Patrick Phillips - Nanoscale Physics Group - University of Illinois at ...
Patrick Phillips - Nanoscale Physics Group - University of Illinois at ...
Patrick Phillips - Nanoscale Physics Group - University of Illinois at ...
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<strong>P<strong>at</strong>rick</strong> J <strong>Phillips</strong><br />
Department <strong>of</strong> <strong>Physics</strong><br />
<strong>University</strong> <strong>of</strong> <strong>Illinois</strong> <strong>at</strong> Chicago<br />
845 W Taylor Street<br />
Chicago, IL 60657<br />
Citizenship: United St<strong>at</strong>es<br />
Educ<strong>at</strong>ion<br />
Office: 312.413.3960<br />
Cell: 262.391.5670<br />
Email: pjphil@uic.edu<br />
Ph.D. M<strong>at</strong>erials Science & Engineering, Ohio St<strong>at</strong>e <strong>University</strong>, 2012.<br />
M.S. M<strong>at</strong>erials Science & Engineering, Ohio St<strong>at</strong>e <strong>University</strong>, 2009.<br />
B.S. <strong>Physics</strong>, St. Norbert College, 2007.<br />
Minors: M<strong>at</strong>hem<strong>at</strong>ics and Chemistry.<br />
Honors: Magna Cum Laude.<br />
Research Experience<br />
Research Assistant Pr<strong>of</strong>essor, <strong>Nanoscale</strong> <strong>Physics</strong> <strong>Group</strong>, <strong>University</strong> <strong>of</strong> <strong>Illinois</strong> <strong>at</strong> Chicago, February<br />
2012 - present.<br />
Gradu<strong>at</strong>e Research Associ<strong>at</strong>e, Michael J Mills, Ohio St<strong>at</strong>e <strong>University</strong>, September 2007 - February 2012.<br />
Research Experience for Undergradu<strong>at</strong>es (REU), Bruce Wessels, M<strong>at</strong>erials Science & Engineering,<br />
Northwestern <strong>University</strong>, Summer 2005.<br />
Continuing Academic Experience<br />
Guest lecture on STEM-based diffraction contrast imaging in MSE 855: Advanced Electron Diffraction,<br />
Ohio St<strong>at</strong>e <strong>University</strong>, November 2011.<br />
Third Intern<strong>at</strong>ional Workshop on Remote Electron Microscopy and In Situ Studies, Carnegie Mellon<br />
<strong>University</strong>, June 2011.<br />
2010 Winter School on High Resolution Microscopy <strong>at</strong> Arizona St<strong>at</strong>e <strong>University</strong>, January 2010.<br />
<strong>Physics</strong> Teaching Assistant, Michael Olson, St. Norbert College, Fall 2004 - Spring 2007.<br />
Public<strong>at</strong>ions<br />
PJ <strong>Phillips</strong>, MJ Mills, Fine-scale structure <strong>of</strong> disloc<strong>at</strong>ions and debris in f<strong>at</strong>igued Ni-based superalloys,<br />
submitted to Phil. Mag.<br />
PJ <strong>Phillips</strong>, D McAllister, Y Gao, D Lv, REA WIlliams, Y Wang, MJ Mills, High-resolution characteriz<strong>at</strong>ion<br />
and phase field modeling <strong>of</strong> IN718 precipit<strong>at</strong>es, accepted to Appl. Phys. Lett.<br />
PJ <strong>Phillips</strong>, RR Unocic, MJ Mills, Low cycle f<strong>at</strong>igue <strong>of</strong> a polycrystalline Ni-based superalloy: deform<strong>at</strong>ion<br />
substructure analysis, submitted to special issue <strong>of</strong> Int. J. F<strong>at</strong>igue.
<strong>P<strong>at</strong>rick</strong> J <strong>Phillips</strong> 2<br />
HZ Deutchman, PJ <strong>Phillips</strong>, N Zhou, MK Samal, S Ghosh, Y Wang, and MJ Mills, Deform<strong>at</strong>ion mechanisms<br />
coupled with phase field and crystal plasticity modeling in a high-temper<strong>at</strong>ure polycrystalline<br />
Ni-based superalloy, Superalloys (2012).<br />
SD Carnevale, C Marginean, PJ <strong>Phillips</strong>, TF Kent, ATMG Sarwar, MJ Mills, RC Myers, Coaxial nanowire<br />
resonant tunneling diodes from non-polar AlN/GaN on silicon, Appl. Phys. Lett. 100 (2012) 142115.<br />
F Yang, L Kovarik, PJ <strong>Phillips</strong>, RD Noebe, MJ Mills, Characteriz<strong>at</strong>ions <strong>of</strong> Precipit<strong>at</strong>e Phases in a Ti-Ni-<br />
Pd Alloy, Scripta M<strong>at</strong>er. (2012).<br />
PJ <strong>Phillips</strong>, M De Graef, L Kovarik, A Agrawal, W Windl, MJ Mills, Atomic-resolution defect contrast<br />
in low angle annular dark-field STEM, Ultramicroscopy 116 (2012) 47-55.<br />
SD Carnevale, TF Kent, PJ <strong>Phillips</strong>, MJ Mills, S Rajan, RC Myers, Polariz<strong>at</strong>ion-induced pn-junctions in<br />
wide band gap semiconductor nanowires with ultraviolet electroluminescence, Nano Lett. (2012) DOI:<br />
10.1021/nl203982.<br />
Yi-Yun Li, L Kovarik, PJ <strong>Phillips</strong>, Yung-Fu Hsu, Wen-Hsiung Wang, MJ Mills, High resolution characteriz<strong>at</strong>ion<br />
<strong>of</strong> the precipit<strong>at</strong>ion behavior <strong>of</strong> an Al-Zn-Mg-Cu alloy, Phil. Mag. Letters (2012) DOI:<br />
10.1080/09500839.2011.652682.<br />
PJ <strong>Phillips</strong>, MC Brandes, MJ Mills, M De Graef, Diffraction contrast STEM <strong>of</strong> disloc<strong>at</strong>ions: imaging<br />
and simul<strong>at</strong>ions, Ultramicroscopy 111 (9-10) (2011) 1483-1487.<br />
PJ <strong>Phillips</strong>, MJ Mills, M De Graef, System<strong>at</strong>ic row and zone axis STEM defect image simul<strong>at</strong>ions, Phil.<br />
Mag. 91 (16) (2011) 2081-2101.<br />
SD Carnevale, J Yang, PJ <strong>Phillips</strong>, MJ Mills, RC Myers, Three-dimensional GaN/AlN nanowire heterostructures<br />
by separ<strong>at</strong>ing nucle<strong>at</strong>ion and growth processes, Nano Lett. 11 (2) (2011) 866-871.<br />
PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, D Wei, D Mourer, MJ Mills, Low cycle f<strong>at</strong>igue <strong>of</strong> a Ni-based superalloy:<br />
non-planar deform<strong>at</strong>ion, Scripta M<strong>at</strong>er. 62 (2010) 790-793.<br />
EJ Payton, PJ <strong>Phillips</strong>, MJ Mills, Semi-autom<strong>at</strong>ed characteriz<strong>at</strong>ion <strong>of</strong> the Gamma Prime phase in Nibased<br />
superalloys via high-resolution backsc<strong>at</strong>ter imaging, M<strong>at</strong>er. Sci. Eng. A 527 (2010) 2684-2692.<br />
SJ May, PJ <strong>Phillips</strong>, BW Wessels, Neg<strong>at</strong>ive magnetoresistance in metal/oxide/InMnAs tunnel junctions,<br />
J. Appl. Phys., 100 053912 (2006).<br />
Extended Abstracts<br />
PJ <strong>Phillips</strong>, MJ Mills, M De Graef, STEM disloc<strong>at</strong>ion analysis and image simul<strong>at</strong>ions, Microsc. Microanal.<br />
17 (2) (2011) 74-75.<br />
PJ <strong>Phillips</strong>, L Kovarik, MJ Mills, Atomic resolution defect analysis using low angle ADF-STEM, Microsc.<br />
Microanal. 17 (2) (2011) 716-717.<br />
PJ <strong>Phillips</strong>, M De Graef, MJ Mills, STEM stacking fault analysis Ni-based superalloys, Microsc. Microanal.<br />
16 (2) (2010) 746-747.<br />
PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, MJ Mills, The importance <strong>of</strong> high-resolution scanning transmission<br />
electron microscopy for fine-scale disloc<strong>at</strong>ion analysis, Microsc. Microanal. 16 (2) (2010) 1798-1799.
<strong>P<strong>at</strong>rick</strong> J <strong>Phillips</strong> 3<br />
Conference Present<strong>at</strong>ions<br />
MS&T 2011: PJ <strong>Phillips</strong>, MC Brandes, MJ Mills, M De Graef. Columbus, OH (October 2011).<br />
MS&T 2011: PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, D Wei, D Mourer, MJ Mills. Columbus, OH (October<br />
2011).<br />
Frontiers <strong>of</strong> Electron Microscopy in M<strong>at</strong>erials Science (Poster): PJ <strong>Phillips</strong>, MC Brandes, MJ Mills, M<br />
De Graef. Rohnert Park, CA (September 2011).<br />
Microscopy and Microanalysis (Poster): PJ <strong>Phillips</strong>, M De Graef, L Kovarik, A Agrawal, W Windl, MJ<br />
Mills. Nashville, TN (August 2011).<br />
Microscopy and Microanalysis (Poster): PJ <strong>Phillips</strong>, MJ Mills, M De Graef. Nashville, TN (August<br />
2011).<br />
TMS 2011: PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, D Wei, D Mourer, MJ Mills. San Diego, CA (March 2011).<br />
Microscopy and Microanalysis: PJ <strong>Phillips</strong>, M De Graef, MJ Mills. Portland, OR (August 2010).<br />
Microscopy and Microanalysis (Poster): PJ <strong>Phillips</strong>, L Kovarik, RR Unocic, MJ Mills. Portland, OR<br />
(August 2010).<br />
TMS 2010: PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, D Wei, D Mourer, MJ Mills. Se<strong>at</strong>tle, WA (February 2010).<br />
Gordon Research Conference on Physical Metallurgy (Poster): PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, D<br />
Wei, D Mourer, MJ Mills. Andover, NH (August 2009).<br />
AeroM<strong>at</strong> 2009: PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, D Wei, D Mourer, MJ Mills. Dayton, OH (June 2009).<br />
TMS 2009: PJ <strong>Phillips</strong>, RR Unocic, L Kovarik, D Wei, D Mourer, MJ Mills. San Francisco, CA (February<br />
2009).<br />
Microscopy Experience<br />
STEM imaging and diffraction-contrast deform<strong>at</strong>ion analysis: FEI Tecnai F20 XT.<br />
High resolution Z-contrast STEM: FEI Titan 3 , JEOL JEM-ARM200CF.<br />
Atomic resolution low angle annular dark-field STEM imaging <strong>of</strong> defects: FEI Titan 3 .<br />
Precipit<strong>at</strong>e phase analysis in a high-temper<strong>at</strong>ure shape memory alloy: FEI Titan 3 .<br />
Z-contrast imaging and chemical analysis <strong>of</strong> GaN/AlN nanowire heterostructures: FEI Titan 3 , JEOL<br />
JEM-ARM200CF.<br />
Multislice ADF image simul<strong>at</strong>ions.<br />
Chemical analysis via electron microscopy - EFTEM, EDS, EELS: FEI Tecnai F20 XT, FEI Titan 3 , JEOL<br />
JEM-ARM200CF.<br />
Conventional diffraction-contrast and weak-beam transmission electron microscopy (TEM) <strong>of</strong> Ni-based<br />
superalloys: Philips CM200T.<br />
Microstructural characteriz<strong>at</strong>ion via scanning electron microscopy (SEM): FEI Sirion XL-30 FEG-SEM.
<strong>P<strong>at</strong>rick</strong> J <strong>Phillips</strong> 4<br />
Honors & Awards<br />
Student Poster Award, Physical Sciences, M&M 2011.<br />
Student Scholarship Award to <strong>at</strong>tend 2010 Winter School on High Resolution Microscopy, Arizona<br />
St<strong>at</strong>e <strong>University</strong>.<br />
Intern<strong>at</strong>ional Metallographic Contest. First Place, Class 3: Electron Microscopy - Transmission and<br />
Analytical, 2009.<br />
Academic Award <strong>of</strong> Excellence, <strong>Physics</strong>, St. Norbert College, 2007.<br />
Pi Mu Epsilon, N<strong>at</strong>ional M<strong>at</strong>hem<strong>at</strong>ics Honor Society.<br />
Sigma Pi Sigma, N<strong>at</strong>ional <strong>Physics</strong> Honor Society.<br />
Academic Dean’s List, St. Norbert College, 2003-2007.<br />
References<br />
Available upon request.<br />
Last upd<strong>at</strong>ed: April 30, 2012
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