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CE 7000 Series.pdf

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FULL REFEREN<strong>CE</strong> BEAM SPA<strong>CE</strong><br />

DISPLAY SCROLLING OF SCANS<br />

CHOI<strong>CE</strong><br />

Curve and Line<br />

OF<br />

Fitting<br />

OPTICAL BANDWIDTH<br />

A straight line, quadratic or cubic curve may automatically be fitted to a<br />

set of up to 30 standards. Fits may be made with an intercept or forced<br />

SUPERB through zero. Replicate VERSATILITY<br />

standards may be used for any given<br />

concentration. All entries are prompted for simplicity of operation. A<br />

quadratic curve fit is shown here.<br />

ACCURACY : FLEXIBILITY : FAST-OPERATION<br />

Editing Suspect Standards and Curve Storage<br />

FULL VALIDATION PRO<strong>CE</strong>DURES<br />

Suspect<br />

standards<br />

may be observed<br />

by inspection of the<br />

screen display and<br />

WIDEST AC<strong>CE</strong>SSORY RANGE<br />

either deleted or<br />

substituted by a<br />

replicate standard.<br />

STANDARD SOFTWARE<br />

Wavelength Scan<br />

Peak and Valley Tabulation<br />

Derivatives 1st-4th<br />

Up to 30 curves<br />

may be stored in<br />

integral memory,<br />

security code<br />

protected for future<br />

use.<br />

Time/Rate Plot<br />

Dynamic Scan Recall<br />

Auto Sequential Scans<br />

Derivative Spectra<br />

Derivative spectroscopy is a powerful technique for revealing hidden<br />

information or enhancing fine detail in a spectral scan. Bands masked<br />

by other overlapping bands or distorted by a sloping background may<br />

be accurately located for quantification.<br />

Derivative plots may be displayed on their own or superimposed on a<br />

wavelength scan, with or without an offset. The degree of smoothing<br />

used is operator entered and ranging is normally selected to be<br />

automatic.<br />

Scan Storage<br />

Scan Overlay<br />

Scan Reprocessing<br />

Method Storage<br />

Curve/Line Fit<br />

Curve Storage<br />

Editing of Standards<br />

Absorbance Ratio<br />

Absorbance Difference<br />

Self Test and Calibration<br />

Measurements in A, C, %T<br />

5

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