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CE MARK TECHNICAL FILE<br />

AS/NZS EMC CONSTRUCTION FILE<br />

Contains:<br />

of<br />

ATA Fl<strong>as</strong>h Drive<br />

Model<br />

AFD 251<br />

1. Declaration of Conformity<br />

2. EN55022/CISPR 22, AS/NZS CISPR 22 EMI test report<br />

3. EN55024, AS/NZS CISPR 24, EN61000-3-2 / AS/NZS 61000.3.2, and<br />

EN61000-3-3 / AS/NZS 61000.3.3 test report<br />

4. Block Diagram and Schematics<br />

5. Users’ manual


Declaration of Conformity<br />

Name of Responsible Party: Apa<strong>ce</strong>r Technology Inc.<br />

Address of Responsible Party: 8F,No. 19-3, San Chong Rd., Nan-Kang<br />

115 Taipei,<br />

Taiwan, R.O.C.<br />

Declares that product: ATA Fl<strong>as</strong>h Drive<br />

Model: AFD 251<br />

Assembled by: Same <strong>as</strong> above<br />

Address: Same <strong>as</strong> above<br />

Page 1 of 2<br />

Report No. ISL-05HE014C, 05HE014E<br />

Conforms to the EMC Directive 89/336/EEC <strong>as</strong> attested by conformity with the following<br />

harmonized standards:<br />

EN55022:1998/A1:2000; AS/NZS CISPR 22: 2002: Limits and methods<br />

of me<strong>as</strong>urement of Radio Interferen<strong>ce</strong> characteristics of Information Technology<br />

Equipment.<br />

EN55024: 1998/A1:2001/A2: 2003; AS/NZS CISPR 24: 1997: Information technology<br />

equipment-Immunity characteristics-Limits and methods of me<strong>as</strong>urement.<br />

Standard Description Results Criteria<br />

EN61000-4-2: 1995/A1: 1998/A2: 2001<br />

AS/NZS 61000.4.2: 2002<br />

EN61000-4-3: 2000/A1: 2002<br />

AS/NZS 61000.4.3: 1999<br />

EN61000-4-4: 1995/A1: 2001/A2: 2001<br />

AS/NZS 61000.4.4: 1999<br />

EN61000-4-5: 1995/A1: 2001<br />

AS/NZS 61000.4.5: 1999<br />

EN61000-4-6: 1996/A1: 2001<br />

AS/NZS 61000.4.6: 1999<br />

EN61000-4-8: 1993/A1: 2001<br />

AS/NZS 61000.4.8: 2002<br />

EN61000-4-11: 1994/A1: 2001<br />

AS/NZS 61000.4.11: 1999<br />

Electrostatic Discharge P<strong>as</strong>s B<br />

Radio-Frequency, Electromagnetic<br />

Field<br />

P<strong>as</strong>s A<br />

Electrical F<strong>as</strong>t Transient/Burst P<strong>as</strong>s B<br />

Surge P<strong>as</strong>s B<br />

Conductive Disturban<strong>ce</strong> P<strong>as</strong>s A<br />

Power Frequency Magnetic Field P<strong>as</strong>s A<br />

Voltage Dips / Short Interruption and<br />

Voltage Variation<br />

>95% in 10ms P<strong>as</strong>s B<br />

30% in 500ms P<strong>as</strong>s C<br />

>95% in 5000ms P<strong>as</strong>s C<br />


EN61000-3-2: 2000<br />

AS/NZS 61000.3.2: 2003<br />

EN61000-3-3: 1995A1: 2001<br />

AS/NZS 61000.3.3: 1998<br />

Page 2 of 2<br />

Report No. ISL-05HE014C, 05HE014E<br />

Standard Description Results<br />

Limits for harmonics current emissions P<strong>as</strong>s<br />

Limits for voltage fluctuations and flicker in<br />

low-voltage supply systems .<br />

We, Apa<strong>ce</strong>r Technology Inc., hereby declare that the equipment bearing the trade name and<br />

model number specified above w<strong>as</strong> tested conforming to the applicable Rules under the most<br />

accurate me<strong>as</strong>urement standards possible, and that all the ne<strong>ce</strong>ssary steps have been taken and<br />

are in for<strong>ce</strong> to <strong>as</strong>sure that production units of the same equipment will continue to comply with<br />

the requirements.<br />

---------------------------<br />

Aaron Chiang<br />

Apa<strong>ce</strong>r Technology Inc.<br />

Date: 2005/02/02<br />

P<strong>as</strong>s


Declaration of Conformity<br />

Name of Responsible Party: Apa<strong>ce</strong>r Technology Inc.<br />

Address of Responsible Party: 8F,No. 19-3, San Chong Rd., Nan-Kang<br />

115 Taipei,<br />

Taiwan, R.O.C.<br />

Declares that product: ATA Fl<strong>as</strong>h Drive<br />

Model: AFD 251<br />

Page 1 of 2<br />

Report No. ISL-05HE014C, 05HE014E<br />

Assembled by: Same <strong>as</strong> above<br />

Address: Same <strong>as</strong> above<br />

Conforms to the C-Tick Mark requirement <strong>as</strong> attested by conformity with the following<br />

standards:<br />

EN55022:1998/A1:2000; AS/NZS CISPR 22: 2002: Limits and methods<br />

of me<strong>as</strong>urement of Radio Interferen<strong>ce</strong> characteristics of Information Technology<br />

Equipment.<br />

EN55024: 1998/A1:2001/A2: 2003; AS/NZS CISPR 24: 1997: Information technology<br />

equipment-Immunity characteristics-Limits and methods of me<strong>as</strong>urement.<br />

Standard Description Results Criteria<br />

EN61000-4-2: 1995/A1: 1998/A2: 2001<br />

AS/NZS 61000.4.2: 2002<br />

EN61000-4-3: 2000/A1: 2002<br />

AS/NZS 61000.4.3: 1999<br />

EN61000-4-4: 1995/A1: 2001/A2: 2001<br />

AS/NZS 61000.4.4: 1999<br />

EN61000-4-5: 1995/A1: 2001<br />

AS/NZS 61000.4.5: 1999<br />

EN61000-4-6: 1996/A1: 2001<br />

AS/NZS 61000.4.6: 1999<br />

EN61000-4-8: 1993/A1: 2001<br />

AS/NZS 61000.4.8: 2002<br />

EN61000-4-11: 1994/A1: 2001<br />

AS/NZS 61000.4.11: 1999<br />

Electrostatic Discharge P<strong>as</strong>s B<br />

Radio-Frequency, Electromagnetic<br />

Field<br />

P<strong>as</strong>s A<br />

Electrical F<strong>as</strong>t Transient/Burst P<strong>as</strong>s B<br />

Surge P<strong>as</strong>s B<br />

Conductive Disturban<strong>ce</strong> P<strong>as</strong>s A<br />

Power Frequency Magnetic Field P<strong>as</strong>s A<br />

Voltage Dips / Short Interruption and<br />

Voltage Variation<br />

>95% in 10ms P<strong>as</strong>s B<br />

30% in 500ms P<strong>as</strong>s C<br />

>95% in 5000ms P<strong>as</strong>s C<br />


EN61000-3-2: 2000<br />

AS/NZS 61000.3.2: 2003<br />

EN61000-3-3: 1995A1: 2001<br />

AS/NZS 61000.3.3: 1998<br />

Page 2 of 2<br />

Report No. ISL-05HE014C, 05HE014E<br />

Standard Description Results<br />

Limits for harmonics current emissions P<strong>as</strong>s<br />

Limits for voltage fluctuations and flicker in<br />

low-voltage supply systems .<br />

We, Apa<strong>ce</strong>r Technology Inc., hereby declare that the equipment bearing the trade name and<br />

model number specified above w<strong>as</strong> tested conforming to the applicable Rules under the most<br />

accurate me<strong>as</strong>urement standards possible, and that all the ne<strong>ce</strong>ssary steps have been taken and<br />

are in for<strong>ce</strong> to <strong>as</strong>sure that production units of the same equipment will continue to comply with<br />

the requirements.<br />

---------------------------<br />

Aaron Chiang<br />

Apa<strong>ce</strong>r Technology Inc.<br />

Date: 2005/02/02<br />

P<strong>as</strong>s


No. 65, Ku Dai Keng St., Hsichih, Taipei 221, R.O. C. Tel: 886-2-2646-2550 FAX: 886-2-26464641<br />

No. 120, Lane 180, San Ho Tsuen, Hsin Ho Rd. Lung-Tan Hsiang,<br />

Tao Yuan County 325, Taiwan, R.O.C. Tel: 886-3-407-1718 FAX:886-3-407-1738<br />

Certificate<br />

Product Name: ATA Fl<strong>as</strong>h Drive Test Report No.: 05HE014C ; 05HE014E<br />

Model Number(s): AFD 251 Issue Date: 2005/02/02<br />

Responsible Party Apa<strong>ce</strong>r Technology Inc.<br />

Address: 8F,No. 19-3, San Chong Rd., Nan-Kang<br />

115 Taipei,, Taiwan, R.O.C.<br />

Contact Person: Aaron Chiang<br />

We, International Standards Laboratory, hereby <strong>ce</strong>rtify that:<br />

The devi<strong>ce</strong> bearing the trade name and model specified above h<strong>as</strong> been shown to comply with the<br />

applicable <strong>technical</strong> standards <strong>as</strong> indicated in the me<strong>as</strong>urement report and w<strong>as</strong> tested in<br />

accordan<strong>ce</strong> with the me<strong>as</strong>urement pro<strong>ce</strong>dures specified in EUROPEAN COUNCIL<br />

DIRECTIVE 89/336/EEC. The devi<strong>ce</strong> w<strong>as</strong> p<strong>as</strong>sed the test performed according to :<br />

EN55022:1998/A1:2000; AS/NZS CISPR 22: 2002: Limits and methods of me<strong>as</strong>urement of<br />

Radio Interferen<strong>ce</strong> characteristics of Information Technology Equipment.<br />

EN55024: 1998/A1:2001/A2: 2003; AS/NZS CISPR 24: 1997: Information technology<br />

equipment-Immunity characteristics-Limits and methods of me<strong>as</strong>urement.<br />

EN61000-4-2: 1995/A1: 1998/A2: 2001<br />

AS/NZS 61000.4.2: 2002<br />

EN61000-4-3: 2000/A1: 2002<br />

AS/NZS 61000.4.3: 1999<br />

EN61000-4-4: 1995/A1: 2001/A2: 2001<br />

AS/NZS 61000.4.4: 1999<br />

EN61000-4-5: 1995/A1: 2001<br />

AS/NZS 61000.4.5: 1999<br />

EN61000-4-6: 1996/A1: 2001<br />

AS/NZS 61000.4.6: 1999<br />

EN61000-4-8: 1993/A1: 2001<br />

AS/NZS 61000.4.8: 2002<br />

EN61000-4-11: 1994/A1: 2001<br />

AS/NZS 61000.4.11: 1999<br />

EN61000-3-2: 2000/AS/NZS 61000.3.2: 2003: Limits for harmonics current emissions.<br />

EN61000-3-3: 1995/A1: 2001/ AS/NZS 61000.3.3: 1998: Limits for voltage fluctuations and<br />

flicker in low-voltage supply systems.<br />

I attest to the accuracy of data and all me<strong>as</strong>urements reported herein were performed by me or<br />

were made under my supervision and are correct to the best of my knowledge and belief. I<br />

<strong>as</strong>sume full responsibility for the completeness of these me<strong>as</strong>urements and vouch for the<br />

qualifications of all persons taking them.<br />

---------------------------------------<br />

Eddy Hsiung/Director


EN55024 / AS/NZS CISPR 24 / IMMUNITY<br />

EN61000-3-2 / HARMONICS<br />

EN61000-3-3 / VOLTAGE FLUCTUATIONS<br />

TEST REPORT<br />

Report Number: ISL-05HE014E Issue Date: 2005/02/02<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

T10-R1-10<br />

of<br />

Product Name<br />

ATA Fl<strong>as</strong>h Drive<br />

Model<br />

AFD 251<br />

Applied by:<br />

Apa<strong>ce</strong>r Technology Inc.<br />

8F,No. 19-3, San Chong Rd., Nan-Kang<br />

115 Taipei,<br />

Taiwan, R.O.C.<br />

Test Performed by:<br />

(NVLAP Lab. Code: 200234-0)<br />

International Standards Laboratory<br />

(V) Hsichih LAB Lung-Tan LAB<br />

NEMKO:ELA 113a NEMKO:ELA 113b<br />

No. 65, Ku Dai Keng St. No. 120, Lane 180, San Ho Tsuen, Hsin Ho Rd.<br />

Hsichih, Taipei Hsien 22117 Lung-Tan Hsiang, Tao Yuan County 325<br />

Taiwan, R.O.C. Taiwan, R.O.C<br />

Tel:(02)2646-2550 Tel:(03)407-1718<br />

Fax:(02)2646-4641 Fax:(03)407-1738


Report Number: ISL-05HE014E Issue Date: 2005/02/02<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

T10-R1-10


-i-<br />

Contents of Report<br />

1. General.......................................................................................................................1<br />

1.1 Certification of Accuracy of Test Data.............................................................................1<br />

2. Summary...................................................................................................................2<br />

2.1 Operation Environment ...................................................................................................2<br />

2.2 Test Standards................................................................................................................2<br />

2.3 Description of Support Equipment...................................................................................3<br />

2.3.1 Software for Controlling Support Unit ........................................................................................................ 5<br />

2.3.2 I/O Cable Condition of EUT and Support Units ........................................................................................ 6<br />

2.4 Description of Equipment Under Test..............................................................................7<br />

3. Electrostatic discharge (ESD) immunity ..........................................8<br />

3.1 Electrostatic discharge (ESD) immunity test.....................................................8<br />

4. Radio-Frequency, Electromagnetic Field immunity..............10<br />

4.1 Radio-Frequency, Electromagnetic Field immunity test...............................10<br />

5. Electrical F<strong>as</strong>t transients/burst immunity.......................................11<br />

5.1 Electrical F<strong>as</strong>t transient/burst immunity test.....................................................11<br />

6. Surge Immunity .................................................................................................13<br />

6.1 Surge immunity test................................................................................................13<br />

7. Immunity to Conductive Disturban<strong>ce</strong> ..............................................14<br />

7.1 Immunity to Conductive Disturban<strong>ce</strong>................................................................14<br />

8. Power Frequency Magnetic Field immunity ...............................15<br />

8.1 Power Frequency Magnetic field immunity test..............................................15<br />

9. Voltage Dips, Short Interruption and Voltage Variation<br />

immunity...........................................................................................................................16<br />

9.1 Voltage Dips, Short Interruption and Voltage Variation immunity test.....16<br />

10. Harmonics..............................................................................................................17<br />

10.1 Harmonics test.....................................................................................................17<br />

11. Voltage Fluctuations......................................................................................18<br />

11.1 Voltage Fluctuations test...................................................................................18<br />

12. Test Equipment List.......................................................................................20<br />

12.1 Software for Controlling Spectrum/Re<strong>ce</strong>iver and Calculating Test Data.......................21<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997


-ii-<br />

13. Photographs..........................................................................................................22<br />

13.1 Photos of ESD me<strong>as</strong>urement...........................................................................22<br />

13.2 Photos of RF Field Strength Sus<strong>ce</strong>ptibility Me<strong>as</strong>urement........................22<br />

13.3 Photos of Electrical F<strong>as</strong>t Transient/Burst me<strong>as</strong>urement............................23<br />

13.4 Photos of Surge me<strong>as</strong>urement.........................................................................23<br />

13.5 Photo of Conductive Me<strong>as</strong>urement................................................................24<br />

13.6 Photo of Magnetic field me<strong>as</strong>urement ...........................................................24<br />

13.7 Photos of Voltage Dips me<strong>as</strong>urement ...........................................................25<br />

13.8 Photos of Harmonics and Voltage Fluctuations .........................................25<br />

13.9 Appendix: Photographs of EUT .....................................................................26<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997


1. General<br />

1.1 Certification of Accuracy of Test Data<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-1-<br />

Applicant: Apa<strong>ce</strong>r Technology Inc.<br />

8F,No. 19-3, San Chong Rd., Nan-Kang<br />

115 Taipei,<br />

Taiwan, R.O.C.<br />

Equipment Tested: ATA Fl<strong>as</strong>h Drive<br />

Model: AFD 251<br />

Date of test: 2005/01/31<br />

Test Site: HC Test Site<br />

Test Engineer: ------------------------<br />

James Kuo<br />

Approve & Signature<br />

---------------------------------------------<br />

Eddy Hsiung/Director<br />

Test results given in this report apply only to the specific sample(s) tested under stated test conditions.<br />

This report shall not be reprodu<strong>ce</strong>d other than in full without the explicit written consent of ISL. This report totally contains<br />

29 pages, including 1 cover page , 2 contents page, and 26 pages for the test description.<br />

This report must not be use to claim product endorsement by NVLA, NIST, any agency of the federal government.<br />

This test report accurately contains the test results of the above standards at the time of the test.<br />

The results in this report apply only to the sample(s) tested.<br />

This test report shall not be reprodu<strong>ce</strong>d ex<strong>ce</strong>pt in full, without the written approval of International Standards Laboratory.


2. Summary<br />

2.1 Operation Environment<br />

Power supply : AC 230 V / 50 Hz<br />

2.2 Test Standards<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-2-<br />

The immunity tests which this report describes were conducted by an independent<br />

electromagnetic compatibility consultant, International Standards Laboratory in accordan<strong>ce</strong><br />

with the<br />

EN55024: 1998/A1:2001/A2: 2003; AS/NZS CISPR 24: 1997: Information technology<br />

equipment-Immunity characteristics-Limits and methods of me<strong>as</strong>urement.<br />

Standard Description Results Criteria<br />

EN61000-4-2: 1995/A1: 1998/A2: 2001<br />

AS/NZS 61000.4.2: 2002<br />

EN61000-4-3: 2000/A1: 2002<br />

AS/NZS 61000.4.3: 1999<br />

EN61000-4-4: 1995/A1: 2001/A2: 2001<br />

AS/NZS 61000.4.4: 1999<br />

EN61000-4-5: 1995/A1: 2001<br />

AS/NZS 61000.4.5: 1999<br />

EN61000-4-6: 1996/A1: 2001<br />

AS/NZS 61000.4.6: 1999<br />

EN61000-4-8: 1993/A1: 2001<br />

AS/NZS 61000.4.8: 2002<br />

EN61000-4-11: 1994/A1: 2001<br />

AS/NZS 61000.4.11: 1999<br />

EN61000-3-2: 2000<br />

AS/NZS 61000.3.2: 2003<br />

EN61000-3-3: 1995A1: 2001<br />

AS/NZS 61000.3.3: 1998<br />

Electrostatic Discharge P<strong>as</strong>s B<br />

Radio-Frequency, Electromagnetic<br />

Field<br />

P<strong>as</strong>s A<br />

Electrical F<strong>as</strong>t Transient/Burst P<strong>as</strong>s B<br />

Surge P<strong>as</strong>s B<br />

Conductive Disturban<strong>ce</strong> P<strong>as</strong>s A<br />

Power Frequency Magnetic Field P<strong>as</strong>s A<br />

Voltage Dips / Short Interruption and<br />

Voltage Variation<br />

>95% in 10ms P<strong>as</strong>s B<br />

30% in 500ms P<strong>as</strong>s C<br />

>95% in 5000ms P<strong>as</strong>s C<br />

Standard Description Results<br />

Limits for harmonics current emissions P<strong>as</strong>s<br />

Limits for voltage fluctuations and flicker in<br />

low-voltage supply systems .<br />

P<strong>as</strong>s


2.3 Description of Support Equipment<br />

Support Unit 1.<br />

Description: HP Printer (for parallel interfa<strong>ce</strong> port)<br />

Model Number: C2642E<br />

Serial Number: N/A<br />

Power Supply Type: AC Adaptor (HP Model: C2175A)<br />

Power Cord: Non-shielded, Detachable<br />

Data Cable: Shielded, Detachable, With Metal Hood<br />

FCC ID: N/A<br />

Support Unit 2.<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-3-<br />

Description: Logitech Mouse<br />

Model Number: M-SAH<br />

Serial Number: LZB81251703<br />

Power Supply Type: N/A<br />

Power Cord: N/A<br />

FCC ID: DZL211029<br />

Support Unit 3.<br />

Description: A<strong>ce</strong>ex Modem<br />

(for serial interfa<strong>ce</strong> port)<br />

Model Number: DM1414<br />

Serial Number: 0301000557<br />

Power Supply Type: Linear, Power Adapter<br />

( AC to AC Xfmr, Wall Mounted Type )<br />

Power Cord: Nonshielded, Without Grounding Pin<br />

FCC ID: IFAXDM1414<br />

Support Unit 4.<br />

Description: A<strong>ce</strong>r Monitor<br />

Model: 7377xe<br />

Serial Number: 999027100501700055P644E1 P<br />

Power Supply Type: Switching<br />

Power Cord: Nonshielded, Detachable<br />

FCC ID: (Comply with FCC DOC)<br />

Support Unit 5.<br />

Description: A<strong>ce</strong>r Keyboard<br />

Model Number: 6511-TW4C<br />

Serial Number: 916600704C83D11076S00000<br />

Power Supply Type: N/A<br />

Power Cord: N/A<br />

FCC ID: JVPKBS-WIN


2.3.1 Software for Controlling Support Unit<br />

follows:<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-5-<br />

Test programs exercising various part of EUT were used. The programs were executed <strong>as</strong><br />

A. Read and write to the disk drives.<br />

B. Send H pattern to the parallel port devi<strong>ce</strong> (Printer).<br />

C. Send H pattern to the serial port devi<strong>ce</strong> (Modem).<br />

D. Send H pattern to the video port devi<strong>ce</strong> (Monitor).<br />

E. Open Winthrax.exe Reader/Writer EUT memory<br />

F. Repeat the above steps.<br />

Filename Issued Date<br />

Monitor HH.bat 8/20/1991<br />

Modem 1 Hm.bat 8/20/1991<br />

Printer1 Wordpad.exe 11/11/1999<br />

Winthrax Winthrax.exe 5/21/1996


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-6-<br />

2.3.2 I/O Cable Condition of EUT and Support Units<br />

Description Path Cable Length Cable Type Connector Type<br />

AC Power Cord 110V (~240V) to<br />

EUT SPS<br />

Keyboard Data<br />

Cable<br />

Keyboard to PC<br />

Keyboard port<br />

Monitor Data Cable Monitor to PC<br />

VGA port<br />

Modem Data Cable Modem to PC<br />

COM 1 port<br />

Mouse Data Cable Mouse to PC<br />

Mouse port<br />

Printer Data Cable Printer to PC<br />

Parallel port<br />

1.8M Nonshielded, Detachable Pl<strong>as</strong>tic Head<br />

1.8M Shielded, Undetachable Metal Head<br />

1.6M Shielded, Un-detachable Metal Head<br />

1.5M Shielded, Detachable Metal Head<br />

1.8M Shielded, Un-detachable Metal Head<br />

1.5M Shielded, Detachable Metal Head


2.4 Description of Equipment Under Test<br />

EUT<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-7-<br />

Description: ATA Fl<strong>as</strong>h Drive<br />

Condition: Pre-Production<br />

Model: AFD 251<br />

Serial Number: N/A<br />

IDE Connector: one 44pin<br />

The test configuration is listed below:<br />

The EUT w<strong>as</strong> connected to Personal Computer via IDE cable to transmission.<br />

EMI Noise Sour<strong>ce</strong>:<br />

None.<br />

EMI Solution:<br />

None.


3. Electrostatic discharge (ESD) immunity<br />

3.1 Electrostatic discharge (ESD) immunity test<br />

Port: Enclosure<br />

B<strong>as</strong>ic Standard: EN61000-4-2/ AS/NZS 61000.4.2<br />

(details referred to Sec 2.2)<br />

Test Level: Air +/- 2 kV, +/- 4 kV, +/- 8 kV<br />

Contact +/- 2 kV, +/- 4 kV<br />

Criteria: B<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S03<br />

Temperature: 14 degree C<br />

Humidity: 60%<br />

Selected Test Point<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-8-<br />

Air: discharges were applied to slots, aperture or insulating surfa<strong>ce</strong>s. 10 single air discharges<br />

were applied to each selected points.<br />

Contact: Total 200 point minimum were to the selected contact points.<br />

Indirect Contact Points: 25 discharges were applied to <strong>ce</strong>nter of each edge of VCP and each EUT<br />

side of HCP with 10 cm away from EUT.


Test Setup<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-9-<br />

EUT is 1m from the wall and other metallic structure. When Battery test mode is needed, a cable with one<br />

470KΩ resister at two rare ends is connected from metallic part of EUT and screwed to HCP.<br />

For battery<br />

test mode<br />

470KΩ<br />

Test Result<br />

80cm<br />

EUT<br />

10cm<br />

470K 470KΩ<br />

Ground referen<strong>ce</strong> Plane<br />

VCP: 0.5m x 0.5m<br />

0.5mm insulation<br />

HCP: 1.6m x 0.8m<br />

Non-Metallic Table<br />

Performan<strong>ce</strong> of EUT complies with the given specification.


4. Radio-Frequency, Electromagnetic Field immunity<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-10-<br />

4.1 Radio-Frequency, Electromagnetic Field immunity test<br />

Port: Enclosure<br />

B<strong>as</strong>ic Standard: EN61000-4-3/ AS/NZS 61000.4.3<br />

(details referred to Sec 2.2)<br />

Test Level:: 3 V/m<br />

Modulation: AM 1KHz 80%<br />

Frequency range: 80 MHz~1 GHz<br />

Frequency Step: 1% of l<strong>as</strong>t step frequency<br />

Step time: 800 ms<br />

Polarization: Vertical and Horizontal<br />

EUT Azimuth Angle � 0° � 90° � 180° � 270°<br />

Criteria: A<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S017<br />

Temperature: 23 degree C<br />

Humidity: 40%<br />

Test Setup<br />

The field sensor is pla<strong>ce</strong>d at one calibration grid point to check the intensity of the established<br />

fields on both polarizations. EUT is adjusted to have each side of EUT fa<strong>ce</strong> coincident with the<br />

calibration plane. A CCD camera and speakers are used to monitor the condition of EUT for the<br />

performan<strong>ce</strong> judgment.<br />

Test Result<br />

Performan<strong>ce</strong> of EUT complies with the given specification.


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-11-<br />

5. Electrical F<strong>as</strong>t transients/burst immunity<br />

5.1 Electrical F<strong>as</strong>t transient/burst immunity test<br />

Port: AC mains;<br />

B<strong>as</strong>ic Standard: EN61000-4-4/ AS/NZS 61000.4.4<br />

(details referred to Sec 2.2)<br />

Test Level: AC Power Port: +/- 1 kV<br />

: +/- 0.5 kV<br />

Rise Time: 5ns<br />

Hold Time: 50ns<br />

Repetition Frequency: 5KHz<br />

Criteria: B<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S05<br />

Temperature: 14 degree C<br />

Humidity: 60%<br />

Test Pro<strong>ce</strong>dure<br />

The EUT w<strong>as</strong> setup on a nonconductive table 0.8 m above a referen<strong>ce</strong> ground plane.<br />

Test Points Polarity Result Comment<br />

Line + N 60 sec<br />

- N 60 sec<br />

Neutral + N 60 sec<br />

- N 60 sec<br />

Ground + N 60 sec<br />

- N 60 sec<br />

Line to + N 60 sec<br />

Neutral - N 60 sec<br />

Line to + N 60 sec<br />

Ground - N 60 sec<br />

Neutral to + N 60 sec<br />

Ground - N 60 sec<br />

Line to Neutral + N 60 sec<br />

to Ground - N 60 sec<br />

Note: ’N’ means normal, the EUT function is correct during the test.


Test Setup<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-12-<br />

EUT is at le<strong>as</strong>t 50cm from the conductive structure .<br />

test generator<br />

Test Result<br />

AC main: L


6. Surge Immunity<br />

6.1 Surge immunity test<br />

Port: AC mains;<br />

B<strong>as</strong>ic Standard: EN61000-4-5/ AS/NZS 61000.4.5<br />

(details referred to Sec 2.2)<br />

Test Level: AC Power Port<br />

Line to Line: +/- 0.5 kV, +/- 1 kV<br />

Line to Earth: +/- 0.5 kV, +/- 1 kV, +/- 2kV<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-13-<br />

Rise Time: 1.2us<br />

Hold Time: 50us<br />

Repetition Rate: 30 second<br />

Angle: � 0° � 90° � 270°<br />

Criteria: B<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S04<br />

Temperature: 14 degree C<br />

Humidity: 60%<br />

Test Setup<br />

Test Result<br />

AC power supply and<br />

Voltage Supply to EUT<br />

To the Peripherals<br />

To AC main Supply Non-Metallic /<br />

Non-Conducted Table<br />

Transient-1000<br />

80 cm<br />

Metal Full Soldered Ground Plane<br />

Performan<strong>ce</strong> of EUT complies with the given specification.<br />

EUT


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-14-<br />

7. Immunity to Conductive Disturban<strong>ce</strong><br />

7.1 Immunity to Conductive Disturban<strong>ce</strong><br />

Port: AC mains;<br />

B<strong>as</strong>ic Standard: EN61000-4-6/ AS/NZS 61000.4.6<br />

(details referred to Sec 2.2)<br />

Test Level:: 3 V<br />

Modulation: AM 1KHz 80%<br />

Frequency range: 0.15 MHz - 80MHz<br />

Frequency Step: 1% of l<strong>as</strong>t Frequency<br />

Step time: 1000 ms<br />

Criteria: A<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S08<br />

Temperature: 14 degree C<br />

Humidity: 60%<br />

Test Setup<br />

Test<br />

Generator<br />

Test Result<br />

To AC main<br />

6d<br />

B<br />

CDN<br />

10~30cm<br />

>3cm<br />

Referen<strong>ce</strong> Ground Plane<br />

EUT<br />

0.1 m support<br />

Performan<strong>ce</strong> of EUT complies with the given specification.<br />

50Ω<br />

CDN<br />

To AE


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-15-<br />

8. Power Frequency Magnetic Field immunity<br />

8.1 Power Frequency Magnetic field immunity test<br />

Port: Enclosure<br />

B<strong>as</strong>ic Standard: EN61000-4-8/ AS/NZS 61000.4.8<br />

(details referred to Sec 2.2)<br />

Test Level: 1A/m<br />

Polarization: X, Y, Z<br />

Criteria: A<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S02<br />

Temperature: 14 degree C<br />

Humidity: 60%<br />

To<br />

AC<br />

main<br />

Test Setup<br />

Test<br />

Generator<br />

Test Result<br />


9. Voltage Dips, Short Interruption and Voltage Variation<br />

immunity<br />

9.1 Voltage Dips, Short Interruption and Voltage Variation immunity test<br />

Port: AC mains<br />

B<strong>as</strong>ic Standard: EN61000-4-11/ AS/NZS 61000.4.11<br />

(details referred to Sec 2.2)<br />

Test Level:<br />

>95% in 10ms<br />

Criteria:<br />

B<br />

Test Level:<br />

30% in 500ms<br />

Criteria:<br />

C<br />

Test Level:<br />

>95% in 5000ms<br />

Criteria:<br />

C<br />

Ph<strong>as</strong>e: 0°; 180°<br />

Test intervals: 3 times with 10s each<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S01<br />

Temperature: 14 degree C<br />

Humidity: 60%<br />

Test Setup<br />

To AC main<br />

Test Result<br />

Test<br />

Generator<br />

EUT AC supply<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-16-<br />

Ground Referen<strong>ce</strong> Plane<br />

80cm<br />

Performan<strong>ce</strong> of EUT complies with the given specification.<br />

EUT<br />

Non-Metallic Table<br />

To AE


10. Harmonics<br />

10.1 Harmonics test<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-17-<br />

Port: AC mains<br />

Active Input Power:


11. Voltage Fluctuations<br />

11.1 Voltage Fluctuations test<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-18-<br />

Port: AC mains<br />

B<strong>as</strong>ic Standard: EN61000-3-3/AS/ AS/NZS 61000.3.3<br />

(details referred to Sec 2.2)<br />

Test Pro<strong>ce</strong>dure refer to ISL QA T04-S44<br />

Observation period: For Pst 10min<br />

For Plt 2 hours<br />

Test Pro<strong>ce</strong>dure<br />

The EUT is supplied in series with referen<strong>ce</strong> impedan<strong>ce</strong> from a power sour<strong>ce</strong> with the voltage and<br />

frequency <strong>as</strong> the nominal supply voltage and frequency of the EUT.<br />

Result<br />

Performan<strong>ce</strong> of EUT complies with the given specification.


Test Data<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-19-


12. Test Equipment List<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-20-<br />

Location Equipment Name Brand Model S/N L<strong>as</strong>t Cal. Date Next Cal. Date<br />

EN61K-3-2/3 DC Burn-In Load 02 D-RAM DBS-2100 2100-910027 N/A N/A<br />

EN61K-3-2/3 Power Analyzer 02 Chroma 6630 1068 04/27/2004 04/27/2005<br />

EN61K-4 Thermo -Hygro Meter -4 HD-36 ISL-C-004 12/04/2004 12/04/2006<br />

EN61K-4-2 ESD Mouse Precision ESD Mouse ESD 101-214 N/A N/A<br />

EN61K-4-2,4,5,<br />

8,11<br />

Test Generator -4 PRECISION TRA1H01B TRA1000-126 08/05/2004 08/05/2005<br />

EN61K-4-3 BILOG Antenna 06 Schaffner CBL6112B 2754 N/A N/A<br />

EN61K-4-3 Amplifier 800Mhz~2Ghz SCD ALP589 P000164-001 N/A N/A<br />

EN61K-4-3 Amplifier 80M~1Ghz AR 100W1000M1 15387 N/A N/A<br />

EN61K-4-3 Broadband coupler Amplifier DC2500 19810 N/A N/A<br />

10K~220Mhz Research<br />

EN61K-4-3 Broadband Coupler Amplifier DC6180 20364 N/A N/A<br />

80M~1GHz<br />

Research<br />

EN61K-4-3 Broadband Couplier<br />

1~4GHz<br />

Werlatone C5291 6516 N/A N/A<br />

EN61K-4-3 Coaxial Cable Chmb<br />

04-3M-2<br />

Belden RG-8/U Chmb 04-3M-2 N/A N/A<br />

EN61K-4-3 Signal Generator 02 HP 8648B 3642U01040 04/04/2003 04/04/2005<br />

EN61K-4-4 Digital Oscilloscope Tektronix TDS 684A B010761 N/A N/A<br />

EN61K-4-4 EFT Clamp Precision 1604242 CNEFT1000-10<br />

3<br />

N/A N/A<br />

EN61K-4-5 CDN-Kit -4 Precision 1604243 CDNKIT1000-3 N/A<br />

2<br />

N/A<br />

EN61K-4-5 CDN Surge Kit 01 EMC-PARTNE<br />

R<br />

CDNKIT1000T; CDNKIT1000-2 08/06/2003<br />

DN-T1; DN-T2; 4<br />

CN-T1; CN-T2<br />

08/06/2006<br />

33-6-34 BC5975 N/A N/A<br />

EN61K-4-6 6dB Attenuator Weinschel<br />

Corp<br />

EN61K-4-6 Amplifier 4-6 Amplifier<br />

Research<br />

150A100 1-1-R-02157 N/A N/A<br />

EN61K-4-6 Attenator 6dB 4-6 BIRO 100-A-FFN-06 0123 N/A N/A<br />

EN61K-4-6 CDN M2+M3 Frankonia M2+M3 A3011016 05/31/2004 05/31/2005<br />

EN61K-4-6 CDN T2 01 Frankonia T2 A3010003 05/31/2004 05/31/2005<br />

EN61K-4-6 CDN T4 01 FCC Inc. FCC-801-T4 9721 05/31/2004 05/31/2005<br />

EN61K-4-6 Coaxial Cable 4-6 01-1 Harbour M17/128-RG40 4-6 01-1 N/A N/A<br />

Industries 0<br />

EN61K-4-6 Coaxial Cable 4-6 01-2 Harbour M17/128-RG40 4-6 01-2 N/A N/A<br />

Industries 0<br />

EN61K-4-6 Coaxial Cable 4-6 01-3 Harbour M17/128-RG40 4-6 01-3 N/A N/A<br />

Industries 0<br />

EN61K-4-6 KAL-AD RJ45S BIRO N/A N/A<br />

EN61K-4-6 KAL-AD T2 BIRO N/A N/A<br />

EN61K-4-6 P<strong>as</strong>sive Impedan<strong>ce</strong> FCC FCC-801-150-50 9758;9759 N/A N/A<br />

Adaptor 4-6<br />

-CDN<br />

EN61K-4-6,<br />

CISPR 13,<br />

Antenn<br />

Signal Generator 01 HP 8656B 2635A04675 08/06/2004 08/06/2005<br />

EN61K-4-8 Clamp Meter 4-8 TES 3090 990900322 06/11/2004 06/11/2005<br />

EN61K-4-8 Magnetic Field Antenna Precision TRAIZ44B MF1000-23 N/A N/A


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-21-<br />

12.1 Software for Controlling Spectrum/Re<strong>ce</strong>iver and Calculating Test Data<br />

Test Item Filename Version<br />

EN61000-3-2 IEC1000.EXE 1.0F<br />

EN61000-3-3 IEC1000.EXE 1.0F<br />

EN61000-4-3 Tile.Exe<br />

EN61000-4-6 Application<br />

2.0.P<br />

EN61000-4-6<br />

Software 1.13.e<br />

EN61000-4-2 N/A 2.0<br />

EN61000-4-4 N/A 2.0<br />

EN61000-4-5 Tracs.Exe 2.0<br />

EN61000-4-8 N/A<br />

EN61000-4-11 N/A


13. Photographs<br />

13.1 Photos of ESD me<strong>as</strong>urement<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-22-<br />

13.2 Photos of RF Field Strength Sus<strong>ce</strong>ptibility Me<strong>as</strong>urement<br />

.


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-23-<br />

13.3 Photos of Electrical F<strong>as</strong>t Transient/Burst me<strong>as</strong>urement<br />

13.4 Photos of Surge me<strong>as</strong>urement


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-24-<br />

13.5 Photo of Conductive Me<strong>as</strong>urement<br />

13.6 Photo of Magnetic field me<strong>as</strong>urement


International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-25-<br />

13.7 Photos of Voltage Dips me<strong>as</strong>urement<br />

13.8 Photos of Harmonics and Voltage Fluctuations


13.9 Appendix: Photographs of EUT<br />

International Standards Laboratory Report Number: ISL-05HE014E<br />

HC LAB:NVLAP:200234-0;VCCI: R-341,C-354;NEMKO:ELA 113a,113c;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178<br />

LT LAB:NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113b,113d;BSMI:SL2-IN-E-0013;CNLA:0997<br />

-26-<br />

Ple<strong>as</strong>e find this appendix in the File of ISL-05HE014P

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