Yelo Product Catalogue 2015

YELO Laser Diode Systems PRODUCTS AND SERVICES
Y1000L
SPECIFICATION
SYSTEM CAPABILITY
Capacity
Y1000L
Low Power Laser
Diode Reliability
Burn-In and
Life-Test System
Easily test the reliability of your low
power laser devices with the Y1000L
burn-in and life-test system. It will
quickly identify defective devices so
you can prevent them reaching your
customers. Y1000L’s full automation
and expandable capacity helps
you work through your tests more
productively. And its user-friendly
software makes testing your laser
devices easier than ever.
Used for burn-in,
life-test and vendor
qualification
Custom built to
your specification
with NIST standard
instruments
Ideal for testing
low power devices
up to 1A
Capable of burn-in
for QFSP, SFP+ and
10G, 40G and 100G
networks
Distinctive
and spacesaving
design
Identify and screen
out defective
devices with ease
Fully expandable
to test up to 2,048
devices
System capacity
Temperature control
Control type
Starting from 16 devices up to 2,048 devices in 2 racks
PID Control
Temperature range 25 to 150ºC
Multiple temperature control
Temperature accuracy +/- 1ºC
General
Dimensions (LxDxH)
UPS
Maximum current for device
Laser control options
Control modes
Device types supported
Device types and packages
PRODUCTIVITY AT ITS BEST
Your devices are placed into mini oven
modules, customized for your device.
This allows you to test up to 2,048
devices and monitor and control each
individual module’s test parameters,
test duration, temperature, current
and optical measurements. You can
run your devices under test (DUT)
for over 10,000 continuous hours with
our proven laser drive cards.
SO MUCH, YET SO LESS
Y1000L is 27.5% smaller than
standard industrial ovens. So you
can test as many devices as
possible, and take up less valuable
clean room space.
Each module independent
80cm x 80cm x 195cm
Optional
1A
ACC, APC and LIV
TO-can
Butterfly
Transmitter optical sub assembly (TOSA)
Dual in-line/Mini Dual in-line (DiL/MiniDiL)
Chip on carrier
Bare chip
Custom packages
RELIABILT 2015 BURN-IN SOFTWARE
A clear user interface displays the
status of your device under test
(DUT). Easily graph all your test
data including LIV sweep analysis
and spot measurements. Get test
notifications via email and set
conditions for each test to decide
pass/fail parameters.
GIVING YOU THE INFORMATION
YOU NEED
Receive valuable test data for your
devices including infant mortality
failure rates, random wear out failure
rates and usage wear out rates.
Burn-in for 100G, QFSP and SFP+
Photodiodes and Avalanche Photodiodes
LASER DEVICE PROTECTION
Proven spike free laser drive cards
and module circuitry will protect your
devices from spikes and electrical
overstress (EOS).
FASTER THROUGHPUT
Using GPIB controlled instruments,
measurements are performed in less
time saving hours of test cycle time.
04 www.yelo.co.uk email: sales@yelo.co.uk tel: +44 (0)28 9335 7300 05