Laser TOF-MS instrumentation for planetary missions - Harsh ...

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DS-TOF • 355 or 337 nm pulses < 10 8 W cm -2 (1 - 20 Hz) • Unprepared chips or powders, mounted on insertion probe and held at +5 kV • Monolithic nonlinear reflectron • Double-sided detector system • Organic and elemental analysis capabilities • Refractory organic LODs in low ppbw range • Probe on fine scales (spot size
LD-TOF-MS of Allende Matrix 12 10 8 6 4 4.0 3.5 3.0 2.5 2.0 1.5 Phenanthrene m/z 178 C 14 H 10 Chrysene Benzo(a)pyrene Probe 4.76 kV Higher Fluence Coronene m/z 252 m/z 228 C 18 H 12 C 16 H 10 450 500 550 600 650 700 750 800 850 C 20 H 12 m/z 300 C 24 H 12 2.0 Pyrene 1.8 1.6 1.4 m/z 202 ~ 50 µm 100 µm Craters Allende NMNH 3529 Probe 6.37 kV Lower Fluence 100 150 200 250 300 350 400 450 500 550 600 m/z (Da) W. B. Brinckerhoff (JHU/APL) et al. 5 th Workshop on Harsh Environment Mass Spectrometry, September 22, 2005
Page 1 and 2: Laser TOF-MS instrumentation for pl
Page 3 and 4: Example Planetary Missions • Mars
Page 5 and 6: Asteroids Goals: Relate asteroids t
Page 7 and 8: In Situ Astrobiology at Comets Murc
Page 9 and 10: Outer Planetary Satellites Europa T
Page 11 and 12: LAMS • 1064 nm Qsw pulses < 10 mJ
Page 13 and 14: JSC Mars-1 Simulant rRSC Unground 1
Page 15: W. B. Brinckerhoff (JHU/APL) et al.
Page 19 and 20: Tower TOF • Normal incidence deso
Page 21 and 22: TOF-on-a-flange, out W. B. Brincker
Page 23 and 24: Sample Handling and Vacuum Stuff Hi
Page 25 and 26: Acknowledgements Collaborators and

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