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Optical Navigation Division<br />
<strong>Biasing</strong> <strong>Bipolar</strong> Junction Transistors<br />
Al Ward<br />
W5LUA<br />
January 31, 2007
Wireless Semiconductor Division<br />
Various BJT <strong>Biasing</strong> Networks<br />
V BB<br />
V CC<br />
R B R C<br />
R B<br />
R C<br />
V CC<br />
R B1 R C<br />
V CC<br />
1<br />
R B2<br />
R B<br />
2 3<br />
R B1<br />
R C<br />
V CC<br />
4 5<br />
R B2<br />
Page 2
Wireless Semiconductor Division<br />
AT-41486<br />
Page 3
Wireless Semiconductor Division<br />
<strong>Bipolar</strong> Transistor Bias Network Analysis<br />
R B1<br />
R C<br />
I BB<br />
+I B<br />
R B<br />
B<br />
C<br />
V CE<br />
I C<br />
+I BB<br />
+I B<br />
I BB<br />
B<br />
V BE<br />
I B<br />
h ie<br />
R B1<br />
I BB<br />
+ I B<br />
I C<br />
C<br />
V CE<br />
R B2<br />
I B<br />
E<br />
h FE<br />
I B<br />
I CBO<br />
(1+h FE<br />
)<br />
V’ BE<br />
R B2<br />
I BB<br />
V BE<br />
B. The equivalent circuit of figure A used in DC stability analysis.<br />
R C<br />
V CC<br />
A. Bias circuit showing only the DC components.<br />
I C = h FE I B + I CBO (1+h FE )<br />
- where h FE is the DC current gain of the transistor and I CBO is the current flowing through a reverse biased PN junction.<br />
E<br />
V BE = V BE + I B h ie<br />
- where V BE is internal to the transistor and h ie is the equivalent Hybrid input resistance of the transistor and is equal<br />
- to h FE / (Ic) where =40 @ +25 degrees C. h ie is generally much smaller than Rb<br />
Page 4
Wireless Semiconductor Division<br />
Temperature Sensitive Parameters<br />
R B1<br />
I BB<br />
+ I B<br />
I C<br />
C<br />
B<br />
I B<br />
h ie<br />
I BB<br />
V BE<br />
V CE<br />
R C<br />
h FE<br />
I B<br />
I CBO<br />
(1+h FE<br />
)<br />
V’ BE<br />
R B2<br />
V CC<br />
E<br />
The equivalent circuit of the voltage feedback and constant base current source bias<br />
network used in DC stability analysis.<br />
V’ BE , h FE , I CBO<br />
V’ BE has a typical negative temperature coefficient of -2mV/°C.<br />
h FE typically increases with temperature at the rate of 0.5%/°C.<br />
I CBO typically doubles for every 10°C temperature rise.<br />
Page 5
Wireless Semiconductor Division<br />
Non-Stabilized Bias Network #1<br />
V CC = V BB = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
R B<br />
V CC V BE<br />
I B<br />
R C<br />
V CC V CE<br />
I C<br />
V BB<br />
R B<br />
V CC<br />
R C<br />
R B = 30770 ohms<br />
R C = 140 ohms<br />
Page 6
Wireless Semiconductor Division<br />
Non-Stabilized Bias Network #1<br />
V CC = V BB = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
V BB<br />
V CC<br />
h . FE<br />
V CC<br />
V BE<br />
I C<br />
I . CBO<br />
1 h FE<br />
h ie<br />
R B<br />
R B<br />
R C<br />
Based on h FE alone<br />
I C max = 9.27 mA<br />
I C min = 3.14 mA<br />
Page 7
Wireless Semiconductor Division<br />
Voltage Feedback Bias Network #2<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
V CE V BE<br />
V CC V CE<br />
R B R C<br />
I B I C<br />
I B<br />
R B<br />
R C<br />
V CC<br />
R B = 19552 ohms<br />
R C = 138 ohms<br />
Page 8
Wireless Semiconductor Division<br />
Voltage Feedback Bias Network #2<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
h . FE V CC V BE I . .<br />
CBO 1 h FE h ie R B R C<br />
I C<br />
h ie R . B R C 1 h FE<br />
R B<br />
R C<br />
V CC<br />
Based on h FE alone<br />
I C max = 7.09 mA<br />
I C min = 3.63 mA<br />
Page 9
Wireless Semiconductor Division<br />
Voltage Feedback and Constant Base Current<br />
Source Bias Network #3<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80 typ, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
R B1 R C<br />
V CC<br />
Choose V RB2 , in which V CE > V RB2 > V BE . Suggest a V RB2 of 1.5V<br />
Suggest a voltage divider current of .5mA.<br />
V CC V CE<br />
V RB2<br />
V BE<br />
R C R B<br />
I C I B2 I B<br />
I B<br />
V CE V RB2<br />
V RB2<br />
R B1 R<br />
I B2<br />
B2 I B I B2<br />
R B2<br />
R B<br />
R C = 126 ohms<br />
R B = 11,539 ohms<br />
R B1 = 889 ohms<br />
R B2 = 3000 ohms<br />
Page 10
Wireless Semiconductor Division<br />
Voltage Feedback and Constant Base Current<br />
Source Bias Network #3<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80 typ, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
V . BE R B1 R B2 R C R . B2 R . . C I CBO 1 h FE V CC<br />
I .<br />
C<br />
h<br />
R . B<br />
h ie<br />
R B1<br />
R B2<br />
R . C<br />
R . B2<br />
h FE<br />
R C<br />
R C<br />
R FE<br />
I . CBO<br />
1 h FE<br />
B1<br />
R B1 R C<br />
V CC<br />
Based on h FE alone<br />
I C max = 6.98 mA<br />
I C min = 3.66 mA<br />
R B2<br />
R B<br />
Page 11
Wireless Semiconductor Division<br />
Voltage Feedback Bias Network #4<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80 typ, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
Choose I B2<br />
, suggest a voltage divider current of .5mA, to calculate R B2<br />
.<br />
R B2<br />
V BE<br />
I B2<br />
V CC V CE<br />
R C<br />
I C I B I B2<br />
I B I B2<br />
V CE I . B2 R B2<br />
R B1<br />
R C = 126 ohms<br />
R B1 = 2169 ohms<br />
R B2 = 1560 ohms<br />
Page 12
Wireless Semiconductor Division<br />
Voltage Feedback Bias Network #4<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80 typ, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
R C<br />
R<br />
. I . C<br />
R<br />
CBO R C I .<br />
C<br />
R<br />
CBO V . . C<br />
R<br />
BE<br />
h FE R<br />
.<br />
h ie I . . B1<br />
R<br />
CBO h ie I .<br />
CBO I . B1<br />
R<br />
CBO R B1 I .<br />
B1<br />
R<br />
CBO V . . B1<br />
BE<br />
B2 R B2 h FE R B2 h FE R<br />
.<br />
h ie I . .<br />
1<br />
CBO h ie I CBO V . BE h . ie I CBO h . ie I CBO<br />
B2 R B2 h FE R B2 h FE<br />
I C<br />
R C<br />
R C<br />
R C<br />
R<br />
. B1<br />
R B1<br />
h . 1<br />
h . ie h .<br />
FE R B2 h FE h . ie h ie<br />
FE R B2 h FE h FE<br />
V CC<br />
Based on h FE alone<br />
I C max = 5.44 mA<br />
I C min = 4.53 mA<br />
Page 13
Wireless Semiconductor Division<br />
Emitter Feedback Bias Network #5<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80 typ, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
R E<br />
V CC V CE<br />
I C<br />
. I CBO<br />
1 h FE<br />
h FE<br />
I C<br />
V CC I . B2 R 2<br />
R 1<br />
I B2 I B<br />
Pick Ib2 of 10% of Ic which is equal to .0005<br />
R 2<br />
V RB2<br />
I B2<br />
V RB2 V BE<br />
. I B I C R E<br />
R E = 138 ohms<br />
R B1 = 2169 ohms<br />
R B2 = 2960 ohms<br />
Page 14
Wireless Semiconductor Division<br />
Emitter Feedback Bias Network #5<br />
V CC = 2.7V, V CE = 2V, I C = 5 mA, h FE = 80 typ, 50 min, 150 max<br />
V BE = 0.78 V, I CBO = 1x10 -7 A @ +25 deg C<br />
1<br />
R<br />
V<br />
. .<br />
BE h ie I<br />
. E<br />
R<br />
CBO h ie I<br />
.<br />
CBO I<br />
. 1<br />
R<br />
CBO R E I<br />
.<br />
1<br />
R<br />
CBO V<br />
. . 1.<br />
R<br />
BE h<br />
h FE<br />
h FE<br />
R . ie I<br />
. 1.<br />
R E<br />
R<br />
CBO h ie I<br />
. 1.<br />
R<br />
CBO I<br />
. 1<br />
CBO R E I<br />
.<br />
CBO I CBO R<br />
. 1 I CBO<br />
2<br />
R 2<br />
h FE<br />
R 2<br />
R 2<br />
h FE<br />
R 2<br />
h FE<br />
I C<br />
1<br />
R<br />
. E<br />
R 1<br />
R<br />
h ie<br />
R . 1<br />
R<br />
E<br />
h . E<br />
R 1<br />
R<br />
. 1<br />
h FE<br />
h . ie<br />
R E<br />
FE<br />
R 2<br />
h FE<br />
R 2<br />
h FE<br />
R 2<br />
h FE<br />
V CC<br />
Based on h FE alone<br />
I C max = 5.27 mA<br />
I C min = 4.70 mA<br />
Page 15
Wireless Semiconductor Division<br />
Summary of I C Variation vs h FE For All Bias Circuits<br />
V BB V CC<br />
R<br />
R B<br />
R B1<br />
R C<br />
C V<br />
V CC<br />
R B1<br />
R C<br />
V<br />
R CC CC<br />
B<br />
R<br />
B<br />
R B2<br />
R B2<br />
Bias Circuit<br />
Nonstabilized<br />
Bias<br />
Network<br />
Voltage<br />
Feedback Bias<br />
Network<br />
Feedback<br />
Voltage<br />
Feedback<br />
w/Current<br />
Source Bias<br />
Network<br />
Voltage<br />
Feedback<br />
w/Voltage<br />
Source Bias<br />
Network<br />
Ic(mA) @ 3.14 3.63 3.66 4.53 4.70<br />
minimum h FE<br />
Ic(mA) @ typical 5.0 5.0 5.0 5.0 5.0<br />
h FE<br />
Ic(mA) @<br />
maximum h FE<br />
9.27 7.09 6.98 5.44 5.27<br />
Percentage change<br />
in Ic from<br />
nominal Ic<br />
+85%<br />
-37%<br />
+42%<br />
-27%<br />
+40%<br />
-27%<br />
+9%<br />
-9%<br />
Emitter<br />
Feedback Bias<br />
Network<br />
+5.4%<br />
-6%<br />
Bias circuit #5 offers best control on h FE<br />
variation but requires emitter resistor<br />
Bias circuit #4 offer best control on h FE<br />
variation without the use of an emitter resistor<br />
Bias circuits #2 and #3 are very similar in performance.<br />
Page 16
Wireless Semiconductor Division<br />
Use of Stability Factors<br />
I CBO = I C First Calculate the stability<br />
I CBO h FE, V’ BE = constant factors for V’ BE , I CBO , and h FE.<br />
Then, to find the change in<br />
V’ BE = I C collector current at any temperature,<br />
V’ BE I CBO, h FE = constant multiply the change from 25C of<br />
each temperature dependent variable<br />
h FE = I C with its corresponding stability<br />
h FE I CBO , V’ BE = constant factor and sum.<br />
I C = SI CBO I CBO + SV’ BE V’ BE +<br />
Sh FE h FE<br />
Page 17
Wireless Semiconductor Division<br />
Calculating I CBO , V BE , and h FE<br />
Example: Calculate deltas from +25 o C to +65 o C<br />
I CBO is typically 100nA @+25 o C and typically doubles for every 10°C<br />
temperature rise. Therefore I CBO<br />
= 1600nA @ +65 o C. I CBO<br />
= 1600 - 100<br />
= 1500 nA<br />
V BE<br />
measured at .755V@ 25 o C and has a typical negative temperature<br />
coefficient of -2mV/°C. Therefore V BE<br />
will be .675V @ +65 o C making<br />
V BE<br />
equal to .675 - .755 = -.08V<br />
h FE is 80 @ +25 o C and typically increases 0.5%/ o C. Therefore h FE<br />
will increase from 80 to 96 @ +65 o C making h FE<br />
equal to 96<br />
-80 = 16<br />
Page 18
Wireless Semiconductor Division<br />
Bias Stability Analysis @ +65 o C using HBFP-04XX<br />
V BB V CC<br />
R B<br />
R C<br />
V R<br />
R CC B1 R C<br />
V B CC<br />
R B1<br />
R C<br />
V CC<br />
R<br />
B<br />
R B2<br />
R B2<br />
Bias Circuits<br />
#1 non-stabilized<br />
#2 volt feedback<br />
#3 volt feedback w/current source<br />
#4 voltage feedback<br />
#5 emitter feedback<br />
Page 19<br />
Bias Circuit<br />
#1 Non-<br />
Stabilized<br />
#2 Voltage<br />
Feedback<br />
#3 Voltage<br />
Feedback<br />
w/Current Source<br />
#4 Voltage<br />
Feedback<br />
#5 Emitter Feedback<br />
I CBO Stability Factor 81 52.238 50.865 19.929 11.286<br />
V’ BE Stability Factor -2.56653x 10 -3 -2.568011x10 -3 -3.956x10 -3 -0.015 -6.224378x10 -3<br />
h FE Stability Factor 6.249877x10 -5 4.031x10 -5 3.924702x10 -5 1.537669x 8.707988x10 -6<br />
10 -5<br />
I C due to I CBO (mA) 0.120 0.078 0.076 0.030 0.017<br />
I C due to V’ BE (mA) 0.210 0.205 0.316 1.200 0.497<br />
I C due to h FE (mA) 0.999 0.645 0.628 0.246 0.140<br />
Total I C (mA) 1.329 0.928 1.020 1.476 0.654<br />
Percentage change in<br />
Ic from nominal Ic<br />
26.6% 18.6% 20.4% 29.5% 13.1%<br />
Bias circuits #2 and #3 similar in<br />
performance at temp and superior<br />
to #1 and #4<br />
Bias circuit #5 is superior but requires<br />
emitter resistor and emitter bypass
Wireless Semiconductor Division<br />
Calculating I CBO , V BE , and h FE<br />
Example: Calculate deltas from +25 o C to +85 o C<br />
I CBO is typically 200nA @+25 o C and typically doubles for every 10°C<br />
temperature rise. Therefore I CBO<br />
= 12800nA @ +85 o C. I CBO<br />
=12800 - 200<br />
= 12600 nA= 12.6 uA<br />
V BE<br />
measured at .755V@ 25 o C and has a typical negative temperature<br />
coefficient of -2mV/°C. Therefore V BE<br />
will be .635V @ +85 o C making<br />
V BE<br />
equal to .635 - .755 = -.120V<br />
h FE is 150 @ +25 o C and typically increases 0.5%/ o C. Therefore h FE<br />
will increase from 150 to 195 @ +85 o C making h FE<br />
equal to 195<br />
- 150 = 45<br />
Page 20
Wireless Semiconductor Division<br />
Bias Stability Analysis @ +85 o C using HBFP-04XX<br />
V BB V CC<br />
R B<br />
R B<br />
R C<br />
VCC<br />
R B1<br />
R C<br />
V CC<br />
R B1<br />
R C<br />
V CC<br />
R<br />
B<br />
R B2<br />
R B2<br />
Bias Circuit #1 #2 #3 #4 #5<br />
I CBO Stability Factor 81 52.238 50.865 19.929 11.286<br />
V’ BE Stability Factor -2.56653x 10 -3 -2.568011x10 -3 -3.956x10 -3 -0.015 -6.224378x10 -3<br />
h FE Stability Factor 6.249877x10 -5 4.031x10 -5 3.924702x10 -5 1.537669x10 -5 8.707988x10 -6<br />
I C due to I CBO (mA) 1.021 0.658 0.641 0.251 0.142<br />
I C due to V’ BE (mA) 0.308 0.308 0.475 1.800 0.747<br />
I C due to h FE (mA) 2.812 1.814 1.766 0.692 0.392<br />
Total I C (mA) 4.141 2.780 2.882 2.743 1.281<br />
Bias Circuits<br />
#1 non-stabilized<br />
#2 volt feedback<br />
#3 volt feedback w/current source<br />
#4 voltage feedback<br />
#5 emitter feedback<br />
Bias circuits #2, #3 and #4 similar in<br />
performance at temp and superior<br />
to #1<br />
Bias circuit #5 is superior but requires<br />
emitter resistor and emitter bypass<br />
I CBO and h FE variations are major<br />
contributors at elevated temperature<br />
Page 21
Wireless Semiconductor Division<br />
Avago Technologies AppCAD<br />
Page 22
Wireless Semiconductor Division<br />
Percent Change in Quiescent Collector Current<br />
versus h FE for the HBFP-0405<br />
Percent Deviation From A<br />
Quiescent Collector Current<br />
100.00%<br />
80.00%<br />
60.00%<br />
40.00%<br />
20.00%<br />
0.00%<br />
-20.00%<br />
-40.00%<br />
50 70 90 110 130 150<br />
Nob-stabilized<br />
Voltage Feedback<br />
Voltage Feedback<br />
w/Current Source<br />
Voltage Feedback<br />
w/Voltage Source<br />
Emitter Feedback<br />
V CC =2.7V<br />
V CE =2V<br />
I C =5 mA<br />
T J =+25 o C<br />
h FE<br />
Page 23
Wireless Semiconductor Division<br />
Percent Change in Quiescent Collector Current<br />
versus Temperature for the HBFP-0405<br />
Percent Change From A<br />
Quiescent Collector Current<br />
30.00%<br />
20.00%<br />
10.00%<br />
0.00%<br />
-10.00%<br />
-20.00%<br />
-30.00%<br />
-40.00%<br />
-25 -15 -5 5 15 25 35 45 55 65<br />
Non-stabilized<br />
Voltage Feedback<br />
Voltage Feedback<br />
w/Current Source<br />
Voltage Feedback<br />
w/Voltage Source<br />
Emitter Feedback<br />
V CC =2.7V<br />
V CE =2V<br />
I C =5 mA<br />
Temperature ( o C)<br />
Page 24
Wireless Semiconductor Division<br />
Percent Change in Quiescent Collector Current versus<br />
Ratio of I C to I RB1 for Max. h FE and +65 o C for the HBFP-<br />
0405<br />
Maximum h FE and +65 o C<br />
Percentage Change from Ic<br />
(+)<br />
140%<br />
120%<br />
100%<br />
80%<br />
60%<br />
40%<br />
20%<br />
0%<br />
1 10 100<br />
Non-stabilized<br />
Voltage Feedback<br />
Voltage Feedback<br />
w/Current Source<br />
Voltage Feedback<br />
w/Voltage Source<br />
Emitter Feedback<br />
V CC =2.7V<br />
V CE =2V<br />
I C =5 mA<br />
Ratio of Ic to IRB1<br />
Page 25
Wireless Semiconductor Division<br />
Percent Change in Quiescent Collector Current versus<br />
Ratio of I C to I RB1 for Min. h FE and -25 o C for the HBFP-0405<br />
Minimum h FE and -25 o C<br />
Percentage Change fromIC (-<br />
)<br />
140.00%<br />
120.00%<br />
100.00%<br />
80.00%<br />
60.00%<br />
40.00%<br />
20.00%<br />
0.00%<br />
Non-stabilized<br />
Voltage Feedback<br />
Voltage Feedback<br />
w/Current Source<br />
Voltage Feedback<br />
w/Voltage Source<br />
Emitter Feedback<br />
V CC =2.7V<br />
V CE =2V<br />
I C =5 mA<br />
1 10 100<br />
Ratio of Ic to IRB1<br />
Page 26
Wireless Semiconductor Division<br />
Conclusions<br />
Emitter feedback in circuit #5 offers the best control on h FE variations<br />
from device to device and over temperature. However, an emitter<br />
bypass capacitor is needed to provide a good <strong>RF</strong> short. The inductance<br />
associated with the bypass capacitor quite often causes circuit<br />
instabilities with high f t transistors.<br />
Best alternative is circuit #4 followed by circuit #2. Circuit #4 offers best<br />
control on h FE variation from device to device and circuit #2 provides<br />
best performance up to +65 degrees C. At +85 degrees C, circuit #4<br />
performs as well as circuit #2.<br />
Page 27
Wireless Semiconductor Division<br />
Additional Thoughts<br />
Higher Vcc can improve the performance of all bias circuits<br />
Additional base bias resistor current can often improve bias regulation<br />
An increase in the value of the emitter resistor for circuit #5 will offer<br />
increased bias circuit regulation.<br />
Active bias network offers best regulation but requires additional<br />
components.<br />
Page 28
Wireless Semiconductor Division<br />
Related Application Notes and Articles<br />
AN 1084 Two-Stage 800 – 1000 MHz Amplifier using the AT-41511<br />
Silicon <strong>Bipolar</strong> Transistor – 5964-3853E (11/99)<br />
AN 1085 900 and 2400 MHz Amplifiers using the AT-3 Series Low Noise<br />
Silicon <strong>Bipolar</strong> Transistors – 5964-3854E (11/99)<br />
AN 1131 Low Noise Amplifiers for 320 MHz and 850 MHz Using the AT-<br />
32063 Dual Transistor – 5966-0781E (11/99)<br />
AN 1293 A Comparison of Various <strong>Bipolar</strong> Transistor <strong>Biasing</strong> Circuits –<br />
5988-6173EN June 27, 2006<br />
AN S014 750 – 1250 MHz Voltage Controlled Oscillators – 5988-0273EN<br />
(9/00)<br />
A Comparison of Various <strong>Bipolar</strong> Transistor <strong>Biasing</strong> Circuits by Al<br />
Ward (W5LUA) and Bryan Ward (N5QGH), Agilent Technologies,<br />
Applied Microwave & Wireless, April 2001, pages 30-44<br />
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