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Liquid Crystal Measurement Instruments 2007 - Instec Inc

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<strong>Liquid</strong> <strong>Crystal</strong><br />

<strong>Measurement</strong><br />

<strong>Instruments</strong><br />

<strong>2007</strong><br />

INSTEC ®<br />

Focus on Excellence


Overview<br />

The <strong>Liquid</strong> <strong>Crystal</strong> industry continues its explosive growth. The long awaited replacement of<br />

CRTs has come and gone. <strong>Liquid</strong> crystal television dimensions grow to unprecedented sizes — both<br />

at the large end and the small as hand held video players become ubiquitous. <strong>Liquid</strong> crystal displays<br />

are everywhere from the laptop computer to the bathroom scale. At the same time LCs are<br />

used in low volume high margin ‘niche’ applications for avionics, telecommunications, and tunable<br />

lasers. The old standard TN mode display is not replaced but rather joined by IPS, VA, FLCs and<br />

others. Competition is fierce and a competitor’s edge can depend on the quality and precise behavior<br />

of the liquid crystal material, or rather mixture — for no pure LC is sufficient for any of these<br />

applications — which it produces or employs. The accurate, simple and quick measurement of a<br />

liquid crystal material’s physical parameters has become a necessity in today’s liquid crystal industry.<br />

Based on more than thirty years of research experience from Prof. Noel Clark’s liquid-crystal<br />

research group at the University of Colorado at Boulder, and twenty-two years of engineering and<br />

design experience at <strong>Instec</strong> <strong>Inc</strong>orporated, <strong>Instec</strong> has developed a line of liquid-crystal parameter<br />

test instruments and accessories to meet your most critical requirements.<br />

The ALCT3: A general purpose instrument for both industrial and academic research, capable<br />

of automatically measuring the most important parameters of nematic (both positive and negative)<br />

and ferroelectric liquid-crystals. For nematics, these include among others the bend and splay<br />

elastic parameters K11 and K33, rotational viscosity (for positive dielectric materials only) and the<br />

dielectric constants. For ferroelectrics, it quickly determines such parameters as the switching<br />

time, polarization, and rotational viscosity.<br />

The NNLCG1: A system specifically designed for measuring the difficult to determine rotational<br />

viscosity of negative dielectric nematics.<br />

The IV1: An instrument designed for LC material and display manufacturers. The IV1’s state of<br />

the art electronics allows for the measurement of ion density, LC resistivity, voltage holding ratio<br />

and residual DC.<br />

The PD02: When added to the ALCT3, this photo detector allows for the measurement of<br />

Transmission vs. Voltage (TV) curves and optical switching times.<br />

<strong>Measurement</strong>s over Temperature<br />

Nematic liquid crystal parameters such as the elastic constants K11 and K33, the rotational viscosity<br />

γ 1, along with ferroelectric liquid crystal parameters such as the polarization can be strong<br />

functions of the temperature. The ALCT3, NNLCG1, and IV1 all make it simple to measure their<br />

parameters over temperature. Each is easily integrated with the optional temperature controlled<br />

shielding box (ALCT3-TS) or any of <strong>Instec</strong>’s signature thermal stages. The software allows the user<br />

to go to a specific temperature for measurement or to setup a series of thermal measurements to<br />

be carried out automatically. After a series of measurements the data can be viewed graphically<br />

or saved to a text based file for later examination in any spreadsheet or data analysis package.<br />

<strong>Liquid</strong> <strong>Crystal</strong> Cells and Cell Holders: A range of empty homogenous and homeotropic LC cells<br />

with precise electrode spacing and area, ideal for the preparation of test samples. A range of homogenous<br />

aligned in-plane switching empty cells are also available for the customer to choose.<br />

<strong>Instec</strong> LC cell holders allow for the quick connection of our LC cells to any of the above instruments<br />

without the need for soldering wires. <strong>Instec</strong> can also offer customized empty or filled LC<br />

cells, and cell holders based on the customer’s specific requirements.<br />

2


ALCT3 - USB Based Automatic <strong>Liquid</strong> <strong>Crystal</strong> Tester<br />

Improved from the earlier PCI card versions of the ALCT1<br />

and ALCT2, the new ALCT3 is an USB based instrument which<br />

can be connected conveniently to both desktop and laptop<br />

computers. The ALCT3’s easy to use software allows for the<br />

measurement of both positive and negative-dielectic nematic<br />

liquid-crystal materials, and the determination of material<br />

parameters of ferroelectic LC materials as well. The range of<br />

material parameters measured by the ALCT3 include:<br />

For NLC (Positive Dielectric Anisotropic Material):<br />

• Threshold voltage<br />

• Splay and Bend elastic constants<br />

• ε ⊥ and ε || dielectric constants<br />

• Ion density and mobility*<br />

• Rotational viscosity<br />

• Electrical resistivity*<br />

For Negative Dielectric Anisotropic Nematic Material:<br />

• Threshold voltage<br />

• ε ⊥ and ε || dielectric constants<br />

• Electrical resistivity*<br />

• Ion density and mobility*<br />

• Splay and Bend elastic constants<br />

For FLC:<br />

• Electrical switching time<br />

• Optical switching time<br />

• Rotational viscosity<br />

• Electrical resistivity*<br />

• Dielectric constant<br />

• Spontaneous polarization<br />

• Ion density and mobility*<br />

*Resistivity and ion density measurement of ALCT3 are designed for academic use only. The smallest current is only 1nA. For current<br />

measurement down to 10pA, please refer to the IV1.<br />

These parameters are of crucial importance to liquid crystal, and liquid crystal display manufacturers and researchers.<br />

They help determine, among other things, the operating voltage of a display, the voltage spacing of visual ‘gray’<br />

levels, and the speed or response time of a display.<br />

The ALCT3 contains a versatile function generator and precision current sensor. <strong>Measurement</strong>s are made by applying<br />

specific waveforms to a liquid crystal cell, detecting the response current and employing the relevant equations of<br />

liquid crystal physics. For example, after applying a series of AC voltages to a nematic liquid crystal cell to measure the<br />

capacitance versus voltage curve, the curve is fit using the following integrals (H.J. Deuling, Mol. Cryst. Liq. Cryst. 19,<br />

123, 1972) to determine the bend elastic constant K33.<br />

2<br />

C 2<br />

2 Vth<br />

φm<br />

(1 + γ sin φ)(1<br />

+ κ sin<br />

= 1+<br />

γ sin φm C π<br />

V<br />

∫0 2<br />

2<br />

0 sin φm<br />

− sin φ<br />

φ)<br />

dφ<br />

2<br />

V 2<br />

2 φm<br />

1+<br />

κ sin φ<br />

= 1+<br />

γ sin φm<br />

dφ<br />

Vth π<br />

∫0 2 2<br />

2<br />

(1 + γ sin φ )(sin φm<br />

− sin φ )<br />

2<br />

with<br />

K ε||<br />

κ = 33 − 1 Δ = ε − ε γ = −1<br />

K<br />

11<br />

ε<br />

||<br />

⊥<br />

ε ⊥<br />

The ALCT3 can also be integrated with <strong>Instec</strong>’s microscope thermal stages and temperature controllers, enabling the<br />

user to analyze the temperature dependence of the above parameters. The temperature controlled shielding box,<br />

ALCT3-TS, is available as an optional accessory.<br />

3


ALCT3 - USB Based Automatic <strong>Liquid</strong> <strong>Crystal</strong> Tester<br />

Technical Specifications<br />

Output Wave DC to 10KHz, voltage 0 to ±100V<br />

Output Update Rate<br />

500KHz<br />

Output Resolution<br />

16 bit<br />

Input Resolution<br />

16 bit<br />

Input Sample Rate<br />

500KHz<br />

Current <strong>Measurement</strong> Range 1nA ~ 1mA<br />

Current Sensing Resistance 10K, 100K, 1M, and 10MΩ<br />

Current Resolution<br />

100pA<br />

Post Gain in the ALCT Box 1, 10, 100, 1000<br />

Capacitance <strong>Measurement</strong> 2pF to 100nF<br />

Easy-to-Use Software, WinLC<br />

The ALCT3’s software has been designed to be both flexible enough for academic research and yet simple enough to<br />

use for easy incorporation on the factory floor. For instance, in the Nematic <strong>Liquid</strong> <strong>Crystal</strong> measurement application the<br />

data chosen to analyze for the determination of the dielectric constants ε || , ε ⊥, the elastic constants K11, K33, and the<br />

threshold voltage can all be chosen by the user. Alternatively by the changing of a single setting they can be fixed to<br />

default values to insure repeatable meaningful results.<br />

Software Interface for CV Curve of Positive NLC<br />

Software Interface for CV Curve of Negative NLC<br />

4


ALCT3 - USB Based Automatic <strong>Liquid</strong> <strong>Crystal</strong> Tester<br />

Software Interface for Gamma1 <strong>Measurement</strong> (Positive NLC)<br />

Software Interface for Function Generator/Oscilloscope<br />

Software Interface for FLC Polarization <strong>Measurement</strong><br />

Software Interface for FLC Switching <strong>Measurement</strong><br />

5


NNLCG1 – Rotational Viscosity for Negative NLC<br />

With the advent of projection and direct-view large-sized<br />

liquid-crystal monitors and televisions the vertically aligned<br />

mode has come into prominence and with it the negative dielectric<br />

liquid crystals on which it relies. One of the most critical<br />

parameters for any LC is γ , the rotational viscosity, which<br />

greatly influences the time response of the display. However,<br />

measuring the rotational viscosity of negative dielectrics has<br />

traditionally been difficult due to such switching phenomena<br />

as backflow and the like. <strong>Instec</strong> designed the Negative<br />

Nematic <strong>Liquid</strong> <strong>Crystal</strong> γ 1 test instrument specifically to overcome<br />

this problem. With it, one can quickly and accurately<br />

measure the rotational viscosity of negative dielectric materials<br />

in seconds.<br />

The rotational viscosity is a parameter particularly sensitive to temperature. As with all <strong>Instec</strong> liquid crystal measuring<br />

instruments, the NNLCG1 integrates easily with either the ALCT3-TS temperature controlled shielding box or our<br />

standard temperature controlled stages.<br />

Technical Specifications<br />

Output Wave 1 KHz, voltage 0 to ±100V<br />

Output Update Rate<br />

500KHz<br />

Output Resolution<br />

16 bit<br />

Input Resolution<br />

16 bit<br />

Input Sample Rate<br />

500KHz<br />

Current <strong>Measurement</strong> Range 1nA ~ 1mA<br />

Current Sensing Resistance 10KΩ<br />

Current Resolution<br />

100pA<br />

Post Gain in the ALCT Box 1, 10, 100, 1000<br />

Capacitance <strong>Measurement</strong> 2pF to 100nF<br />

Easy-to-Use Software<br />

6


IV1 - LC Tester for Ion, Resistivity, VHR, and RDC<br />

<strong>Instec</strong> designed the IV1 specifically with the industrial customers in<br />

mind. Its electronics are capable of exceedingly sensitive current<br />

measurement and low leakage voltage measurement. Its cables and<br />

connectors are triaxial in order to allow guarding against external leakages.<br />

The IV1 can be configured to measure any or all of the following:<br />

• Ion Density<br />

• <strong>Liquid</strong> <strong>Crystal</strong> Resistivity<br />

• Voltage Holding Ratio (VHR)<br />

• Residual DC (RDC)<br />

Ion density and liquid crystal resistivity are critical components in the proper functioning of any LC display but especially<br />

active matrix LCDs. With too many contaminant ions or too low a resistivity, displays are prone to problems such<br />

as image retention and flicker. These measurements are useful to LC manufactures both in the development of liquid<br />

crystals and quality control. In addition, display manufacturers can use them for both incoming and in line quality inspection<br />

and as a diagnostic tool to trace down root causes of problems on the line.<br />

VHR and RDC are a more direct probe for potential problems. Lowered Voltage Holding Ratios can result in noticeable<br />

flicker to a display user. Elevated Residual DC values can also produce flicker and/or image retention (or image<br />

sticking).<br />

In measuring VHR, the IV1’s built in function generator outputs to the sample under test an AC pulse train of user<br />

adjustable frequency, amplitude, and duration. Simultaneously, the IV1’s internal electrometer senses changes in voltage<br />

on the sample, in particular the voltage droop between pulses. For the measurement of RDC, the IV1 applies a set<br />

DC voltage to the liquid crystal cell of user selectable magnitude and duration. The built in electrometer then records<br />

the residual DC voltage left on the sample cell, again for a user selectable duration. Since the duration of the initial DC<br />

voltage may be an hour or more, while the measurement time may be set to ten or more minutes, a single RDC determination<br />

can be a long process. With that in mind we designed the IV1’s electronics with a modular structure and options<br />

exist to add up to 8 channels.<br />

Technical Specifications<br />

Ion/Resistivity<br />

Voltage (Min)<br />

Voltage (Max)<br />

Resolution<br />

Frequency<br />

Current Range<br />

Current Resolution<br />

Electrical Connections<br />

Voltage (Min)<br />

Voltage (Max)<br />

Resolution<br />

Output Current<br />

Offset Voltage<br />

Input Capacitance (Hold Mode)<br />

Leak Current (Hold Mode)<br />

V.G Offset (Hold Mode)<br />

Charge Injection<br />

Electrical Connections<br />

± 10mV<br />

± 10V (± 100V optional)<br />

100 μ V<br />

0.01 ~ 1kHz<br />

100pA to 1mA<br />

1pA<br />

Triaxial<br />

Voltage Holding Ratio / Residual DC Voltage <strong>Measurement</strong><br />

± 10mV<br />

± 10V<br />

100 μ V<br />

± 100mA (Max)<br />

± 0.1mV<br />

< 1pF<br />

< ± 0.1pA<br />

± 0.1mV<br />

± 5pC<br />

Triaxial<br />

7


PD02 C-Mount Photo Detector<br />

The addition of the PD02 photo detector expands ALCT3’s capabilities to include the optical measurement of transmission<br />

versus voltage curves and switching times. This low noise high speed photo detector comes C-mount ready for<br />

attachment to a microscope and also includes a standard 1/4-20 tapped hole for easy mounting to an optical table.<br />

Fully integrated into the ALCT3’s software, switching between electrical and optical measurements can be done with<br />

a click of the mouse.<br />

Features<br />

• 1 μs Response Time<br />

• Easy To Use<br />

• Differential Output<br />

• 4 Post-gains To Choose<br />

• Microscope C-mount Ready<br />

• ¼-20 Tapped Hole For Horizontal Mounting<br />

Technical Specification<br />

Response Speed<br />

Post Gain<br />

Input Voltage<br />

Output Voltage<br />

Mounting<br />

1 μs with post gain X1<br />

x1, Rf = 10 KΩ; x10, Rf = 100 KΩ; x100, Rf = 1 MΩ; x1000, Rf = 10 MΩ<br />

100V ~ 240 VAC<br />

10V<br />

C-mount for microscope or ¼-20 for horizontal mounting<br />

X1000<br />

X100<br />

X10<br />

X1<br />

8


<strong>Liquid</strong> <strong>Crystal</strong> Cells and Cell Holder<br />

<strong>Instec</strong> provides a lineup of empty liquid crystal test cells ideally suited for use with<br />

the ALCT in addition to other LC research applications. When measuring a liquid crystal’s<br />

parameters, sample preparation is as critical to the measurement as the testing<br />

instrument itself. <strong>Instec</strong>’s cells are manufactured with patterned electrodes in industry<br />

standard clean rooms and equipment. This yields a cell whose active sample area is<br />

known precisely, has low parasitic capacitance, and can be completely filled with the LC<br />

material under test.<br />

Even so, the reliance on spacers to determine cell gap can lead to errors of several<br />

percent. Thus for critical testing applications, <strong>Instec</strong> makes available calibrated cells<br />

whose spacing have been individually measured both optically and electronically. Each<br />

calibrated cell is then shipped along with its individual cell thickness and parasitic capacitance.<br />

The adhesive of <strong>Instec</strong> cells can withstand up to 200ºC. Alignment layers are of 1º to<br />

3º pre-tilt angles. Physical dimensions and spacing of cells vary depending on different<br />

models. Cell gap tolerance is ±0.2 µm.<br />

Image above is an example of<br />

LC1, 90° twist aligned.<br />

PI Type<br />

Homogenous Alignment<br />

90º Twist<br />

Homogenous Alignment<br />

Parallel<br />

Homogenous Alignment<br />

Anti-Parallel<br />

Homogenous Alignment<br />

Anti-Parallel<br />

Homeotropic Alignment<br />

Anti-Parallel<br />

Part No<br />

ITO Area<br />

(mm)<br />

Cell Spacing<br />

(microns)<br />

LC1-6.0<br />

6.0 µm<br />

5 X 5<br />

LC1-6.8 6.8 µm<br />

LC3-5.0<br />

5 µm<br />

LC2-5.0 5 µm<br />

LC4-6.8<br />

5 X 5<br />

6.8 µm<br />

LC2-9.0 9 µm<br />

LC2-20.0 20 µm<br />

SA025A04uG180 5 X 5 4 µm<br />

SA100A09uG180 10 X 10 9 µm<br />

SA100A18uG180 10 X 10 18 µm<br />

SA025A04uT180 5 X 5 4 µm<br />

SA100A09uT180 10 X 10 9 µm<br />

SA100A18uT180 10 X 10 18 µm<br />

No PI (Patterned ITO) SA100A04uNOPI 10 X 10 4 µm<br />

In-Plane-Switching<br />

Homogenous Alignment<br />

Vertical Rubbing to Electric<br />

Field<br />

In-Plane-Switching<br />

Homogenous Alignment<br />

Parallel Rubbing to Electric<br />

Field<br />

IPS02A09uGVE 10 X 10 9 µm<br />

IPS02A18uGVE 10 X 10 18 µm<br />

IPS02A09uGPE 10 X 10 9 µm<br />

IPS02A18uGPE 10 X 10 18 µm<br />

ITO<br />

Resistance<br />

Cell Outer Dimensions<br />

(mm) &<br />

Cell Holder Model<br />

100 Ω/□ 15.25 X 20.25 X 2.25<br />

100 Ω/□ 15.25 X 17 X 1.5<br />

30 Ω/□<br />

21 X 25 X 1.5<br />

Cell Holder: LCH2<br />

Image above shows the structures<br />

of LC2, LC3, and LC4 empty cells.<br />

Image above shows the structures<br />

of SA Series empty cells. Example<br />

is SA100<br />

LCH2<br />

<strong>Instec</strong> LC cell holder, LCH2 accommodate various <strong>Instec</strong> empty cell models: SA025,<br />

SA100, and IPS02. The cell holder can be used inside the <strong>Instec</strong> microscope hot and<br />

cold stages. The LCH2 has external electrical grounding for electrical noise shielding.<br />

The LCH2 can be used to attach electrodes to the LC Cells. Otherwise, solder or silver<br />

epoxy can be used to attach wires.<br />

How to Use <strong>Instec</strong> LC Cells<br />

There are two openings on <strong>Instec</strong> liquid crystal cells. Heat the cell above the isotropic temperature of your LC material.<br />

Then drop a very small amount of LC material on one opening of the <strong>Instec</strong> empty cell. The capillary force will suck LC<br />

material into the empty cell. It may take a few minutes before the cell is fully filled. You can see the filling process at<br />

"right" angle under light. Once the cell is filled, in order to get good alignment, please cool down slowly, especially during<br />

the phase transition temperature.<br />

9


TS62 Microscope Thermal Stage<br />

All of <strong>Instec</strong>’s <strong>Liquid</strong> <strong>Crystal</strong> <strong>Measurement</strong> <strong>Instruments</strong> work not only with the ALCT3-TS temperature controlled<br />

shielding box, but also with <strong>Instec</strong>’s full line of Thermal microscope stages, plates and chucks. A popular choice for liquid<br />

crystal research and development is the TS62. This microscope thermal stage’s built-in peltier heating/cooling unit<br />

adjusts temperature from -30 o C to 120 o C, a range sufficient for nearly all commercial LC research and development.<br />

The TS62 boasts a large sample area, adjustable sample chamber height, and fast heating and cooling rates. With the<br />

TS62 not only can an LC sample’s parameters be measured over its entire operating temperature range but it can be<br />

studied under the microscope as well. (Note: if a wider temperature range is required <strong>Instec</strong> has units with ranges available<br />

from -190 o C to 700 o C).<br />

Features<br />

• Peltier-Based Microscope Thermal Stage<br />

• Programmable Precision Temperature Control<br />

from -30ºC to 120ºC with 0.1ºC Temperature Precision<br />

• Accommodates Up to 1.5"X2.0" Sample Size<br />

• Fast Heating and Cooling Rate<br />

• Variable Sample Chamber Height<br />

• Large Viewing Window<br />

• Configured with STC200 Standalone Temperature<br />

Controller with RS232 Communication Port and Windows Based Software<br />

• Optional IEEE488 Communication Port<br />

• Free LabVIEW Drivers for IEEE488 and RS232<br />

Technical Specifications<br />

Temperature Control Sensor<br />

Platinum RTD<br />

Control Method<br />

PID, variable DC power output<br />

Temperature Range -30°C to 120°C<br />

Temperature Precision<br />

0.1°C<br />

Temperature Stability ±0.1°C at 37°C<br />

Minimum Heating and Cooling Rate ±0.1°C/Hour<br />

Maximum Heating Rate +50°C/Min. at 37°C<br />

Maximum Cooling Rate -50°C/Min. at 37°C<br />

Minimum Working Distance<br />

2.5 mm when using double glass windows on the cover<br />

1.6 mm when using single glass window on the cover<br />

Minimum Condenser Distance 17 mm<br />

Sample Chamber Height<br />

2.5mm, increasable to 11.5mm<br />

Sample Area 1.5" X 2"<br />

Sample View Aperture<br />

0.2" (5 mm) for transmitted light<br />

0.8" (20mm) for reflected light<br />

10


TS62 Microscope Thermal Stage<br />

Cross Section View<br />

Stage height H: 1.1"<br />

Working distance F:<br />

2.5 mm<br />

Working distance for condenser C: 17 mm<br />

Mounting Hole Pattern<br />

11


ALCT3<br />

For NLC (Positive Dielectric Anisotropic Material):<br />

• Threshold Voltage<br />

• Splay and Bend Elastic Constants<br />

• ε ⊥ and ε || Dielectric Constants<br />

• Ion Density and Mobility<br />

• Rotational Viscosity<br />

• Electrical Resistivity<br />

For Negative Dielectric Anisotropic Nematic Material:<br />

• Threshold Voltage<br />

• ε ⊥ and ε || Dielectric Constants<br />

• Electrical Resistivity<br />

• Ion Density and Mobility<br />

• Splay and Bend Elastic Constants<br />

For FLC:<br />

• Electrical Switching Time<br />

• Optical Switching Time<br />

• Rotational Viscosity<br />

• Electrical Resistivity<br />

• Dielectric Constant<br />

• Spontaneous Polarization<br />

• Ion Density and Mobility<br />

NNLCG1<br />

• Rotational Viscosity (Gamma1) for Negative<br />

NLC material<br />

IV1<br />

• Ion Density<br />

• Resistivity<br />

• Voltage Holding Ratio<br />

• Residual DC<br />

PD02<br />

• Transmission vs. Voltage (TV) Curve and<br />

Optical Switching Time<br />

<strong>Liquid</strong> <strong>Crystal</strong> Cells & Cell Holder<br />

TS62 Microscope Thermal Stage<br />

<strong>Instec</strong>, <strong>Inc</strong>.<br />

5589 Arapahoe Avenue #208<br />

Boulder, CO 80303<br />

USA<br />

Represented By:<br />

Phone: +1 303-444-4608<br />

Fax: +1 303-444-4607<br />

E-mail: sales@instec.com<br />

www.instec.com

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