Unit Testing Integration Testing ISO 26262
Unit Testing Integration Testing ISO 26262
Unit Testing Integration Testing ISO 26262
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Infineon Quarterly Technical Workshop<br />
How to perform the<br />
<strong>Unit</strong> <strong>Testing</strong><br />
and<br />
<strong>Integration</strong> <strong>Testing</strong><br />
required by<br />
<strong>ISO</strong> <strong>26262</strong><br />
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<strong>26262</strong> V-Model of System Engineering<br />
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<strong>26262</strong> V-Model of SW Engineering<br />
3
<strong>ISO</strong> <strong>26262</strong> Requirements<br />
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<strong>ISO</strong> <strong>26262</strong> Requirements<br />
The Classification Tree Method (tool included in Tessy) supports<br />
1a, 1b, 1c and even 1d.<br />
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<strong>26262</strong> V-Model of System Engineering<br />
Tessy<br />
Tessy<br />
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So What isTessy ?<br />
• Tessy Provide Module tests and <strong>Integration</strong> tests<br />
according to below standards:<br />
• Test coverage<br />
– IEC 61508 (<strong>ISO</strong> <strong>26262</strong>), all SIL levels<br />
– DO178B, all levels<br />
– Automotive SPiCE (2005)<br />
• Branch coverage<br />
• MCC, MC/DC coverage<br />
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Tessy supports All relevant<br />
• Microcontroller Architectures<br />
• Cross-compiler for embedded systems<br />
• Simulators<br />
• OCDS/JTAG/BDM<br />
• In-circuit emulators<br />
Func1<br />
Testcase1<br />
Compiler<br />
Tessy / CTE<br />
Func1<br />
Testcase2<br />
Func1<br />
Testcase3<br />
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Test Planning-Classification Tree Editor (CTE)<br />
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Various <strong>Testing</strong> Report<br />
• Excerpt from test reports<br />
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Coverage Result Viewer<br />
12
Traceability Requirements/Test cases<br />
13
Traceability Requirements/Test cases<br />
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Live Demo<br />
2013 年 1 月 10 日<br />
15
Q & A<br />
???<br />
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For Complex System – IBM Rational<br />
f(x)<br />
f(x)<br />
Software<br />
<strong>Unit</strong><br />
<strong>Testing</strong><br />
h(x)<br />
g(x)<br />
k(x)<br />
Software<br />
<strong>Integration</strong><br />
<strong>Testing</strong><br />
ECU / HIL*<br />
<strong>Integration</strong><br />
<strong>Testing</strong><br />
Sub-system<br />
<strong>Integration</strong><br />
<strong>Testing</strong><br />
System<br />
<strong>Testing</strong><br />
Test Management<br />
Manual <strong>Testing</strong><br />
Rational Quality Manager<br />
Automated <strong>Testing</strong><br />
Runtime Analysis<br />
Rational Test RealTime<br />
Model-driven <strong>Testing</strong><br />
Rhapsody TestConductor<br />
(*) ECU: Electronic Control <strong>Unit</strong><br />
HIL: Hardware-In-the-loop<br />
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Collabration, Automation, All lifecycle<br />
• Software <strong>Unit</strong> & <strong>Integration</strong> <strong>Testing</strong><br />
• Electronic Control <strong>Unit</strong> (ECU) /<br />
Hardware in the Loop (HIL)<br />
Validation<br />
• Code coverage including MC/DC<br />
• Memory Profiling<br />
• Performance Profiling<br />
• Runtime Tracing<br />
• Static Code Analysis (MISRA-C)<br />
• Tests run on any embedded<br />
environments<br />
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More about<br />
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Details needed? Contact us please<br />
• Flash Technology Trading (Shanghai) Limited<br />
上 海 市 长 宁 区 天 山 路 600 弄 1 号 同 达 创 业 大 厦 405<br />
Tel: 8621-61457130 Fax: 8621-61457131<br />
Email : sales@flashtech.com.cn (sales)<br />
support@flashtech.com.cn (support)<br />
• Flash Technology (HK) Limited<br />
香 港 九 龙 长 沙 湾 长 沙 湾 道 928-930 时 代 中 心 13 搂 02 室<br />
Tel : 852-23109662 Fax: 852-28157209<br />
Email: sales@flashtech.com.cn (sales)<br />
support@flashtech.com.cn (support)<br />
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Or Please visit our website<br />
•http://www.flashtech.com.cn<br />
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