Fourier Transform Holography - Stanford University

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FTH Mask �Focused Ion Beam milling was used to pattern the Au structure. �The block letter F is the sample and has an intensity transmittance of 12% at 780eV �All five reference holes penetrate the entire structure with a mean diameter of 140±6nm Multiple Reference Holes Fourier Transform Holography Mask Front Back W. F. Schlotter, R. Rick, K. Chen, et. al., Appl. Phys. Lett. 89 (2006)
photons Coherent Diffraction Pattern Soft x-ray Fourier transform hologram of FTH mask. E= 780eV The common logarithm of the detected intensity is plotted. The hologram contains ~7*10 6 photons (E= 780eV).
Page 1 and 2: Fourier Transform Holography Single
Page 3 and 4: Outline • Motivation and the phas
Page 5 and 6: �Polarization Full Field X-ray Mi
Page 7 and 8: Linac Coherent Light Source 10 13 c
Page 9 and 10: Coherent Illumination cattering amp
Page 11 and 12: A Lensless Image Intensity Fourier
Page 13 and 14: eference Reconstructing the Object
Page 15 and 16: Integrated Sample Structure . �Pa
Page 17: Focused Ion Beam Milling FEI Strata
Page 20 and 21: In Vacuum Soft X-ray CCD
Page 22 and 23: UHV Beam Shutter Operation Paramete
Page 24 and 25: Single Shot Imaging on a Photon Bud
Page 28 and 29: • The squared magnitude of the co
Page 30 and 31: Single sub-image Reconstruction and
Page 32 and 33: Holographic Mask �Strategic refer
Page 34 and 35: Comparing real space images
Page 36 and 37: Camera Translation: Zoom Hologram A
Page 38 and 39: Pump Probe �Temporal resolution s
Page 40 and 41: Panoramic Imaging over 180 µm A sc
Page 42 and 43: Probe pulse Toward Ultrafast Evolut
Page 44 and 45: Increasing Dynamic Range
Page 46 and 47: Patterned Prototype Concentric disk
Page 48 and 49: Enhanced Dynamic Range
Page 50: Coherence Crew Ramon Rick Kang Chen

Fourier Transform Holography - Stanford University

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