Annual Report 2005.pdf - School of Physics - University of Melbourne
Annual Report 2005.pdf - School of Physics - University of Melbourne
Annual Report 2005.pdf - School of Physics - University of Melbourne
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Van Dijk L, Bozkurt M, Alves A, Johnston<br />
PN, Davis TJ, Reichart PT & Jamieson DN,<br />
“Macrochannelling: characterisation <strong>of</strong> nanostructures<br />
by ion beam analysis” Nuclear<br />
Instruments & Methods in <strong>Physics</strong> Research<br />
Section B - Beam Interact with Materials and<br />
Atoms 231:130-135 (2005)<br />
McCamey DR, Francis M, McCallum JC, Hamilton<br />
AR, Greentree AD & Clark RG, “Donor activation<br />
and damage in Si-SiO2 from low-dose, lowenergy<br />
ion implantation studied via electrical<br />
transport in MOSFETs” Semiconductor Science<br />
and Technology 20:363-368 (2005)<br />
Gibson BC, Huntington ST, Rubanov S, Olivero<br />
P, Digweed-Lyytikainen K, Canning J & Love<br />
JD, “Exposure and characterization <strong>of</strong> nanostructured<br />
hole arrays in tapered photonic crystal<br />
fibers using a combined FIB/SEM technique”<br />
Optics Express 13(22):9023-9028 (2005)<br />
Gurarie VN, Otsuka PH, Jamieson DN & Prawer<br />
S, “Crack-arresting compression layers produced<br />
by ion implantation” Nuclear Instruments &<br />
Methods in <strong>Physics</strong> Research Section B - Beam<br />
Interact with Materials and Atoms 242:421-423<br />
(2005)<br />
Gurarie VN, Otsuka PH, Jamieson DN & Prawer S,<br />
“Raman-based analysis <strong>of</strong> implantation-induced<br />
expansion and stresses in sapphire crystals”<br />
Journal <strong>of</strong> Materials Research 20(5):1131-1138<br />
(2005)<br />
H<strong>of</strong>fman A, Andrienko I, Jamieson DN & Prawer<br />
S, “Electron trapping and detrapping in ionbeam-damaged<br />
diamond surfaces” Applied<br />
<strong>Physics</strong> Letters 86(4):41031-41033 (2005)<br />
Huang L, Lau SP, Yang HY, Leong SP, Yu SF &<br />
Prawer S, “Stable superhydrophobic surface via<br />
carbon nanotubes coated with a ZnO thin film”<br />
Journal <strong>of</strong> Physical Chemistry B 109:7746-7748<br />
(2005)<br />
Jamieson DN, Yang C, Hopf TF, Hearne S, Pakes<br />
CI, Prawer S, Mitic M, Gauja E, Andresen SE,<br />
Hudson FE, Dzurak AS & Clark RG, “Controlled<br />
shallow single-ion implantation in silicon using<br />
an active substrate for sub-20-keV ions” Applied<br />
<strong>Physics</strong> Letters 86(20):21011-21013 (2005)<br />
Millar V, Pakes CI, Prawer S, Rout B & Jamieson<br />
DN, “Thin film resists for registration <strong>of</strong> singleion<br />
impacts” Nanotechnology 16:823-826<br />
(2005)<br />
Rabeau JR, Chin YL, Prawer S, Jelezko JR,<br />
Gaebel T & Wrachtrup J, “Fabrication <strong>of</strong> single<br />
nickel-nitrogen defects in diamond by chemical<br />
vapour deposition” Applied <strong>Physics</strong> Letters<br />
86(13):19231-19263 (2005)<br />
Sakoolnamarka R, Burrow MF, Prawer S & Tyas<br />
MJ, “Raman spectroscopic study <strong>of</strong> noncarious<br />
cervical lesions” Odontology 93(1):35-40 (2005)<br />
Sze JY, Tay BK, Pakes CI, Jamieson DN & Prawer<br />
S, “Conducting Ni nanoparticles in an ionmodified<br />
polymer” Journal <strong>of</strong> Applied <strong>Physics</strong><br />
98(6):61011-61013 (2005)<br />
Trajkov E, Prawer S, Butler JE & Hearne S,<br />
“Charge trap levels in sulfur-doped chemicalvapour-deposited<br />
diamond with applications<br />
to ultraviolet dosimetry” Journal <strong>of</strong> Applied<br />
<strong>Physics</strong> 98(2):37041-37047 (2005)<br />
Ang JC, Wellard CJ & Hollenberg LC, “Dephasing<br />
<strong>of</strong> charge qubits in the presence <strong>of</strong> charge<br />
traps” In J-C Chiao, DN Jamieson, L Faraone<br />
& AS Dzurak (eds), Proceedings <strong>of</strong> SPIE. 5650 :<br />
527-535. Washington, United States <strong>of</strong> America:<br />
SPIE - The International Society for Optical<br />
Engineering (2005)<br />
Conrad VI, Greentree AD, Jamieson DN &<br />
Hollenberg LC, “Optimising single electron<br />
transistors as electrometers for high-precision<br />
electrometry <strong>of</strong> charge on quantum dots” In J-<br />
C Chiao, DN Jamieson, L Faraone & AS Dzurak<br />
(eds), Proceedings <strong>of</strong> SPIE. 5650 : 536-547.<br />
Washington, United States <strong>of</strong> America: SPIE -<br />
The International Society for Optical Engineering<br />
(2005)<br />
Devitt SJ, Fowler AG & Hollenberg LC,<br />
“Investigating the practical implementation <strong>of</strong><br />
Shor's algorithm” In J-C Chiao, DN Jamieson,<br />
L Faraone & AS Dzurak (eds), Proceedings <strong>of</strong><br />
SPIE. 5650 : 483-494. Washington, United States<br />
<strong>of</strong> America: SPIE - The International Society for<br />
Optical Engineering (2005)<br />
Fowler AG, Devitt SJ & Hollenberg LC,<br />
“Constructing steane code fault-tolerant gates”<br />
In J-C Chiao, DN Jamieson, L Faraone & AS<br />
Dzurak (eds), Proceedings <strong>of</strong> SPIE. 5650 : 557-<br />
568. Washington, United States <strong>of</strong> America:<br />
SPIE - The International Society for Optical<br />
Engineering (2005)<br />
Greentree AD, Cole JH, Hamilton AR &<br />
Hollenberg LC, “Scaling <strong>of</strong> coherent tunnelling<br />
adiabatic passage in solid-state coherent<br />
quantum systems” In J-C Chiao, DN Jamieson,<br />
L Faraone & AS Dzurak (eds), Proceedings <strong>of</strong><br />
SPIE. 5650 : 72-80. Washington, United States<br />
<strong>of</strong> America: SPIE - The International Society for<br />
Optical Engineering (2005)<br />
Hill CD, Hollenberg LC, Fowler AG, Wellard CJ,<br />
Greentree AD & Goan H-S, “Fast donor based<br />
electron spin quantum computing” In J-C Chiao,<br />
DN Jamieson, L Faraone & AS Dzurak (eds),<br />
Proceedings <strong>of</strong> SPIE. 5650: 44-54. Washington,<br />
37
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