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Analytical solutions from a single source - Aqura Gmbh

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Microscopy<br />

Electron microscopy<br />

• Scanning electron microscopy (SEM) and<br />

field emission scanning electron microscopy<br />

(FE-SEM) with various sample preparation<br />

techniques, including (cryo-) microtomy,<br />

embedding, grinding, polishing, cryofracture,<br />

selective etching<br />

• Transmission electron microscopy (TEM)<br />

with various sample preparation techniques,<br />

including (cryo-) ultra-microtomy,<br />

contrasting methods<br />

• Energy dispersive X-ray analysis (EDX)<br />

in SEM (microanalysis) and TEM<br />

(nanoanalysis)<br />

• Electron energy loss spectroscopy (EELS)<br />

in the TEM<br />

• Cryo-TEM<br />

Molecular spectroscopy<br />

NMR spectroscopy<br />

• Digital 400, 500 and 600 MHz NMR<br />

spectrometer<br />

• From 2012: Cryo probe technology for<br />

maximum sensivity of 1 H and hetero nuclei<br />

• Routine 1 H, 13 C, 29 Si and 31 P-NMR<br />

spectroscopy<br />

• Also other NMR-active hetero nuclei<br />

( 11 B, 27 Al, 119 Sn, 195 Pt, amongst others)<br />

• Determination of molecular structure and<br />

identity<br />

• Special pulse techniques, multi-dimensional<br />

NMR for structural elucidation<br />

• Content determination against certified<br />

internal standards (qNMR)<br />

• Measurements in accordance with GMP<br />

and GLP requirements on qualified<br />

spectrometers<br />

• Kinetic measurements, molecular dynamics<br />

• Solid state NMR (400 MHz), CP-MAS<br />

• <strong>Analytical</strong> TEM with maximum resolution<br />

(HR-TEM, 200 kV field emission, resolution<br />

down to 1.2 Angstrom), with STEM addition<br />

and HAADF detector<br />

• Electron diffraction, determination of<br />

lattice constants<br />

• Particle size distributions<br />

• Primary particle size determination<br />

(according to ASTM, using TGZ techniques)<br />

• Aggregate size distributions and<br />

classification analyses<br />

• Plasma preparation techniques<br />

• Digital image processing and<br />

documentation<br />

Optical microscopy<br />

• Optical microscopy (reflected/transmitted<br />

light, polarisation, hot stage, fluorescence)<br />

• Digital image processing and<br />

documentation<br />

• Laser-assisted surface profiling<br />

(2 and 3-D measurements)<br />

Infrared / Near-infrared spectroscopy<br />

(IR / NIR), Raman spectroscopy<br />

• Fourier transform infrared spectroscopy<br />

(FT-IR)<br />

• Measurements in accordance with GMP<br />

and GLP requirements on qualified<br />

spectrometers<br />

• Surface and micro-particle analysis with<br />

attenuated total reflection (ATR, diamond<br />

ATR, germanium ATR)<br />

• Reflection measurements with heatable<br />

DRIFT unit<br />

• Identity check using NIR spectroscopy<br />

• FT Raman spectroscopy with NIR excitation<br />

Spectroscopy in the ultraviolet and<br />

visible range (UV / Vis)<br />

• UV / Vis spectrometer scaning and<br />

diode array<br />

• UV / Vis remission measurements<br />

(reflection of powders and surfaces up<br />

to 1100 nm) UV/Vis applications with or<br />

without derivatisation, colour reactions<br />

and derivative spectroscopy<br />

• Spectroscopic determination of colour<br />

numbers (APHA, Gardner, yellowness<br />

index) etc.<br />

Info<br />

On the basis of their spectroscopic properties,<br />

molecules can be identified in a similar<br />

manner to a fingerprint.<br />

If unknown compounds such as undesirable<br />

impurities occur, the molecular structure<br />

is often determined by means of detective<br />

work using spectroscopy.<br />

In addition, the purity and the course of<br />

entire chemical reactions can be followed.<br />

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