Presentation - Investigation of the Effects of Ground Vias, Solder ...
Presentation - Investigation of the Effects of Ground Vias, Solder ...
Presentation - Investigation of the Effects of Ground Vias, Solder ...
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Differential Pair Characterization in BGA Packages<br />
Huihui (Grace) Hu<br />
Electrical Engineer;<br />
Package Characterization<br />
Enabling a<br />
Microelectronic World
• Introduction<br />
Outline<br />
• Full wave simulation results<br />
– Comparisons<br />
� Virtual return path vs. Physical grounding<br />
� Differential driven vs. Single-ended<br />
– Return current distribution<br />
• Conclusions<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Why full wave simulation?<br />
• Challenges <strong>of</strong> chip packages<br />
– High routing density in limited space<br />
– High-frequency performance demand<br />
– Discontinuities caused by vias and solder balls<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Tricks <strong>of</strong> HFSS<br />
• Engineering judgments are always necessary<br />
for specific applications<br />
• The simulation results might be affected by<br />
– “<strong>Ground</strong>ing”<br />
– Ineffective absorbing boundary<br />
– Solving criteria (maximum delta)<br />
• How to get accurate S parameters for PBGA<br />
packages?<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Differential<br />
pairs<br />
Four-layer PBGA package with four<br />
differential pairs<br />
Take a close look at<br />
<strong>the</strong> middle section<br />
<strong>Ground</strong> plane is split to<br />
lower <strong>the</strong> coupling between<br />
differential pairs<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Mold compound<br />
<strong>Solder</strong> ball<br />
Die<br />
<strong>Ground</strong> vias<br />
Power balls<br />
Die Attach Wire bond <strong>Solder</strong> mask<br />
via Rigid laminate<br />
<strong>Ground</strong> plane<br />
Power plane<br />
Enabling a Microelectronic World
HFSS modeling questions for <strong>the</strong> specific design<br />
Q1: What is <strong>the</strong> proper size <strong>of</strong> <strong>the</strong> absorbing<br />
boundary?<br />
Q2: Should <strong>the</strong> power net be treated as signal<br />
or ground?<br />
Q3: How to “<strong>Ground</strong>” <strong>the</strong> die?<br />
Q4: Are <strong>the</strong> simulation results going to be<br />
changed by removing <strong>the</strong> ground vias or<br />
balls?<br />
Q5: Is <strong>the</strong>re a way to create a return path<br />
without physical connections?<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Answers for Q1 and Q2<br />
• It is recommended that <strong>the</strong> air box should be no less than lamda/4<br />
away from <strong>the</strong> strong radiator and no less than lamda/10 from <strong>the</strong><br />
weak radiator.<br />
• If <strong>the</strong> solving frequency is set at 20 GHz, <strong>the</strong> corresponding free<br />
space wavelength is 15 mm and <strong>the</strong> minimum distance from <strong>the</strong> air<br />
box to <strong>the</strong> traces is 1.5 mm.<br />
• Power net is supposed to carry DC voltage and it is part <strong>of</strong> <strong>the</strong><br />
return path for high-frequency currents. Thus power net should be<br />
treated as part <strong>of</strong> <strong>the</strong> “<strong>Ground</strong>” system in <strong>the</strong> HFSS model.<br />
Q1: What is <strong>the</strong> proper size <strong>of</strong> <strong>the</strong> absorbing boundary?<br />
Q2: Should <strong>the</strong> power net be treated as signal or ground?<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Edges <strong>of</strong> power and<br />
ground planes, mo<strong>the</strong>r<br />
board ground plane<br />
Start from <strong>the</strong> simplified structure<br />
Die ground edges<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
• One differential pair is modeled<br />
Gap source for singleended<br />
terminal excitation<br />
Circular excitation<br />
simulates <strong>the</strong> real<br />
measurements<br />
• All <strong>of</strong> <strong>the</strong> ground vias and solder balls are<br />
removed<br />
• The edge <strong>of</strong> <strong>the</strong> power and ground planes,<br />
mo<strong>the</strong>rboard ground plane and die internal<br />
ground plane are assigned Perfect-E<br />
• “<strong>Ground</strong>” is virtually created<br />
Enabling a Microelectronic World
Single-ended and differential-ended S<br />
parameters for <strong>the</strong> simplified structure<br />
Differentially driven with<br />
100 ohms impedance<br />
Single-ended return loss is high at<br />
low frequency because <strong>the</strong> planes<br />
are not physically connected.<br />
“Bad grounding at DC”<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Single-ended S parameters<br />
from HFSS<br />
Enabling a Microelectronic World
Create better DC grounding<br />
• Extend die ground to internal package ground<br />
– Simulate <strong>the</strong> ground vias in real packages<br />
– Metal box takes much less time to solve<br />
• Physically connect power and ground planes<br />
– No virtual connections needed<br />
– Continuous return path over frequency range<br />
– Simulation time increases because <strong>of</strong> <strong>the</strong> mesh<br />
size<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Step 1: Extend die ground on <strong>the</strong> basis <strong>of</strong><br />
simplified structure<br />
Die ground<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Internal ground plane<br />
Internal power plane<br />
Simplified structure Extend die ground to internal ground plane<br />
Enabling a Microelectronic World
Single-ended<br />
Differential<br />
Simulation results <strong>of</strong> extended die-ground<br />
Return Loss Insertion Loss<br />
Comparing simplified structure and extended die ground:<br />
� No significant difference in differential S parameters over frequency range<br />
� Single-ended return loss at DC decreased by 12 dB by extending <strong>the</strong> die ground<br />
(Better DC <strong>Ground</strong>ing)<br />
� No significant difference in single-ended S parameters at high frequency (over 15 GHz)<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Signal vias<br />
Signal balls<br />
Step 2: Add ground vias and solder balls on<br />
<strong>the</strong> basis <strong>of</strong> extended die<br />
Extended die ground<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
<strong>Ground</strong> ball Power ball<br />
<strong>Ground</strong> ball<br />
<strong>Ground</strong> via Power via<br />
Side view<br />
Top view<br />
Power ball<br />
Enabling a Microelectronic World
Simulation results <strong>of</strong> added ground vias and<br />
solder balls<br />
Single-ended<br />
Differential<br />
Return Loss Insertion Loss<br />
Comparing extended die ground and added ground vias, solder balls:<br />
� No significant difference in differential S parameters over frequency range<br />
� Single-ended return loss at DC decreased by 16 dB by adding ground via and balls<br />
(Better DC <strong>Ground</strong>ing)<br />
� No significant difference in single-ended S parameters at high frequency (over 15 GHz)<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Top view<br />
Step 3: Add ground (power) wire and trace<br />
on <strong>the</strong> basis <strong>of</strong> added vias and solder balls<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Power wire<br />
Power trace<br />
Power via<br />
� Power wire and trace are added right adjacent to <strong>the</strong> signal<br />
� One end <strong>of</strong> <strong>the</strong> power wire is extended to die internal ground (part <strong>of</strong> <strong>the</strong> return path)<br />
� Power ball bottom is touching mo<strong>the</strong>rboard ground plane (part <strong>of</strong> <strong>the</strong> return path)<br />
Enabling a Microelectronic World
Single-ended<br />
Differential<br />
Simulation results <strong>of</strong> added power wire and<br />
trace<br />
Return Loss<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Insertion Loss<br />
Comparing added ground vias, solder balls and added power trace, wire:<br />
� No significant difference in differential S parameters over frequency range<br />
� Single-ended parameters do not change much by adding power wire and trace<br />
Enabling a Microelectronic World
Review <strong>the</strong> comparisons<br />
• Different “<strong>Ground</strong>ing” approaches have been tried<br />
– Perfect-E edges<br />
– Extended die internal ground<br />
– <strong>Ground</strong> (power) balls and vias added<br />
– <strong>Ground</strong> (power) wire and trace added<br />
• Differential S parameters do not show significant<br />
differences over whole frequency range<br />
• Single-ended S parameters can be affected by <strong>the</strong><br />
return path connections, especially at lower<br />
frequencies<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World
Comparison <strong>of</strong> simulation time and sources<br />
Simplified<br />
structure<br />
Extended_die<br />
<strong>Ground</strong> vias and<br />
balls added<br />
<strong>Ground</strong> wire and<br />
trace added<br />
CPU Time<br />
(Hour:Minute)<br />
3:14<br />
1:35<br />
11:03<br />
22:33<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
RAM Size<br />
(Gigabytes)<br />
0.66<br />
0.34<br />
1.25<br />
1.48<br />
• HFSS version 8.5 was used for all <strong>the</strong> simulations on a UNIX<br />
workstation with 2048 megabytes RAM<br />
• Serial/sequential simulations.<br />
Enabling a Microelectronic World
Return current distribution for differential signals<br />
<strong>Ground</strong> ball land<br />
Current distribution on mo<strong>the</strong>rboard ground plane<br />
Current distribution on<br />
internal ground plane<br />
Current distribution on<br />
internal power plane<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Power ball land<br />
Coupling between signal<br />
ball and ground is weak<br />
Coupling between<br />
signal balls is strong<br />
• The fields are calculated at<br />
24.2 GHz<br />
• For differentially-driven signals,<br />
<strong>the</strong> coupling between <strong>the</strong> signal<br />
balls is stronger than <strong>the</strong><br />
coupling between each <strong>of</strong> <strong>the</strong>m<br />
and ground<br />
• Most <strong>of</strong> <strong>the</strong> return currents flow<br />
on <strong>the</strong> ground plane, right in<br />
<strong>the</strong> shadow <strong>of</strong> <strong>the</strong> signal traces<br />
(lowest inductance)<br />
Enabling a Microelectronic World
Return current distribution for single-ended signals<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
<strong>Ground</strong> ball land<br />
Current distribution on mo<strong>the</strong>rboard ground plane<br />
Current distribution on<br />
internal ground plane<br />
Current distribution on<br />
internal power plane<br />
Power ball land<br />
Coupling between<br />
signal balls is weak<br />
Coupling between signal<br />
ball and ground is strong<br />
• The fields are calculated at<br />
24.2 GHz<br />
• For single-ended signals, <strong>the</strong><br />
coupling between <strong>the</strong> signal<br />
balls is weaker than <strong>the</strong><br />
coupling between each <strong>of</strong> <strong>the</strong>m<br />
and ground<br />
• Most <strong>of</strong> <strong>the</strong> return currents flow<br />
on <strong>the</strong> ground plane, right in<br />
<strong>the</strong> shadow <strong>of</strong> <strong>the</strong> signal traces<br />
(lowest inductance)<br />
Enabling a Microelectronic World
Method 1<br />
Method 2<br />
PBGA package with two differential pairs<br />
Differential pair A<br />
Differential pair A<br />
Differential pair B<br />
Power via and wire<br />
Differential pair B<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
No power/ground vias, balls or wires<br />
Internal ground plane and power<br />
plane are virtually connected using<br />
boundary conditions<br />
Power ball <strong>Ground</strong> ball<br />
Power/ground vias, balls and wires are<br />
added to physically connect <strong>the</strong> power<br />
and ground planes<br />
Enabling a Microelectronic World
Port 1<br />
Diff pair A<br />
Eight-port terminal S matrix to four-port<br />
differential S matrix<br />
Port 3<br />
Port 2<br />
Differential S parameters:<br />
Diff pair B<br />
Port 4<br />
S11, S22 ---- return loss for pair A<br />
S33, S44 ---- return loss for pair B<br />
S12, S21 ---- insertion loss for pair A<br />
S34, S43 ---- insertion loss for pair B<br />
Port 1<br />
Port 3<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
100 ohms<br />
100 ohms<br />
1<br />
2<br />
3<br />
4<br />
.s8p<br />
100 ohms<br />
100 ohms<br />
Eight-port single-ended S parameters were imported<br />
in ADS to get four-port differential S parameters<br />
5<br />
6<br />
7<br />
8<br />
Port 2<br />
Port 4<br />
Enabling a Microelectronic World
I.S.<br />
R.T.<br />
Differential S parameters comparison<br />
Method 1: Virtual connection<br />
Method 2: Physical connection<br />
More solutions needed for<br />
<strong>the</strong> interpolate sweeping to<br />
refine simulation results at<br />
resonance frequencies<br />
Insertion Loss S43<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Method 1: Virtual connection<br />
Method 2: Physical connection<br />
Return Loss S11<br />
Pair A Pair B<br />
Enabling a Microelectronic World
Conclusions<br />
• Virtual grounding is a good method for differential pair<br />
characterization in PBGA package<br />
– Without losing accuracy over frequency range<br />
– Shorten simulation time by more than 90%<br />
• Accurate single-ended characterization requires physical<br />
connection for return path<br />
– Extend die ground to simulate ground vias in real package<br />
– Connect power and ground planes by vias and solder balls.<br />
– No significant changes in <strong>the</strong> simulation results by adding more<br />
ground (power) vias, balls, traces or wires<br />
Ans<strong>of</strong>t HFSS Workshop 2003, L.A.<br />
Enabling a Microelectronic World