Analytical solutions from a single source - Aqura Gmbh
Analytical solutions from a single source - Aqura Gmbh
Analytical solutions from a single source - Aqura Gmbh
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Microscopy<br />
Electron microscopy<br />
• Scanning electron microscopy (SEM) and<br />
field emission scanning electron microscopy<br />
(FE-SEM) with various sample preparation<br />
techniques, including (cryo-) microtomy,<br />
embedding, grinding, polishing, cryofracture,<br />
selective etching<br />
• Transmission electron microscopy (TEM)<br />
with various sample preparation techniques,<br />
including (cryo-) ultra-microtomy,<br />
contrasting methods<br />
• Energy dispersive X-ray analysis (EDX)<br />
in SEM (microanalysis) and TEM<br />
(nanoanalysis)<br />
• Electron energy loss spectroscopy (EELS)<br />
in the TEM<br />
• Cryo-TEM<br />
Molecular spectroscopy<br />
NMR spectroscopy<br />
• Digital 400, 500 and 600 MHz NMR<br />
spectrometer<br />
• From 2012: Cryo probe technology for<br />
maximum sensivity of 1 H and hetero nuclei<br />
• Routine 1 H, 13 C, 29 Si and 31 P-NMR<br />
spectroscopy<br />
• Also other NMR-active hetero nuclei<br />
( 11 B, 27 Al, 119 Sn, 195 Pt, amongst others)<br />
• Determination of molecular structure and<br />
identity<br />
• Special pulse techniques, multi-dimensional<br />
NMR for structural elucidation<br />
• Content determination against certified<br />
internal standards (qNMR)<br />
• Measurements in accordance with GMP<br />
and GLP requirements on qualified<br />
spectrometers<br />
• Kinetic measurements, molecular dynamics<br />
• Solid state NMR (400 MHz), CP-MAS<br />
• <strong>Analytical</strong> TEM with maximum resolution<br />
(HR-TEM, 200 kV field emission, resolution<br />
down to 1.2 Angstrom), with STEM addition<br />
and HAADF detector<br />
• Electron diffraction, determination of<br />
lattice constants<br />
• Particle size distributions<br />
• Primary particle size determination<br />
(according to ASTM, using TGZ techniques)<br />
• Aggregate size distributions and<br />
classification analyses<br />
• Plasma preparation techniques<br />
• Digital image processing and<br />
documentation<br />
Optical microscopy<br />
• Optical microscopy (reflected/transmitted<br />
light, polarisation, hot stage, fluorescence)<br />
• Digital image processing and<br />
documentation<br />
• Laser-assisted surface profiling<br />
(2 and 3-D measurements)<br />
Infrared / Near-infrared spectroscopy<br />
(IR / NIR), Raman spectroscopy<br />
• Fourier transform infrared spectroscopy<br />
(FT-IR)<br />
• Measurements in accordance with GMP<br />
and GLP requirements on qualified<br />
spectrometers<br />
• Surface and micro-particle analysis with<br />
attenuated total reflection (ATR, diamond<br />
ATR, germanium ATR)<br />
• Reflection measurements with heatable<br />
DRIFT unit<br />
• Identity check using NIR spectroscopy<br />
• FT Raman spectroscopy with NIR excitation<br />
Spectroscopy in the ultraviolet and<br />
visible range (UV / Vis)<br />
• UV / Vis spectrometer scaning and<br />
diode array<br />
• UV / Vis remission measurements<br />
(reflection of powders and surfaces up<br />
to 1100 nm) UV/Vis applications with or<br />
without derivatisation, colour reactions<br />
and derivative spectroscopy<br />
• Spectroscopic determination of colour<br />
numbers (APHA, Gardner, yellowness<br />
index) etc.<br />
Info<br />
On the basis of their spectroscopic properties,<br />
molecules can be identified in a similar<br />
manner to a fingerprint.<br />
If unknown compounds such as undesirable<br />
impurities occur, the molecular structure<br />
is often determined by means of detective<br />
work using spectroscopy.<br />
In addition, the purity and the course of<br />
entire chemical reactions can be followed.<br />
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