

– High-frequency performance demand<br />

– Discontinuities caused by vias and solder balls<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Tricks <strong>of</strong> HFSS<br />

• Engineering judgments are always necessary<br />

for specific applications<br />

• The simulation results might be affected by<br />

– “<strong>Ground</strong>ing”<br />

– Ineffective absorbing boundary<br />

– Solving criteria (maximum delta)<br />

• How to get accurate S parameters for PBGA<br />

packages?<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Differential<br />

pairs<br />

Four-layer PBGA package with four<br />

differential pairs<br />

Take a close look at<br />

<strong>the</strong> middle section<br />

<strong>Ground</strong> plane is split to<br />

lower <strong>the</strong> coupling between<br />

differential pairs<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Mold compound<br />

<strong>Solder</strong> ball<br />

Die<br />

<strong>Ground</strong> vias<br />

Power balls<br />

Die Attach Wire bond <strong>Solder</strong> mask<br />

via Rigid laminate<br />

<strong>Ground</strong> plane<br />

Power plane<br />

Enabling a Microelectronic World


HFSS modeling questions for <strong>the</strong> specific design<br />

Q1: What is <strong>the</strong> proper size <strong>of</strong> <strong>the</strong> absorbing<br />

boundary?<br />

Q2: Should <strong>the</strong> power net be treated as signal<br />

or ground?<br />

Q3: How to “<strong>Ground</strong>” <strong>the</strong> die?<br />

Q4: Are <strong>the</strong> simulation results going to be<br />

changed by removing <strong>the</strong> ground vias or<br />

balls?<br />

Q5: Is <strong>the</strong>re a way to create a return path<br />

without physical connections?<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Answers for Q1 and Q2<br />

• It is recommended that <strong>the</strong> air box should be no less than lamda/4<br />

away from <strong>the</strong> strong radiator and no less than lamda/10 from <strong>the</strong><br />

weak radiator.<br />

• If <strong>the</strong> solving frequency is set at 20 GHz, <strong>the</strong> corresponding free<br />

space wavelength is 15 mm and <strong>the</strong> minimum distance from <strong>the</strong> air<br />

box to <strong>the</strong> traces is 1.5 mm.<br />

• Power net is supposed to carry DC voltage and it is part <strong>of</strong> <strong>the</strong><br />

return path for high-frequency currents. Thus power net should be<br />

treated as part <strong>of</strong> <strong>the</strong> “<strong>Ground</strong>” system in <strong>the</strong> HFSS model.<br />

Q1: What is <strong>the</strong> proper size <strong>of</strong> <strong>the</strong> absorbing boundary?<br />

Q2: Should <strong>the</strong> power net be treated as signal or ground?<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Edges <strong>of</strong> power and<br />

ground planes, mo<strong>the</strong>r<br />

board ground plane<br />

Start from <strong>the</strong> simplified structure<br />

Die ground edges<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

• One differential pair is modeled<br />

Gap source for singleended<br />

terminal excitation<br />

Circular excitation<br />

simulates <strong>the</strong> real<br />

measurements<br />

• All <strong>of</strong> <strong>the</strong> ground vias and solder balls are<br />

removed<br />

• The edge <strong>of</strong> <strong>the</strong> power and ground planes,<br />

mo<strong>the</strong>rboard ground plane and die internal<br />

ground plane are assigned Perfect-E<br />

• “<strong>Ground</strong>” is virtually created<br />

Enabling a Microelectronic World


Single-ended and differential-ended S<br />

parameters for <strong>the</strong> simplified structure<br />

Differentially driven with<br />

100 ohms impedance<br />

Single-ended return loss is high at<br />

low frequency because <strong>the</strong> planes<br />

are not physically connected.<br />

“Bad grounding at DC”<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Single-ended S parameters<br />

from HFSS<br />

Enabling a Microelectronic World


Create better DC grounding<br />

• Extend die ground to internal package ground<br />

– Simulate <strong>the</strong> ground vias in real packages<br />

– Metal box takes much less time to solve<br />

• Physically connect power and ground planes<br />

– No virtual connections needed<br />

– Continuous return path over frequency range<br />

– Simulation time increases because <strong>of</strong> <strong>the</strong> mesh<br />

size<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Step 1: Extend die ground on <strong>the</strong> basis <strong>of</strong><br />

simplified structure<br />

Die ground<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Internal ground plane<br />

Internal power plane<br />

Simplified structure Extend die ground to internal ground plane<br />

Enabling a Microelectronic World


Single-ended<br />

Differential<br />

Simulation results <strong>of</strong> extended die-ground<br />

Return Loss Insertion Loss<br />

Comparing simplified structure and extended die ground:<br />

� No significant difference in differential S parameters over frequency range<br />

� Single-ended return loss at DC decreased by 12 dB by extending <strong>the</strong> die ground<br />

(Better DC <strong>Ground</strong>ing)<br />

� No significant difference in single-ended S parameters at high frequency (over 15 GHz)<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Signal vias<br />

Signal balls<br />

Step 2: Add ground vias and solder balls on<br />

<strong>the</strong> basis <strong>of</strong> extended die<br />

Extended die ground<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

<strong>Ground</strong> ball Power ball<br />

<strong>Ground</strong> ball<br />

<strong>Ground</strong> via Power via<br />

Side view<br />

Top view<br />

Power ball<br />

Enabling a Microelectronic World


Simulation results <strong>of</strong> added ground vias and<br />

solder balls<br />

Single-ended<br />

Differential<br />

Return Loss Insertion Loss<br />

Comparing extended die ground and added ground vias, solder balls:<br />

� No significant difference in differential S parameters over frequency range<br />

� Single-ended return loss at DC decreased by 16 dB by adding ground via and balls<br />

(Better DC <strong>Ground</strong>ing)<br />

� No significant difference in single-ended S parameters at high frequency (over 15 GHz)<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Top view<br />

Step 3: Add ground (power) wire and trace<br />

on <strong>the</strong> basis <strong>of</strong> added vias and solder balls<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Power wire<br />

Power trace<br />

Power via<br />

� Power wire and trace are added right adjacent to <strong>the</strong> signal<br />

� One end <strong>of</strong> <strong>the</strong> power wire is extended to die internal ground (part <strong>of</strong> <strong>the</strong> return path)<br />

� Power ball bottom is touching mo<strong>the</strong>rboard ground plane (part <strong>of</strong> <strong>the</strong> return path)<br />

Enabling a Microelectronic World


Single-ended<br />

Differential<br />

Simulation results <strong>of</strong> added power wire and<br />

trace<br />

Return Loss<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Insertion Loss<br />

Comparing added ground vias, solder balls and added power trace, wire:<br />

� No significant difference in differential S parameters over frequency range<br />

� Single-ended parameters do not change much by adding power wire and trace<br />

Enabling a Microelectronic World


Review <strong>the</strong> comparisons<br />

• Different “<strong>Ground</strong>ing” approaches have been tried<br />

– Perfect-E edges<br />

– Extended die internal ground<br />

– <strong>Ground</strong> (power) balls and vias added<br />

– <strong>Ground</strong> (power) wire and trace added<br />

• Differential S parameters do not show significant<br />

differences over whole frequency range<br />

• Single-ended S parameters can be affected by <strong>the</strong><br />

return path connections, especially at lower<br />

frequencies<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World


Comparison <strong>of</strong> simulation time and sources<br />

Simplified<br />

structure<br />

Extended_die<br />

<strong>Ground</strong> vias and<br />

balls added<br />

<strong>Ground</strong> wire and<br />

trace added<br />

CPU Time<br />

(Hour:Minute)<br />

3:14<br />

1:35<br />

11:03<br />

22:33<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

RAM Size<br />

(Gigabytes)<br />

0.66<br />

0.34<br />

1.25<br />

1.48<br />

• HFSS version 8.5 was used for all <strong>the</strong> simulations on a UNIX<br />

workstation with 2048 megabytes RAM<br />

• Serial/sequential simulations.<br />

Enabling a Microelectronic World


Return current distribution for differential signals<br />

<strong>Ground</strong> ball land<br />

Current distribution on mo<strong>the</strong>rboard ground plane<br />

Current distribution on<br />

internal ground plane<br />

Current distribution on<br />

internal power plane<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Power ball land<br />

Coupling between signal<br />

ball and ground is weak<br />

Coupling between<br />

signal balls is strong<br />

• The fields are calculated at<br />

24.2 GHz<br />

• For differentially-driven signals,<br />

<strong>the</strong> coupling between <strong>the</strong> signal<br />

balls is stronger than <strong>the</strong><br />

coupling between each <strong>of</strong> <strong>the</strong>m<br />

and ground<br />

• Most <strong>of</strong> <strong>the</strong> return currents flow<br />

on <strong>the</strong> ground plane, right in<br />

<strong>the</strong> shadow <strong>of</strong> <strong>the</strong> signal traces<br />

(lowest inductance)<br />

Enabling a Microelectronic World


Return current distribution for single-ended signals<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

<strong>Ground</strong> ball land<br />

Current distribution on mo<strong>the</strong>rboard ground plane<br />

Current distribution on<br />

internal ground plane<br />

Current distribution on<br />

internal power plane<br />

Power ball land<br />

Coupling between<br />

signal balls is weak<br />

Coupling between signal<br />

ball and ground is strong<br />

• The fields are calculated at<br />

24.2 GHz<br />

• For single-ended signals, <strong>the</strong><br />

coupling between <strong>the</strong> signal<br />

balls is weaker than <strong>the</strong><br />

coupling between each <strong>of</strong> <strong>the</strong>m<br />

and ground<br />

• Most <strong>of</strong> <strong>the</strong> return currents flow<br />

on <strong>the</strong> ground plane, right in<br />

<strong>the</strong> shadow <strong>of</strong> <strong>the</strong> signal traces<br />

(lowest inductance)<br />

Enabling a Microelectronic World


Method 1<br />

Method 2<br />

PBGA package with two differential pairs<br />

Differential pair A<br />

Differential pair A<br />

Differential pair B<br />

Power via and wire<br />

Differential pair B<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

No power/ground vias, balls or wires<br />

Internal ground plane and power<br />

plane are virtually connected using<br />

boundary conditions<br />

Power ball <strong>Ground</strong> ball<br />

Power/ground vias, balls and wires are<br />

added to physically connect <strong>the</strong> power<br />

and ground planes<br />

Enabling a Microelectronic World


Port 1<br />

Diff pair A<br />

Eight-port terminal S matrix to four-port<br />

differential S matrix<br />

Port 3<br />

Port 2<br />

Differential S parameters:<br />

Diff pair B<br />

Port 4<br />

S11, S22 ---- return loss for pair A<br />

S33, S44 ---- return loss for pair B<br />

S12, S21 ---- insertion loss for pair A<br />

S34, S43 ---- insertion loss for pair B<br />

Port 1<br />

Port 3<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

100 ohms<br />

100 ohms<br />

1<br />

2<br />

3<br />

4<br />

.s8p<br />

100 ohms<br />

100 ohms<br />

Eight-port single-ended S parameters were imported<br />

in ADS to get four-port differential S parameters<br />

5<br />

6<br />

7<br />

8<br />

Port 2<br />

Port 4<br />

Enabling a Microelectronic World


I.S.<br />

R.T.<br />

Differential S parameters comparison<br />

Method 1: Virtual connection<br />

Method 2: Physical connection<br />

More solutions needed for<br />

<strong>the</strong> interpolate sweeping to<br />

refine simulation results at<br />

resonance frequencies<br />

Insertion Loss S43<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Method 1: Virtual connection<br />

Method 2: Physical connection<br />

Return Loss S11<br />

Pair A Pair B<br />

Enabling a Microelectronic World


Conclusions<br />

• Virtual grounding is a good method for differential pair<br />

characterization in PBGA package<br />

– Without losing accuracy over frequency range<br />

– Shorten simulation time by more than 90%<br />

• Accurate single-ended characterization requires physical<br />

connection for return path<br />

– Extend die ground to simulate ground vias in real package<br />

– Connect power and ground planes by vias and solder balls.<br />

– No significant changes in <strong>the</strong> simulation results by adding more<br />

ground (power) vias, balls, traces or wires<br />

Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />

Enabling a Microelectronic World

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